linear array

Industry

CPC
G01N2223/5015

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/5015linear array

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Contact imaging sensor head for computed radiography
- Patent number 12,044,637
- Issue date Jul 23, 2024
- Leidos, Inc.
- Rex David Richardson
- G01 - MEASURING TESTING
Information Patent Grant
Static CT detection device
- Patent number 11,925,183
- Issue date Mar 12, 2024
- Tsinghua University
- Zhiqiang Chen
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Calibration method and device therefor
- Patent number 11,885,752
- Issue date Jan 30, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectrometer and chemical state analysis method using the same
- Patent number 11,137,360
- Issue date Oct 5, 2021
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,054,375
- Issue date Jul 6, 2021
- University of Washington
- Gerald Todd Seidler
- G02 - OPTICS
Information Patent Grant
Dynamic radiation collimation for non destructive analysis of test...
- Patent number 11,009,471
- Issue date May 18, 2021
- Illinois Tool Works Inc.
- Brett A. Muehlhauser
- G01 - MEASURING TESTING
Information Patent Grant
Stationary tomographic X-ray imaging systems for automatically sort...
- Patent number 10,976,271
- Issue date Apr 13, 2021
- Rapiscan Systems, Inc.
- Edward James Morton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wavelength dispersive X-ray fluorescence spectrometer
- Patent number 10,948,436
- Issue date Mar 16, 2021
- Rigaku Corporation
- Shuichi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Reducing scatter for computed tomography
- Patent number 10,948,428
- Issue date Mar 16, 2021
- Delavan Inc.
- Thomas J. Ocken
- G01 - MEASURING TESTING
Information Patent Grant
Contact imaging sensor head for computed radiography
- Patent number 10,876,981
- Issue date Dec 29, 2020
- Leidos, Inc.
- Rex David Richardson
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection apparatus
- Patent number 10,859,516
- Issue date Dec 8, 2020
- System Square Inc.
- Noriaki Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis device and method for optical axis alignment thereof
- Patent number 10,837,923
- Issue date Nov 17, 2020
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-ray diffraction method and apparatus
- Patent number 10,753,890
- Issue date Aug 25, 2020
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating an x-ray device and associated x-ray device
- Patent number 10,684,237
- Issue date Jun 16, 2020
- Siemens Healthcare GmbH
- Alexander Graf
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Contact imaging sensor head for computed radiography
- Patent number 10,458,931
- Issue date Oct 29, 2019
- Leidos, Inc.
- Rex David Richardson
- G01 - MEASURING TESTING
Information Patent Grant
X-ray sidescatter inspection of laminates
- Patent number 10,393,680
- Issue date Aug 27, 2019
- The Boeing Company
- Nathan R. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Scanning method
- Patent number 10,067,076
- Issue date Sep 4, 2018
- Johnson Matthey Public Limited Company
- Emanuele Ronchi
- G01 - MEASURING TESTING
Information Patent Grant
Stationary CT apparatus
- Patent number 9,453,937
- Issue date Sep 27, 2016
- Nuctech Company Limited
- Jinyu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for materials testing of test objects using X-rays
- Patent number 9,341,546
- Issue date May 17, 2016
- GE Sensing & Inspection Technologies GmbH
- Ingo Stuke
- G01 - MEASURING TESTING
Information Patent Grant
Multi-linear X-ray scanning systems and methods for X-ray scanning
- Patent number 8,989,348
- Issue date Mar 24, 2015
- Visuum, LLC
- John D. Cox
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer
- Patent number 8,675,816
- Issue date Mar 18, 2014
- P. N. Lebedev Physical Institute of the Russian Academy of Sciences (LPI)
- Alexander Georgievich Turyansky
- G01 - MEASURING TESTING
Information Patent Grant
One dimensional linescan X-ray detector
- Patent number 8,284,895
- Issue date Oct 9, 2012
- The United States of America, as represented by the Secretary of Agriculture
- Ronald P. Haff
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Detector array and device using the same
- Patent number 7,724,869
- Issue date May 25, 2010
- Tsinghua University
- Xuewu Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for X-ray fluorescence analysis and detection
- Patent number 7,555,098
- Issue date Jun 30, 2009
- HD Technologies Inc.
- Ke Zhang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scanning line detector for two-dimensional x-ray diffractometer
- Patent number 7,190,762
- Issue date Mar 13, 2007
- Broker AXS, Inc
- Bob Baoping He
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248048
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248049
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...
- Publication number 20240219323
- Publication date Jul 4, 2024
- SMITHS DETECTION GERMANY GMBH
- Philipp FISCHER
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY SPECTROMETER AND METHODS FOR USE
- Publication number 20220003694
- Publication date Jan 6, 2022
- University of Washington
- Gerald Todd SEIDLER
- G01 - MEASURING TESTING
Information Patent Application
IMAGE DISTORTION CORRECTION FOR X-RAY DETECTOR
- Publication number 20210172886
- Publication date Jun 10, 2021
- Illinois Tool Works, Inc.
- Michael Glatzmaier
- G01 - MEASURING TESTING
Information Patent Application
CONTACT IMAGING SENSOR HEAD FOR COMPUTED RADIOGRAPHY
- Publication number 20210109044
- Publication date Apr 15, 2021
- Leidos, Inc.
- Rex David Richardson
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC RADIATION COLLIMATION FOR NON-DESTRUCTIVE ANALYSIS OF TEST...
- Publication number 20200080946
- Publication date Mar 12, 2020
- Illinois Tool Works Inc.
- Brett A. Muehlhauser
- G01 - MEASURING TESTING
Information Patent Application
Contact Imaging Sensor Head For Computed Radiography
- Publication number 20200064282
- Publication date Feb 27, 2020
- Leidos, Inc.
- Rex David Richardson
- G01 - MEASURING TESTING
Information Patent Application
REDUCING SCATTER FOR COMPUTED TOMOGRAPHY
- Publication number 20190360947
- Publication date Nov 28, 2019
- DELAVAN INC
- Thomas J. Ocken
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROMETER AND METHODS FOR USE
- Publication number 20190257774
- Publication date Aug 22, 2019
- University of Washington
- Gerald Todd SEIDLER
- G01 - MEASURING TESTING
Information Patent Application
High resolution X-ray Diffraction Method and Apparatus
- Publication number 20180259464
- Publication date Sep 13, 2018
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATED SEGMENTED X-RAY DETECTOR SYSTEM AND METHOD
- Publication number 20180017684
- Publication date Jan 18, 2018
- Teledyne Dalsa, Inc.
- Bryan DELODDER
- G01 - MEASURING TESTING
Information Patent Application
STATIONARY CT APPARATUS
- Publication number 20140185743
- Publication date Jul 3, 2014
- Jinyu ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Multi-Linear X-Ray Scanning Systems and Methods for X-Ray Scanning
- Publication number 20130202087
- Publication date Aug 8, 2013
- VISUUM, LLC
- John D. Cox
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MATERIALS TESTING OF TEST OBJECTS USING X-RAYS
- Publication number 20120045033
- Publication date Feb 23, 2012
- Ingo Stuke
- G01 - MEASURING TESTING
Information Patent Application
X-ray spectrometer
- Publication number 20110188631
- Publication date Aug 4, 2011
- P. N. Lebedev Physical Institute of the Russian Academy of Sciences (LPI)
- Alexander Georgievich Turyansky
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR COMPUTER TOMOGRAPHY OF NUCLEAR ISOTOPES USI...
- Publication number 20090196397
- Publication date Aug 6, 2009
- Passport Systems, Inc.
- William Bertozzi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR X-RAY FLUORESCENCE ANALYSIS AND DETECTION
- Publication number 20080273663
- Publication date Nov 6, 2008
- Ke Zhang
- G01 - MEASURING TESTING
Information Patent Application
Detector array and device using the same
- Publication number 20070286337
- Publication date Dec 13, 2007
- Xuewu Wang
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Scanning line detector for two-dimensional x-ray diffractometer
- Publication number 20060093090
- Publication date May 4, 2006
- Bruker AXS, Inc.
- Bob Baoping He
- G01 - MEASURING TESTING

linear array

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System, method, and apparatus for x-ray backscatter inspection of p...

X-ray automated calibration and monitoring

Contact imaging sensor head for computed radiography

Static CT detection device

Calibration method and device therefor

X-ray spectrometer and methods for use

X-ray spectrometer and chemical state analysis method using the same

X-ray spectrometer and methods for use

Dynamic radiation collimation for non destructive analysis of test...

Stationary tomographic X-ray imaging systems for automatically sort...

Wavelength dispersive X-ray fluorescence spectrometer

Reducing scatter for computed tomography

Contact imaging sensor head for computed radiography

X-ray inspection apparatus

X-ray analysis device and method for optical axis alignment thereof

High resolution X-ray diffraction method and apparatus

Method for operating an x-ray device and associated x-ray device

Contact imaging sensor head for computed radiography

X-ray sidescatter inspection of laminates

Scanning method

Stationary CT apparatus

Apparatus for materials testing of test objects using X-rays

Multi-linear X-ray scanning systems and methods for X-ray scanning

X-ray spectrometer

One dimensional linescan X-ray detector

Detector array and device using the same

Method and apparatus for X-ray fluorescence analysis and detection

Scanning line detector for two-dimensional x-ray diffractometer

Patents Applicationslast 30 patents

X-RAY ANALYZER

RAY SCANNING APPARATUS

RAY SCANNING APPARATUS

X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...

Calibration Method and Device Therefor

Systems and Methods for Generating High-Energy Three-Dimensional Co...

X-RAY SPECTROMETER AND METHODS FOR USE

IMAGE DISTORTION CORRECTION FOR X-RAY DETECTOR

CONTACT IMAGING SENSOR HEAD FOR COMPUTED RADIOGRAPHY

DYNAMIC RADIATION COLLIMATION FOR NON-DESTRUCTIVE ANALYSIS OF TEST...

Contact Imaging Sensor Head For Computed Radiography

REDUCING SCATTER FOR COMPUTED TOMOGRAPHY

X-RAY SPECTROMETER AND METHODS FOR USE

High resolution X-ray Diffraction Method and Apparatus

ARTICULATED SEGMENTED X-RAY DETECTOR SYSTEM AND METHOD

STATIONARY CT APPARATUS

Multi-Linear X-Ray Scanning Systems and Methods for X-Ray Scanning

APPARATUS FOR MATERIALS TESTING OF TEST OBJECTS USING X-RAYS

X-ray spectrometer

METHODS AND SYSTEMS FOR COMPUTER TOMOGRAPHY OF NUCLEAR ISOTOPES USI...

METHOD AND APPARATUS FOR X-RAY FLUORESCENCE ANALYSIS AND DETECTION

Detector array and device using the same

Scanning line detector for two-dimensional x-ray diffractometer