Lorenz microscopy (magnetic field measurement)

Industry

  • CPC
  • H01J2237/2588
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Magnetic Domain Imaging System

    • Publication number 20100294932
    • Publication date Nov 25, 2010
    • JEOL Ltd.
    • Takeshi Tomita
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ELECTRON BEAM DEVICE

    • Publication number 20090206256
    • Publication date Aug 20, 2009
    • Ken HARADA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Transmission electron microscope

    • Publication number 20080210868
    • Publication date Sep 4, 2008
    • Hitachi, Ltd.
    • Teruo Kohashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron microscope equipped with magnetic microprobe

    • Publication number 20050274889
    • Publication date Dec 15, 2005
    • TOHOKU UNIVERSITY
    • Daisuke Shindo
    • H01 - BASIC ELECTRIC ELEMENTS