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Lorenz microscopy (magnetic field measurement)
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CPC
H01J2237/2588
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Parent Industries
H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
Current Industry
H01J2237/2588
Lorenz microscopy (magnetic field measurement)
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic domain imaging system
Patent number
8,158,940
Issue date
Apr 17, 2012
Jeol Ltd.
Takeshi Tomita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam device
Patent number
7,923,685
Issue date
Apr 12, 2011
Hitachi, Ltd.
Ken Harada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope
Patent number
7,755,046
Issue date
Jul 13, 2010
Hitachi, Ltd.
Teruo Kohashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope equipped with magnetic microprobe
Patent number
7,241,995
Issue date
Jul 10, 2007
TOHOKU UNIVERSITY
Daisuke Shindo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Technique to quantitatively measure magnetic properties of thin str...
Patent number
6,590,209
Issue date
Jul 8, 2003
The Regents of the University of California
Sasa Bajt
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Magnetic Domain Imaging System
Publication number
20100294932
Publication date
Nov 25, 2010
JEOL Ltd.
Takeshi Tomita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM DEVICE
Publication number
20090206256
Publication date
Aug 20, 2009
Ken HARADA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transmission electron microscope
Publication number
20080210868
Publication date
Sep 4, 2008
Hitachi, Ltd.
Teruo Kohashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron microscope equipped with magnetic microprobe
Publication number
20050274889
Publication date
Dec 15, 2005
TOHOKU UNIVERSITY
Daisuke Shindo
H01 - BASIC ELECTRIC ELEMENTS