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Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor
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CPC
H01J37/224
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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J37/00
Discharge tubes with provision for introducing objects or material to be exposed to the discharge
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H01J37/224
Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor
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Patents Grants
last 30 patents
Information
Patent Grant
Transmission electron microscope and imaging method
Patent number
12,183,542
Issue date
Dec 31, 2024
HITACHI HIGH-TECH CORPORATION
Hiroki Kawamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for Schottky TFE inspection
Patent number
12,165,834
Issue date
Dec 10, 2024
NUFLARE TECHNOLOGY, INC.
Victor Katsap
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
11,869,745
Issue date
Jan 9, 2024
HITACHI HIGH-TECH CORPORATION
Minami Shouji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for producing phosphor panel, phosphor panel, image intensif...
Patent number
11,658,003
Issue date
May 23, 2023
Hamamatsu Photonics K.K.
Yasumasa Hamana
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for Schottky TFE inspection
Patent number
11,640,896
Issue date
May 2, 2023
NUFLARE TECHNOLOGY, INC.
Victor Katsap
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,322,331
Issue date
May 3, 2022
Jeol Ltd.
Yuta Murakami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charge control device for a system with multiple electron beams
Patent number
11,087,950
Issue date
Aug 10, 2021
KLA-Tencor Corporation
Christopher Sears
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
11,024,481
Issue date
Jun 1, 2021
FEI Company
Karel Diederick Van Der Mast
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for high speed EELS spectrum acquisition
Patent number
11,024,484
Issue date
Jun 1, 2021
Gatan, Inc.
Edward Michael James
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Holder and charged particle beam apparatus
Patent number
10,937,626
Issue date
Mar 2, 2021
HITACHI HIGH-TECH CORPORATION
Kotaro Hosoya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
Patent number
10,903,042
Issue date
Jan 26, 2021
TECHNISCHE UNIVERSITEIT DELFT
Pieter Kruit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope
Patent number
10,796,879
Issue date
Oct 6, 2020
Phenom-World Holding B.V.
Karel Diederick Van Der Mast
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Holder and charged particle beam apparatus
Patent number
10,777,379
Issue date
Sep 15, 2020
HITACHI HIGH-TECH CORPORATION
Kotaro Hosoya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Image capture assembly and method for electron back scatter diffrac...
Patent number
10,692,689
Issue date
Jun 23, 2020
VG Systems Limited
Zoran Pesic
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device for moving an aperture having pluralit...
Patent number
10,636,621
Issue date
Apr 28, 2020
Hitachi High-Technologies Corporation
Akinari Hanawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and method for adjusting charged parti...
Patent number
10,522,320
Issue date
Dec 31, 2019
Hitachi High-Technologies Corporation
Tomohiko Ogata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Signal separator for a multi-beam charged particle inspection appar...
Patent number
10,504,687
Issue date
Dec 10, 2019
Technische Universiteit Delft
Pieter Kruit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Object preparation device and particle beam device having an object...
Patent number
10,483,084
Issue date
Nov 19, 2019
Carl Zeiss Microscopy GmbH
Josef Biberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
Patent number
10,453,649
Issue date
Oct 22, 2019
Technische Universiteit Delft
Pieter Kruit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for inspecting a surface of a sample, using a...
Patent number
10,395,887
Issue date
Aug 27, 2019
Technische Universiteit Delft
Pieter Kruit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron spectrometer and measurement method
Patent number
9,613,790
Issue date
Apr 4, 2017
Jeol Ltd.
Yasuhide Nakagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit and method for controlling a microscope
Patent number
9,612,429
Issue date
Apr 4, 2017
Leica Microsystems CMS GmbH
Thorsten Koester
G02 - OPTICS
Information
Patent Grant
Charged particle beam device, sample stage unit, and sample observa...
Patent number
9,472,375
Issue date
Oct 18, 2016
Hitachi High-Technologies Corporation
Yusuke Ominami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam detector
Patent number
9,330,882
Issue date
May 3, 2016
Raytheon Company
Bruce Chignola
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Detection method for use in charged-particle microscopy
Patent number
9,153,416
Issue date
Oct 6, 2015
FEI Company
Petr Hlavenka
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining a distance between two beamlets in a multi-b...
Patent number
9,030,675
Issue date
May 12, 2015
Mapper Lithography IP B.V.
Jan Andries Meijer
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Detector for use in charged-particle microscopy
Patent number
8,735,849
Issue date
May 27, 2014
FEI Company
Petr Hlavenka
G01 - MEASURING TESTING
Information
Patent Grant
Electron microscope with electron spectrometer
Patent number
8,344,320
Issue date
Jan 1, 2013
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Retractable lens-coupled electron microscope camera with image sens...
Patent number
7,964,846
Issue date
Jun 21, 2011
Gatan, Inc.
Paul Mooney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope with electron spectrometer
Patent number
7,888,641
Issue date
Feb 15, 2011
Hitachi High-Technologies Corporation
Shohei Terada
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE IMAGE OBSERVATION DEVICE AND METHOD
Publication number
20240222065
Publication date
Jul 4, 2024
HITACHI HIGH-TECH CORPORATION
Yuta IMAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transmission Electron Microscope
Publication number
20240096588
Publication date
Mar 21, 2024
JEOL Ltd.
Kanako Noguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
Publication number
20230253178
Publication date
Aug 10, 2023
NUFLARE TECHNOLOGY, INC.
Victor KATSAP
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...
Publication number
20230238213
Publication date
Jul 27, 2023
Carl Zeiss SMT GMBH
Ottmar Hoinkis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
Publication number
20220367145
Publication date
Nov 17, 2022
NUFLARE TECHNOLOGY, INC.
Victor KATSAP
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transmission Electron Microscope and Imaging Method
Publication number
20220359153
Publication date
Nov 10, 2022
Hitachi High-Tech Corporation
Hiroki KAWAMOTO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20220270847
Publication date
Aug 25, 2022
Hitachi High-Tech Corporation
Kazuki Ikeda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PRODUCING PHOSPHOR PANEL, PHOSPHOR PANEL, IMAGE INTENSIF...
Publication number
20220148848
Publication date
May 12, 2022
Hamamatsu Photonics K.K.
Yasumasa HAMANA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20220139667
Publication date
May 5, 2022
Hitachi High-Tech Corporation
Minami Shouji
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR HIGH SPEED EELS SPECTRUM ACQUISITION
Publication number
20210090856
Publication date
Mar 25, 2021
GATAN, INC.
Edward Michael JAMES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE
Publication number
20200402760
Publication date
Dec 24, 2020
Phenom-World Holding B.V.
Karel Diederick VAN DER MAST
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HOLDER AND CHARGED PARTICLE BEAM APPARATUS
Publication number
20200373119
Publication date
Nov 26, 2020
HITACHI HIGH-TECH CORPORATION
Kotaro HOSOYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HOLDER AND CHARGED PARTICLE BEAM APPARATUS
Publication number
20200303157
Publication date
Sep 24, 2020
Hitachi High-Technologies Corporation
Kotaro HOSOYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20200294761
Publication date
Sep 17, 2020
JEOL Ltd.
Yuta Murakami
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
Publication number
20200035447
Publication date
Jan 30, 2020
Technische Universiteit Delft
Pieter KRUIT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGE CONTROL DEVICE FOR A SYSTEM WITH MULTIPLE ELECTRON BEAMS
Publication number
20190371566
Publication date
Dec 5, 2019
KLA-Tencor Corporation
Christopher Sears
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Apparatus and method for inspecting a surface of a sample, using a...
Publication number
20190259570
Publication date
Aug 22, 2019
Technische Universiteit Delft
Pieter KRUIT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Signal separator for a multi-beam charged particle inspection appar...
Publication number
20190259564
Publication date
Aug 22, 2019
Technische Universiteit Delft
Pieter KRUIT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device and Method for Adjusting Charged Parti...
Publication number
20190108969
Publication date
Apr 11, 2019
Hitachi High-Technologies Corporation
Tomohiko OGATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE
Publication number
20190103245
Publication date
Apr 4, 2019
Phenom-World Holding B.V.
Karel Diederick VAN DER MAST
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...
Publication number
20180286632
Publication date
Oct 4, 2018
CARL ZEISS MICROSCOPY GMBH
Josef Biberger
G01 - MEASURING TESTING
Information
Patent Application
Image Capture Assembly and Method for Electron Back Scatter Diffrac...
Publication number
20180166253
Publication date
Jun 14, 2018
VG Systems Limited
Zoran PESIC
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device and Sample Observation Method
Publication number
20180076004
Publication date
Mar 15, 2018
Hitachi High-Technologies Corporation
Akinari HANAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Spectrometer and Measurement Method
Publication number
20160268119
Publication date
Sep 15, 2016
JEOL Ltd.
Yasuhide Nakagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle Beam Detector
Publication number
20160035536
Publication date
Feb 4, 2016
Raytheon Company
Bruce Chignola
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...
Publication number
20150311033
Publication date
Oct 29, 2015
HITACHI HIGH-TECHNOLOGY CORPORATION
Yusuke OMINAMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY
Publication number
20140374593
Publication date
Dec 25, 2014
FEI Company
Petr Hlavenka
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON MICROSCOPE
Publication number
20140103208
Publication date
Apr 17, 2014
Hitachi High-Technologies Corporation
Hiroyuki Noda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...
Publication number
20130062519
Publication date
Mar 14, 2013
Toshiyuki Oyagi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DETERMINING A DISTANCE BETWEEN TWO BEAMLETS IN A MULTI-B...
Publication number
20120293810
Publication date
Nov 22, 2012
MAPPER LITHOGRAPHY IP BV
Jan Andries MEIJER
B82 - NANO-TECHNOLOGY