Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor

Industry

CPC
H01J37/224

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/224Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope and imaging method
- Patent number 12,183,542
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroki Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,869,745
- Issue date Jan 9, 2024
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing phosphor panel, phosphor panel, image intensif...
- Patent number 11,658,003
- Issue date May 23, 2023
- Hamamatsu Photonics K.K.
- Yasumasa Hamana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 11,640,896
- Issue date May 2, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,322,331
- Issue date May 3, 2022
- Jeol Ltd.
- Yuta Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge control device for a system with multiple electron beams
- Patent number 11,087,950
- Issue date Aug 10, 2021
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 11,024,481
- Issue date Jun 1, 2021
- FEI Company
- Karel Diederick Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for high speed EELS spectrum acquisition
- Patent number 11,024,484
- Issue date Jun 1, 2021
- Gatan, Inc.
- Edward Michael James
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder and charged particle beam apparatus
- Patent number 10,937,626
- Issue date Mar 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,903,042
- Issue date Jan 26, 2021
- TECHNISCHE UNIVERSITEIT DELFT
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,796,879
- Issue date Oct 6, 2020
- Phenom-World Holding B.V.
- Karel Diederick Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holder and charged particle beam apparatus
- Patent number 10,777,379
- Issue date Sep 15, 2020
- HITACHI HIGH-TECH CORPORATION
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image capture assembly and method for electron back scatter diffrac...
- Patent number 10,692,689
- Issue date Jun 23, 2020
- VG Systems Limited
- Zoran Pesic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for moving an aperture having pluralit...
- Patent number 10,636,621
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Akinari Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for adjusting charged parti...
- Patent number 10,522,320
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Tomohiko Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal separator for a multi-beam charged particle inspection appar...
- Patent number 10,504,687
- Issue date Dec 10, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object preparation device and particle beam device having an object...
- Patent number 10,483,084
- Issue date Nov 19, 2019
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,453,649
- Issue date Oct 22, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a surface of a sample, using a...
- Patent number 10,395,887
- Issue date Aug 27, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer and measurement method
- Patent number 9,613,790
- Issue date Apr 4, 2017
- Jeol Ltd.
- Yasuhide Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit and method for controlling a microscope
- Patent number 9,612,429
- Issue date Apr 4, 2017
- Leica Microsystems CMS GmbH
- Thorsten Koester
- G02 - OPTICS
Information Patent Grant
Charged particle beam device, sample stage unit, and sample observa...
- Patent number 9,472,375
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam detector
- Patent number 9,330,882
- Issue date May 3, 2016
- Raytheon Company
- Bruce Chignola
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method for use in charged-particle microscopy
- Patent number 9,153,416
- Issue date Oct 6, 2015
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a distance between two beamlets in a multi-b...
- Patent number 9,030,675
- Issue date May 12, 2015
- Mapper Lithography IP B.V.
- Jan Andries Meijer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detector for use in charged-particle microscopy
- Patent number 8,735,849
- Issue date May 27, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope with electron spectrometer
- Patent number 8,344,320
- Issue date Jan 1, 2013
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retractable lens-coupled electron microscope camera with image sens...
- Patent number 7,964,846
- Issue date Jun 21, 2011
- Gatan, Inc.
- Paul Mooney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with electron spectrometer
- Patent number 7,888,641
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE AND FILM QUALITY INSPECTION METHOD
- Publication number 20250046569
- Publication date Feb 6, 2025
- Hitachi High-Tech Corporation
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE IMAGE OBSERVATION DEVICE AND METHOD
- Publication number 20240222065
- Publication date Jul 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20240096588
- Publication date Mar 21, 2024
- JEOL Ltd.
- Kanako Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
- Publication number 20230253178
- Publication date Aug 10, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...
- Publication number 20230238213
- Publication date Jul 27, 2023
- Carl Zeiss SMT GMBH
- Ottmar Hoinkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
- Publication number 20220367145
- Publication date Nov 17, 2022
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Imaging Method
- Publication number 20220359153
- Publication date Nov 10, 2022
- Hitachi High-Tech Corporation
- Hiroki KAWAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220270847
- Publication date Aug 25, 2022
- Hitachi High-Tech Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING PHOSPHOR PANEL, PHOSPHOR PANEL, IMAGE INTENSIF...
- Publication number 20220148848
- Publication date May 12, 2022
- Hamamatsu Photonics K.K.
- Yasumasa HAMANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220139667
- Publication date May 5, 2022
- Hitachi High-Tech Corporation
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR HIGH SPEED EELS SPECTRUM ACQUISITION
- Publication number 20210090856
- Publication date Mar 25, 2021
- GATAN, INC.
- Edward Michael JAMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20200402760
- Publication date Dec 24, 2020
- Phenom-World Holding B.V.
- Karel Diederick VAN DER MAST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDER AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20200373119
- Publication date Nov 26, 2020
- HITACHI HIGH-TECH CORPORATION
- Kotaro HOSOYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDER AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20200303157
- Publication date Sep 24, 2020
- Hitachi High-Technologies Corporation
- Kotaro HOSOYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20200294761
- Publication date Sep 17, 2020
- JEOL Ltd.
- Yuta Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20200035447
- Publication date Jan 30, 2020
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE CONTROL DEVICE FOR A SYSTEM WITH MULTIPLE ELECTRON BEAMS
- Publication number 20190371566
- Publication date Dec 5, 2019
- KLA-Tencor Corporation
- Christopher Sears
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a surface of a sample, using a...
- Publication number 20190259570
- Publication date Aug 22, 2019
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Signal separator for a multi-beam charged particle inspection appar...
- Publication number 20190259564
- Publication date Aug 22, 2019
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Adjusting Charged Parti...
- Publication number 20190108969
- Publication date Apr 11, 2019
- Hitachi High-Technologies Corporation
- Tomohiko OGATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20190103245
- Publication date Apr 4, 2019
- Phenom-World Holding B.V.
- Karel Diederick VAN DER MAST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...
- Publication number 20180286632
- Publication date Oct 4, 2018
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- G01 - MEASURING TESTING
Information Patent Application
Image Capture Assembly and Method for Electron Back Scatter Diffrac...
- Publication number 20180166253
- Publication date Jun 14, 2018
- VG Systems Limited
- Zoran PESIC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20180076004
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Spectrometer and Measurement Method
- Publication number 20160268119
- Publication date Sep 15, 2016
- JEOL Ltd.
- Yasuhide Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam Detector
- Publication number 20160035536
- Publication date Feb 4, 2016
- Raytheon Company
- Bruce Chignola
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...
- Publication number 20150311033
- Publication date Oct 29, 2015
- HITACHI HIGH-TECHNOLOGY CORPORATION
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY
- Publication number 20140374593
- Publication date Dec 25, 2014
- FEI Company
- Petr Hlavenka
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20140103208
- Publication date Apr 17, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...
- Publication number 20130062519
- Publication date Mar 14, 2013
- Toshiyuki Oyagi
- H01 - BASIC ELECTRIC ELEMENTS

Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Transmission electron microscope and imaging method

Method and apparatus for Schottky TFE inspection

Charged particle beam device

Method for producing phosphor panel, phosphor panel, image intensif...

Method and apparatus for Schottky TFE inspection

Charged particle beam apparatus

Charge control device for a system with multiple electron beams

Scanning electron microscope

Method for high speed EELS spectrum acquisition

Holder and charged particle beam apparatus

Apparatus and method for inspecting a sample using a plurality of c...

Scanning electron microscope

Holder and charged particle beam apparatus

Image capture assembly and method for electron back scatter diffrac...

Charged particle beam device for moving an aperture having pluralit...

Charged particle beam device and method for adjusting charged parti...

Signal separator for a multi-beam charged particle inspection appar...

Object preparation device and particle beam device having an object...

Apparatus and method for inspecting a sample using a plurality of c...

Apparatus and method for inspecting a surface of a sample, using a...

Electron spectrometer and measurement method

Circuit and method for controlling a microscope

Charged particle beam device, sample stage unit, and sample observa...

Particle beam detector

Detection method for use in charged-particle microscopy

Method for determining a distance between two beamlets in a multi-b...

Detector for use in charged-particle microscopy

Electron microscope with electron spectrometer

Retractable lens-coupled electron microscope camera with image sens...

Electron microscope with electron spectrometer

Patents Applicationslast 30 patents

INSPECTION DEVICE AND FILM QUALITY INSPECTION METHOD

SAMPLE IMAGE OBSERVATION DEVICE AND METHOD

Transmission Electron Microscope

METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION

APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE...

METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION

Transmission Electron Microscope and Imaging Method

CHARGED PARTICLE BEAM DEVICE

METHOD FOR PRODUCING PHOSPHOR PANEL, PHOSPHOR PANEL, IMAGE INTENSIF...

CHARGED PARTICLE BEAM DEVICE

METHOD FOR HIGH SPEED EELS SPECTRUM ACQUISITION

SCANNING ELECTRON MICROSCOPE

HOLDER AND CHARGED PARTICLE BEAM APPARATUS

HOLDER AND CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Apparatus

Apparatus and method for inspecting a sample using a plurality of c...

CHARGE CONTROL DEVICE FOR A SYSTEM WITH MULTIPLE ELECTRON BEAMS

Apparatus and method for inspecting a surface of a sample, using a...

Signal separator for a multi-beam charged particle inspection appar...

Charged Particle Beam Device and Method for Adjusting Charged Parti...

SCANNING ELECTRON MICROSCOPE

OBJECT PREPARATION DEVICE AND PARTICLE BEAM DEVICE WITH AN OBJECT P...

Image Capture Assembly and Method for Electron Back Scatter Diffrac...

Charged Particle Beam Device and Sample Observation Method

Electron Spectrometer and Measurement Method

Particle Beam Detector

Charged Particle Beam Device, Sample Stage Unit, and Sample Observa...

DETECTION METHOD FOR USE IN CHARGED-PARTICLE MICROSCOPY

ELECTRON MICROSCOPE

ELECTRON MICROSCOPE, AND METHOD FOR ADJUSTNG OPTICAL AXIS OF ELECTR...