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G01J2009/0288
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2009/0288
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Patents Grants
last 30 patents
Information
Patent Grant
Optical sensor module including an interferometric sensor and exten...
Patent number
12,209,890
Issue date
Jan 28, 2025
Apple Inc.
Tong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Refractive scanning interferometer
Patent number
11,668,603
Issue date
Jun 6, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel optical phase detector, multi-channel sensing system...
Patent number
11,469,848
Issue date
Oct 11, 2022
Korea Advanced Institute of Science and Technology
Jungwon Kim
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Laser detection system
Patent number
11,169,030
Issue date
Nov 9, 2021
Aston University
David Benton
G01 - MEASURING TESTING
Information
Patent Grant
Compact wavelength meter and laser output measurement device
Patent number
10,578,494
Issue date
Mar 3, 2020
Lockheed Martin Coherent Technologies, Inc.
Bruce Gregory Tiemann
G01 - MEASURING TESTING
Information
Patent Grant
Optical pulse-generator and optical pulse-generating method
Patent number
9,570,879
Issue date
Feb 14, 2017
Sumitomo Osaka Cement Co., Ltd.
Tokutaka Hara
G02 - OPTICS
Information
Patent Grant
Mach-Zehnder interferometer having a doubly-corrugated spoofed surf...
Patent number
9,557,223
Issue date
Jan 31, 2017
The Regents of the University of Michigan
Pinaki Mazumder
G02 - OPTICS
Information
Patent Grant
Polarization beam splitter and optical device
Patent number
9,459,406
Issue date
Oct 4, 2016
NEC Corporation
Takashi Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Apolarized interferometric system, and apolarized interferometric m...
Patent number
8,953,169
Issue date
Feb 10, 2015
IXBLUE
Herve Lefevre
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic radiation detector utilizing an electromagnetic rad...
Patent number
5,349,437
Issue date
Sep 20, 1994
The United States of America as represented by the Secretary of the Navy
Lloyd C. Bobb
G01 - MEASURING TESTING
Information
Patent Grant
Passive quadrature phase detection system for coherent fiber optic...
Patent number
5,200,795
Issue date
Apr 6, 1993
The Board of Trustees of the Leland Stanford Junior University
Byoung Y. Kim
G02 - OPTICS
Information
Patent Grant
Coded-fringe interferometric method and device for wavefront detect...
Patent number
5,192,982
Issue date
Mar 9, 1993
Office Galileo S.p.A.
Antonio Lapucci
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber sensor for measuring physical properties of fluids
Patent number
5,115,127
Issue date
May 19, 1992
The United States of America as represented by the Secretary of the Navy
Lloyd C. Bobb
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring the duration of single optical radiation pu...
Patent number
5,068,525
Issue date
Nov 26, 1991
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften E.V.
Fritz P. Schaefer
G01 - MEASURING TESTING
Information
Patent Grant
Optical fiber sensor for measuring physical properties of liquids
Patent number
5,047,626
Issue date
Sep 10, 1991
The United States of America as represented by the Secretary of the Navy
Lloyd C. Bobb
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength-independent interferometer for optical signal processing
Patent number
4,991,963
Issue date
Feb 12, 1991
The Secretary of State for Defence in Her Britannic Majesty's Government of t...
Philip Sutton
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PHOTONIC WAVEGUIDE POWER AND PHASE MONITOR
Publication number
20240385243
Publication date
Nov 21, 2024
IMEC vzw
Wim BOGAERTS
G01 - MEASURING TESTING
Information
Patent Application
Integrated High-Extinction Ratio Unbalanced Mach Zehnder Interferom...
Publication number
20240344891
Publication date
Oct 17, 2024
The Regents of the University of California
Kaikai Liu
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR EXPANDING THE DYNAMIC RANGE OF MACH-ZEHNDER S...
Publication number
20240019310
Publication date
Jan 18, 2024
Shanghai Haina Data Technology Company Ltd.
Rui YIN
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE SCANNING INTERFEROMETER
Publication number
20230375409
Publication date
Nov 23, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Application
Optical Sensor Module Including an Interferometric Sensor and Exten...
Publication number
20230314185
Publication date
Oct 5, 2023
Apple Inc.
Tong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Entanglement-Enhanced Interferometers
Publication number
20220373397
Publication date
Nov 24, 2022
The Regents of the University of Colorado, a Body Corporate
Juliet T. Gopinath
G02 - OPTICS
Information
Patent Application
REFRACTIVE SCANNING INTERFEROMETER
Publication number
20210293624
Publication date
Sep 23, 2021
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Application
LASER DETECTION SYSTEM
Publication number
20200278258
Publication date
Sep 3, 2020
ASTON UNIVERSITY
David Benton
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CHANNEL OPTICAL PHASE DETECTOR, MULTI-CHANNEL SENSING SYSTEM...
Publication number
20200266913
Publication date
Aug 20, 2020
Korea Advanced Institute of Science and Technology
Jungwon KIM
G01 - MEASURING TESTING
Information
Patent Application
POLARIZATION BEAM SPLITTER AND OPTICAL DEVICE
Publication number
20150378098
Publication date
Dec 31, 2015
NEC Corporation
Takashi MATSUMOTO
G02 - OPTICS
Information
Patent Application
APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC M...
Publication number
20130222810
Publication date
Aug 29, 2013
Herve Lefevre
G01 - MEASURING TESTING