Magnetic deflection

Industry

CPC
H01J49/20

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/20Magnetic deflection

Industries

Patents Grantslast 30 patents

Information Patent Grant
Locating mining sites using an open mass spectrometer
- Patent number 12,100,580
- Issue date Sep 24, 2024
- LUNAR HELIUM-3 MINING, LLC
- Chris Salvino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-power mass interrogation system and assay for determining Vitam...
- Patent number 11,967,495
- Issue date Apr 23, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection systems
- Patent number 11,587,776
- Issue date Feb 21, 2023
- EL-MUL TECHNOLOGIES LTD.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining energy spectrum of X-ray device
- Patent number 11,437,225
- Issue date Sep 6, 2022
- Shanghai United Imaging Healthcare Co., Ltd.
- Peng Cheng
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Low-power mass interrogation system and assay for determining vitam...
- Patent number 11,227,754
- Issue date Jan 18, 2022
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source with mixed magnets
- Patent number 10,886,118
- Issue date Jan 5, 2021
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
- Patent number 10,804,087
- Issue date Oct 13, 2020
- Takashi Hosaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Floating magnet for a mass spectrometer
- Patent number 10,580,635
- Issue date Mar 3, 2020
- Luxembourg Institute of Science and Technology (LIST)
- Roch Andrzejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source with mixed magnets
- Patent number 10,490,396
- Issue date Nov 26, 2019
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, methods, and structures for compound-specific coding mass...
- Patent number 10,410,850
- Issue date Sep 10, 2019
- Duke University
- Michael E. Gehm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzer
- Patent number 10,366,871
- Issue date Jul 30, 2019
- ATONARP INC.
- Prakash Sreedhar Murthy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-compact mass analysis device and ultra-compact particle accel...
- Patent number 10,249,483
- Issue date Apr 2, 2019
- Takashi Hosaka
- G01 - MEASURING TESTING
Information Patent Grant
Ion implantation system having beam angle control in drift and dece...
- Patent number 10,037,877
- Issue date Jul 31, 2018
- Axcelis Technologies, Inc.
- Bo H. Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight analysis of a continuous beam of ions by a detector...
- Patent number 9,978,576
- Issue date May 22, 2018
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight analysis of a continuous beam of ions by a detector...
- Patent number 9,812,313
- Issue date Nov 7, 2017
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzing electromagnet and ion beam irradiation apparatus
- Patent number 9,728,390
- Issue date Aug 8, 2017
- Nissin ION Equipment Co., Ltd.
- Junichi Tatemichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with improved magnetic sector
- Patent number 9,564,306
- Issue date Feb 7, 2017
- Luxembourg Institute of Science and Technology (LIST)
- Hung Quang Hoang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with optimized magnetic shunt
- Patent number 9,401,268
- Issue date Jul 26, 2016
- Luxembourg Institute of Science and Technology (LIST)
- Hung Quang Hoang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap
- Patent number 8,975,581
- Issue date Mar 10, 2015
- The University of Sussex
- Jose Luis Verdu Galiana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer apparatus and systems operative for focusing ribbon i...
- Patent number 8,921,802
- Issue date Dec 30, 2014
- Nicholas R. White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap
- Patent number 8,362,423
- Issue date Jan 29, 2013
- The University of Sussex
- Jose Luis Verdu Galiana
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron cooling system and method for increasing the phase space i...
- Patent number 8,063,390
- Issue date Nov 22, 2011
- Delbert J. Larson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Toroidal charged particle deflector with high mechanical stability...
- Patent number 6,153,885
- Issue date Nov 28, 2000
- Nikon Corporation
- Rodney Arthur Kendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carrier gas separator for mass spectroscopy
- Patent number 6,043,488
- Issue date Mar 28, 2000
- The Perkin-Elmer Corporation
- Dar Bahatt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Noise reduction in negative-ion quadrupole mass spectrometry
- Patent number 5,204,530
- Issue date Apr 20, 1993
- Philippe Chastagner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical systems having therein means for correctin...
- Patent number 4,823,003
- Issue date Apr 18, 1989
- George C. King
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of steering and focusing ion and electron beams
- Patent number 4,694,457
- Issue date Sep 15, 1987
- Unisearch Limited
- John C. Kelly
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Ion and electron beam steering and focussing system
- Patent number 4,672,615
- Issue date Jun 9, 1987
- Unisearch Limited
- John C. Kelly
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Coaxial miniature magnetic spectrometer
- Patent number 4,514,628
- Issue date Apr 30, 1985
- Commissariat a l'Energie Atomique
- Joel Frehaut
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for the achromatic magnetic deflection of a beam of charged...
- Patent number 4,322,622
- Issue date Mar 30, 1982
- CGR-MeV
- Dominique Tronc
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
Improved Low-Power Mass Interrogation System and Assay For Determin...
- Publication number 20240347330
- Publication date Oct 17, 2024
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC SECTOR WITH A SHUNT FOR A MASS SPECTROMETER
- Publication number 20240014026
- Publication date Jan 11, 2024
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Hung Quang Hoang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20230245878
- Publication date Aug 3, 2023
- SHIMADZU CORPORATION
- Masaru NISHIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low-Power Mass Interrogation System and Assay For Determining Vitam...
- Publication number 20220093376
- Publication date Mar 24, 2022
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS APPARATUS HAVING IMPROVED INPUT OPTICS AND COMPONEN...
- Publication number 20210151304
- Publication date May 20, 2021
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING ENERGY SPECTRUM OF X-RAY DEVICE
- Publication number 20200176237
- Publication date Jun 4, 2020
- Shanghai United Imaging Healthcare Co., Ltd.
- Peng CHENG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Low-Power Mass Interrogation System and Assay For Determining Vitam...
- Publication number 20190333747
- Publication date Oct 31, 2019
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...
- Publication number 20190198306
- Publication date Jun 27, 2019
- Takashi HOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, METHODS, AND STRUCTURES FOR COMPOUND-SPECIFIC CODING MASS...
- Publication number 20190122877
- Publication date Apr 25, 2019
- DUKE UNIVERSITY
- Michael E. Gehm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Floating Magnet For A Mass Spectrometer
- Publication number 20190057853
- Publication date Feb 21, 2019
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Roch Andrzejewski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...
- Publication number 20180025898
- Publication date Jan 25, 2018
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...
- Publication number 20170330739
- Publication date Nov 16, 2017
- Takashi HOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low Power Mass Analyzer and System Integrating Same For Chemical An...
- Publication number 20170271138
- Publication date Sep 21, 2017
- Leidos, Inc.
- Noah Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Using Hand-Modes to Charge or Energize Materials
- Publication number 20170200542
- Publication date Jul 13, 2017
- Seth J. Hornack
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...
- Publication number 20160336161
- Publication date Nov 17, 2016
- DH Technologies Development Pte. Ltd.
- Robert Alois Grothe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjustment Mechanism
- Publication number 20160172090
- Publication date Jun 16, 2016
- Thermo Fisher Scientific (Bremen) GmbH
- Silke SEEDORF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYZING ELECTROMAGNET AND ION BEAM IRRADIATION APPARATUS
- Publication number 20160126082
- Publication date May 5, 2016
- NISSIN ION EQUIPMENT CO., LTD.
- Junichi TATEMICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA CLEANING FOR MASS SPECTROMETERS
- Publication number 20160035550
- Publication date Feb 4, 2016
- Agilent Technologies, Inc.
- Gershon Perelman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer With Improved Magnetic Sector
- Publication number 20150357175
- Publication date Dec 10, 2015
- Luxembourg Institute of Science and Technology (LIST)
- Hung Quang Hoang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer With Optimized Magnetic Shunt
- Publication number 20150348770
- Publication date Dec 3, 2015
- Hung Quang Hoang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP
- Publication number 20140332680
- Publication date Nov 13, 2014
- Jose Luis Verdu Galiana
- B82 - NANO-TECHNOLOGY
Information Patent Application
Mass analyzer apparatus and systems operative for focusing ribbon i...
- Publication number 20120235053
- Publication date Sep 20, 2012
- Nicholas R. White
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Cooling System and Method for Increasing the Phase Space I...
- Publication number 20110215236
- Publication date Sep 8, 2011
- Delbert J. Larson
- H01 - BASIC ELECTRIC ELEMENTS

Magnetic deflection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Locating mining sites using an open mass spectrometer

Low-power mass interrogation system and assay for determining Vitam...

Ion detection systems

Method and system for determining energy spectrum of X-ray device

Low-power mass interrogation system and assay for determining vitam...

Ion source with mixed magnets

Ultra-compact mass analysis device and ultra-compact particle accel...

Floating magnet for a mass spectrometer

Ion source with mixed magnets

Systems, methods, and structures for compound-specific coding mass...

Analyzer

Ultra-compact mass analysis device and ultra-compact particle accel...

Ion implantation system having beam angle control in drift and dece...

Time-of-flight analysis of a continuous beam of ions by a detector...

Time-of-flight analysis of a continuous beam of ions by a detector...

Mass analyzing electromagnet and ion beam irradiation apparatus

Mass spectrometer with improved magnetic sector

Mass spectrometer with optimized magnetic shunt

Ion trap

Mass analyzer apparatus and systems operative for focusing ribbon i...

Ion trap

Electron cooling system and method for increasing the phase space i...

Toroidal charged particle deflector with high mechanical stability...

Carrier gas separator for mass spectroscopy

Noise reduction in negative-ion quadrupole mass spectrometry

Charged particle optical systems having therein means for correctin...

Methods of steering and focusing ion and electron beams

Ion and electron beam steering and focussing system

Coaxial miniature magnetic spectrometer

Device for the achromatic magnetic deflection of a beam of charged...

Patents Applicationslast 30 patents

Improved Low-Power Mass Interrogation System and Assay For Determin...

MAGNETIC SECTOR WITH A SHUNT FOR A MASS SPECTROMETER

MASS SPECTROMETER

Low-Power Mass Interrogation System and Assay For Determining Vitam...

SAMPLE ANALYSIS APPARATUS HAVING IMPROVED INPUT OPTICS AND COMPONEN...

METHOD AND SYSTEM FOR DETERMINING ENERGY SPECTRUM OF X-RAY DEVICE

Low-Power Mass Interrogation System and Assay For Determining Vitam...

ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...

SYSTEMS, METHODS, AND STRUCTURES FOR COMPOUND-SPECIFIC CODING MASS...

Floating Magnet For A Mass Spectrometer

Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...

ULTRA-COMPACT MASS ANALYSIS DEVICE AND ULTRA-COMPACT PARTICLE ACCEL...

Low Power Mass Analyzer and System Integrating Same For Chemical An...

Method of Using Hand-Modes to Charge or Energize Materials

Time-of-Flight Analysis of a Continuous Beam of Ions by a Detector...

Adjustment Mechanism

MASS ANALYZING ELECTROMAGNET AND ION BEAM IRRADIATION APPARATUS

PLASMA CLEANING FOR MASS SPECTROMETERS

Mass Spectrometer With Improved Magnetic Sector

Mass Spectrometer With Optimized Magnetic Shunt

ION TRAP

Mass analyzer apparatus and systems operative for focusing ribbon i...

Electron Cooling System and Method for Increasing the Phase Space I...