magnetic

Industry

CPC
H01J37/1475

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/1475magnetic

Industries

Patents Grantslast 30 patents

Information Patent Grant
Dual source injector with switchable analyzing magnet
- Patent number 12,112,918
- Issue date Oct 8, 2024
- Axcelis Technologies, Inc.
- Wilhelm Platow
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Beam deflection device, aberration corrector, monochromator, and ch...
- Patent number 12,062,519
- Issue date Aug 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,967,482
- Issue date Apr 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual source injector with switchable analyzing magnet
- Patent number 11,823,858
- Issue date Nov 21, 2023
- Axcelis Technologies, Inc.
- Wilhelm Platow
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Wien filter and charged particle beam imaging apparatus
- Patent number 11,756,761
- Issue date Sep 12, 2023
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Supported X-ray horn for controlling e-beams
- Patent number 11,717,584
- Issue date Aug 8, 2023
- Fermi Research Alliance, LLC
- Thomas Kroc
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Examining, analyzing and/or processing an object using an object re...
- Patent number 11,721,518
- Issue date Aug 8, 2023
- Carl Zeiss Microscopy GmbH
- Andreas Schertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation method and ion implanter for performing the same
- Patent number 11,482,401
- Issue date Oct 25, 2022
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Chaorong Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of charged-particle beam such as electron microscope comp...
- Patent number 11,295,927
- Issue date Apr 5, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wien filter and charged particle beam imaging apparatus
- Patent number 11,239,044
- Issue date Feb 1, 2022
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang Meng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and electrostatic lens
- Patent number 11,201,033
- Issue date Dec 14, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuta Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam application apparatus
- Patent number 11,177,108
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle scanners
- Patent number 11,152,190
- Issue date Oct 19, 2021
- Decision Sciences International Corporation
- Robert D. Penny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam vaporizer and method for vaporizing a vaporization ma...
- Patent number 11,133,154
- Issue date Sep 28, 2021
- VON ARDENNE Asset GmbH & Co. KG
- Carsten Deus
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Scanning electron microscope with objective lens below sample stage
- Patent number 11,127,564
- Issue date Sep 21, 2021
- KKT HOLDINGS SYNDICATE
- Tzu-Yi Kuo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning magnet design with enhanced efficiency
- Patent number 11,114,270
- Issue date Sep 7, 2021
- Axcelis Technologies, Inc.
- Bo Vanderberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging apparatus and related control unit
- Patent number 11,062,875
- Issue date Jul 13, 2021
- City University of Hong Kong
- Fu-Rong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scan and corrector magnet designs for high throughput scanned beam...
- Patent number 11,037,754
- Issue date Jun 15, 2021
- Axcelis Technologies, Inc.
- Edward Eisner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, and observation method and elemental...
- Patent number 11,031,211
- Issue date Jun 8, 2021
- HITACHI HIGH-TECH CORPORATION
- Naoto Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 10,971,332
- Issue date Apr 6, 2021
- Canon Anelva Corporation
- Hiroshi Yakushiji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control method for multi-phase winding deflection scanning device
- Patent number 10,950,411
- Issue date Mar 16, 2021
- Xiaodong Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and optical-axis adjusting method thereof
- Patent number 10,910,194
- Issue date Feb 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Shuhei Yabu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam axial alignment device, charged particle beam...
- Patent number 10,903,038
- Issue date Jan 26, 2021
- Shimadzu Corporation
- Takehiro Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam image acquisition apparatus, and alignment m...
- Patent number 10,896,801
- Issue date Jan 19, 2021
- NuFlare Technology, Inc.
- Kazuhiko Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam steering arrangement
- Patent number 10,854,422
- Issue date Dec 1, 2020
- RELIANCE PRECISION LIMITED
- Nigel Crosland
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Charged particle beam control device
- Patent number 10,847,344
- Issue date Nov 24, 2020
- HITACHI HIGH-TECH CORPORATION
- Shinichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,818,470
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deflection scanning device with multi-phase winding and deflection...
- Patent number 10,804,070
- Issue date Oct 13, 2020
- Xiaodong Huang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Low voltage scanning electron microscope and method for specimen ob...
- Patent number 10,777,382
- Issue date Sep 15, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reflection-mode electron-beam inspection using ptychographic imaging
- Patent number 10,755,892
- Issue date Aug 25, 2020
- KLA-Tencor Corporation
- Weijie Huang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMPACT 2D SCANNER MAGNET WITH TRAPEZOIDAL COILS
- Publication number 20240395495
- Publication date Nov 28, 2024
- UChicago Argonne, LLC
- Brahim Mustapha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC MULTIPOLE DEVICE, CHARGED PARTICLE BEAM APPARATUS, AND MET...
- Publication number 20240087837
- Publication date Mar 14, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL SOURCE INJECTOR WITH SWITCHABLE ANALYZING MAGNET
- Publication number 20240029998
- Publication date Jan 25, 2024
- Axcelis Technologies, Inc.
- Wilhelm Platow
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20240014002
- Publication date Jan 11, 2024
- HITACHI HIGH-TECH CORPORATION
- Takayasu IWATSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System and Control Method Therefor
- Publication number 20230343550
- Publication date Oct 26, 2023
- JEOL Ltd.
- Takamitsu Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROMAGNETIC LENS AND ELECTRON SOURCE MECHANISM
- Publication number 20230335368
- Publication date Oct 19, 2023
- NuFlare Technology, Inc.
- Munehiro OGASAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...
- Publication number 20230326707
- Publication date Oct 12, 2023
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL SOURCE INJECTOR WITH SWITCHABLE ANALYZING MAGNET
- Publication number 20230307210
- Publication date Sep 28, 2023
- Axcelis Technologies, Inc.
- Wilhelm Platow
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ION IMPLANTER AND ION IMPLANTATION METHOD
- Publication number 20230260741
- Publication date Aug 17, 2023
- Sumitomo Heavy Industries Ion Technology Co., Ltd.
- Tetsuya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUC...
- Publication number 20230260744
- Publication date Aug 17, 2023
- CARL ZEISS MICROSCOPY GMBH
- Heiko Stegmann
- G01 - MEASURING TESTING
Information Patent Application
Compact 2D Scanner Magnet with Double-Helix Coils
- Publication number 20230238206
- Publication date Jul 27, 2023
- UChicago Argonne, LLC
- Brahim Mustapha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A DETECTOR SUBSTRATE FOR USE IN A CHARGED PARTICLE MULTI-BEAM ASSES...
- Publication number 20230238211
- Publication date Jul 27, 2023
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR CONTROLLING CHARGED PA...
- Publication number 20230113759
- Publication date Apr 13, 2023
- Hitachi High-Tech Corporation
- Shingo HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20220392735
- Publication date Dec 8, 2022
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CATHODOLUMINESCENCE ELECTRON MICROSCOPE
- Publication number 20220216028
- Publication date Jul 7, 2022
- ATTOLIGHT AG
- BERNEY Jean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUPPORTED X-RAY HORN FOR CONTROLLING E-BEAMS
- Publication number 20220175981
- Publication date Jun 9, 2022
- FERMI RESEARCH ALLIANCE, LLC
- Thomas Kroc
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam Deflection Device, Aberration Corrector, Monochromator, and Ch...
- Publication number 20220172920
- Publication date Jun 2, 2022
- Hitachi High-Tech Corporation
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS
- Publication number 20220157556
- Publication date May 19, 2022
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang MENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...
- Publication number 20220108865
- Publication date Apr 7, 2022
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM FOR AZIMUTHAL DEFLECTION OF INDIVIDUAL PARTICL...
- Publication number 20220102104
- Publication date Mar 31, 2022
- Carl Zeiss MultiSEM GmbH
- Hans Fritz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220102105
- Publication date Mar 31, 2022
- Hitachi High-Tech Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE FIELD-OF-VIEW CHARGED PARTICLE FILTER
- Publication number 20210310348
- Publication date Oct 7, 2021
- Thermo Electron Scientific Instruments LLC
- Justin Morrow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...
- Publication number 20210241992
- Publication date Aug 5, 2021
- CARL ZEISS MICROSCOPY GMBH
- Andreas Schertel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20210233737
- Publication date Jul 29, 2021
- Hitachi High-Tech Corporation
- Yu YAMAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING SAME
- Publication number 20210217577
- Publication date Jul 15, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING APPARATUS AND RELATED CONTROL UNIT
- Publication number 20210110990
- Publication date Apr 15, 2021
- City University of Hong Kong
- Fu-Rong Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS
- Publication number 20210066022
- Publication date Mar 4, 2021
- Zhongke Jingyuan Electron Limited, Beijing (CN)
- Qinglang MENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPLICATION APPARATUS
- Publication number 20210005417
- Publication date Jan 7, 2021
- Hitachi High-Tech Corporation
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IMPLANTATION METHOD AND ION IMPLANTER FOR PERFORMING THE SAME
- Publication number 20200388465
- Publication date Dec 10, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Chaorong Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SCANNERS
- Publication number 20200335299
- Publication date Oct 22, 2020
- DECISION SCIENCES INTERNATIONAL CORPORATION
- Robert D. Penny
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dual source injector with switchable analyzing magnet

Beam deflection device, aberration corrector, monochromator, and ch...

Charged particle beam device

Dual source injector with switchable analyzing magnet

Wien filter and charged particle beam imaging apparatus

Supported X-ray horn for controlling e-beams

Examining, analyzing and/or processing an object using an object re...

Ion implantation method and ion implanter for performing the same

Apparatus of charged-particle beam such as electron microscope comp...

Wien filter and charged particle beam imaging apparatus

Charged particle beam device and electrostatic lens

Charged particle beam application apparatus

Charged particle scanners

Electron beam vaporizer and method for vaporizing a vaporization ma...

Scanning electron microscope with objective lens below sample stage

Scanning magnet design with enhanced efficiency

Imaging apparatus and related control unit

Scan and corrector magnet designs for high throughput scanned beam...

Charged particle beam device, and observation method and elemental...

Plasma processing apparatus and plasma processing method

Control method for multi-phase winding deflection scanning device

Charged particle beam device and optical-axis adjusting method thereof

Charged particle beam axial alignment device, charged particle beam...

Multiple electron beam image acquisition apparatus, and alignment m...

Charged particle beam steering arrangement

Charged particle beam control device

Charged particle beam device

Deflection scanning device with multi-phase winding and deflection...

Low voltage scanning electron microscope and method for specimen ob...

Reflection-mode electron-beam inspection using ptychographic imaging

Patents Applicationslast 30 patents

COMPACT 2D SCANNER MAGNET WITH TRAPEZOIDAL COILS

MAGNETIC MULTIPOLE DEVICE, CHARGED PARTICLE BEAM APPARATUS, AND MET...

DUAL SOURCE INJECTOR WITH SWITCHABLE ANALYZING MAGNET

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam System and Control Method Therefor

ELECTROMAGNETIC LENS AND ELECTRON SOURCE MECHANISM

EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...

DUAL SOURCE INJECTOR WITH SWITCHABLE ANALYZING MAGNET

ION IMPLANTER AND ION IMPLANTATION METHOD

METHOD FOR PRODUCING A SAMPLE ON AN OBJECT, COMPUTER PROGRAM PRODUC...

Compact 2D Scanner Magnet with Double-Helix Coils

A DETECTOR SUBSTRATE FOR USE IN A CHARGED PARTICLE MULTI-BEAM ASSES...

CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR CONTROLLING CHARGED PA...

METHOD FOR INSPECTING A SPECIMEN AND CHARGED PARTICLE BEAM DEVICE

CATHODOLUMINESCENCE ELECTRON MICROSCOPE

SUPPORTED X-RAY HORN FOR CONTROLLING E-BEAMS

Beam Deflection Device, Aberration Corrector, Monochromator, and Ch...

WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS

APPARATUS OF CHARGED-PARTICLE BEAM SUCH AS ELECTRON MICROSCOPE COMP...

PARTICLE BEAM SYSTEM FOR AZIMUTHAL DEFLECTION OF INDIVIDUAL PARTICL...

CHARGED PARTICLE BEAM DEVICE

WIDE FIELD-OF-VIEW CHARGED PARTICLE FILTER

EXAMINING, ANALYZING AND/OR PROCESSING AN OBJECT USING AN OBJECT RE...

Electron Beam Apparatus

MULTI-BEAM PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING SAME

IMAGING APPARATUS AND RELATED CONTROL UNIT

WIEN FILTER AND CHARGED PARTICLE BEAM IMAGING APPARATUS

CHARGED PARTICLE BEAM APPLICATION APPARATUS

ION IMPLANTATION METHOD AND ION IMPLANTER FOR PERFORMING THE SAME

CHARGED PARTICLE SCANNERS