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G01R33/0052
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PHYSICS
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Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R33/00
Arrangements or instruments for measuring magnetic variables
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G01R33/0052
Manufacturing aspects; Manufacturing of single devices
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetoresistive sensor element having a wide linear response and r...
Patent number
12,204,005
Issue date
Jan 21, 2025
ALLEGRO MICROSYSTEMS, LLC
Jeffrey Childress
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of designing and manufacturing magnetic sensor
Patent number
12,158,510
Issue date
Dec 3, 2024
TDK Corporation
Tsuyoshi Umehara
G01 - MEASURING TESTING
Information
Patent Grant
Programmable magnetic tunnel junction
Patent number
12,156,476
Issue date
Nov 26, 2024
GLOBALFOUNDRIES Singapore Pte. Ltd.
Ping Zheng
G11 - INFORMATION STORAGE
Information
Patent Grant
NV center-based microwave-free galvanically isolated magnetometer
Patent number
12,092,709
Issue date
Sep 17, 2024
Elmos Semiconductor SE
Bernd Burchard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of making graphene structures and devices
Patent number
12,084,758
Issue date
Sep 10, 2024
Paragraf Limited
Hugh Glass
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Device, in particular machine, for producing a Wiegand wire from a...
Patent number
12,076,777
Issue date
Sep 3, 2024
Sew-Eurodrive GmbH & Co. KG
Olaf Simon
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor structure and fabrication method thereof
Patent number
12,075,705
Issue date
Aug 27, 2024
Semiconductor Manufacturing International (Shanghai) Corporation
Wen Bin Xia
G11 - INFORMATION STORAGE
Information
Patent Grant
Thin film anisotropic magnetoresistor device and formation
Patent number
12,069,956
Issue date
Aug 20, 2024
Texas Instruments Incorporated
Fuchao Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit package with magnet having a channel
Patent number
11,961,920
Issue date
Apr 16, 2024
ALLEGRO MICROSYSTEMS, LLC
Ravi Vig
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for measuring second order and higher gradients
Patent number
11,933,864
Issue date
Mar 19, 2024
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
Controlling electric fields in vapor cells having a body defined by...
Patent number
11,899,051
Issue date
Feb 13, 2024
Quantum Valley Ideas Laboratories
Rajesh Pandiyan
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Magnetic resonance antenna with wire structure embedded in foam
Patent number
11,892,531
Issue date
Feb 6, 2024
Siemens Healthcare GmbH
Stephan Zink
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Magnetoresistive sensor and fabrication method for a magnetoresisti...
Patent number
11,892,526
Issue date
Feb 6, 2024
Infineon Technologies AG
Bernhard Endres
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Controlling electric fields in vapor cells
Patent number
11,885,842
Issue date
Jan 30, 2024
Quantum Valley Ideas Laboratories
Rajesh Pandiyan
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor apparatus
Patent number
11,879,951
Issue date
Jan 23, 2024
Infineon Technologies AG
Mario Motz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single point gradiometer
Patent number
11,874,343
Issue date
Jan 16, 2024
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
Laser bonded glass-silicon vapor cell
Patent number
11,867,776
Issue date
Jan 9, 2024
FieldLine Industries Inc.
Kenneth J. Hughes
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Systems, devices, and methods for resistance metrology using graphe...
Patent number
11,867,775
Issue date
Jan 9, 2024
Government of the United States of America
Randolph Elmquist
G01 - MEASURING TESTING
Information
Patent Grant
Wireless flexible magnetic sensor based on magnetothermal effect, a...
Patent number
11,846,686
Issue date
Dec 19, 2023
Xi'an Jiaotong University
Shejuan Xie
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive magnetic field sensor bridge with compensated cros...
Patent number
11,835,601
Issue date
Dec 5, 2023
Robert Bosch GmbH
Brad Engel
G01 - MEASURING TESTING
Information
Patent Grant
Magnonic magneto-resistance device including two-dimensional spacer...
Patent number
11,808,828
Issue date
Nov 7, 2023
Institute of Physics, Chinese Academy of Sciences
Xiufeng Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic field sensor with flux guide reset
Patent number
11,800,810
Issue date
Oct 24, 2023
Robert Bosch GmbH
Phillip Mather
G01 - MEASURING TESTING
Information
Patent Grant
Hall sensor with dielectric isolation and p-n junction isolation
Patent number
11,782,102
Issue date
Oct 10, 2023
Texas Instruments Incorporated
Keith Ryan Green
G01 - MEASURING TESTING
Information
Patent Grant
Rf shielding conduit in an mri closure assembly
Patent number
11,774,532
Issue date
Oct 3, 2023
Aspect Imaging Ltd.
Shmuel Azulay
G01 - MEASURING TESTING
Information
Patent Grant
Method for forming a sensor circuit
Patent number
11,768,086
Issue date
Sep 26, 2023
Infineon Technologies AG
Franz Jost
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,733,319
Issue date
Aug 22, 2023
Showa Denko K.K.
Sho Tonegawa
G01 - MEASURING TESTING
Information
Patent Grant
Method for manufacturing an integrated magnetoresistive sensor
Patent number
11,737,369
Issue date
Aug 22, 2023
STMicroelectronics S.r.l.
Dario Paci
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Jig for assembling a position sensor
Patent number
11,707,341
Issue date
Jul 25, 2023
BIOSENSE WEBSTER (ISRAEL) LTD.
Yehuda Algawi
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
System and method for measuring second order and higher gradients
Patent number
11,693,065
Issue date
Jul 4, 2023
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
Methods of manufacturing a magnetic field sensor
Patent number
11,678,584
Issue date
Jun 13, 2023
EVERSPIN TECHNOLOGIES, INC.
Renu Whig
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD OF SENSING CATHETER'S LOCATION AND FORCE
Publication number
20250057438
Publication date
Feb 20, 2025
BIOSENSE WEBSTER (ISRAEL) LTD.
Nathanel Yehuda David Hayat
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE FORMED OF DIAMOND MATERIAL
Publication number
20250052839
Publication date
Feb 13, 2025
ELEMENT SIX TECHNOLOGIES LIMITED
Pierre-Olivier François Marc COLARD
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PRODUCING AN xMR MAGNETIC FIELD SENSOR
Publication number
20250035717
Publication date
Jan 30, 2025
3D-Micromac AG
Alexander Böhm
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MAGNETIC MULTILAYERED STACK BASED ADFMR SENSORS WITH ENHANCED SENSI...
Publication number
20250020741
Publication date
Jan 16, 2025
Sonera, Inc.
Kumar SRINIVASAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR FABRICATING A 2-D-MATERIAL-BASED QUANTUM SE...
Publication number
20240402263
Publication date
Dec 5, 2024
Toyota Motor Engineering & Manufacturing North America, Inc.
Biswajit Sahoo
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR A 2D-MATERIAL-BASED QUANTUM SENSOR CHIP WIT...
Publication number
20240402270
Publication date
Dec 5, 2024
Toyota Motor Engineering & Manufacturing North America, Inc.
Biswajit Sahoo
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR A 2D-MATERIAL-BASED QUANTUM SENSOR CHIP WIT...
Publication number
20240402264
Publication date
Dec 5, 2024
Toyota Motor Engineering & Manufacturing North America, Inc.
Biswajit Sahoo
G01 - MEASURING TESTING
Information
Patent Application
Thin Film Anisotropic Magnetoresistor Device and Formation
Publication number
20240407268
Publication date
Dec 5, 2024
TEXAS INSTRUMENTS INCORPORATED
Fuchao Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NV CENTER BASED MICROWAVE FREE AND GALVANICALLY ISOLATED MAGNETOMETER
Publication number
20240402271
Publication date
Dec 5, 2024
Elmos Semiconductor SE
Bernd Burchard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TRIAXIAL MAGNETIC SENSOR AND MANUFACTURING PROCESS THEREFOR
Publication number
20240393412
Publication date
Nov 28, 2024
QST CORPORATION LIMITED
Huifang GUO
G01 - MEASURING TESTING
Information
Patent Application
SHIM COILS FOR A COMPACT MRI GRADIENT SYSTEM BASED ON MULTILAYER FL...
Publication number
20240319303
Publication date
Sep 26, 2024
Bruker France S.A.S.
Lukas HÄNICHEN
G01 - MEASURING TESTING
Information
Patent Application
SPIN ORBIT TORQUE BASED THERMAL SENSOR FOR INSITU MONITORING OF MAG...
Publication number
20240310459
Publication date
Sep 19, 2024
Western Digital Technologies, Inc.
Quang LE
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Sensor Device, Method of Manufacturing the Sensor Device,...
Publication number
20240247932
Publication date
Jul 25, 2024
TDK Corporation
Shinichirou Mochizuki
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING MAGNETORESISTANCE ELEMENT USING LASER PINNI...
Publication number
20240230792
Publication date
Jul 11, 2024
ALLEGRO MICROSYSTEMS, LLC
Samridh Jaiswal
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE WITH CIRCUIT AND INTEGRATED COMPONENT FOR MAGNETO-IMP...
Publication number
20240219487
Publication date
Jul 4, 2024
Melexis Technologies SA
Guido DUPONT
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR INTEGRATED CIRCUIT WITH INTEGRAL FERROMAGNETI...
Publication number
20240222526
Publication date
Jul 4, 2024
ALLEGRO MICROSYSTEMS, LLC
Ravi Vig
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR, POSITION DETECTOR INCLUDING THE SAME, AND METHOD O...
Publication number
20240219489
Publication date
Jul 4, 2024
Murata Manufacturing Co., Ltd.
Daisuke NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
THERMAL PACKAGE FOR AN ATOMIC DEVICE
Publication number
20240168111
Publication date
May 23, 2024
FieldLine Inc.
Svenja Knappe
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING MAGNETORESISTANCE ELEMENT USING LASER PINNI...
Publication number
20240133977
Publication date
Apr 25, 2024
ALLEGRO MICROSYSTEMS, LLC
Samridh Jaiswal
G01 - MEASURING TESTING
Information
Patent Application
LASER BONDED GLASS-SILICON VAPOR CELL
Publication number
20240111000
Publication date
Apr 4, 2024
FieldLine Inc.
Kenneth J. Hughes
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF MANUFACTURING A MAGNETIC FIELD SENSOR
Publication number
20240090335
Publication date
Mar 14, 2024
EVERSPIN TECHNOLOGIES, INC.
Renu WHIG
G01 - MEASURING TESTING
Information
Patent Application
FABRICATING AN ELECTROCONDUCTIVE CONTACT ON A TOP LAYER OF A TUNNEL...
Publication number
20240074322
Publication date
Feb 29, 2024
ALLEGRO MICROSYSTEMS, LLC
Maxim Klebanov
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE SENSOR ELEMENT HAVING A WIDE LINEAR RESPONSE AND R...
Publication number
20240019509
Publication date
Jan 18, 2024
CROCUS TECHNOLOGY SA
Jeffrey Childress
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240003990
Publication date
Jan 4, 2024
Panasonic Intellectual Property Management Co., Ltd.
Kazuhiro KANDA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR HEAD AND METHOD FOR MANUFACTURING SAME
Publication number
20240003994
Publication date
Jan 4, 2024
CITIZEN FINEDEVICE CO., LTD.
Mitsunori MIYAMOTO
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR, METHOD OF MANUFACTURING MAGNETIC SENSOR, AND SENSI...
Publication number
20240003996
Publication date
Jan 4, 2024
Resonac Corporation
Akira SAKAWAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TRANSCEIVER COIL ARRANGEMENT FOR AN MAS NMR PROBE HEAD AND METHOD F...
Publication number
20240004005
Publication date
Jan 4, 2024
Bruker Switzerland AG
Nicolas FREYTAG
G01 - MEASURING TESTING
Information
Patent Application
VAPOR CELL DETECTION SYSTEM
Publication number
20230417848
Publication date
Dec 28, 2023
Northrop Grumman Systems Corporation
August John McClenehan
G01 - MEASURING TESTING
Information
Patent Application
NV CENTER-BASED MICROWAVE-FREE GALVANICALLY ISOLATED MAGNETOMETER
Publication number
20230349989
Publication date
Nov 2, 2023
Elmos Semiconductor SE
Bernd Burchard
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Alloy of extremely low magnetic noise
Publication number
20230328942
Publication date
Oct 12, 2023
University of Iowa Research Foundation
David M Miles
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR