mapping distribution of elements

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CPC
G01N2223/402

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/402mapping distribution of elements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 11,598,206
- Issue date Mar 7, 2023
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- E21 - EARTH DRILLING MINING
Information Patent Grant
Photon counting X-ray CT apparatus
- Patent number 11,327,031
- Issue date May 10, 2022
- Canon Medical Systems Corporation
- Kenta Moriyasu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray dosage mitigation for semiconductors and material inspection...
- Patent number 11,226,297
- Issue date Jan 18, 2022
- Raytheon Company
- Mark Northrup
- G01 - MEASURING TESTING
Information Patent Grant
High speed/low dose multi-objective autonomous scanning materials i...
- Patent number 11,120,968
- Issue date Sep 14, 2021
- Northwestern University
- Karl A. Hujsak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method of processing data acquired in x-ray examinati...
- Patent number 11,016,040
- Issue date May 25, 2021
- JOB CORPORATION
- Tsutomu Yamakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating abrasion resistance and fracture resistance
- Patent number 10,794,893
- Issue date Oct 6, 2020
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscopy in a charged-particle microscope
- Patent number 10,620,142
- Issue date Apr 14, 2020
- FEI Company
- Michael James Owen
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, surface analyzer, and image processing...
- Patent number 10,593,072
- Issue date Mar 17, 2020
- Jeol Ltd.
- Naoki Katoh
- G01 - MEASURING TESTING
Information Patent Grant
Data processing apparatus and data processing method for X-ray exam...
- Patent number 10,502,698
- Issue date Dec 10, 2019
- JOB CORPORATION
- Tsutomu Yamakawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Photon counting X-ray CT apparatus
- Patent number 10,451,568
- Issue date Oct 22, 2019
- Canon Medical Systems Corporation
- Kenta Moriyasu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electron probe microanalyzer and storage medium
- Patent number 10,410,825
- Issue date Sep 10, 2019
- Shimadzu Corporation
- Hiroshi Sakamae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for treating a cancer patient based on atomic therapeutic in...
- Patent number 10,302,661
- Issue date May 28, 2019
- Atomic Oncology Pty Ltd
- George L. Gabor Miklos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray device, method, manufacturing method for structure, program,...
- Patent number 10,190,997
- Issue date Jan 29, 2019
- Nikon Corporation
- Takashi Aoki
- G05 - CONTROLLING REGULATING
Information Patent Grant
Multimodality mineralogy segmentation system and method
- Patent number 10,107,769
- Issue date Oct 23, 2018
- CARL ZEISS X-RAY MICROSCOPY INC.
- Sreenivas Naga Bhattiprolu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined handheld XRF and OES systems and methods
- Patent number 10,012,603
- Issue date Jul 3, 2018
- SciAps, Inc.
- Donald W. Sackett
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing EDS analysis
- Patent number 9,726,625
- Issue date Aug 8, 2017
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Grant
Sub-pixel analysis and display of fine grained mineral samples
- Patent number 9,714,908
- Issue date Jul 25, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatuses for measuring effective atomic number of an...
- Patent number 9,464,997
- Issue date Oct 11, 2016
- Nuctech Company Limited
- Shuwei Li
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for improving characteristic peak signals in anal...
- Patent number 9,406,496
- Issue date Aug 2, 2016
- Universitat de Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 9,250,201
- Issue date Feb 2, 2016
- Horiba, Ltd.
- Satoshi Ohashi
- G01 - MEASURING TESTING
Information Patent Grant
Clustering of multi-modal data
- Patent number 8,748,816
- Issue date Jun 10, 2014
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Grant
Dual angle radiation scanning of objects
- Patent number 8,551,785
- Issue date Oct 8, 2013
- Varian Medical Systems, Inc.
- Paul Bjorkholm
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of materials
- Patent number 8,537,968
- Issue date Sep 17, 2013
- Kromek Limited
- Ian Radley
- G01 - MEASURING TESTING
Information Patent Grant
Dual angle radiation scanning of objects
- Patent number 8,137,976
- Issue date Mar 20, 2012
- Varian Medical Systems, Inc.
- Paul Bjorkholm
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for estimating presence of a material within a...
- Patent number 7,471,768
- Issue date Dec 30, 2008
- General Electric Company
- Steven E. Curtis
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for target transmitting information about a ta...
- Patent number 7,308,077
- Issue date Dec 11, 2007
- L-3 Communications Security and Detection Systems Corporation
- Richard R Bijjani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for transmitting information about a target ob...
- Patent number 7,023,957
- Issue date Apr 4, 2006
- L-3 Communications Security and Detection Systems, Inc.
- Richard R. Bijjani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20240027377
- Publication date Jan 25, 2024
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE
- Publication number 20240003837
- Publication date Jan 4, 2024
- Bar Ilan University
- Sharon SHWARTZ
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
- Publication number 20230296540
- Publication date Sep 21, 2023
- GATAN INC.
- Johannes ÖSTERREICHER
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
- Publication number 20230258587
- Publication date Aug 17, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Simon BURGESS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING DOWNHOLE FLUID COMPOSITION UTILIZING PHOTON EMISSION
- Publication number 20230184108
- Publication date Jun 15, 2023
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- E21 - EARTH DRILLING MINING
Information Patent Application
Phase Analyzer, Sample Analyzer, and Analysis Method
- Publication number 20230137130
- Publication date May 4, 2023
- JEOL Ltd.
- Kouta Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scatter Diagram Display Device, Scatter Diagram Display Method, and...
- Publication number 20230083479
- Publication date Mar 16, 2023
- JEOL Ltd.
- Naoki Kato
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MAPPING ELEMENTAL COMPOSITION IN DYNAMIC AND...
- Publication number 20220317048
- Publication date Oct 6, 2022
- Impossible Sensing LLC
- Pablo Sobron
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DOSAGE MITIGATION FOR SEMICONDUCTORS AND MATERIAL INSPECTION...
- Publication number 20200393389
- Publication date Dec 17, 2020
- Raytheon Company
- Mark Northrup
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED/LOW DOSE MULTI-OBJECTIVE AUTONOMOUS SCANNING MATERIALS I...
- Publication number 20200321188
- Publication date Oct 8, 2020
- Northwestern University
- Karl A. HUJSAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTON COUNTING X-RAY CT APPARATUS
- Publication number 20200033273
- Publication date Jan 30, 2020
- Canon Medical Systems Corporation
- Kenta Moriyasu
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMPROVED METHOD PTYCHOGRAPHIC DETECTOR MAPPING
- Publication number 20180328867
- Publication date Nov 15, 2018
- PHASE FOCUS LIMITED
- Martin James Humphry
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING APPARATUS AND DATA PROCESSING METHOD FOR X-RAY EXAM...
- Publication number 20180209922
- Publication date Jul 26, 2018
- JOB CORPORATION
- Tsutomu YAMAKAWA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR 3D MINERAL MAPPING OF A ROCK SAMPLE
- Publication number 20140376685
- Publication date Dec 25, 2014
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Dmitry Anatolievich Koroteev
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN...
- Publication number 20140314201
- Publication date Oct 23, 2014
- Shuwei LI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...
- Publication number 20130240728
- Publication date Sep 19, 2013
- Universitat De Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BE...
- Publication number 20130054153
- Publication date Feb 28, 2013
- TESCAN, a.s.
- David MOTL
- G01 - MEASURING TESTING
Information Patent Application
CLUSTERING OF MULTI-MODAL DATA
- Publication number 20130015351
- Publication date Jan 17, 2013
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Application
DUAL ANGLE RADIATION SCANNING OF OBJECTS
- Publication number 20120177175
- Publication date Jul 12, 2012
- Paul Bjorkholm
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Inspection of Materials
- Publication number 20110116605
- Publication date May 19, 2011
- DURHAM SCIENTIFIC CRYSTALS LIMITED
- Ian Radley
- G01 - MEASURING TESTING
Information Patent Application
Computed Tomography Systems and Related Methods Involving Localized...
- Publication number 20090274264
- Publication date Nov 5, 2009
- United Technologies Corp.
- Edwin L. Strickland, III
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Dual angle radiation scanning of objects
- Publication number 20080014643
- Publication date Jan 17, 2008
- Paul Bjorkholm
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for estimating presence of a material within a...
- Publication number 20070211853
- Publication date Sep 13, 2007
- General Electric Company
- Steven E. Curtis
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method and apparatus for target transmitting information about a ta...
- Publication number 20050111619
- Publication date May 26, 2005
- L-3 Communications Security and Detection Systems Corporation Delaware
- Richard R. Bijjani
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TRANSMITTING INFORMATION ABOUT A TARGET OB...
- Publication number 20050094765
- Publication date May 5, 2005
- L-3 Communications Security and Detection Systems Corporation Delaware
- Richard R. Bijjani
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for transmitting information about a target ob...
- Publication number 20050053184
- Publication date Mar 10, 2005
- L-3 Communications Security and Detection Systems Corporation Delaware
- Richard R. Bijjani
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for transmitting information about a target ob...
- Publication number 20040101098
- Publication date May 27, 2004
- L-3 Communications Security and Detection Systems Corporation Delaware
- Richard R. Bijjani
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for transmitting information about a target ob...
- Publication number 20040101102
- Publication date May 27, 2004
- L-3 Communications Security and Detection Systems Corporation Delaware
- Richard R. Bijjani
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for transmitting information about a target ob...
- Publication number 20030147489
- Publication date Aug 7, 2003
- Richard R. Bijjani
- G01 - MEASURING TESTING

mapping distribution of elements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Radiation detection device, recording medium, and positioning method

Screening system

Diffraction analysis device and method for full-field x-ray fluores...

Detecting downhole fluid composition utilizing photon emission

Photon counting X-ray CT apparatus

X-ray dosage mitigation for semiconductors and material inspection...

High speed/low dose multi-objective autonomous scanning materials i...

Apparatus and method of processing data acquired in x-ray examinati...

Method for estimating abrasion resistance and fracture resistance

X-ray spectroscopy in a charged-particle microscope

Image processing apparatus, surface analyzer, and image processing...

Data processing apparatus and data processing method for X-ray exam...

Photon counting X-ray CT apparatus

Electron probe microanalyzer and storage medium

Method for treating a cancer patient based on atomic therapeutic in...

X-ray device, method, manufacturing method for structure, program,...

Multimodality mineralogy segmentation system and method

Combined handheld XRF and OES systems and methods

Method and system for performing EDS analysis

Sub-pixel analysis and display of fine grained mineral samples

Methods and apparatuses for measuring effective atomic number of an...

Method and system for improving characteristic peak signals in anal...

X-ray analyzer

Clustering of multi-modal data

Dual angle radiation scanning of objects

Method and apparatus for inspection of materials

Dual angle radiation scanning of objects

Systems and methods for estimating presence of a material within a...

Method and apparatus for target transmitting information about a ta...

Method and apparatus for transmitting information about a target ob...

Patents Applicationslast 30 patents

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...

MATERIAL ANALYSIS WITH MULTIPLE DETECTORS

DETECTING DOWNHOLE FLUID COMPOSITION UTILIZING PHOTON EMISSION

Phase Analyzer, Sample Analyzer, and Analysis Method

Scatter Diagram Display Device, Scatter Diagram Display Method, and...

METHOD AND SYSTEM FOR MAPPING ELEMENTAL COMPOSITION IN DYNAMIC AND...

X-RAY DOSAGE MITIGATION FOR SEMICONDUCTORS AND MATERIAL INSPECTION...

HIGH SPEED/LOW DOSE MULTI-OBJECTIVE AUTONOMOUS SCANNING MATERIALS I...

PHOTON COUNTING X-RAY CT APPARATUS

IMPROVED METHOD PTYCHOGRAPHIC DETECTOR MAPPING

DATA PROCESSING APPARATUS AND DATA PROCESSING METHOD FOR X-RAY EXAM...

METHOD FOR 3D MINERAL MAPPING OF A ROCK SAMPLE

METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN...

METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...

METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BE...

CLUSTERING OF MULTI-MODAL DATA

DUAL ANGLE RADIATION SCANNING OF OBJECTS

Method and Apparatus for Inspection of Materials

Computed Tomography Systems and Related Methods Involving Localized...

Dual angle radiation scanning of objects

Systems and methods for estimating presence of a material within a...

Method and apparatus for target transmitting information about a ta...

METHOD AND APPARATUS FOR TRANSMITTING INFORMATION ABOUT A TARGET OB...

Method and apparatus for transmitting information about a target ob...

Method and apparatus for transmitting information about a target ob...

Method and apparatus for transmitting information about a target ob...

Method and apparatus for transmitting information about a target ob...