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G01N2223/403

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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Patents Grantslast 30 patents

Information Patent Grant
X-ray baggage and parcel inspection system with efficient third-par...
- Patent number 12,007,341
- Issue date Jun 11, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Multi-color nanoscale imaging based on nanoparticle cathodoluminesc...
- Patent number 9,541,512
- Issue date Jan 10, 2017
- President and Fellows of Harvard College
- Ronald Walsworth
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
- Publication number 20240280514
- Publication date Aug 22, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND STORAGE ME...
- Publication number 20220091050
- Publication date Mar 24, 2022
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
Sample Analysis Apparatus and Method
- Publication number 20220026377
- Publication date Jan 27, 2022
- JEOL Ltd.
- Yasuaki Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Multi-Color Nanoscale Imaging Based On Nanoparticle Cathodoluminesc...
- Publication number 20140194314
- Publication date Jul 10, 2014
- President and Fellows of Harvard College
- Ronald Walsworth
- G01 - MEASURING TESTING