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G01J2003/2866
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PHYSICS
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Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/2866
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Patents Grants
last 30 patents
Information
Patent Grant
Chromaticity measurement method and device for calibration of tiled...
Patent number
12,203,809
Issue date
Jan 21, 2025
WUHAN JINGCE ELECTRONIC GROUP CO., LTD.
Changdong Ou
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Methods and assemblies for determining and using standardized spect...
Patent number
12,163,878
Issue date
Dec 10, 2024
Marathon Petroleum Company LP
Roy Roger Bledsoe
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for element identification via optical emission s...
Patent number
12,140,478
Issue date
Nov 12, 2024
Agilent Technologies, Inc.
Daniel Finn McCarthy
G01 - MEASURING TESTING
Information
Patent Grant
Biomarker value calculation method
Patent number
12,140,530
Issue date
Nov 12, 2024
Rockley Photonics Limited
Craig Gardner
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Systems and methods for an absorbance detector with optical reference
Patent number
12,111,212
Issue date
Oct 8, 2024
Excelitas Technologies Corp.
Lowell Brunson
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral image measurement device and calibration method there...
Patent number
12,104,956
Issue date
Oct 1, 2024
SEOUL VIOSYS CO., LTD.
Seong Tae Jang
G01 - MEASURING TESTING
Information
Patent Grant
Spatial light modulator spectroscopy
Patent number
12,072,241
Issue date
Aug 27, 2024
Texas Instruments Incorporated
Philip Scott King
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral sensing system and processing methods for hyperspectr...
Patent number
12,072,242
Issue date
Aug 27, 2024
Flying Gybe Inc.
Nicholas Tufillaro
G01 - MEASURING TESTING
Information
Patent Grant
Method for predicting a property value of interest of a material
Patent number
12,055,480
Issue date
Aug 6, 2024
Evonik Operations GmbH
Ingolf Reimann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Calibration device, calibration method, calibration program, spectr...
Patent number
11,985,299
Issue date
May 14, 2024
Seiko Epson Corporation
Masashi Kanai
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Methods and assemblies for determining and using standardized spect...
Patent number
11,921,035
Issue date
Mar 5, 2024
Marathon Petroleum Company LP
Roy Roger Bledsoe
G01 - MEASURING TESTING
Information
Patent Grant
Methods, assemblies, and controllers for determining and using stan...
Patent number
11,906,423
Issue date
Feb 20, 2024
Marathon Petroleum Company LP
Roy Roger Bledsoe
G01 - MEASURING TESTING
Information
Patent Grant
Methods and assemblies for determining and using standardized spect...
Patent number
11,885,739
Issue date
Jan 30, 2024
Marathon Petroleum Company LP
Roy Roger Bledsoe
G01 - MEASURING TESTING
Information
Patent Grant
Portable water quality instrument
Patent number
11,867,631
Issue date
Jan 9, 2024
OndaVia, Inc.
Mark C. Peterman
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Methods and assemblies for determining and using standardized spect...
Patent number
11,860,069
Issue date
Jan 2, 2024
Marathon Petroleum Company LP
Roy Roger Bledsoe
G01 - MEASURING TESTING
Information
Patent Grant
Methods and assemblies for determining and using standardized spect...
Patent number
11,835,450
Issue date
Dec 5, 2023
Marathon Petroleum Company LP
Roy Roger Bledsoe
G01 - MEASURING TESTING
Information
Patent Grant
Skin barrier preparation and method therefor
Patent number
11,744,905
Issue date
Sep 5, 2023
Johnson & Johnson Consumer Inc.
Jalil Bensaci
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Portable water quality instrument
Patent number
11,719,642
Issue date
Aug 8, 2023
OndaVia, Inc.
Mark C. Peterman
C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information
Patent Grant
Systems and methods for dual comb spectroscopy
Patent number
11,686,622
Issue date
Jun 27, 2023
The Regents of The University of Colorado, A Body Corporate
Gregory B. Rieker
G01 - MEASURING TESTING
Information
Patent Grant
Hyperspectral imaging method and device
Patent number
11,686,618
Issue date
Jun 27, 2023
Hypermed Imaging, Inc.
Mark Anthony Darty
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for an absorbance detector with optical reference
Patent number
11,513,006
Issue date
Nov 29, 2022
Phoseon Technology, Inc.
Lowell Brunson
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer system and enhanced optical characterization of b...
Patent number
11,473,976
Issue date
Oct 18, 2022
Mayo Foundation for Medical Education and Research
Daniel J. Schwab
G01 - MEASURING TESTING
Information
Patent Grant
Transfer of a calibration model using a sparse transfer set
Patent number
11,378,452
Issue date
Jul 5, 2022
VIAVI Solutions Inc.
Changmeng Hsiung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for ICPMS matrix offset calibration
Patent number
11,348,773
Issue date
May 31, 2022
Elemental Scientific, Inc.
Daniel R. Wiederin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectral imaging system
Patent number
11,346,718
Issue date
May 31, 2022
California Institute of Technology
Andrew K. Thorpe
G01 - MEASURING TESTING
Information
Patent Grant
Hyper-spectral image measurement device and calibration method ther...
Patent number
11,274,966
Issue date
Mar 15, 2022
SEOUL VIOSYS CO., LTD.
Seong Tae Jang
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength shift correction system and wavelength shift correction...
Patent number
11,231,321
Issue date
Jan 25, 2022
Konica Minolta, Inc.
Yoshiroh Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Substrate processing apparatus, substrate processing module, and se...
Patent number
11,215,506
Issue date
Jan 4, 2022
Samsung Electronics Co., Ltd.
Kyeonghun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer calibration methods and systems
Patent number
11,181,422
Issue date
Nov 23, 2021
Agilent Technologies, Inc.
David Death
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
DMD based UV absorption detector for liquid chromatography
Patent number
11,112,392
Issue date
Sep 7, 2021
Waters Technologies Corporation
Anthony C. Jeannotte
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PEAK POSITION MEASUREMENT OFFSET IN A TWO-DIMENSIONAL OPTICAL SPECTRUM
Publication number
20250052615
Publication date
Feb 13, 2025
THERMO FISHER SCIENTIFIC (SHANGHAI) INSTRUMENTS CO., LTD.
Shenghai Wu
G01 - MEASURING TESTING
Information
Patent Application
CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM...
Publication number
20240377252
Publication date
Nov 14, 2024
National University of Singapore
Zi Heng LIM
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY
Publication number
20230349764
Publication date
Nov 2, 2023
The Regents of the University of Colorado, a Body Corporate
Gregory B. Rieker
G01 - MEASURING TESTING
Information
Patent Application
Chromaticity Measurement Method and Device for Calibration of Tiled...
Publication number
20230314223
Publication date
Oct 5, 2023
WUHAN JINGCE ELECTRONIC GROUP CO., LTD
Changdong Ou
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
METHOD FOR PREDICTING A PROPERTY VALUE OF INTEREST OF A MATERIAL
Publication number
20230194415
Publication date
Jun 22, 2023
Evonik Operations GmbH
Ingolf REIMANN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BIOMARKER VALUE CALCULATION METHOD
Publication number
20230104416
Publication date
Apr 6, 2023
ROCKLEY PHOTONICS LIMITED
Craig GARDNER
G01 - MEASURING TESTING
Information
Patent Application
TECHNIQUES FOR COMPOSITION IDENTIFICATION OF AN ANATOMICAL TARGET
Publication number
20220313062
Publication date
Oct 6, 2022
GYRUS ACMI, INC. D/B/A OLYMPUS SURGICAL TECHNOLOGIES AMERICA
Vladimir Polejaev
G01 - MEASURING TESTING
Information
Patent Application
Spectrophotometer System and Enhanced Optical Characterization of B...
Publication number
20210404875
Publication date
Dec 30, 2021
Mayo Foundation for Medical Education and Research
Daniel J. Schwab
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...
Publication number
20210231497
Publication date
Jul 29, 2021
Flying Gybe Inc.
Nicholas TUFILLARO
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...
Publication number
20210231498
Publication date
Jul 29, 2021
Flying Gybe Inc.
Nicholas TUFILLARO
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL LIGHT MODULATOR SPECTROSCOPY
Publication number
20210172796
Publication date
Jun 10, 2021
TEXAS INSTRUMENTS INCORPORATED
Philip Scott King
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING MODULE, AND SE...
Publication number
20210148760
Publication date
May 20, 2021
Samsung Electronics Co., Ltd.
Kyeonghun KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wavelength Shift Correction System and Wavelength Shift Correction...
Publication number
20210123804
Publication date
Apr 29, 2021
Konica Minolta, Inc.
Yoshiroh NAGAI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR AN ABSORBANCE DETECTOR WITH OPTICAL REFERENCE
Publication number
20210108962
Publication date
Apr 15, 2021
PHOSEON TECHNOLOGY, INC.
Lowell Brunson
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY
Publication number
20210080324
Publication date
Mar 18, 2021
The Regents of the University of Colorado, a Body Corporate
Gregory B. Rieker
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING MODULE, AND SE...
Publication number
20200209063
Publication date
Jul 2, 2020
Samsung Electronics Co., Ltd.
Kyeonghun KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Spectral Imaging System
Publication number
20200124477
Publication date
Apr 23, 2020
California Institute of Technology
Andrew K. Thorpe
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR CALIBRATING A SPECTROMETER
Publication number
20200116643
Publication date
Apr 16, 2020
Rigaku Analytical Devices, Inc.
Stevan Kun
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL OBJECT DETECTION
Publication number
20200109990
Publication date
Apr 9, 2020
Parsons Corporation
Matthew B. Campbell
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGING METHOD AND DEVICE
Publication number
20200088580
Publication date
Mar 19, 2020
Hypermed Imaging, Inc.
Mark Anthony Darty
G01 - MEASURING TESTING
Information
Patent Application
Method for Correcting a Wavelength and Tuning Range of a Laser Spec...
Publication number
20200088576
Publication date
Mar 19, 2020
Siemens Aktiengesellschaft
Daniel Depenheuer
G01 - MEASURING TESTING
Information
Patent Application
DMD BASED UV ABSORPTION DETECTOR FOR LIQUID CHROMATOGRAPHY
Publication number
20200049674
Publication date
Feb 13, 2020
Water Technologies Corporation
Anthony C. Jeannotte
G02 - OPTICS
Information
Patent Application
HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTR...
Publication number
20200025613
Publication date
Jan 23, 2020
Flying Gybe Inc.
Nicholas TUFILLARO
G01 - MEASURING TESTING
Information
Patent Application
TRANSFER OF A CALIBRATION MODEL USING A SPARSE TRANSFER SET
Publication number
20200018648
Publication date
Jan 16, 2020
VIAVI Solutions Inc.
Changmeng HSIUNG
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL IMAGE CORRECTING APPARATUS AND SPECTRAL IMAGE CORRECTING M...
Publication number
20190391015
Publication date
Dec 26, 2019
Samsung Electronics Co., Ltd.
Yun S PARK
G01 - MEASURING TESTING
Information
Patent Application
SKIN BARRIER PREPARATION AND METHOD THEREFOR
Publication number
20190212324
Publication date
Jul 11, 2019
Johnson & Johnson Consumer Inc.
Jalil Bensaci
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR ICPMS MATRIX OFFSET CALIBRATION
Publication number
20190206663
Publication date
Jul 4, 2019
ELEMENTAL SCIENTIFIC, INC.
Daniel R. Wiederin
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETER, A SPECTRUM SAMPLING DEVICE AND SPECTRUM CORRECTION ME...
Publication number
20190204151
Publication date
Jul 4, 2019
InnoSpectra Corporation
Ming-Hui Lin
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL LIGHT MODULATOR SPECTROSCOPY
Publication number
20190162595
Publication date
May 30, 2019
TEXAS INSTRUMENTS INCORPORATED
Philip Scott King
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRIC SENSOR CONTROL METHOD AND ELECTRONIC DEVICE FOR SUPPO...
Publication number
20190113387
Publication date
Apr 18, 2019
Samsung Electronics Co., Ltd.
Jaesung LEE
G01 - MEASURING TESTING