Marking defects

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CPC
G01N2021/888

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/888Marking defects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 12,313,564
- Issue date May 27, 2025
- Toyota Jidosha Kabushiki Kaisha
- Tomohiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
- Patent number 12,292,387
- Issue date May 6, 2025
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
System and method of object detection using AI deep learning models
- Patent number 12,288,390
- Issue date Apr 29, 2025
- QC Hero, Inc.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of processing a cleaved semiconductor wafer
- Patent number 12,270,768
- Issue date Apr 8, 2025
- GlobalWafers Co., Ltd.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection support apparatus, inspection support method, and comput...
- Patent number 12,270,766
- Issue date Apr 8, 2025
- NEC Corporation
- Akira Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects of the horizontal mold seal for glass...
- Patent number 12,265,035
- Issue date Apr 1, 2025
- TIAMIA
- Lubin Fayolle
- G01 - MEASURING TESTING
Information Patent Grant
Type of device(s) for automatically monitoring a coating and/or str...
- Patent number 12,264,909
- Issue date Apr 1, 2025
- QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- G01 - MEASURING TESTING
Information Patent Grant
Automated in-line object inspection
- Patent number 12,254,617
- Issue date Mar 18, 2025
- KODAK ALARIS LLC
- Bruce A. Link
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface defect monitoring system
- Patent number 12,253,471
- Issue date Mar 18, 2025
- TERRACON CONSULTANTS, INC.
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method and system for determining the location of a surfa...
- Patent number 12,253,474
- Issue date Mar 18, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
- Patent number 12,249,526
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for detecting defect of electrode tab and method for detecti...
- Patent number 12,247,926
- Issue date Mar 11, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Han Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrode sheet defect detection system
- Patent number 12,241,843
- Issue date Mar 4, 2025
- LG ENERGY SOLUTION, LTD.
- Ee Beom Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a dishwasher and method for operating a dishwasher
- Patent number 12,239,274
- Issue date Mar 4, 2025
- BSH Hausgeräte GmbH
- Alfredo Calvimontes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for defect inspection, system, and computer-readable medium
- Patent number 12,235,223
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Takanori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,228,521
- Issue date Feb 18, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems to locate anomalies along an inside surface of...
- Patent number 12,228,524
- Issue date Feb 18, 2025
- SonDance Solutions LLC
- Jeffery M Wilkinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 12,222,298
- Issue date Feb 11, 2025
- HYDROMAX USA, LLC
- Guy Schiavone
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,216,064
- Issue date Feb 4, 2025
- FUJI CORPORATION
- Tomoya Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system having human-machine interaction function
- Patent number 12,217,498
- Issue date Feb 4, 2025
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device which can determine a dirtiness level
- Patent number 12,216,063
- Issue date Feb 4, 2025
- PixArt Imaging Inc.
- Tsung-Fa Wang
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Automated optical double-sided inspection apparatus
- Patent number 12,188,877
- Issue date Jan 7, 2025
- Feng Chia University
- Yee Siang Gan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscopic non-destructive measurement method of microstructure li...
- Patent number 12,190,495
- Issue date Jan 7, 2025
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhishan Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Station and method for translationally detecting glaze defects on g...
- Patent number 12,181,419
- Issue date Dec 31, 2024
- TIAMA
- Laurent Cosneau
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring health of low-cost sensors used in...
- Patent number 12,175,680
- Issue date Dec 24, 2024
- TATA Consultancy Services Limited
- Prachin Lalit Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Broadband wafer defect detection
- Patent number 12,158,434
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM
- Publication number 20250180488
- Publication date Jun 5, 2025
- Xerox Corporation
- Jeng PING LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...
- Publication number 20250180489
- Publication date Jun 5, 2025
- TIAMA
- Olivier COLLE
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...
- Publication number 20250182267
- Publication date Jun 5, 2025
- Samsung Electronics Co., Ltd.
- Jaemin Jeon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...
- Publication number 20250183073
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen Min LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...
- Publication number 20250162086
- Publication date May 22, 2025
- ATOP S.p.A.
- Massimiliano GIACHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...
- Publication number 20250155378
- Publication date May 15, 2025
- Carl Zeiss SMT GMBH
- Alexander Freytag
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION SYSTEM AND METHOD
- Publication number 20250146951
- Publication date May 8, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Wushu LI
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Sensor
- Publication number 20250130178
- Publication date Apr 24, 2025
- Araz Yacoubian
- G01 - MEASURING TESTING
Information Patent Application
BATTERY DEFECT DETECTION APPARATUS, METHOD, AND SYSTEM
- Publication number 20250123219
- Publication date Apr 17, 2025
- LG ENERGY SOLUTION, LTD.
- Tae Jin NOH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE
- Publication number 20250123555
- Publication date Apr 17, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Lin SYU
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM
- Publication number 20250123218
- Publication date Apr 17, 2025
- Lenovo (Beijing) Limited
- Yonghua LIU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20250116614
- Publication date Apr 10, 2025
- Hydromax USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...
- Publication number 20250111496
- Publication date Apr 3, 2025
- GEHRING TECHNOLOGIES GMBH + CO. KG
- Laurens Schmid
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Passive Camera Lens Smudge Detection
- Publication number 20250110059
- Publication date Apr 3, 2025
- Apple Inc.
- Xiaochun Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...
- Publication number 20250101640
- Publication date Mar 27, 2025
- SANKO TEKSTIL ISLETMELERI SANAYI VE TICARET ANONIM SIRKETI BASPINAR SUBESI
- Hakan KONUKOGLU
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...
- Publication number 20250093280
- Publication date Mar 20, 2025
- UnitX, Inc.
- Tommy Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting containers provided with fittings
- Publication number 20250085233
- Publication date Mar 13, 2025
- KRONES AG
- Andreas Kraus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FUSION WITH EDDY CURRENT SENSING
- Publication number 20250073780
- Publication date Mar 6, 2025
- DIVERGENT TECHNOLOGIES, INC.
- Farzaneh KAJI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...
- Publication number 20250078543
- Publication date Mar 6, 2025
- Aktiebolaget SKF
- Weichen GU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHODS FOR THE CALCULATION OF ADDITIONAL LOCAL STRETCHI...
- Publication number 20250066153
- Publication date Feb 27, 2025
- VALMET AB
- Fabrizio BARTOLINI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...
- Publication number 20250060316
- Publication date Feb 20, 2025
- SCUOLA UNIVERSITARIA PROFESSIONALE DELLA SVIZZERA ITALIANA (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES
- Publication number 20250060318
- Publication date Feb 20, 2025
- TEXAS TECH UNIVERSITY SYSTEM
- Aniruddha Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...
- Publication number 20250045898
- Publication date Feb 6, 2025
- Konica Minolta, Inc.
- Yoshihito SOUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...
- Publication number 20250045905
- Publication date Feb 6, 2025
- AQC INDUSTRY
- Pierre MAGRANGEAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...
- Publication number 20250035559
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...
- Publication number 20250026603
- Publication date Jan 23, 2025
- Konica Minolta, Inc.
- Hiromu Nagato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...
- Publication number 20250027884
- Publication date Jan 23, 2025
- COGNEX CORPORATION
- Eric Moore
- G01 - MEASURING TESTING

Marking defects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detection method of crease degree of screen and visual detection ap...

Inspection device and inspection method

3D image acquisition system for optical inspection and method for o...

Apparatus and method for inspecting laser defect inside of transpar...

Deterioration diagnosis device, deterioration diagnosis method, and...

System and method of object detection using AI deep learning models

Method of processing a cleaved semiconductor wafer

Inspection support apparatus, inspection support method, and comput...

Method for detecting defects of the horizontal mold seal for glass...

Type of device(s) for automatically monitoring a coating and/or str...

Automated in-line object inspection

Surface defect monitoring system

Detection method and system for determining the location of a surfa...

Detecting damaged semiconductor wafers utilizing a semiconductor wa...

System for detecting defect of electrode tab and method for detecti...

Electrode sheet defect detection system

System comprising a dishwasher and method for operating a dishwasher

Method for defect inspection, system, and computer-readable medium

Surface analysis of gemstones

Methods and systems to locate anomalies along an inside surface of...

Multi-sensor pipe inspection system and method

Inspection device

Defect inspection system having human-machine interaction function

Electronic device which can determine a dirtiness level

Qualitative or quantitative characterization of a coating surface

Automated optical double-sided inspection apparatus

Microscopic non-destructive measurement method of microstructure li...

Station and method for translationally detecting glaze defects on g...

System and method for monitoring health of low-cost sensors used in...

Broadband wafer defect detection

Patents Applicationslast 30 patents

HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM

METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...

SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...

DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...

METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...

COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...

VISUAL INSPECTION SYSTEM AND METHOD

Surface Inspection Sensor

BATTERY DEFECT DETECTION APPARATUS, METHOD, AND SYSTEM

METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE

PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...

Passive Camera Lens Smudge Detection

INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...

MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...

Method and apparatus for inspecting containers provided with fittings

TOPOGRAPHICAL INSPECTION

SENSOR FUSION WITH EDDY CURRENT SENSING

METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...

SYSTEM AND METHODS FOR THE CALCULATION OF ADDITIONAL LOCAL STRETCHI...

APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...

METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...

METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...

WAFER DEFECT INSPECTION SYSTEM

METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...

SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...