Marking defects

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CPC
G01N2021/888

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/888Marking defects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting defects of the horizontal mold seal for glass...
- Patent number 12,265,035
- Issue date Apr 1, 2025
- TIAMIA
- G01 - MEASURING TESTING
Information Patent Grant
Type of device(s) for automatically monitoring a coating and/or str...
- Patent number 12,264,909
- Issue date Apr 1, 2025
- QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- G01 - MEASURING TESTING
Information Patent Grant
Automated in-line object inspection
- Patent number 12,254,617
- Issue date Mar 18, 2025
- KODAK ALARIS LLC
- Bruce A. Link
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface defect monitoring system
- Patent number 12,253,471
- Issue date Mar 18, 2025
- TERRACON CONSULTANTS, INC.
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method and system for determining the location of a surfa...
- Patent number 12,253,474
- Issue date Mar 18, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
- Patent number 12,249,526
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for detecting defect of electrode tab and method for detecti...
- Patent number 12,247,926
- Issue date Mar 11, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Han Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrode sheet defect detection system
- Patent number 12,241,843
- Issue date Mar 4, 2025
- LG ENERGY SOLUTION, LTD.
- Ee Beom Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a dishwasher and method for operating a dishwasher
- Patent number 12,239,274
- Issue date Mar 4, 2025
- BSH Hausgeräte GmbH
- Alfredo Calvimontes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for defect inspection, system, and computer-readable medium
- Patent number 12,235,223
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Takanori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,228,521
- Issue date Feb 18, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems to locate anomalies along an inside surface of...
- Patent number 12,228,524
- Issue date Feb 18, 2025
- SonDance Solutions LLC
- Jeffery M Wilkinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 12,222,298
- Issue date Feb 11, 2025
- HYDROMAX USA, LLC
- Guy Schiavone
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,216,064
- Issue date Feb 4, 2025
- FUJI CORPORATION
- Tomoya Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system having human-machine interaction function
- Patent number 12,217,498
- Issue date Feb 4, 2025
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic device which can determine a dirtiness level
- Patent number 12,216,063
- Issue date Feb 4, 2025
- PixArt Imaging Inc.
- Tsung-Fa Wang
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Automated optical double-sided inspection apparatus
- Patent number 12,188,877
- Issue date Jan 7, 2025
- Feng Chia University
- Yee Siang Gan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscopic non-destructive measurement method of microstructure li...
- Patent number 12,190,495
- Issue date Jan 7, 2025
- NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
- Zhishan Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Station and method for translationally detecting glaze defects on g...
- Patent number 12,181,419
- Issue date Dec 31, 2024
- TIAMA
- Laurent Cosneau
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring health of low-cost sensors used in...
- Patent number 12,175,680
- Issue date Dec 24, 2024
- TATA Consultancy Services Limited
- Prachin Lalit Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for automatically reconstituting the reinforcing architectur...
- Patent number 12,159,396
- Issue date Dec 3, 2024
- SAFRAN AIRCRAFT ENGINES
- Yanneck Wielhorski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Broadband wafer defect detection
- Patent number 12,158,434
- Issue date Dec 3, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Nai-Han Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Method for multivariate testing, development, and validation of a m...
- Patent number 12,158,432
- Issue date Dec 3, 2024
- Stratasys, Inc.
- Joel Ong
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Inspection system, inspection method, and inspection program
- Patent number 12,148,145
- Issue date Nov 19, 2024
- Mitsubishi Heavy Industries, Ltd.
- Takahiro Tachibana
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Product-inspection apparatus, product-inspection method, and non-tr...
- Patent number 12,148,143
- Issue date Nov 19, 2024
- NEC Corporation
- Keiko Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cutter analysis and mapping
- Patent number 12,141,960
- Issue date Nov 12, 2024
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for checking compliance of a mechanical part of a vehicle
- Patent number 12,135,293
- Issue date Nov 5, 2024
- JTEKT Europe
- Sarah Tallet-Pinet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspection system for foil article
- Patent number 12,111,268
- Issue date Oct 8, 2024
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...
- Publication number 20250101640
- Publication date Mar 27, 2025
- SANKO TEKSTIL ISLETMELERI SANAYI VE TICARET ANONIM SIRKETI BASPINAR SUBESI
- Hakan KONUKOGLU
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...
- Publication number 20250093280
- Publication date Mar 20, 2025
- UnitX, Inc.
- Tommy Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting containers provided with fittings
- Publication number 20250085233
- Publication date Mar 13, 2025
- KRONES AG
- Andreas Kraus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SENSOR FUSION WITH EDDY CURRENT SENSING
- Publication number 20250073780
- Publication date Mar 6, 2025
- DIVERGENT TECHNOLOGIES, INC.
- Farzaneh KAJI
- B22 - CASTING POWDER METALLURGY
Information Patent Application
TOPOGRAPHICAL INSPECTION
- Publication number 20250076207
- Publication date Mar 6, 2025
- SPIRIT AEROSYSTEMS, INC
- Mark Haynes
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...
- Publication number 20250078543
- Publication date Mar 6, 2025
- Aktiebolaget SKF
- Weichen GU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHODS FOR THE CALCULATION OF ADDITIONAL LOCAL STRETCHI...
- Publication number 20250066153
- Publication date Feb 27, 2025
- VALMET AB
- Fabrizio BARTOLINI
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...
- Publication number 20250060316
- Publication date Feb 20, 2025
- SCUOLA UNIVERSITARIA PROFESSIONALE DELLA SVIZZERA ITALIANA (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES
- Publication number 20250060318
- Publication date Feb 20, 2025
- TEXAS TECH UNIVERSITY SYSTEM
- Aniruddha Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...
- Publication number 20250045898
- Publication date Feb 6, 2025
- Konica Minolta, Inc.
- Yoshihito SOUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...
- Publication number 20250045905
- Publication date Feb 6, 2025
- AQC INDUSTRY
- Pierre MAGRANGEAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...
- Publication number 20250035559
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...
- Publication number 20250026603
- Publication date Jan 23, 2025
- Konica Minolta, Inc.
- Hiromu Nagato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...
- Publication number 20250027884
- Publication date Jan 23, 2025
- COGNEX CORPORATION
- Eric Moore
- G01 - MEASURING TESTING
Information Patent Application
CUTTER ANALYSIS AND MAPPING
- Publication number 20250029236
- Publication date Jan 23, 2025
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CALENDERING AN ELECTRODE TAPE, AND CALENDERING DEVICE
- Publication number 20250015253
- Publication date Jan 9, 2025
- Volkswagen Aktiengesellschaft
- Ludger BUSSWINKEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
- Publication number 20250014164
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GAS LEAK DETECTION DEVICE AND DETECTING METHOD
- Publication number 20250012655
- Publication date Jan 9, 2025
- VIA TECHNOLOGIES, INC.
- Yeh Cho
- G08 - SIGNALLING
Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...
- Publication number 20250003887
- Publication date Jan 2, 2025
- BRITESCAN, INC.
- Danica HARBAUGH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EXAMINATION APPARATUS
- Publication number 20250003890
- Publication date Jan 2, 2025
- FUJIFILM CORPORATION
- Yoshinobu MIURA
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
- Publication number 20250003889
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Tomoe Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Product Detection System
- Publication number 20240426762
- Publication date Dec 26, 2024
- TE Connectivity Solutions GMBH
- Qing (Carrie) Zhou
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
- Publication number 20240426750
- Publication date Dec 26, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFYING AND CHARACTERIZING, BY MEANS OF ARTIFICIAL I...
- Publication number 20240404032
- Publication date Dec 5, 2024
- Brembo S.p.A.
- Stefano BELOTTI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
GEMSTONE ANALYSIS DEVICE, SYSTEM, AND METHOD USING NEURAL NETWORKS
- Publication number 20240393255
- Publication date Nov 28, 2024
- Parikh Holdings LLC
- Aniket Parikh
- G01 - MEASURING TESTING

Marking defects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for detecting defects of the horizontal mold seal for glass...

Type of device(s) for automatically monitoring a coating and/or str...

Automated in-line object inspection

Surface defect monitoring system

Detection method and system for determining the location of a surfa...

Detecting damaged semiconductor wafers utilizing a semiconductor wa...

System for detecting defect of electrode tab and method for detecti...

Electrode sheet defect detection system

System comprising a dishwasher and method for operating a dishwasher

Method for defect inspection, system, and computer-readable medium

Surface analysis of gemstones

Methods and systems to locate anomalies along an inside surface of...

Multi-sensor pipe inspection system and method

Inspection device

Defect inspection system having human-machine interaction function

Electronic device which can determine a dirtiness level

Qualitative or quantitative characterization of a coating surface

Automated optical double-sided inspection apparatus

Microscopic non-destructive measurement method of microstructure li...

Station and method for translationally detecting glaze defects on g...

System and method for monitoring health of low-cost sensors used in...

Method for automatically reconstituting the reinforcing architectur...

Broadband wafer defect detection

Method for multivariate testing, development, and validation of a m...

Inspection system, inspection method, and inspection program

Product-inspection apparatus, product-inspection method, and non-tr...

Cutter analysis and mapping

Method for checking compliance of a mechanical part of a vehicle

Surface inspection system for foil article

System for detecting surface type of object and artificial neural n...

Patents Applicationslast 30 patents

INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...

MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...

Method and apparatus for inspecting containers provided with fittings

SENSOR FUSION WITH EDDY CURRENT SENSING

TOPOGRAPHICAL INSPECTION

METHOD FOR DETERMINING THE STATUS OF GREASE CONTAINING PARTICLES BY...

SYSTEM AND METHODS FOR THE CALCULATION OF ADDITIONAL LOCAL STRETCHI...

APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...

METHODS AND SYSTEMS FOR EVALUATING FIBER QUALITIES

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...

METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...

WAFER DEFECT INSPECTION SYSTEM

METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...

SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...

CUTTER ANALYSIS AND MAPPING

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

METHOD FOR CALENDERING AN ELECTRODE TAPE, AND CALENDERING DEVICE

METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...

GAS LEAK DETECTION DEVICE AND DETECTING METHOD

PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...

PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...

EXAMINATION APPARATUS

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...

Product Detection System

TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...

METHOD FOR IDENTIFYING AND CHARACTERIZING, BY MEANS OF ARTIFICIAL I...

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

GEMSTONE ANALYSIS DEVICE, SYSTEM, AND METHOD USING NEURAL NETWORKS