Marking defects

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CPC
G01N2021/888

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/888Marking defects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting joint portion of fluororesin member and fluoro...
- Patent number 12,366,536
- Issue date Jul 22, 2025
- Daikin Industries, Ltd.
- Masao Noumi
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting product for defects, electronic device, and st...
- Patent number 12,367,378
- Issue date Jul 22, 2025
- Hon Hai Precision Industry Co., Ltd.
- Chung-Yu Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,360,049
- Issue date Jul 15, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming optical proximity correction model and method of...
- Patent number 12,354,920
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sang Chul Yeo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shape reconstruction method and image measurement device
- Patent number 12,352,558
- Issue date Jul 8, 2025
- Machine Vision Lighting Inc.
- Shigeki Masumura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method for detecting formation of...
- Patent number 12,342,468
- Issue date Jun 24, 2025
- FUJI CORPORATION
- Mikiya Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of textile fiber composition
- Patent number 12,339,224
- Issue date Jun 24, 2025
- VALVAN NV
- Frank Vandeputte
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting product for defects, electronic device, and st...
- Patent number 12,332,183
- Issue date Jun 17, 2025
- Hon Hai Precision Industry Co., Ltd.
- Chung-Yu Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 12,313,564
- Issue date May 27, 2025
- Toyota Jidosha Kabushiki Kaisha
- Tomohiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
- Patent number 12,292,387
- Issue date May 6, 2025
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
System and method of object detection using AI deep learning models
- Patent number 12,288,390
- Issue date Apr 29, 2025
- QC Hero, Inc.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of processing a cleaved semiconductor wafer
- Patent number 12,270,768
- Issue date Apr 8, 2025
- GlobalWafers Co., Ltd.
- Benjamin Michael Meyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection support apparatus, inspection support method, and comput...
- Patent number 12,270,766
- Issue date Apr 8, 2025
- NEC Corporation
- Akira Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects of the horizontal mold seal for glass...
- Patent number 12,265,035
- Issue date Apr 1, 2025
- TIAMIA
- Lubin Fayolle
- G01 - MEASURING TESTING
Information Patent Grant
Type of device(s) for automatically monitoring a coating and/or str...
- Patent number 12,264,909
- Issue date Apr 1, 2025
- QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- G01 - MEASURING TESTING
Information Patent Grant
Automated in-line object inspection
- Patent number 12,254,617
- Issue date Mar 18, 2025
- KODAK ALARIS LLC
- Bruce A. Link
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface defect monitoring system
- Patent number 12,253,471
- Issue date Mar 18, 2025
- TERRACON CONSULTANTS, INC.
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method and system for determining the location of a surfa...
- Patent number 12,253,474
- Issue date Mar 18, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
- Patent number 12,249,526
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for detecting defect of electrode tab and method for detecti...
- Patent number 12,247,926
- Issue date Mar 11, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Han Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrode sheet defect detection system
- Patent number 12,241,843
- Issue date Mar 4, 2025
- LG ENERGY SOLUTION, LTD.
- Ee Beom Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a dishwasher and method for operating a dishwasher
- Patent number 12,239,274
- Issue date Mar 4, 2025
- BSH Hausgeräte GmbH
- Alfredo Calvimontes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for defect inspection, system, and computer-readable medium
- Patent number 12,235,223
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Takanori Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,228,521
- Issue date Feb 18, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems to locate anomalies along an inside surface of...
- Patent number 12,228,524
- Issue date Feb 18, 2025
- SonDance Solutions LLC
- Jeffery M Wilkinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 12,222,298
- Issue date Feb 11, 2025
- HYDROMAX USA, LLC
- Guy Schiavone
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 12,216,064
- Issue date Feb 4, 2025
- FUJI CORPORATION
- Tomoya Fujimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT ANALYZER, METHOD FOR ANALYZING DEFECT, AND PROGRAM
- Publication number 20250239050
- Publication date Jul 24, 2025
- Resonac Corporation
- Yu OKANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD OF OBJECT DETECTION USING AI DEEP LEARNING
- Publication number 20250232573
- Publication date Jul 17, 2025
- QC HERO, INC.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION OF OPTICAL COMPONENTS IN OPTICAL SYSTEMS
- Publication number 20250231081
- Publication date Jul 17, 2025
- VIAVI SOLUTIONS INC.
- Eugene CHAN
- G01 - MEASURING TESTING
Information Patent Application
Electrode Sheet Defect Inspection Device
- Publication number 20250224341
- Publication date Jul 10, 2025
- LG ENERGY SOLUTION, LTD.
- Jong Hwa Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...
- Publication number 20250225641
- Publication date Jul 10, 2025
- HEFEI GENERAL MACHINERY RESEARCH INSTITUTE CO., LTD
- Tao CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD WITH DEFECT DETECTION
- Publication number 20250225647
- Publication date Jul 10, 2025
- Samsung Electro-Mechanics Co., Ltd.
- Dongjin PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION AND CLASSIFICATION (FDC) FOR ENDPOINT DETECTION (EP...
- Publication number 20250216336
- Publication date Jul 3, 2025
- TOKYO ELECTRON LIMITED
- Colin PILCHER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...
- Publication number 20250210387
- Publication date Jun 26, 2025
- Samsung Electronics Co., Ltd.
- Soon Kyu HWANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
YARN-OUT STATE DETECTION METHOD AND APPARATUS, DEVICE AND STORAGE M...
- Publication number 20250207300
- Publication date Jun 26, 2025
- ZHEJIANG HENGYI PETROCHEMICAL CO., LTD.
- Mingyi LIU
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
ELECTRODE MARKING DEVICE AND ROLL MAP CREATION SYSTEM
- Publication number 20250198940
- Publication date Jun 19, 2025
- LG ENERGY SOLUTION, LTD.
- Ki Deok HAN
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
Measurements Of Complex Semiconductor Structures Based On Component...
- Publication number 20250198942
- Publication date Jun 19, 2025
- KLA Corporation
- Zhengquan Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING FOREIGN OBJECT DEBRIS WITHIN A ST...
- Publication number 20250198944
- Publication date Jun 19, 2025
- The Boeing Company
- Amani Alonazi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- Chia-Liang LIN
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20250191173
- Publication date Jun 12, 2025
- Hitachi Astemo, Ltd.
- Yoshihiko KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING
- Publication number 20250189457
- Publication date Jun 12, 2025
- Rolls-Royce plc
- Benjamin J MOORE
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM
- Publication number 20250180488
- Publication date Jun 5, 2025
- Xerox Corporation
- Jeng PING LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...
- Publication number 20250180489
- Publication date Jun 5, 2025
- TIAMA
- Olivier COLLE
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...
- Publication number 20250182267
- Publication date Jun 5, 2025
- Samsung Electronics Co., Ltd.
- Jaemin Jeon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...
- Publication number 20250183073
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen Min LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...
- Publication number 20250162086
- Publication date May 22, 2025
- ATOP S.p.A.
- Massimiliano GIACHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...
- Publication number 20250155378
- Publication date May 15, 2025
- Carl Zeiss SMT GMBH
- Alexander Freytag
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION SYSTEM AND METHOD
- Publication number 20250146951
- Publication date May 8, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Wushu LI
- G01 - MEASURING TESTING
Information Patent Application
Surface Inspection Sensor
- Publication number 20250130178
- Publication date Apr 24, 2025
- Araz Yacoubian
- G01 - MEASURING TESTING
Information Patent Application
BATTERY DEFECT DETECTION APPARATUS, METHOD, AND SYSTEM
- Publication number 20250123219
- Publication date Apr 17, 2025
- LG ENERGY SOLUTION, LTD.
- Tae Jin NOH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE
- Publication number 20250123555
- Publication date Apr 17, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jia-Lin SYU
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM
- Publication number 20250123218
- Publication date Apr 17, 2025
- Lenovo (Beijing) Limited
- Yonghua LIU
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20250116614
- Publication date Apr 10, 2025
- Hydromax USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...
- Publication number 20250111496
- Publication date Apr 3, 2025
- GEHRING TECHNOLOGIES GMBH + CO. KG
- Laurens Schmid
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Passive Camera Lens Smudge Detection
- Publication number 20250110059
- Publication date Apr 3, 2025
- Apple Inc.
- Xiaochun Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...
- Publication number 20250101640
- Publication date Mar 27, 2025
- SANKO TEKSTIL ISLETMELERI SANAYI VE TICARET ANONIM SIRKETI BASPINAR SUBESI
- Hakan KONUKOGLU
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING

Marking defects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of inspecting joint portion of fluororesin member and fluoro...

Method for detecting product for defects, electronic device, and st...

Surface analysis of gemstones

Method of forming optical proximity correction model and method of...

Shape reconstruction method and image measurement device

Inspection device and inspection method for detecting formation of...

Method and apparatus for determination of textile fiber composition

Method for detecting product for defects, electronic device, and st...

Detection method of crease degree of screen and visual detection ap...

Inspection device and inspection method

3D image acquisition system for optical inspection and method for o...

Apparatus and method for inspecting laser defect inside of transpar...

Deterioration diagnosis device, deterioration diagnosis method, and...

System and method of object detection using AI deep learning models

Method of processing a cleaved semiconductor wafer

Inspection support apparatus, inspection support method, and comput...

Method for detecting defects of the horizontal mold seal for glass...

Type of device(s) for automatically monitoring a coating and/or str...

Automated in-line object inspection

Surface defect monitoring system

Detection method and system for determining the location of a surfa...

Detecting damaged semiconductor wafers utilizing a semiconductor wa...

System for detecting defect of electrode tab and method for detecti...

Electrode sheet defect detection system

System comprising a dishwasher and method for operating a dishwasher

Method for defect inspection, system, and computer-readable medium

Surface analysis of gemstones

Methods and systems to locate anomalies along an inside surface of...

Multi-sensor pipe inspection system and method

Inspection device

Patents Applicationslast 30 patents

DEFECT ANALYZER, METHOD FOR ANALYZING DEFECT, AND PROGRAM

SYSTEM AND METHOD OF OBJECT DETECTION USING AI DEEP LEARNING

INSPECTION OF OPTICAL COMPONENTS IN OPTICAL SYSTEMS

Electrode Sheet Defect Inspection Device

CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...

APPARATUS AND METHOD WITH DEFECT DETECTION

FAULT DETECTION AND CLASSIFICATION (FDC) FOR ENDPOINT DETECTION (EP...

SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...

YARN-OUT STATE DETECTION METHOD AND APPARATUS, DEVICE AND STORAGE M...

ELECTRODE MARKING DEVICE AND ROLL MAP CREATION SYSTEM

Measurements Of Complex Semiconductor Structures Based On Component...

SYSTEMS AND METHODS FOR DETECTING FOREIGN OBJECT DEBRIS WITHIN A ST...

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

IMAGING

HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM

METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...

SEMICONDUCTOR PACKAGE INSPECTION METHOD AND METHOD OF MANUFACTURING...

DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...

METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...

COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...

VISUAL INSPECTION SYSTEM AND METHOD

Surface Inspection Sensor

BATTERY DEFECT DETECTION APPARATUS, METHOD, AND SYSTEM

METHOD AND SYSTEM TO FOR RAPID INSPECTION OF PHOTOLITHOGRAPHY RETICLE

PROCESSING METHOD, PROCESSING APPARATUS, AND PROCESSING SYSTEM

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...

Passive Camera Lens Smudge Detection

INSPECTION SYSTEM FOR YARN BOBBINS AND METHOD FOR INSPECTING YARN B...