Membership
Tour
Register
Log in
Marking defects
Follow
Industry
CPC
G01N2021/888
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/888
Marking defects
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Automated optical double-sided inspection apparatus
Patent number
12,188,877
Issue date
Jan 7, 2025
Feng Chia University
Yee Siang Gan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Microscopic non-destructive measurement method of microstructure li...
Patent number
12,190,495
Issue date
Jan 7, 2025
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
Zhishan Gao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Station and method for translationally detecting glaze defects on g...
Patent number
12,181,419
Issue date
Dec 31, 2024
TIAMA
Laurent Cosneau
G01 - MEASURING TESTING
Information
Patent Grant
System and method for monitoring health of low-cost sensors used in...
Patent number
12,175,680
Issue date
Dec 24, 2024
TATA Consultancy Services Limited
Prachin Lalit Jain
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for automatically reconstituting the reinforcing architectur...
Patent number
12,159,396
Issue date
Dec 3, 2024
SAFRAN AIRCRAFT ENGINES
Yanneck Wielhorski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Broadband wafer defect detection
Patent number
12,158,434
Issue date
Dec 3, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Nai-Han Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Method for multivariate testing, development, and validation of a m...
Patent number
12,158,432
Issue date
Dec 3, 2024
Stratasys, Inc.
Joel Ong
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Grant
Inspection system, inspection method, and inspection program
Patent number
12,148,145
Issue date
Nov 19, 2024
Mitsubishi Heavy Industries, Ltd.
Takahiro Tachibana
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Product-inspection apparatus, product-inspection method, and non-tr...
Patent number
12,148,143
Issue date
Nov 19, 2024
NEC Corporation
Keiko Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cutter analysis and mapping
Patent number
12,141,960
Issue date
Nov 12, 2024
Halliburton Energy Services, Inc.
William Brian Atkins
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for checking compliance of a mechanical part of a vehicle
Patent number
12,135,293
Issue date
Nov 5, 2024
JTEKT Europe
Sarah Tallet-Pinet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface inspection system for foil article
Patent number
12,111,268
Issue date
Oct 8, 2024
KAPITO INC.
Feng-Tso Sun
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for detecting surface type of object and artificial neural n...
Patent number
12,111,267
Issue date
Oct 8, 2024
Getac Holdings Corporation
Kun-Yu Tsai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device, inspection method, machine learning device, and...
Patent number
12,094,102
Issue date
Sep 17, 2024
Sintokogio, Ltd.
Takehiro Sugino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device and coating apparatus equipped with the same
Patent number
12,085,514
Issue date
Sep 10, 2024
Daifuku Co., Ltd.
Masahiro Ooe
G01 - MEASURING TESTING
Information
Patent Grant
Processing method and processing device
Patent number
12,085,512
Issue date
Sep 10, 2024
Lenovo (Beijing) Limited
Wei Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection method based on edge field and deep learning
Patent number
12,078,599
Issue date
Sep 3, 2024
Cognex Corporation
Hunmin Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimized printing defect compensation using automatic job image re...
Patent number
12,076,976
Issue date
Sep 3, 2024
Xerox Corporation
Dara N. Lubin
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
Portable visual inspection apparatus and method for inspecting article
Patent number
12,072,296
Issue date
Aug 27, 2024
Tyco Electronics (Shanghai) Co., Ltd.
Lei (Alex) Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for synthesizing a diamond using machine learning
Patent number
12,072,299
Issue date
Aug 27, 2024
Fraunhofer USA, Inc.
Rohan Reddy Mekala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimized path planning for defect inspection based on effective re...
Patent number
12,063,442
Issue date
Aug 13, 2024
Hong Kong Applied Science and Technology Research Institute Company Limited
Tai Wai David Chik
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Characterization system and method with guided defect discovery
Patent number
12,062,165
Issue date
Aug 13, 2024
KLA Corporation
Bradley Ries
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer surface defect inspection method and apparatus thereof
Patent number
12,044,631
Issue date
Jul 23, 2024
GlobalWafers Co., Ltd.
Shang-Chi Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting defects in product and computer device
Patent number
12,045,970
Issue date
Jul 23, 2024
Hon Hai Precision Industry Co., Ltd.
Chin-Pin Kuo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for evaluating defect in monoclinic gallium oxide
Patent number
12,038,388
Issue date
Jul 16, 2024
The Industry & Academic Cooperation in Chungnam National University (IAC)
Soon-Ku Hong
C30 - CRYSTAL GROWTH
Information
Patent Grant
Detection method of crease degree of screen and visual detection de...
Patent number
12,025,570
Issue date
Jul 2, 2024
WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
Yali Liu
G01 - MEASURING TESTING
Information
Patent Grant
Stamping line defect quality monitoring systems and methods of moni...
Patent number
12,023,722
Issue date
Jul 2, 2024
Ford Global Technologies, LLC
Raj Sohmshetty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for simulating the optical power of a laminated glass
Patent number
12,026,439
Issue date
Jul 2, 2024
Saint-Gobain Glass France
Yolande Sikali Mamden
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Quality detection method for porous metal material
Patent number
12,025,552
Issue date
Jul 2, 2024
HANGZHOU DIANZI UNIVERSITY
Chuanyong Wang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and methods for inspecting an optical surface of...
Patent number
12,025,565
Issue date
Jul 2, 2024
The Boeing Company
Fei Cai
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR CALENDERING AN ELECTRODE TAPE, AND CALENDERING DEVICE
Publication number
20250015253
Publication date
Jan 9, 2025
Volkswagen Aktiengesellschaft
Ludger BUSSWINKEL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
Publication number
20250014164
Publication date
Jan 9, 2025
ASML NETHERLANDS B.V.
Vasco Tomas TENNER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GAS LEAK DETECTION DEVICE AND DETECTING METHOD
Publication number
20250012655
Publication date
Jan 9, 2025
VIA TECHNOLOGIES, INC.
Yeh Cho
G08 - SIGNALLING
Information
Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
Publication number
20250003888
Publication date
Jan 2, 2025
Onto Innovation Inc.
John M. Thornell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PORTABLE SCANNING DEVICE FOR ASCERTAINING ATTRIBUTES OF SAMPLE MATE...
Publication number
20250003887
Publication date
Jan 2, 2025
BRITESCAN, INC.
Danica HARBAUGH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EXAMINATION APPARATUS
Publication number
20250003890
Publication date
Jan 2, 2025
FUJIFILM CORPORATION
Yoshinobu MIURA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND NON-TRANSI...
Publication number
20250003889
Publication date
Jan 2, 2025
Canon Kabushiki Kaisha
Tomoe Kikuchi
G01 - MEASURING TESTING
Information
Patent Application
Product Detection System
Publication number
20240426762
Publication date
Dec 26, 2024
TE Connectivity Solutions GMBH
Qing (Carrie) Zhou
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
Publication number
20240426750
Publication date
Dec 26, 2024
Heraeus Quartz North America LLC
Maximilian SCHMITT
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IDENTIFYING AND CHARACTERIZING, BY MEANS OF ARTIFICIAL I...
Publication number
20240404032
Publication date
Dec 5, 2024
Brembo S.p.A.
Stefano BELOTTI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
Publication number
20240402093
Publication date
Dec 5, 2024
ASML NETHERLANDS B.V.
Xiaodong MENG
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
GEMSTONE ANALYSIS DEVICE, SYSTEM, AND METHOD USING NEURAL NETWORKS
Publication number
20240393255
Publication date
Nov 28, 2024
Parikh Holdings LLC
Aniket Parikh
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
Publication number
20240393258
Publication date
Nov 28, 2024
WICKON HIGHTECH GMBH
Roman WIESER
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
Publication number
20240393261
Publication date
Nov 28, 2024
PRECITEC OPTRONIK GMBH
Tobias Beck
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...
Publication number
20240385121
Publication date
Nov 21, 2024
Musashi AI North America Inc.
Saeed Bakhshmand
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION METHOD BASED ON EDGE FIELD AND DEEP LEARNING
Publication number
20240385122
Publication date
Nov 21, 2024
COGNEX CORPORATION
Hunmin CHO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR PREDICTING THE EVOLUTION OF A DEFECT OF A BEARING, ASSOC...
Publication number
20240377283
Publication date
Nov 14, 2024
Aktiebolaget SKF
Mourad CHENNAOUI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE SENSOR AND ELECTRONIC CAMERA
Publication number
20240377628
Publication date
Nov 14, 2024
Nikon Corporation
Osamu SARUWATARI
G01 - MEASURING TESTING
Information
Patent Application
WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...
Publication number
20240369498
Publication date
Nov 7, 2024
Republic of Korea (National Forensic Service Director Ministry of the Interio...
Kyu Young LIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR DEFECT DETECTION USING VISIBLE LIGHT CAMERAS...
Publication number
20240354930
Publication date
Oct 24, 2024
EIGEN INNOVATIONS INC.
Jacob WILSON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUF...
Publication number
20240353350
Publication date
Oct 24, 2024
Samsung Electronics Co., Ltd.
Kihong CHUNG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MONITORING APPARATUS AND OPERATION METHOD THEREOF
Publication number
20240353348
Publication date
Oct 24, 2024
LG ENERGY SOLUTION, LTD.
Min Ji KIM
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD FOR FINDING BLACK SPOTS IN SEPARATOR
Publication number
20240337602
Publication date
Oct 10, 2024
Samsung SDI Co., Ltd.
Jungyi YU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPEARANCE INSPECTING DEVICE, WELDING SYSTEM, SHAPE DATA CORRECTING...
Publication number
20240337604
Publication date
Oct 10, 2024
Panasonic Intellectual Property Management Co., Ltd.
Toru SAKAI
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD AND APPARATUS FOR DETERMINING QUALITY OF SEMICONDUCTOR CHIP
Publication number
20240337607
Publication date
Oct 10, 2024
OPTO SYSTEM CO., LTD.
Kenichi IKEDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR ASSESSING THE STATE OF A PRESSING PUNCH
Publication number
20240326369
Publication date
Oct 3, 2024
FETTE COMPACTING GMBH
Sven Vulp
B30 - PRESSES
Information
Patent Application
MOTION BASED DYNAMIC TENSIOMETER FOR DETECTING THE PRESENCE OF SURF...
Publication number
20240328959
Publication date
Oct 3, 2024
ECOLAB USA INC.
Stephan Doerries
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTION METHOD OF CREASE DEGREE OF SCREEN AND VISUAL DETECTION AP...
Publication number
20240310295
Publication date
Sep 19, 2024
Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd.
Yali LIU
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER
Publication number
20240302288
Publication date
Sep 12, 2024
Japan Tobacco Inc.
Shota KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
Virtual color sensor for recognizing and distinguishing different-c...
Publication number
20240302289
Publication date
Sep 12, 2024
KRONES AG
Ahmad ALSHEIKH
G01 - MEASURING TESTING