Mass spectrometers or separator tubes

Industry

CPC
H01J49/26

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/26Mass spectrometers or separator tubes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Analysis-device selection device and analysis-device selection method
- Patent number 12,140,602
- Issue date Nov 12, 2024
- Shimadzu Corporation
- Takayuki Nakatani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometry method and mass spectrometer
- Patent number 12,111,285
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric barrier discharge ionization, analytical instrument and...
- Patent number 12,106,954
- Issue date Oct 1, 2024
- Shimadzu Corporation
- Yiming Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for identifying microorganisms by mass spectrometry and scor...
- Patent number 12,091,702
- Issue date Sep 17, 2024
- bioMerieux, Inc.
- Grégory Strubel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for rapid exchange of ion sources and ion transmission devices
- Patent number 12,080,540
- Issue date Sep 3, 2024
- Micromass UK Limited
- Paul Murray
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inline chemical agent addition for inline reaction with fluid sampl...
- Patent number 12,074,017
- Issue date Aug 27, 2024
- Elemental Scientific, Inc.
- Charles D. Quarles
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Signal detection device, measurement device, and mass spectrometer
- Patent number 12,066,582
- Issue date Aug 20, 2024
- HITACHI HIGH-TECH CORPORATION
- Takuma Nishimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Axial CI source—off-axis electron beam
- Patent number 12,014,916
- Issue date Jun 18, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector having improved construction
- Patent number 11,978,616
- Issue date May 7, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-assisted laser desorption/ionization method, mass spectrome...
- Patent number 11,961,728
- Issue date Apr 16, 2024
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identification of sample subspecies based on particle mass and char...
- Patent number 11,942,317
- Issue date Mar 26, 2024
- The Trustees of Indiana University
- David E. Clemmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coupled-amplifier multi-frequency circuit topologies applicable to...
- Patent number 11,935,735
- Issue date Mar 19, 2024
- Agilent Technologies, Inc.
- Michael J. Schoessow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector comprising transmission secondary electron emission means
- Patent number 11,869,757
- Issue date Jan 9, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods, mediums, and systems for identifying samples of interest b...
- Patent number 11,854,780
- Issue date Dec 26, 2023
- WATERS TECHNOLOGIES IRELAND LIMITED
- Nathaniel Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inner source assembly and associated components
- Patent number 11,848,186
- Issue date Dec 19, 2023
- Micromass UK Limited
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator for charged particle beam apparatus and charged partic...
- Patent number 11,846,736
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particulate matter sensor
- Patent number 11,841,307
- Issue date Dec 12, 2023
- The Board of Trustees of the University of Illinois
- Igor Paprotny
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion focusing
- Patent number 11,830,717
- Issue date Nov 28, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Encoding of precursor ion beam to aid product ion assignment
- Patent number 11,817,300
- Issue date Nov 14, 2023
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometric analysis of microbes
- Patent number 11,764,048
- Issue date Sep 19, 2023
- Micromass UK Limited
- Zoltan Takats
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method and apparatus for ion mobility separations utilizing alterna...
- Patent number 11,761,925
- Issue date Sep 19, 2023
- Battelle Memorial Institute
- Venkata B S Garimella
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for quantitative detection of gases
- Patent number 11,761,887
- Issue date Sep 19, 2023
- NATIONAL INSTITUTE OF METROLOGY, CHINA
- Zejian Huang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for delivering reagent ions to a mass spectrometer
- Patent number 11,756,781
- Issue date Sep 12, 2023
- Christopher Mullen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer amplifier compensation
- Patent number 11,728,154
- Issue date Aug 15, 2023
- Peter Komander
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques for rapid detection and quantitation of volatile organic...
- Patent number 11,721,533
- Issue date Aug 8, 2023
- InspectIR Systems, LLC
- Guido Fridolin Verbeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cell population analysis
- Patent number 11,710,627
- Issue date Jul 25, 2023
- Micromass UK Limited
- Emrys Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mass spectrometry system
- Patent number 11,699,579
- Issue date Jul 11, 2023
- APPLIED SCIENCE & TECHNOLOGY SOLUTIONS LTD
- Andrew David Morse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer, mass spectrometry method and detection system
- Patent number 11,694,887
- Issue date Jul 4, 2023
- Shimadzu Corporation
- Yiming Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source assembly with multiple ionization volumes for use in a m...
- Patent number 11,658,020
- Issue date May 23, 2023
- Inficon, Inc.
- Michael F. Vollero
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRY SYSTEM FOR DETERMINING A MEASURE OF A RATE OF DECAY
- Publication number 20240355608
- Publication date Oct 24, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Jan-Peter HAUSCHILD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD
- Publication number 20240310327
- Publication date Sep 19, 2024
- OSAKA UNIVERSITY
- Michisato TOYODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector Having Improved Construction
- Publication number 20240266157
- Publication date Aug 8, 2024
- ADAPTAS SOLUTIONS PTY LTD
- Russell Jurek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IDENTIFICATION OF SAMPLE SUBSPECIES BASED ON PARTICLE CHARGE BEHAVI...
- Publication number 20240242955
- Publication date Jul 18, 2024
- THE TRUSTEES OF INDIANA UNIVERSITY
- David E. CLEMMER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION FOCUSING
- Publication number 20240186133
- Publication date Jun 6, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SUPPLY SYSTEMS AND METHODS
- Publication number 20240145224
- Publication date May 2, 2024
- Micromass UK Limited
- Thomas Moore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR INCREASING REACTION YIELD
- Publication number 20240131490
- Publication date Apr 25, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...
- Publication number 20240128071
- Publication date Apr 18, 2024
- Micromass UK Limited
- Zoltán TAKÁTS
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
- Publication number 20240102962
- Publication date Mar 28, 2024
- SHIMADZU CORPORATION
- Hidenori TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULATING A MASS SPECTROMETER
- Publication number 20240086587
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSING A FIELD OF A MASS SPECTROMETER
- Publication number 20240087871
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Markus Pfeifer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING AN EXPECTED RESPONSE OF A MASS SPECTROMETER
- Publication number 20240087872
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIXING MODEL TO DETERMINE THE COMPOSITION OF PRODUCED WATER USING O...
- Publication number 20240085394
- Publication date Mar 14, 2024
- Saudi Arabian Oil Company
- Sattam S. Mutairi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING, SELECTING AND PURIFYING PARTICLES
- Publication number 20240050895
- Publication date Feb 15, 2024
- THE TRUSTEES OF INDIANA UNIVERSITY
- Brooke A. BROWN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ANALYZING SAMPLES
- Publication number 20240047189
- Publication date Feb 8, 2024
- CMP Scientific Corp.
- Paul Nurmi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ANALYZING SAMPLES
- Publication number 20240047188
- Publication date Feb 8, 2024
- CMP Scientific Corp.
- Joshua Wiley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ION MOBILITY SEPARATIONS UTILIZING ALTERNA...
- Publication number 20240003847
- Publication date Jan 4, 2024
- Battelle Memorial Institute
- Venkata BS Garimella
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED CLINICAL DIAGNOSTIC SYSTEM AND METHOD
- Publication number 20230420240
- Publication date Dec 28, 2023
- Roche Diagnostics Operations, Inc.
- Claudia Epping
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL METHOD OF SAMPLE PRETREATMENT APPARATUS
- Publication number 20230417784
- Publication date Dec 28, 2023
- HITACHI HIGH-TECH CORPORATION
- Akiko SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Image Processing Apparatus and Method
- Publication number 20230377116
- Publication date Nov 23, 2023
- JEOL Ltd.
- Masahiko Takei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADICAL GENERATION DEVICE AND ION SPECTROMETER
- Publication number 20230363076
- Publication date Nov 9, 2023
- SHIMADZU CORPORATION
- Masaji FURUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System And A Method For Determining Characteristics Of Food
- Publication number 20230324357
- Publication date Oct 12, 2023
- Isofoodtrace Limited
- Chung-Lim LUK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
- Publication number 20230307219
- Publication date Sep 28, 2023
- HITACHI HIGH-TECH CORPORATION
- Ryusuke HIROSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION IDENTIFICATION USING ION MOBILITY SPECTROMETRY
- Publication number 20230296561
- Publication date Sep 21, 2023
- Micromass UK Limited
- Martin Raymond GREEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230290625
- Publication date Sep 14, 2023
- Hamamatsu Photonics K.K.
- Takamasa IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION FOCUSING
- Publication number 20230260772
- Publication date Aug 17, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM
- Publication number 20230230826
- Publication date Jul 20, 2023
- Thermo Finnigan LLC
- Scott T. QUARMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROME...
- Publication number 20230207296
- Publication date Jun 29, 2023
- HAMAMATSU PHOTONICS K. K.
- Yasuhide NAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ANALYSING VOLATILE ORGANIC COMPOUNDS (VOC) BY...
- Publication number 20230207300
- Publication date Jun 29, 2023
- Universite de Lille
- Isabelle SALZET
- H01 - BASIC ELECTRIC ELEMENTS

Mass spectrometers or separator tubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Analysis-device selection device and analysis-device selection method

Mass spectrometry method and mass spectrometer

Dielectric barrier discharge ionization, analytical instrument and...

Method for identifying microorganisms by mass spectrometry and scor...

Device for rapid exchange of ion sources and ion transmission devices

Inline chemical agent addition for inline reaction with fluid sampl...

Signal detection device, measurement device, and mass spectrometer

Axial CI source—off-axis electron beam

Detector having improved construction

Surface-assisted laser desorption/ionization method, mass spectrome...

Identification of sample subspecies based on particle mass and char...

Coupled-amplifier multi-frequency circuit topologies applicable to...

Detector comprising transmission secondary electron emission means

Methods, mediums, and systems for identifying samples of interest b...

Inner source assembly and associated components

Scintillator for charged particle beam apparatus and charged partic...

Particulate matter sensor

Ion focusing

Encoding of precursor ion beam to aid product ion assignment

Spectrometric analysis of microbes

Method and apparatus for ion mobility separations utilizing alterna...

Systems and approaches for semiconductor metrology and surface anal...

Apparatus and method for quantitative detection of gases

Apparatus for delivering reagent ions to a mass spectrometer

Spectrometer amplifier compensation

Techniques for rapid detection and quantitation of volatile organic...

Cell population analysis

Mass spectrometry system

Mass spectrometer, mass spectrometry method and detection system

Ion source assembly with multiple ionization volumes for use in a m...

Patents Applicationslast 30 patents

MASS SPECTROMETRY SYSTEM FOR DETERMINING A MEASURE OF A RATE OF DECAY

MASS SPECTROMETRY DEVICE, AND MASS SPECTROMETRY METHOD

Detector Having Improved Construction

IDENTIFICATION OF SAMPLE SUBSPECIES BASED ON PARTICLE CHARGE BEHAVI...

ION FOCUSING

POWER SUPPLY SYSTEMS AND METHODS

SYSTEMS AND METHODS FOR INCREASING REACTION YIELD

INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER

SIMULATING A MASS SPECTROMETER

ANALYSING A FIELD OF A MASS SPECTROMETER

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

DETERMINING AN EXPECTED RESPONSE OF A MASS SPECTROMETER

MIXING MODEL TO DETERMINE THE COMPOSITION OF PRODUCED WATER USING O...

SYSTEM AND METHOD FOR IDENTIFYING, SELECTING AND PURIFYING PARTICLES

SYSTEMS AND METHODS FOR ANALYZING SAMPLES

SYSTEMS AND METHODS FOR ANALYZING SAMPLES

METHOD AND APPARATUS FOR ION MOBILITY SEPARATIONS UTILIZING ALTERNA...

AUTOMATED CLINICAL DIAGNOSTIC SYSTEM AND METHOD

CONTROL METHOD OF SAMPLE PRETREATMENT APPARATUS

Mass Image Processing Apparatus and Method

RADICAL GENERATION DEVICE AND ION SPECTROMETER

System And A Method For Determining Characteristics Of Food

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER

ION IDENTIFICATION USING ION MOBILITY SPECTROMETRY

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

ION FOCUSING

AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM

SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROME...

SYSTEM AND METHOD FOR ANALYSING VOLATILE ORGANIC COMPOUNDS (VOC) BY...