mathematical transformations on beams or signals

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CPC
G01N2223/345

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/345mathematical transformations on beams or signals

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Patents Grantslast 30 patents

Information Patent Grant
Determining atomic coordinates from X-ray diffraction data
- Patent number 11,860,114
- Issue date Jan 2, 2024
- David Hurwitz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for material characterization
- Patent number 11,796,479
- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method and device for acquiring tomographic image data by oversampl...
- Patent number 11,307,153
- Issue date Apr 19, 2022
- Riken
- Takaoki Takanashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for material characterization
- Patent number 11,243,327
- Issue date Feb 8, 2022
- Southern Innovation International Pty Ltd
- Paul Scoullar
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 10,962,485
- Issue date Mar 30, 2021
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Material identification method
- Patent number 10,564,113
- Issue date Feb 18, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating crosslink concentration in crosslinked rubber
- Patent number 10,168,289
- Issue date Jan 1, 2019
- Sumitomo Rubber Industries, Ltd.
- Tomomi Masui
- G01 - MEASURING TESTING
Information Patent Grant
Depth determination in X-ray backscatter system using frequency mod...
- Patent number 9,329,300
- Issue date May 3, 2016
- Nucsafe, Inc.
- Steven W. Pauly
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus and image processing method
- Patent number 9,019,479
- Issue date Apr 28, 2015
- Canon Kabushiki Kaisha
- Kentaro Nagai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Back-projection of a projection image data set with depth-dependent...
- Patent number 8,630,474
- Issue date Jan 14, 2014
- Siemens Aktiengesellschaft
- Frank Dennerlein
- G01 - MEASURING TESTING
Information Patent Grant
Device for processing a measured signal corresponding to the intens...
- Patent number 5,457,727
- Issue date Oct 10, 1995
- U.S. Philips Corporation
- Peter Frijlink
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a given characteristic of a material sample
- Patent number 5,442,676
- Issue date Aug 15, 1995
- U.S. Philips Corporation
- Paul F. Fewster
- G01 - MEASURING TESTING
Information Patent Grant
Method and installation for the analysis by neutron activation of a...
- Patent number 5,162,095
- Issue date Nov 10, 1992
- L'Etat Francais
- Rene Alegre
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis method and apparatus
- Patent number 5,055,679
- Issue date Oct 8, 1991
- Hitachi, Ltd.
- Ken Ninomiya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing the spectral data in an elemental analyzer...
- Patent number 4,171,485
- Issue date Oct 16, 1979
- MDH Industries, Inc.
- J. Howard Marshall
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20230296539
- Publication date Sep 21, 2023
- Rigaku Corporation
- Masatsugu YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION
- Publication number 20230105649
- Publication date Apr 6, 2023
- Saudi Arabian Oil Company
- Mohamed Soua
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ATOMIC COORDINATES FROM X-RAY DIFFRACTION DATA
- Publication number 20210302332
- Publication date Sep 30, 2021
- David HURWITZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR ACQUIRING TOMOGRAPHIC IMAGE DATA BY OVERSAMPL...
- Publication number 20210262947
- Publication date Aug 26, 2021
- Riken
- Takaoki TAKANASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
- Publication number 20210199592
- Publication date Jul 1, 2021
- Southern Innovation International Pty Ltd
- Paul Scoullar
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASE...
- Publication number 20210020272
- Publication date Jan 21, 2021
- Oxford University Innovation Limited
- Andrew Leslie GODWIN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
- Publication number 20190212273
- Publication date Jul 11, 2019
- Paul SCOULLAR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
- Publication number 20190212272
- Publication date Jul 11, 2019
- Paul SCOULLAR
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL IDENTIFICATION METHOD
- Publication number 20180195981
- Publication date Jul 12, 2018
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING CROSSLINK CONCENTRATION IN CROSSLINKED RUBBER
- Publication number 20160349196
- Publication date Dec 1, 2016
- Sumitomo Rubber Industries, Ltd.
- Tomomi MASUI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA
- Publication number 20140306108
- Publication date Oct 16, 2014
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Simon Billinge
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR APPARATUS AND METHOD
- Publication number 20140303932
- Publication date Oct 9, 2014
- Kromek Limited
- Stephen Whitaker SNOW
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND IMAGE PROCESSING METHOD
- Publication number 20140241632
- Publication date Aug 28, 2014
- Kentaro Nagai
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS AND PROGRAM AND METHOD FOR ANALYZING INTERFERENCE...
- Publication number 20140114615
- Publication date Apr 24, 2014
- Canon Kabushiki Kaisha
- Kentaro Nagai
- G01 - MEASURING TESTING
Information Patent Application
AUGER ELEMENTAL IDENTIFICATION ALGORITHM
- Publication number 20130341504
- Publication date Dec 26, 2013
- KLA -TENCOR CORPORATION,
- Mark Neill
- G01 - MEASURING TESTING
Information Patent Application
BACK-PROJECTION OF A PROJECTION IMAGE DATA SET WITH DEPTH-DEPENDENT...
- Publication number 20130028498
- Publication date Jan 31, 2013
- Frank Dennerlein
- G01 - MEASURING TESTING

mathematical transformations on beams or signals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Determining atomic coordinates from X-ray diffraction data

System and method for material characterization

Method and device for acquiring tomographic image data by oversampl...

System and method for material characterization

System and method for material characterization

Material identification method

Method for evaluating crosslink concentration in crosslinked rubber

Depth determination in X-ray backscatter system using frequency mod...

Imaging apparatus and image processing method

Back-projection of a projection image data set with depth-dependent...

Device for processing a measured signal corresponding to the intens...

Method of determining a given characteristic of a material sample

Method and installation for the analysis by neutron activation of a...

Surface analysis method and apparatus

Apparatus for analyzing the spectral data in an elemental analyzer...

Patents Applicationslast 30 patents

CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM

DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION

DETERMINING ATOMIC COORDINATES FROM X-RAY DIFFRACTION DATA

METHOD AND DEVICE FOR ACQUIRING TOMOGRAPHIC IMAGE DATA BY OVERSAMPL...

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASE...

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

MATERIAL IDENTIFICATION METHOD

METHOD FOR EVALUATING CROSSLINK CONCENTRATION IN CROSSLINKED RUBBER

METHOD OF COLLECTING AND PROCESSING ELECTRON DIFFRACTION DATA

DETECTOR APPARATUS AND METHOD

IMAGING APPARATUS AND IMAGE PROCESSING METHOD

IMAGING APPARATUS AND PROGRAM AND METHOD FOR ANALYZING INTERFERENCE...

AUGER ELEMENTAL IDENTIFICATION ALGORITHM

BACK-PROJECTION OF A PROJECTION IMAGE DATA SET WITH DEPTH-DEPENDENT...