Means associated with the vessel for preventing the generation of or for shielding unwanted radiation

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CPC
H01J37/165

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/165Means associated with the vessel for preventing the generation of or for shielding unwanted radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Vacuum compatible X-ray shield
- Patent number 11,972,920
- Issue date Apr 30, 2024
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source cathode
- Patent number 11,961,696
- Issue date Apr 16, 2024
- Ion Technology Solutions, LLC
- Manuel A. Jerez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Faraday shield and apparatus for treating substrate
- Patent number 11,817,291
- Issue date Nov 14, 2023
- PSK Inc.
- Mu-Kyeom Mun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,270,875
- Issue date Mar 8, 2022
- Shimadzu Corporation
- Takuro Kishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,152,202
- Issue date Oct 19, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed CFE electron source with fast blanker for ultrafast TEM appl...
- Patent number 11,114,272
- Issue date Sep 7, 2021
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for proactive mitigation of coronal discharge and flash-over...
- Patent number 10,842,007
- Issue date Nov 17, 2020
- VISURAY INTECH LTD (BVI)
- Philip Teague
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray and particle shield for improved vacuum conductivity
- Patent number 10,748,740
- Issue date Aug 18, 2020
- FEI Company
- Rients Jan De Groot
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Nozzle-type electron beam irradiation device, and electron beam ste...
- Patent number 10,568,980
- Issue date Feb 25, 2020
- Hitachi Zosen Corporation
- Takeshi Noda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Shielded, transmission-target, x-ray tube
- Patent number 10,453,643
- Issue date Oct 22, 2019
- Moxtek, Inc.
- Dustin Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive interface system between vacuum chambers in a charged pa...
- Patent number 10,290,522
- Issue date May 14, 2019
- Hitachi High-Technologies Corporation
- Masashi Fujita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sterilization machine and method for sterilizing packaging containers
- Patent number 10,226,540
- Issue date Mar 12, 2019
- Tetra Laval Holdings & Finance S.A.
- Jonas Dickner
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
XRF analyzer with separate source and detector heat sinks
- Patent number 10,219,363
- Issue date Feb 26, 2019
- Moxtek, Inc.
- Vincent Floyd Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
XRF analyzer with a hand shield
- Patent number 9,961,753
- Issue date May 1, 2018
- Moxtek, Inc.
- Vincent Floyd Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Rotating-anode X-ray tube assembly with cooling system
- Patent number 9,892,883
- Issue date Feb 13, 2018
- Toshiba Electron Tubes & Devices Co., Ltd.
- Hidero Anno
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
XRF analyzer
- Patent number 9,775,574
- Issue date Oct 3, 2017
- Moxtek, Inc.
- Vincent Floyd Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Capacitively coupled plasma source for abating compounds produced i...
- Patent number 9,543,124
- Issue date Jan 10, 2017
- Applied Materials, Inc.
- Michael S. Cox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation and analysis unit
- Patent number 9,268,126
- Issue date Feb 23, 2016
- Carl Zeiss Microscopy GmbH
- Martin Edelmann
- G01 - MEASURING TESTING
Information Patent Grant
Hall effect enhanced capacitively coupled plasma source
- Patent number 9,230,780
- Issue date Jan 5, 2016
- Applied Materials, Inc.
- Michael S. Cox
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Removing byproducts of physical and chemical reactions in an ion im...
- Patent number 7,173,260
- Issue date Feb 6, 2007
- Axcelis Technologies, Inc.
- Maria J. Anc
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus wherein ionizing radiation is generated
- Patent number 6,787,779
- Issue date Sep 7, 2004
- LEO Elektronenmikroskopie GmbH
- Daniel Tobias
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3727026
- Patent number 3,727,026
- Issue date Apr 10, 1973
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
3327112
- Patent number 3,327,112
- Issue date Jun 20, 1967
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
2944172
- Patent number 2,944,172
- Issue date Jul 5, 1960
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICES AND MEMBRANE ASSEMBLIES USEFUL THEREIN
- Publication number 20240412940
- Publication date Dec 12, 2024
- AIRSEM TECHNOLOGIES LTD.
- Jenny SHKLOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Concentrated Solar Irradiation of Targets in Plasmas
- Publication number 20240363308
- Publication date Oct 31, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Jeffrey Daniel ENGERER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Source Cathode
- Publication number 20240145207
- Publication date May 2, 2024
- Ion Technology Solutions, LLC
- Manuel A. Jerez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROWAVE DRIVEN PLASMA ION SOURCE
- Publication number 20230164903
- Publication date May 25, 2023
- TOFWERK AG
- Martin TANNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM COMPATIBLE X-RAY SHIELD
- Publication number 20230162942
- Publication date May 25, 2023
- FEI Company
- Pleun Dona
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FARADAY SHIELD AND APPARATUS FOR TREATING SUBSTRATE
- Publication number 20220230839
- Publication date Jul 21, 2022
- PSK INC.
- Mu-Kyeom MUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCED SUBSTRATE PROCESS CHAMBER CAVITY VOLUME
- Publication number 20220223367
- Publication date Jul 14, 2022
- Applied Materials, Inc.
- Kirankumar Neelasandra SAVANDAIAH
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PULSED CFE ELECTRON SOURCE WITH FAST BLANKER FOR ULTRAFAST TEM APPL...
- Publication number 20210090846
- Publication date Mar 25, 2021
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-Ray and Particle Shield for Improved Vacuum Conductivity
- Publication number 20200066479
- Publication date Feb 27, 2020
- FEI Company
- Rients Jan DE GROOT
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
XRF Analyzer with Separate Source and Detector Heat Sinks
- Publication number 20180228009
- Publication date Aug 9, 2018
- Moxtek, Inc.
- Vincent Floyd Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
STERILIZATION MACHINE AND METHOD FOR STERILIZING PACKAGING CONTAINERS
- Publication number 20170049914
- Publication date Feb 23, 2017
- TETRA LAVAL HOLDINGS & FINANCE S.A.
- Jonas DICKNER
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
PLASMA PROCESSING APPARATUS
- Publication number 20160358758
- Publication date Dec 8, 2016
- TOKYO ELECTRON LIMITED
- Takahiro HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20160133433
- Publication date May 12, 2016
- Hitachi High-Technologies Corporation
- Masashi FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HALL EFFECT ENHANCED CAPACITIVELY COUPLED PLASMA SOURCE
- Publication number 20160118226
- Publication date Apr 28, 2016
- Applied Materials, Inc.
- Michael S. COX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HALL EFFECT ENHANCED CAPACITIVELY COUPLED PLASMA SOURCE
- Publication number 20150255251
- Publication date Sep 10, 2015
- Applied Materials, Inc.
- Michael S. COX
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOP OPENING-CLOSING MECHANISM AND INSPECTION APPARATUS
- Publication number 20150221469
- Publication date Aug 6, 2015
- EBARA CORPORATION
- Matsutaro MIYAMOTO
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
OBSERVATION AND ANALYSIS UNIT
- Publication number 20120168623
- Publication date Jul 5, 2012
- CARL ZEISS MICROIMAGING GMBH
- Martin Edelmann
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VAC...
- Publication number 20110042579
- Publication date Feb 24, 2011
- MAPPER LITHOGRAPHY IP BV
- Guido DE BOER
- B82 - NANO-TECHNOLOGY
Information Patent Application
DC only tool cell with a charged particle beam system
- Publication number 20070085029
- Publication date Apr 19, 2007
- Bruce B. Baxter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Removing byproducts of physical and chemical reactions in an ion im...
- Publication number 20060131514
- Publication date Jun 22, 2006
- Axcelis Technologies, Inc.
- Maria J. Anc
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus wherein ionizing radiation is generated
- Publication number 20030116722
- Publication date Jun 26, 2003
- Daniel Tobias
- H01 - BASIC ELECTRIC ELEMENTS

Means associated with the vessel for preventing the generation of or for shielding unwanted radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Vacuum compatible X-ray shield

Ion source cathode

Faraday shield and apparatus for treating substrate

Mass spectrometer

Time-of-flight mass spectrometer

Pulsed CFE electron source with fast blanker for ultrafast TEM appl...

Method for proactive mitigation of coronal discharge and flash-over...

X-ray and particle shield for improved vacuum conductivity

Nozzle-type electron beam irradiation device, and electron beam ste...

Shielded, transmission-target, x-ray tube

Conductive interface system between vacuum chambers in a charged pa...

Sterilization machine and method for sterilizing packaging containers

XRF analyzer with separate source and detector heat sinks

XRF analyzer with a hand shield

Rotating-anode X-ray tube assembly with cooling system

XRF analyzer

Capacitively coupled plasma source for abating compounds produced i...

Observation and analysis unit

Hall effect enhanced capacitively coupled plasma source

Removing byproducts of physical and chemical reactions in an ion im...

Apparatus wherein ionizing radiation is generated

3727026

3327112

2944172

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICES AND MEMBRANE ASSEMBLIES USEFUL THEREIN

Concentrated Solar Irradiation of Targets in Plasmas

Ion Source Cathode

MICROWAVE DRIVEN PLASMA ION SOURCE

VACUUM COMPATIBLE X-RAY SHIELD

FARADAY SHIELD AND APPARATUS FOR TREATING SUBSTRATE

REDUCED SUBSTRATE PROCESS CHAMBER CAVITY VOLUME

PULSED CFE ELECTRON SOURCE WITH FAST BLANKER FOR ULTRAFAST TEM APPL...

X-Ray and Particle Shield for Improved Vacuum Conductivity

XRF Analyzer with Separate Source and Detector Heat Sinks

STERILIZATION MACHINE AND METHOD FOR STERILIZING PACKAGING CONTAINERS

PLASMA PROCESSING APPARATUS

Charged Particle Beam Device

HALL EFFECT ENHANCED CAPACITIVELY COUPLED PLASMA SOURCE

HALL EFFECT ENHANCED CAPACITIVELY COUPLED PLASMA SOURCE

TOP OPENING-CLOSING MECHANISM AND INSPECTION APPARATUS

OBSERVATION AND ANALYSIS UNIT

CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VAC...

DC only tool cell with a charged particle beam system

Removing byproducts of physical and chemical reactions in an ion im...

Apparatus wherein ionizing radiation is generated