Means for interchanging parts of the lens

Industry

CPC
H01J37/1413

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/1413Means for interchanging parts of the lens

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multistage-connected multipole, multistage multipole unit, and char...
- Patent number 11,769,650
- Issue date Sep 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideto Dohi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multipole unit and charged particle beam device
- Patent number 11,769,649
- Issue date Sep 26, 2023
- HITACHI HIGH-TECH CORPORATION
- Masanori Mita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,640,897
- Issue date May 2, 2023
- Hitachi High-Technologies Corporation
- Ryo Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,430,630
- Issue date Aug 30, 2022
- Hitachi High-Technologies Corporation
- Ryo Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope with an objective electro...
- Patent number 10,381,193
- Issue date Aug 13, 2019
- TESCAN Brno, s.r.o.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,478,389
- Issue date Oct 25, 2016
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Desktop electron microscope and combined round-multipole magnetic l...
- Patent number 9,343,261
- Issue date May 17, 2016
- National Tsing Hua University
- Wei-Yu Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Desktop electron microscope and wide range tunable magnetic lens th...
- Patent number 9,305,741
- Issue date Apr 5, 2016
- National Tsing Hua University
- Wei-Yu Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configurable charged-particle apparatus
- Patent number 8,829,470
- Issue date Sep 9, 2014
- FEI Company
- Lubomir Tuma
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electric-magnetic field-generating element and assembling method fo...
- Patent number 7,429,740
- Issue date Sep 30, 2008
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Carlo Salvesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lens for a scanning electron microscope
- Patent number 6,906,335
- Issue date Jun 14, 2005
- National University of Singapore
- Anjam Khursheed
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for adjusting a focal position of an electron beam and el...
- Patent number 5,272,347
- Issue date Dec 21, 1993
- Fujitsu Limited
- Yoshihisa Oae
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
LENS FOR A CHARGED PARTICLE BEAM APPARATUS, CHARGED PARTICLE BEAM A...
- Publication number 20240212968
- Publication date Jun 27, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Benjamin Cook
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS, MULTI-ELECTRON BEA...
- Publication number 20230102715
- Publication date Mar 30, 2023
- NuFlare Technology, Inc.
- Kazuhiko INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS, AND MULTI-ELECTRON...
- Publication number 20230077403
- Publication date Mar 16, 2023
- NuFlare Technology, Inc.
- Kazuhiko INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multipole Unit and Charged Particle Beam Device
- Publication number 20220270844
- Publication date Aug 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Masanori MITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE SOLENOID MAGNETIC LENS
- Publication number 20220148844
- Publication date May 12, 2022
- IMATREX, INC.
- Roy E. Rand
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multistage-Connected Multipole, Multistage Multipole Unit, and Char...
- Publication number 20220037113
- Publication date Feb 3, 2022
- Hitachi High-Tech Corporation
- Hideto DOHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200251304
- Publication date Aug 6, 2020
- Hitachi High-Technologies Corporation
- Ryo HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20200219697
- Publication date Jul 9, 2020
- Hitachi High-Technologies Corporation
- Ryo HIRANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Transmission Electron Microscope With An Objective Electro...
- Publication number 20180269030
- Publication date Sep 20, 2018
- TESCAN ORSAY HOLDING, a.s.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESKTOP ELECTRON MICROSCOPE AND COMBINED ROUND-MULTIPOLE MAGNETIC L...
- Publication number 20160042911
- Publication date Feb 11, 2016
- National Tsing-Hua University
- WEI-YU CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESKTOP ELECTRON MICROSCOPE AND WIDE RANGE TUNABLE MAGNETIC LENS TH...
- Publication number 20160042910
- Publication date Feb 11, 2016
- National Tsing-Hua University
- WEI-YU CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Configurable Charged-Particle Apparatus
- Publication number 20140110597
- Publication date Apr 24, 2014
- FEI Company
- Lubomir Tuma
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Electric-magnetic field-generating element and assembling method fo...
- Publication number 20070023673
- Publication date Feb 1, 2007
- ICT. INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUR HALBLEITERPRUFTECHNIK MBH
- Carlo Salvesen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lens for a scanning electron microscope
- Publication number 20040084620
- Publication date May 6, 2004
- Anjam Khursheed
- G01 - MEASURING TESTING

Means for interchanging parts of the lens

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multistage-connected multipole, multistage multipole unit, and char...

Multipole unit and charged particle beam device

Charged particle beam device

Charged particle beam apparatus

Scanning transmission electron microscope with an objective electro...

Scanning electron microscope

Desktop electron microscope and combined round-multipole magnetic l...

Desktop electron microscope and wide range tunable magnetic lens th...

Configurable charged-particle apparatus

Electric-magnetic field-generating element and assembling method fo...

Lens for a scanning electron microscope

Apparatus for adjusting a focal position of an electron beam and el...

Patents Applicationslast 30 patents

LENS FOR A CHARGED PARTICLE BEAM APPARATUS, CHARGED PARTICLE BEAM A...

MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS, MULTI-ELECTRON BEA...

MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS, AND MULTI-ELECTRON...

Multipole Unit and Charged Particle Beam Device

COMPOSITE SOLENOID MAGNETIC LENS

Multistage-Connected Multipole, Multistage Multipole Unit, and Char...

Charged Particle Beam Device

Charged Particle Beam Apparatus

Scanning Transmission Electron Microscope With An Objective Electro...

DESKTOP ELECTRON MICROSCOPE AND COMBINED ROUND-MULTIPOLE MAGNETIC L...

DESKTOP ELECTRON MICROSCOPE AND WIDE RANGE TUNABLE MAGNETIC LENS TH...

Configurable Charged-Particle Apparatus

Electric-magnetic field-generating element and assembling method fo...

Lens for a scanning electron microscope