Means for introducing and/or outputting objects

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CPC
H01J2237/204

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/204Means for introducing and/or outputting objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and methods for automated processing of multiple samples in...
- Patent number 12,165,833
- Issue date Dec 10, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum apparatus
- Patent number 12,142,512
- Issue date Nov 12, 2024
- NuFlare Technology, Inc.
- Yoshiaki Shinohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample protection device for scanning electron microscopy
- Patent number 12,040,156
- Issue date Jul 16, 2024
- SHANGHAI NEMOR OPTOELECTRONIC TECHNOLOGY CO., LTD.
- Xuan Tang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum transfer assembly
- Patent number 11,994,663
- Issue date May 28, 2024
- HennyZ B.V.
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing apparatus
- Patent number 11,978,654
- Issue date May 7, 2024
- Semes Co., Ltd.
- Min Sung Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryotransfer holder and workstation
- Patent number 11,908,655
- Issue date Feb 20, 2024
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,881,377
- Issue date Jan 23, 2024
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 11,631,569
- Issue date Apr 18, 2023
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,450,507
- Issue date Sep 20, 2022
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Positioning samples for microscopy, inspection, or analysis
- Patent number 11,398,365
- Issue date Jul 26, 2022
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder, ion milling apparatus, sample processing method, sam...
- Patent number 11,226,273
- Issue date Jan 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Atsushi Kamino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sputter deposition apparatus including roller assembly and method
- Patent number 11,177,412
- Issue date Nov 16, 2021
- Beijing Apollo Ding Rong Solar Technology Co., Ltd.
- Thomas Heckel
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System for dynamically compensating position errors of a sample
- Patent number 11,127,618
- Issue date Sep 21, 2021
- ASML Netherlands B.V.
- Fangfu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Paint hardening device and paint hardening method
- Patent number 11,097,310
- Issue date Aug 24, 2021
- Toyota Jidosha Kabushiki Kaisha
- Atsuo Nabeshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,075,055
- Issue date Jul 27, 2021
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 11,024,481
- Issue date Jun 1, 2021
- FEI Company
- Karel Diederick Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coating arrangement and method
- Patent number 11,021,787
- Issue date Jun 1, 2021
- VON ARDENNE Asset GmbH & Co. KG
- Carsten Deus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-piece substrate holder and alignment mechanism
- Patent number 10,854,772
- Issue date Dec 1, 2020
- Intevac, Inc.
- Hoang Huy Vu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryotransfer holder and workstation
- Patent number 10,832,887
- Issue date Nov 10, 2020
- Gatan, Inc.
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reduced workpiece adhesion due to electrostat...
- Patent number 10,825,645
- Issue date Nov 3, 2020
- Varian Semiconductor Equipment Associates, Inc.
- Eric D. Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope specimen and method of manufacturi...
- Patent number 10,804,071
- Issue date Oct 13, 2020
- National Chiao Tung University
- Wen-Wei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for large-scale high throughput quantitative c...
- Patent number 10,804,073
- Issue date Oct 13, 2020
- THE NCS TESTING TECHNOLOGY CO., LTD.
- Haizhou Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,796,879
- Issue date Oct 6, 2020
- Phenom-World Holding B.V.
- Karel Diederick Van Der Mast
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for dust emitting of foreign matter and dust emission cause...
- Patent number 10,748,742
- Issue date Aug 18, 2020
- HITACHI HIGH-TECH CORPORATION
- Hiroyuki Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of observing liquid specimen, method of analyzing liquid spe...
- Patent number 10,741,357
- Issue date Aug 11, 2020
- Jeol Ltd.
- Noriyuki Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam sample preparation and coating apparatus and methods
- Patent number 10,731,246
- Issue date Aug 4, 2020
- Gatan, Inc.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correlation microscope
- Patent number 10,663,708
- Issue date May 26, 2020
- Nakamura Sangyo Gakuen
- Shinichiro Isobe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cryostation system
- Patent number 10,658,150
- Issue date May 19, 2020
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Method for enabling modular part replacement within an electron mic...
- Patent number 10,586,679
- Issue date Mar 10, 2020
- PROTOCHIPS, INC.
- Daniel Stephen Gardiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample stage
- Patent number 10,580,613
- Issue date Mar 3, 2020
- Phenom-World Holding B.V.
- Gerhardus Bernardus Stamsnijder
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM
- Publication number 20240420916
- Publication date Dec 19, 2024
- ASML NETHERLANDS B.V.
- Xiaoyu JI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND ELECTRON MICROSCOPE
- Publication number 20240404781
- Publication date Dec 5, 2024
- Hitachi Ltd.
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device For Interfacing A Sample Transfer Device To An Analytic Or S...
- Publication number 20240274399
- Publication date Aug 15, 2024
- Ferrovac AG
- Urs MAIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20240212972
- Publication date Jun 27, 2024
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE, SAMPLE ANALYSIS...
- Publication number 20240153734
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Yeoseon Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLUME FILLING CASSETTE FOR LOAD LOCK
- Publication number 20240153733
- Publication date May 9, 2024
- Applied Materials, Inc.
- Michael Mason Carrell
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Systems And Methods For Transferring A Sample
- Publication number 20240112879
- Publication date Apr 4, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM OF SCANNING ELECTRON MICROSCOPE SAMPLE BOX AND METHOD OF OPE...
- Publication number 20240014001
- Publication date Jan 11, 2024
- UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
- Hongmin Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, LOADING DEVICE, AND METHOD FOR INSERTING A SAMPLE IN...
- Publication number 20230386779
- Publication date Nov 30, 2023
- Leica Mikrosysteme GmbH
- Thomas Pfeifer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHODS FOR AUTOMATED PROCESSING OF MULTIPLE SAMPLES IN...
- Publication number 20230377833
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...
- Publication number 20230170178
- Publication date Jun 1, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE TRANSFER DEVICE
- Publication number 20230039753
- Publication date Feb 9, 2023
- Leica Mikrosysteme GmbH
- Heinz PLANK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20220415607
- Publication date Dec 29, 2022
- RICHARD JOSEPH PICKREIGN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR POSITIONING OBJECTS IN A PARTICLE BEAM MICROSCOPE WITH T...
- Publication number 20220375714
- Publication date Nov 24, 2022
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20220223371
- Publication date Jul 14, 2022
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transport Device and Charged Particle Beam System
- Publication number 20220223369
- Publication date Jul 14, 2022
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PROTECTION DEVICE FOR SCANNING ELECTRON MICROSCOPY
- Publication number 20220216031
- Publication date Jul 7, 2022
- SHANGHAI NEMOR OPTOELECTRONIC TECHNOLOGY CO., LTD
- Xuan TANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20210343498
- Publication date Nov 4, 2021
- RICHARD JOSEPH PICKREIGN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF POST-CURING ADDITIVE MANUFACTURING PARTS USING ELECTRON...
- Publication number 20210331394
- Publication date Oct 28, 2021
- FORD GLOBAL TECHNOLOGIES, L.L.C.
- Christopher Michael Seubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20210125854
- Publication date Apr 29, 2021
- SEMES CO. LTD.
- MIN SUNG HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYOTRANSFER HOLDER AND WORKSTATION
- Publication number 20210110991
- Publication date Apr 15, 2021
- Gatan, Inc.
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED MULTI-GRID HANDLING APPARATUS
- Publication number 20210082657
- Publication date Mar 18, 2021
- RICHARD JOSEPH PICKREIGN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM TRANSFER ASSEMBLY
- Publication number 20210055534
- Publication date Feb 25, 2021
- HennyZ B.V.
- Hendrik Willem ZANDBERGEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20200402760
- Publication date Dec 24, 2020
- Phenom-World Holding B.V.
- Karel Diederick VAN DER MAST
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PAINT HARDENING DEVICE AND PAINT HARDENING METHOD
- Publication number 20200306792
- Publication date Oct 1, 2020
- Toyota Jidosha Kabushiki Kaisha
- Atsuo NABESHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR LARGE-SCALE HIGH THROUGHPUT QUANTITATIVE C...
- Publication number 20200294760
- Publication date Sep 17, 2020
- THE NCS TESTING TECHNOLOGY CO., LTD.
- Haizhou WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VACUUM SPUTTERING APPARATUS AND ITS VACUUM ATMOSPHERE EXCHANGE DEVICE
- Publication number 20200123648
- Publication date Apr 23, 2020
- Qiuping HUANG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE SPECIMEN AND METHOD OF MANUFACTURI...
- Publication number 20200027691
- Publication date Jan 23, 2020
- NATIONAL CHIAO-TUNG UNIVERSITY
- Wen-Wei WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Coating arrangement and method
- Publication number 20200017953
- Publication date Jan 16, 2020
- VON ARDENNE Asset GmbH & Co. KG
- Carsten DEUS
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of Observing Liquid Specimen, Method of Analyzing Liquid Spe...
- Publication number 20190295813
- Publication date Sep 26, 2019
- JEOL Ltd.
- Noriyuki Inoue
- H01 - BASIC ELECTRIC ELEMENTS

Means for introducing and/or outputting objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and methods for automated processing of multiple samples in...

Vacuum apparatus

Sample protection device for scanning electron microscopy

Vacuum transfer assembly

Substrate processing apparatus

Cryotransfer holder and workstation

Automated multi-grid handling apparatus

Charged particle beam system

Automated multi-grid handling apparatus

Positioning samples for microscopy, inspection, or analysis

Sample holder, ion milling apparatus, sample processing method, sam...

Sputter deposition apparatus including roller assembly and method

System for dynamically compensating position errors of a sample

Paint hardening device and paint hardening method

Automated multi-grid handling apparatus

Scanning electron microscope

Coating arrangement and method

Multi-piece substrate holder and alignment mechanism

Cryotransfer holder and workstation

System and method for reduced workpiece adhesion due to electrostat...

Transmission electron microscope specimen and method of manufacturi...

Apparatus and method for large-scale high throughput quantitative c...

Scanning electron microscope

Device for dust emitting of foreign matter and dust emission cause...

Method of observing liquid specimen, method of analyzing liquid spe...

Ion beam sample preparation and coating apparatus and methods

Correlation microscope

Cryostation system

Method for enabling modular part replacement within an electron mic...

Sample stage

Patents Applicationslast 30 patents

WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM

SAMPLE HOLDER AND ELECTRON MICROSCOPE

Device For Interfacing A Sample Transfer Device To An Analytic Or S...

Automated Multi-Grid Handling Apparatus

SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE, SAMPLE ANALYSIS...

VOLUME FILLING CASSETTE FOR LOAD LOCK

Systems And Methods For Transferring A Sample

SYSTEM OF SCANNING ELECTRON MICROSCOPE SAMPLE BOX AND METHOD OF OPE...

SAMPLE HOLDER, LOADING DEVICE, AND METHOD FOR INSERTING A SAMPLE IN...

SYSTEM AND METHODS FOR AUTOMATED PROCESSING OF MULTIPLE SAMPLES IN...

RAPID AND AUTOMATIC VIRUS IMAGING AND ANALYSIS SYSTEM AS WELL AS ME...

SAMPLE TRANSFER DEVICE

Automated Multi-Grid Handling Apparatus

METHOD FOR POSITIONING OBJECTS IN A PARTICLE BEAM MICROSCOPE WITH T...

Charged Particle Beam System

Transport Device and Charged Particle Beam System

SAMPLE PROTECTION DEVICE FOR SCANNING ELECTRON MICROSCOPY

Automated Multi-Grid Handling Apparatus

METHODS OF POST-CURING ADDITIVE MANUFACTURING PARTS USING ELECTRON...

SUBSTRATE PROCESSING APPARATUS

CRYOTRANSFER HOLDER AND WORKSTATION

AUTOMATED MULTI-GRID HANDLING APPARATUS

VACUUM TRANSFER ASSEMBLY

SCANNING ELECTRON MICROSCOPE

PAINT HARDENING DEVICE AND PAINT HARDENING METHOD

APPARATUS AND METHOD FOR LARGE-SCALE HIGH THROUGHPUT QUANTITATIVE C...

VACUUM SPUTTERING APPARATUS AND ITS VACUUM ATMOSPHERE EXCHANGE DEVICE

TRANSMISSION ELECTRON MICROSCOPE SPECIMEN AND METHOD OF MANUFACTURI...

Coating arrangement and method

Method of Observing Liquid Specimen, Method of Analyzing Liquid Spe...