Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences

Industry

CPC
G01Q30/18

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/18Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Systems, method and computer-accessible medium for providing balanc...
- Patent number 11,835,545
- Issue date Dec 5, 2023
- The Trustees of Columbia University In the City of New York
- Alexander Swinton McLeod
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Frequency modulation detection for photo induced force microscopy
- Patent number 10,955,437
- Issue date Mar 23, 2021
- MOLECULAR VISTA, INC.
- Thomas R. Albrecht
- G01 - MEASURING TESTING
Information Patent Grant
System and method for preparing cryo-em grids
- Patent number 10,866,172
- Issue date Dec 15, 2020
- Neptune Fluid Flow Systems LLC
- Trevor Allen McQueen
- G01 - MEASURING TESTING
Information Patent Grant
Sample container mounting member and sample container sealing method
- Patent number 10,830,791
- Issue date Nov 10, 2020
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,697,997
- Issue date Jun 30, 2020
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and light intensity adjusting method
- Patent number 10,598,691
- Issue date Mar 24, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
High magnetic field scanning probe microscope employing liquid heli...
- Patent number 10,539,590
- Issue date Jan 21, 2020
- FUDAN UNIVERSITY
- Shiwei Wu
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 10,416,190
- Issue date Sep 17, 2019
- Oxford Instruments Asylum Research Inc
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Sample vessel retention structure for scanning probe microscope
- Patent number 10,175,263
- Issue date Jan 8, 2019
- Bruker Nano, Inc.
- Charles Meyer
- G02 - OPTICS
Information Patent Grant
Scanning probe microscope with a reduced Q-factor
- Patent number 9,897,626
- Issue date Feb 20, 2018
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Femke Chantal Tabak
- G01 - MEASURING TESTING
Information Patent Grant
Modular atomic force microscope with environmental controls
- Patent number 9,581,616
- Issue date Feb 28, 2017
- Oxford Instruments Asylum Research, Inc.
- Mario Viani
- G01 - MEASURING TESTING
Information Patent Grant
Sealed AFM cell
- Patent number 9,110,093
- Issue date Aug 18, 2015
- National University Corporation Kanazawa University
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,813,261
- Issue date Aug 19, 2014
- Hitachi High-Tech Science Corporation
- Masato Iyoki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Mounting systems for a surface forces apparatus
- Patent number 8,371,182
- Issue date Feb 12, 2013
- Jacob Israelachvili
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Modular atomic force microscope
- Patent number 8,370,960
- Issue date Feb 5, 2013
- Asylum Research Corporation
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring electrical properties in torsion...
- Patent number 7,757,544
- Issue date Jul 20, 2010
- Veeco Instruments Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope displacement detecting mechanism and scan...
- Patent number 7,614,287
- Issue date Nov 10, 2009
- SII NanoTechnology Inc.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring electrical properties in torsion...
- Patent number 7,155,964
- Issue date Jan 2, 2007
- Veeco Instruments Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy system and method of measurement by the same
- Patent number 7,098,453
- Issue date Aug 29, 2006
- SII NanoTechnology Inc.
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scanning apertureless fluorescence microscope
- Patent number 6,953,927
- Issue date Oct 11, 2005
- California Institute of Technology
- Stephen R. Quake
- G01 - MEASURING TESTING
Information Patent Grant
Micromanipulator with piezoelectric movement elements
- Patent number 6,603,239
- Issue date Aug 5, 2003
- Forschungszentrum Julich GmbH
- Thomas Michely
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device scanning in a raster mode, with compensation of disturbing e...
- Patent number 6,308,557
- Issue date Oct 30, 2001
- Peter Heiland
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Support device and stage assembly for a scanned-probe microscope
- Patent number 5,847,387
- Issue date Dec 8, 1998
- Burleigh Instruments, Inc.
- Gordon M. Shedd
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron...
- Patent number 5,510,615
- Issue date Apr 23, 1996
- TopoMetrix Corporation
- Huddee Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus for use in a scanning electron
- Patent number 5,455,420
- Issue date Oct 3, 1995
- Topometrix
- Huddee Ho
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,317,153
- Issue date May 31, 1994
- Nikon Corporation
- Hiroyuki Matsushiro
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 5,296,704
- Issue date Mar 22, 1994
- Olympus Optical Co., Ltd.
- Shuzo Mishima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Loading mechanism and support structure having improved vibration d...
- Patent number 4,908,519
- Issue date Mar 13, 1990
- The Board of Thustees of the Leland Stanford Jr. University
- Sang-il Park
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High-performance vibration filter
- Patent number 4,605,194
- Issue date Aug 12, 1986
- International Business Machines Corporation
- Gerd Binnig
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD
- Publication number 20230176088
- Publication date Jun 8, 2023
- Rutgers, The State University of New Jersey
- Angela M. COE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, METHOD AND COMPUTER-ACCESSIBLE MEDIUM FOR PROVIDING BALANC...
- Publication number 20210215737
- Publication date Jul 15, 2021
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- ALEXANDER SWINTON MCLEOD
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PREPARING CRYO-EM GRIDS
- Publication number 20200363301
- Publication date Nov 19, 2020
- Neptune Fluid Flow Systems LLC
- Trevor Allen McQueen
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY
- Publication number 20200049735
- Publication date Feb 13, 2020
- MOLECULAR VISTA, INC.
- Thomas R. ALBRECHT
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER MOUNTING MEMBER AND SAMPLE CONTAINER SEALING METHOD
- Publication number 20190353680
- Publication date Nov 21, 2019
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD
- Publication number 20190331711
- Publication date Oct 31, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190293680
- Publication date Sep 26, 2019
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190212361
- Publication date Jul 11, 2019
- BRUKER NANO, INC.
- Charles MEYER
- G01 - MEASURING TESTING
Information Patent Application
HIGH MAGNETIC FIELD SCANNING PROBE MICROSCOPE EMPLOYING LIQUID HELI...
- Publication number 20190025339
- Publication date Jan 24, 2019
- Fudan University
- Shiwei WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE MICROSCOPE WITH A REDUCED Q-FACTOR
- Publication number 20170307655
- Publication date Oct 26, 2017
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Femke Chantal TABAK
- G01 - MEASURING TESTING
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20170254834
- Publication date Sep 7, 2017
- OXFORD INSTRUMENTS PLC
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
SEALED AFM CELL
- Publication number 20140289910
- Publication date Sep 25, 2014
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
Modular Atomic Force Microscope
- Publication number 20140223612
- Publication date Aug 7, 2014
- ASYLUM CORPORATION
- Roger Proksch
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope
- Publication number 20140059724
- Publication date Feb 27, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masato Iyoki
- B82 - NANO-TECHNOLOGY
Information Patent Application
MOUNTING SYSTEMS FOR A SURFACE FORCES APPARATUS
- Publication number 20130327160
- Publication date Dec 12, 2013
- Jacob Israelachvili
- B82 - NANO-TECHNOLOGY
Information Patent Application
MOUNTING SYSTEMS FOR A SURFACE FORCES APPARATUS
- Publication number 20130327161
- Publication date Dec 12, 2013
- Jacob Israelachvili
- B82 - NANO-TECHNOLOGY
Information Patent Application
Modular atomic force microscope
- Publication number 20100275334
- Publication date Oct 28, 2010
- Roger Proksch
- G01 - MEASURING TESTING
Information Patent Application
Reducing Noise In Atomic Force Microscopy Measurements
- Publication number 20090241648
- Publication date Oct 1, 2009
- AGILENT TECHNOLOGIES, INC.
- Michael Dieudonne
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE DISPLACEMENT DETECTING MECHANISM AND SCAN...
- Publication number 20080048115
- Publication date Feb 28, 2008
- SII NANO TECHNOLOGY INC.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES IN TORSION...
- Publication number 20070163335
- Publication date Jul 19, 2007
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring electrical properties in torsion...
- Publication number 20050212529
- Publication date Sep 29, 2005
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy and method of measurement by the same
- Publication number 20050189490
- Publication date Sep 1, 2005
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Application
Method and system for scanning apertureless fluorescence microscope
- Publication number 20040089816
- Publication date May 13, 2004
- California Institute of Technology
- Stephen R. Quake
- G02 - OPTICS

Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems, method and computer-accessible medium for providing balanc...

Frequency modulation detection for photo induced force microscopy

System and method for preparing cryo-em grids

Sample container mounting member and sample container sealing method

Scanning probe microscope

Scanning probe microscope and light intensity adjusting method

High magnetic field scanning probe microscope employing liquid heli...

Modular atomic force microscope with environmental controls

Sample vessel retention structure for scanning probe microscope

Scanning probe microscope with a reduced Q-factor

Modular atomic force microscope with environmental controls

Sealed AFM cell

Scanning probe microscope

Mounting systems for a surface forces apparatus

Modular atomic force microscope

Method and apparatus for measuring electrical properties in torsion...

Scanning probe microscope displacement detecting mechanism and scan...

Method and apparatus for measuring electrical properties in torsion...

Scanning probe microscopy system and method of measurement by the same

Method and system for scanning apertureless fluorescence microscope

Micromanipulator with piezoelectric movement elements

Device scanning in a raster mode, with compensation of disturbing e...

Support device and stage assembly for a scanned-probe microscope

Scanning probe microscope apparatus for use in a scanning electron...

Scanning probe microscope apparatus for use in a scanning electron

Scanning probe microscope

Scanning tunneling microscope

Loading mechanism and support structure having improved vibration d...

High-performance vibration filter

Patents Applicationslast 30 patents

DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD

SYSTEMS, METHOD AND COMPUTER-ACCESSIBLE MEDIUM FOR PROVIDING BALANC...

SYSTEM AND METHOD FOR PREPARING CRYO-EM GRIDS

FREQUENCY MODULATION DETECTION FOR PHOTO-INDUCED FORCE MICROSCOPY

SAMPLE CONTAINER MOUNTING MEMBER AND SAMPLE CONTAINER SEALING METHOD

SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD

SCANNING PROBE MICROSCOPE

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

HIGH MAGNETIC FIELD SCANNING PROBE MICROSCOPE EMPLOYING LIQUID HELI...

SCANNING PROBE MICROSCOPE WITH A REDUCED Q-FACTOR

Modular Atomic Force Microscope

SEALED AFM CELL

Modular Atomic Force Microscope

Scanning Probe Microscope

MOUNTING SYSTEMS FOR A SURFACE FORCES APPARATUS

MOUNTING SYSTEMS FOR A SURFACE FORCES APPARATUS

Modular atomic force microscope

Reducing Noise In Atomic Force Microscopy Measurements

SCANNING PROBE MICROSCOPE DISPLACEMENT DETECTING MECHANISM AND SCAN...

METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES IN TORSION...

Method and apparatus for measuring electrical properties in torsion...

Scanning probe microscopy and method of measurement by the same

Method and system for scanning apertureless fluorescence microscope