Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy

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CPC
H01J37/266

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/266Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for charged particle flooding to enhance voltag...
- Patent number 11,929,232
- Issue date Mar 12, 2024
- ASML Netherlands B.V.
- Frank Nan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma impedance tomography for plasma parameter imaging
- Patent number 11,621,146
- Issue date Apr 4, 2023
- The Government of the United States of America, as represented by the Secreta...
- Erik Tejero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method of preparing integrated circuits for backside pro...
- Patent number 11,605,525
- Issue date Mar 14, 2023
- FEI Company
- James Vickers
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic material observation method, and magnetic material observa...
- Patent number 11,474,169
- Issue date Oct 18, 2022
- NATIONAL INSTITUTES FOR QUANTUM SCIENCE AND TECHNOLOGY
- Toshiya Inami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector transfer optics for Lorentz EM
- Patent number 10,825,644
- Issue date Nov 3, 2020
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for charged particle flooding to enhance voltag...
- Patent number 10,784,077
- Issue date Sep 22, 2020
- ASML Netherlands B.V.
- Frank Nan Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,663,513
- Issue date May 26, 2020
- Micron Technology, Inc.
- Kevin G. Werhane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope for magnetic field measurement and magnetic fie...
- Patent number 10,629,410
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Installation location noise floor evaluation device
- Patent number 10,439,860
- Issue date Oct 8, 2019
- AT&T Digital Life, Inc.
- Plamen Vanchev
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical-cavity based ponderomotive phase plate for transmission ele...
- Patent number 10,395,888
- Issue date Aug 27, 2019
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for measuring magnetic fields produced within m...
- Patent number 10,373,801
- Issue date Aug 6, 2019
- Board of Regents, The University of Texas System
- Arturo Ponce-Pedraza
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses including test segment circuits having latch circuits f...
- Patent number 10,330,726
- Issue date Jun 25, 2019
- Micron Technology, Inc.
- Kevin G. Werhane
- G01 - MEASURING TESTING
Information Patent Grant
Compact deflecting magnet
- Patent number 10,332,718
- Issue date Jun 25, 2019
- IMATREX, INC.
- Roy E. Rand
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact deflecting magnet
- Patent number 10,290,463
- Issue date May 14, 2019
- IMATREX, INC.
- Roy E. Rand
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,186,413
- Issue date Jan 22, 2019
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged Particle Beam System With Receptacle Chamber For Cleaning S...
- Patent number 9,881,768
- Issue date Jan 30, 2018
- Jeol Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam irradiation method and scanning electron microscope
- Patent number 9,640,366
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,502,212
- Issue date Nov 22, 2016
- Hitachi High-Technologies Corporation
- Yuzuru Mizuhara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 9,368,314
- Issue date Jun 14, 2016
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Specimen potential measuring method, and charged particle beam device
- Patent number 9,129,775
- Issue date Sep 8, 2015
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus sample holder with magnetic field g...
- Patent number 9,070,532
- Issue date Jun 30, 2015
- Hitachi, Ltd.
- Akira Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 8,803,103
- Issue date Aug 12, 2014
- Ebara Corporation
- Mamoru Nakasuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam inspection apparatus and inspection method us...
- Patent number 8,507,857
- Issue date Aug 13, 2013
- Advantest Corp.
- Keisuke Itou
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 8,368,031
- Issue date Feb 5, 2013
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic domain imaging system
- Patent number 8,158,940
- Issue date Apr 17, 2012
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 8,053,726
- Issue date Nov 8, 2011
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 7,876,113
- Issue date Jan 25, 2011
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope
- Patent number 7,755,046
- Issue date Jul 13, 2010
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system by charged particle beam and method of manufactur...
- Patent number 7,411,191
- Issue date Aug 12, 2008
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting pattern and inspecting instrument
- Patent number 7,375,538
- Issue date May 20, 2008
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20240379325
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...
- Publication number 20210142979
- Publication date May 13, 2021
- ASML NETHERLANDS B.V.
- Frank Nan ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma Impedance Tomography for Plasma Parameter Imaging
- Publication number 20210118644
- Publication date Apr 22, 2021
- The Government of the United States of America, as represented by the Secreta...
- Erik Tejero
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20210098228
- Publication date Apr 1, 2021
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC MATERIAL OBSERVATION METHOD, AND MAGNETIC MATERIAL OBSERVA...
- Publication number 20200249288
- Publication date Aug 6, 2020
- NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECHNOLOGY
- Toshiya INAMI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...
- Publication number 20190295817
- Publication date Sep 26, 2019
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method of preparing integrated circuits for backside pro...
- Publication number 20190287762
- Publication date Sep 19, 2019
- FEI Company
- James VICKERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...
- Publication number 20190271739
- Publication date Sep 5, 2019
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING
Information Patent Application
COMPACT DEFLECTING MAGNET
- Publication number 20190198286
- Publication date Jun 27, 2019
- IMATREX, INC.
- Roy E. RAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...
- Publication number 20180364303
- Publication date Dec 20, 2018
- Micron Technology, Inc.
- KEVIN G. WERHANE
- G01 - MEASURING TESTING
Information Patent Application
COMPACT DEFLECTING MAGNET
- Publication number 20180315578
- Publication date Nov 1, 2018
- IMATREX, INC.
- Roy E. RAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL-CAVITY BASED PONDEROMOTIVE PHASE PLATE FOR TRANSMISSION ELE...
- Publication number 20180286631
- Publication date Oct 4, 2018
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20170358440
- Publication date Dec 14, 2017
- SHIMADZU CORPORATION
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems And Methods For Measuring Magnetic Fields Produced Within A...
- Publication number 20170309447
- Publication date Oct 26, 2017
- Board of Regents, The University of Texas System
- Arturo Ponce-Pedraza
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam System
- Publication number 20170133197
- Publication date May 11, 2017
- JEOL Ltd.
- Shuji Kawai
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
- Publication number 20140319346
- Publication date Oct 30, 2014
- EBARA CORPORATION
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER AND CHARGED PARTICLE BEAM APPARATUS USING SAME
- Publication number 20140319371
- Publication date Oct 30, 2014
- Akira Sugawara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
- Publication number 20140034831
- Publication date Feb 6, 2014
- KABUSHIKI KAISHA TOSHIBA
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Irradiation Method and Scanning Electron Microscope
- Publication number 20130009057
- Publication date Jan 10, 2013
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20130009058
- Publication date Jan 10, 2013
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Nobuo Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN POTENTIAL MEASURING METHOD, AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20120119085
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...
- Publication number 20120032079
- Publication date Feb 9, 2012
- KABUSHIKI KAISHA TOSHIBA
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Domain Imaging System
- Publication number 20100294932
- Publication date Nov 25, 2010
- JEOL Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam inspection apparatus and inspection method us...
- Publication number 20100102225
- Publication date Apr 29, 2010
- Keisuke Itou
- G01 - MEASURING TESTING
Information Patent Application
Inspection system by charged particle beam and method of manufactur...
- Publication number 20090032708
- Publication date Feb 5, 2009
- EBARA CORPORATION
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
Transmission electron microscope
- Publication number 20080210868
- Publication date Sep 4, 2008
- Hitachi, Ltd.
- Teruo Kohashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20080122462
- Publication date May 29, 2008
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION AND MEASUREMENT APPARATUS
- Publication number 20080017797
- Publication date Jan 24, 2008
- Zhaohui CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection system by charged particle beam and method of manufactur...
- Publication number 20070235644
- Publication date Oct 11, 2007
- EBARA CORPORATION
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting pattern and inspecting instrument
- Publication number 20050250224
- Publication date Nov 10, 2005
- Hitachi, Ltd.
- Mari Nozoe
- G01 - MEASURING TESTING

Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for charged particle flooding to enhance voltag...

Plasma impedance tomography for plasma parameter imaging

System and method of preparing integrated circuits for backside pro...

Magnetic material observation method, and magnetic material observa...

Corrector transfer optics for Lorentz EM

Systems and methods for charged particle flooding to enhance voltag...

Apparatuses including test segment circuits having latch circuits f...

Electron microscope for magnetic field measurement and magnetic fie...

Installation location noise floor evaluation device

Optical-cavity based ponderomotive phase plate for transmission ele...

Systems and methods for measuring magnetic fields produced within m...

Apparatuses including test segment circuits having latch circuits f...

Compact deflecting magnet

Compact deflecting magnet

Time-of-flight mass spectrometer

Charged Particle Beam System With Receptacle Chamber For Cleaning S...

Electron beam irradiation method and scanning electron microscope

Charged particle beam apparatus

Inspection system by charged particle beam and method of manufactur...

Specimen potential measuring method, and charged particle beam device

Charged particle beam apparatus sample holder with magnetic field g...

Inspection system by charged particle beam and method of manufactur...

Charged particle beam inspection apparatus and inspection method us...

Inspection system by charged particle beam and method of manufactur...

Magnetic domain imaging system

Inspection system by charged particle beam and method of manufactur...

Method of inspecting pattern and inspecting instrument

Transmission electron microscope

Inspection system by charged particle beam and method of manufactur...

Method of inspecting pattern and inspecting instrument

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAG...

Plasma Impedance Tomography for Plasma Parameter Imaging

System and method of preparing integrated circuits for backside pro...

MAGNETIC MATERIAL OBSERVATION METHOD, AND MAGNETIC MATERIAL OBSERVA...

ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...

System and method of preparing integrated circuits for backside pro...

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS HAVING LATCH CIRCUITS F...

COMPACT DEFLECTING MAGNET

APPARATUSES INCLUDING TEST SEGMENT CIRCUITS AND METHODS FOR TESTING...

COMPACT DEFLECTING MAGNET

OPTICAL-CAVITY BASED PONDEROMOTIVE PHASE PLATE FOR TRANSMISSION ELE...

TIME-OF-FLIGHT MASS SPECTROMETER

Systems And Methods For Measuring Magnetic Fields Produced Within A...

Charged Particle Beam System

INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...

SAMPLE HOLDER AND CHARGED PARTICLE BEAM APPARATUS USING SAME

INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...

Electron Beam Irradiation Method and Scanning Electron Microscope

ELECTRON MICROSCOPE

SPECIMEN POTENTIAL MEASURING METHOD, AND CHARGED PARTICLE BEAM DEVICE

INSPECTION SYSTEM BY CHARGED PARTICLE BEAM AND METHOD OF MANUFACTUR...

Magnetic Domain Imaging System

Charged particle beam inspection apparatus and inspection method us...

Inspection system by charged particle beam and method of manufactur...

Transmission electron microscope

Method of inspecting pattern and inspecting instrument

PATTERN INSPECTION AND MEASUREMENT APPARATUS

Inspection system by charged particle beam and method of manufactur...

Method of inspecting pattern and inspecting instrument