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Measuring critical current
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CPC
G01R33/1246
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R33/00
Arrangements or instruments for measuring magnetic variables
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G01R33/1246
Measuring critical current
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Patents Grants
last 30 patents
Information
Patent Grant
Tape lifetime monitor in fault current limiter
Patent number
10,971,926
Issue date
Apr 6, 2021
Varian Semiconductor Equipment Associates, Inc.
Saeed Jazebi
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining persistent critical current of superconducti...
Patent number
10,401,393
Issue date
Sep 3, 2019
The United States of America as represented by the Secretary of the Army
George A. Levin
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the quality control of superconducting bands
Patent number
9,081,048
Issue date
Jul 14, 2015
BASF SE
Michael Bäcker
G01 - MEASURING TESTING
Information
Patent Grant
Measuring method of critical current density of superconductor wire...
Patent number
8,788,227
Issue date
Jul 22, 2014
Korea Polytechnic University Industry Academic Cooperation Foundation
Kyeong Dal Choi
G01 - MEASURING TESTING
Information
Patent Grant
Continuous critical current measurement apparatus and method of mea...
Patent number
8,441,247
Issue date
May 14, 2013
Korea Electrotechnology Research Institute
Hong-Soo Ha
G01 - MEASURING TESTING
Information
Patent Grant
Detection apparatus and method for superconducting coil quench
Patent number
8,405,410
Issue date
Mar 26, 2013
Mitsubishi Heavy Industries, Ltd.
Hiroshi Kawashima
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Apparatus and method for measuring critical current properties of a...
Patent number
8,228,055
Issue date
Jul 24, 2012
LOS ALAMOS NATIONAL SECURITY, LLC
Fred M. Mueller
G01 - MEASURING TESTING
Information
Patent Grant
Critical current testing techniques for superconducting conductors
Patent number
7,554,317
Issue date
Jun 30, 2009
Superpower, Inc.
Yi-Yuan Xie
G01 - MEASURING TESTING
Information
Patent Grant
Method for the determination of the critical current for a conducto...
Patent number
6,841,988
Issue date
Jan 11, 2005
American Superconductor Corporation
Michael Deleuran Bentzon
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measurement of critical current in superconductive tapes
Patent number
6,452,375
Issue date
Sep 17, 2002
The Regents of the University of California
J. Yates Coulter
G01 - MEASURING TESTING
Information
Patent Grant
Method and measuring apparatus for a contactless longitudinal and t...
Patent number
6,034,527
Issue date
Mar 7, 2000
Forschungszentrum Karlsruhe GmbH
Heinz-Peter Schiller
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring critical current value of superc...
Patent number
5,936,394
Issue date
Aug 10, 1999
Sumitomo Electric Industries, Ltd.
Tetsuyuki Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring the resistive transition and critical current...
Patent number
5,223,798
Issue date
Jun 29, 1993
The United States of America as represented by the Secretary of the Navy
Wayne C. McGinnis
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining at least one characteristic of...
Patent number
5,218,296
Issue date
Jun 8, 1993
International Business Machines Corporation
Subhash L. Shinde
G01 - MEASURING TESTING
Information
Patent Grant
Superconductor quench measuring device which evaluates reflected pu...
Patent number
5,179,342
Issue date
Jan 12, 1993
Westinghouse Electric Corp.
William R. Wolfe
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for critical current measurements
Patent number
5,134,360
Issue date
Jul 28, 1992
The United States of America as represented by the United States Department o...
Joe A. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining transport critical current densities and flu...
Patent number
5,132,279
Issue date
Jul 21, 1992
California Institute of Technology
Ulf E. Israelsson
G01 - MEASURING TESTING
Information
Patent Grant
Superconductor sensors
Patent number
5,030,614
Issue date
Jul 9, 1991
Omega Engineering, Inc.
Milton B. Hollander
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the continuous, contactless testing of an...
Patent number
4,132,949
Issue date
Jan 2, 1979
Siemens Aktiengesellschaft
Gunter Rupp
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for the continuous, contactless testing of a l...
Patent number
3,976,934
Issue date
Aug 24, 1976
Siemens Aktiengesellschaft
Hans Voigt
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR PRODUCTION QUALITY CONTROL OF FLEXIBLE SUPERCONDUCTING T...
Publication number
20230232723
Publication date
Jul 20, 2023
THE UNIVERSITY OF HOUSTON SYSTEM
Jarek Wosik
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING THE ELECTRICAL PROPERTIES OF A HTS SUPERCONDU...
Publication number
20200200841
Publication date
Jun 25, 2020
Bruker HTS GmbH
Alexander USOSKIN
G01 - MEASURING TESTING
Information
Patent Application
TAPE LIFETIME MONITOR IN FAULT CURRENT LIMITER
Publication number
20190267799
Publication date
Aug 29, 2019
Varian Semiconductor Equipment Associates, Inc.
Saeed Jazebi
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Quench Detection System for Superconducting Magnets
Publication number
20130293987
Publication date
Nov 7, 2013
Brookhaven Science Associates, LLC
Piyush Nanubhai Joshi
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR THE QUALITY CONTROL OF SUPERCONDUCTING BANDS
Publication number
20120249171
Publication date
Oct 4, 2012
BASF SE
Michael Bäcker
G01 - MEASURING TESTING
Information
Patent Application
MEASURING METHOD OF CRITICAL CURRENT DENSITY OF SUPERCONDUCTOR WIRE...
Publication number
20110270557
Publication date
Nov 3, 2011
Korea Polytechnic University Industry Academic Cooperation Foundation
Kyeong Dal Choi
G01 - MEASURING TESTING
Information
Patent Application
Continuous Critical Current Measurement Apparatus And Method Of Mea...
Publication number
20110140710
Publication date
Jun 16, 2011
KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE
Hong-soo Ha
G01 - MEASURING TESTING
Information
Patent Application
DETECTION APPARATUS AND METHOD FOR SUPERCONDUCTING COIL QUENCH
Publication number
20100253373
Publication date
Oct 7, 2010
Mitsubishi Heavy Industries, Ltd.
Hiroshi KAWASHIMA
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Method of Measuring Critical Current Value of Superconducting Wire
Publication number
20100227765
Publication date
Sep 9, 2010
SUMITOMO ELECTRIC INDUSTRIES, LTD.
Eisaku Ueno
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING CRITICAL CURRENT PROPERTIES OF A...
Publication number
20100066357
Publication date
Mar 18, 2010
LOS ALAMOS NATIONAL SECURITY, LLC
Fred M. Mueller
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING SUPERCONDUCTING WIRE
Publication number
20100019776
Publication date
Jan 28, 2010
Douglas C. Folts
G01 - MEASURING TESTING
Information
Patent Application
Critical current testing techniques for superconducting conductors
Publication number
20060073977
Publication date
Apr 6, 2006
SuperPower, Inc.
Yi-Yuan Xie
G01 - MEASURING TESTING