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measuring electrostatic potential
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G01R15/165
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R15/00
Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00 and G01R33/00 - G01R35/00
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G01R15/165
measuring electrostatic potential
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Patents Grants
last 30 patents
Information
Patent Grant
Constructive system regarding a capacitive sensor
Patent number
12,111,337
Issue date
Oct 8, 2024
G & W Electric Company
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Electric field measuring device and electric field measuring method
Patent number
11,828,782
Issue date
Nov 28, 2023
Hitachi, Ltd.
Tomohiko Yano
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Constructive system regarding a capacitive sensor
Patent number
11,815,529
Issue date
Nov 14, 2023
G & W Electric Company
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive voltage sensor assembly
Patent number
11,740,261
Issue date
Aug 29, 2023
G & W Electric Company
Lorenzo Peretto
G01 - MEASURING TESTING
Information
Patent Grant
Electrical sensor assembly
Patent number
11,644,484
Issue date
May 9, 2023
G & W Electric Company
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Constructive system regarding a capacitive sensor
Patent number
11,543,436
Issue date
Jan 3, 2023
G & W Electric Company
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Electrical sensor assembly
Patent number
11,340,266
Issue date
May 24, 2022
G & W Electric Company
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Non-intrusive monitoring
Patent number
11,262,386
Issue date
Mar 1, 2022
Massachusetts Institute of Technology
John Sebastian Donnal
G01 - MEASURING TESTING
Information
Patent Grant
Test point voltage sensor for high voltage separable connectors
Patent number
11,262,387
Issue date
Mar 1, 2022
3M Innovative Properties Company
David V. Mahoney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for calibrating a conducted electrical weapon
Patent number
11,248,880
Issue date
Feb 15, 2022
Axon Enterprise, Inc.
Magne H. Nerheim
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for calibrating a conducted electrical weapon
Patent number
11,187,498
Issue date
Nov 30, 2021
Axon Enterprise, Inc.
Magne H. Nerheim
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information
Patent Grant
Constructive system regarding a capacitive sensor
Patent number
11,079,410
Issue date
Aug 3, 2021
G & W Electric Company
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Grant
Electromechanical component, electromechanical component arrangemen...
Patent number
11,079,411
Issue date
Aug 3, 2021
Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
Linus Elsäber
G01 - MEASURING TESTING
Information
Patent Grant
RF sensing apparatus of plasma processing chamber and plasma proces...
Patent number
10,901,007
Issue date
Jan 26, 2021
Samsung Electronics Co., Ltd.
Young Do Kim
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive voltage-sensor assembly
Patent number
10,852,324
Issue date
Dec 1, 2020
G & W Electric Company
Lorenzo Peretto
G01 - MEASURING TESTING
Information
Patent Grant
Surface potential measurement of dielectric materials in plasma
Patent number
10,852,265
Issue date
Dec 1, 2020
University of Southern California
Kevin Chou
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for measuring electric field by using MOS capacitor
Patent number
10,725,082
Issue date
Jul 28, 2020
SNU R&DB Foundation
Sang Lyul Min
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring an electrical quantity of one phase of an AC e...
Patent number
10,690,706
Issue date
Jun 23, 2020
Schneider Electric Industries SAS
Michel Clemence
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Barium-strontium-titanium (BST) capacitor configuration method
Patent number
10,541,088
Issue date
Jan 21, 2020
STMicroelectronics (Tours) SAS
Sylvain Charley
G01 - MEASURING TESTING
Information
Patent Grant
Barium-strontium-titanium (BST) capacitor configuration method
Patent number
10,541,089
Issue date
Jan 21, 2020
STMicroelectronics (Tours) SAS
Sylvain Charley
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for detecting electrostatically sensitive areas
Patent number
10,473,705
Issue date
Nov 12, 2019
Quanta Computer Inc.
Chao-Hung Kuo
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for calibrating a conducted electrical weapon
Patent number
10,451,386
Issue date
Oct 22, 2019
Axon Enterprise, Inc.
Magne H. Nerheim
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for calibrating a conducted electrical weapon
Patent number
10,451,387
Issue date
Oct 22, 2019
Axon Enterprise, Inc.
Magne H. Nerheim
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting surface electric field distribution of nanostr...
Patent number
10,429,425
Issue date
Oct 1, 2019
Tsinghua University
Jiang-Tao Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method for calculating surface electric field distribution of nanos...
Patent number
10,408,871
Issue date
Sep 10, 2019
Tsinghua University
Jiang-Tao Wang
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for propagating brush discharge testing
Patent number
10,330,720
Issue date
Jun 25, 2019
The Boeing Company
Dejan Nikic
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for calibrating a conducted electrical weapon
Patent number
10,274,290
Issue date
Apr 30, 2019
Taser International, Inc.
Magne H. Nerheim
F41 - WEAPONS
Information
Patent Grant
Noncontact voltage measurement apparatus
Patent number
10,254,313
Issue date
Apr 9, 2019
Alps Alpine Co., Ltd.
Hiroyuki Hebiguchi
G01 - MEASURING TESTING
Information
Patent Grant
Voltage sensor housing and assembly including the same
Patent number
10,151,778
Issue date
Dec 11, 2018
EATON INTELLIGENT POWER LIMITED
Abhijeet Vikram Kshirsagar
G01 - MEASURING TESTING
Information
Patent Grant
Non-contact voltage measurement device
Patent number
10,145,865
Issue date
Dec 4, 2018
Omron Corporation
Hiroshi Imai
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SHORT CIRCUIT DETECTION DEVICE AND SHORT CIRCUIT DETECTION METHOD
Publication number
20240272239
Publication date
Aug 15, 2024
Hioki E. E. Corporation
Kota NISHIMURA
G01 - MEASURING TESTING
Information
Patent Application
CONSTRUCTIVE SYSTEM REGARDING A CAPACITIVE SENSOR
Publication number
20240077520
Publication date
Mar 7, 2024
G & W ELECTRIC COMPANY
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Application
DETERMINATION OF AN UNBALANCED LOAD IN A HIGH-VOLTAGE SYSTEM AND RE...
Publication number
20240036078
Publication date
Feb 1, 2024
Tobias AURAND
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE VOLTAGE-SENSOR ASSEMBLY
Publication number
20230375597
Publication date
Nov 23, 2023
G & W ELECTRIC COMPANY
Lorenzo Peretto
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL SENSOR ASSEMBLY
Publication number
20230273242
Publication date
Aug 31, 2023
G & W ELECTRIC COMPANY
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Application
CONSTRUCTIVE SYSTEM REGARDING A CAPACITIVE SENSOR
Publication number
20230143620
Publication date
May 11, 2023
G & W ELECTRIC COMPANY
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL SENSOR ASSEMBLY
Publication number
20220357364
Publication date
Nov 10, 2022
G & W ELECTRIC COMPANY
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL SENSOR ASSEMBLY
Publication number
20220043033
Publication date
Feb 10, 2022
G & W ELECTRIC COMPANY
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE VOLTAGE SENSOR ASSEMBLY
Publication number
20210072289
Publication date
Mar 11, 2021
G & W ELECTRIC COMPANY
Lorzeno Peretto
G01 - MEASURING TESTING
Information
Patent Application
TEST POINT VOLTAGE SENSOR FOR HIGH VOLTAGE SEPARABLE CONNECTORS
Publication number
20200110114
Publication date
Apr 9, 2020
3M Innovative Properties Company
David V. Mahoney
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RF SENSING APPARATUS OF PLASMA PROCESSING CHAMBER AND PLASMA PROCES...
Publication number
20200072874
Publication date
Mar 5, 2020
Samsung Electronics Co., Ltd.
YOUNG DO KIM
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE VOLTAGE SENSOR
Publication number
20190234995
Publication date
Aug 1, 2019
Lorenzo PERETTO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR CALIBRATING A CONDUCTED ELECTRICAL WEAPON
Publication number
20190154408
Publication date
May 23, 2019
Axon Enterprise, Inc.
Magne H. Nerheim
F41 - WEAPONS
Information
Patent Application
Electromechanical component, electromechanical component arrangemen...
Publication number
20190086446
Publication date
Mar 21, 2019
Fraunhofer-Gesellschaft aur Fõrderung der angewandten Forschung e.V.
Linus ELSÄßER
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR MEASURING AN ELECTRICAL QUANTITY OF ONE PHASE OF AN AC E...
Publication number
20190049491
Publication date
Feb 14, 2019
Schneider Electric Industries SAS
Michel CLEMENCE
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PROPAGATING BRUSH DISCHARGE TESTING
Publication number
20190041449
Publication date
Feb 7, 2019
The Boeing Company
Dejan Nikic
G01 - MEASURING TESTING
Information
Patent Application
DEVICES AND METHODS FOR DETECTING ELECTROSTATICALLY SENSITIVE AREAS
Publication number
20180313881
Publication date
Nov 1, 2018
QUANTA COMPUTER INC.
Chao-Hung KUO
G01 - MEASURING TESTING
Information
Patent Application
NON-INTRUSIVE MONITORING
Publication number
20180306839
Publication date
Oct 25, 2018
MASSACHUSETTS INTITUTE OF TECHNOLOGY
John Sebastian Donnal
G01 - MEASURING TESTING
Information
Patent Application
BARIUM-STRONTIUM-TITANIUM (BST) CAPACITOR CONFIGURATION METHOD
Publication number
20180130607
Publication date
May 10, 2018
STMicroelectronics (Tours) SAS
Sylvain Charley
G01 - MEASURING TESTING
Information
Patent Application
BARIUM-STRONTIUM-TITANIUM (BST) CAPACITOR CONFIGURATION METHOD
Publication number
20180130608
Publication date
May 10, 2018
STMicroelectronics (Tours) SAS
Sylvain Charley
G01 - MEASURING TESTING
Information
Patent Application
Systems and Methods for Calibrating a Conducted Electrical Weapon
Publication number
20180059150
Publication date
Mar 1, 2018
TASER International, Inc.
Magne H. Nerheim
F41 - WEAPONS
Information
Patent Application
DEVICE AND METHOD FOR MEASURING ELECTRIC FIELD BY USING MOS CAPACITOR
Publication number
20180003757
Publication date
Jan 4, 2018
SNU R&DB Foundation
Sang Lyul MIN
G01 - MEASURING TESTING
Information
Patent Application
RESISTIVITY IMAGING USING COMBINATION CAPACITIVE AND INDUCTIVE SENSORS
Publication number
20170139073
Publication date
May 18, 2017
BAKER HUGHES INCORPORATED
Matthias Gorek
G01 - MEASURING TESTING
Information
Patent Application
ELECTROSTATIC DETECTING CIRCUIT AND METHOD THEREOF
Publication number
20140347061
Publication date
Nov 27, 2014
Raydium Semiconductor Corporation
Cheng-Chin LIU
G01 - MEASURING TESTING
Information
Patent Application
Methods, Systems and Apparatuses for Sensing and Measuring the Elec...
Publication number
20130300419
Publication date
Nov 14, 2013
GROUNDMETRICS, INC.
Andrew D. Hibbs
G01 - MEASURING TESTING
Information
Patent Application
SENSOR FOR MEASURING ELECTRICAL CHARACTERISTICS
Publication number
20120223697
Publication date
Sep 6, 2012
SangWon Lee
G01 - MEASURING TESTING
Information
Patent Application
WIDE-DYNAMIC RANGE ELECTROMETER WITH A FAST RESPONSE
Publication number
20120086434
Publication date
Apr 12, 2012
MKS Instruments, Inc.
William Roger Fletcher
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CONSTRUCTION SYSTEM FOR A CAPACITIVE SENSOR
Publication number
20110205683
Publication date
Aug 25, 2011
Lorenzo Peretto
G01 - MEASURING TESTING
Information
Patent Application
CAPACITIVE SENSOR TO SENSE AN ELECTRIC FIELD GENERATED BY A CONDUCTOR
Publication number
20110121842
Publication date
May 26, 2011
Alberto Bauer
G01 - MEASURING TESTING
Information
Patent Application
REMOTE TEST POINT FOR ELECTRICAL CONNECTOR
Publication number
20110025342
Publication date
Feb 3, 2011
Thomas & Betts International, Inc.
Larry N. Siebens
G01 - MEASURING TESTING