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Measuring force or stress in general
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Industry
CPC
G01L1/00
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01L
MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
Current Industry
G01L1/00
Measuring force or stress in general
Sub Industries
G01L1/005
by electrical means and not provided for in G01L1/06 - G01L1/22
G01L1/02
by hydraulic or pneumatic means
G01L1/04
by measuring elastic deformation of gauges
G01L1/042
of helical springs
G01L1/044
of leaf springs
G01L1/046
of spiral springs
G01L1/048
of torsionally deformable elements
G01L1/06
by measuring the permanent deformation of gauges
G01L1/08
by the use of counterbalancing forces
G01L1/083
using hydraulic or pneumatic counterbalancing forces
G01L1/086
using electrostatic or electromagnetic counterbalancing forces
G01L1/10
by measuring variations of frequency of stressed vibrating elements
G01L1/103
optical excitation or measuring of vibrations
G01L1/106
Constructional details
G01L1/12
by measuring variations in the magnetic properties of materials resulting from the application of stress
G01L1/122
by using permanent magnets
G01L1/125
by using magnetostrictive means
G01L1/127
by using inductive means
G01L1/14
by measuring variations in capacitance or inductance of electrical elements
G01L1/142
using capacitors
G01L1/144
with associated circuitry
G01L1/146
for measuring force distributions
G01L1/148
using semiconductive material
G01L1/16
using properties of piezo-electric devices
G01L1/162
using piezo-electric resonators
G01L1/165
with acoustic surface waves
G01L1/167
optical excitation or measuring of vibrations
G01L1/18
using properties of piezo-resistive materials
G01L1/183
by measuring variations of frequency of vibrating piezo-resistive material
G01L1/186
optical excitation or measuring of vibrations
G01L1/20
by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids by making use of electro-kinetic cells
G01L1/205
using distributed sensing elements
G01L1/22
using resistance strain gauges
G01L1/2206
Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
G01L1/2212
particularly adapted to unbounded-wire-type strain gauges
G01L1/2218
the supports being of the column type
G01L1/2225
the direction being perpendicular to the central axis
G01L1/2231
the supports being disc- or ring-shaped, adapted for measuring a force along a single direction
G01L1/2237
the direction being perpendicular to the central axis
G01L1/2243
the supports being parallelogram-shaped
G01L1/225
Measuring circuits therefor
G01L1/2256
involving digital counting
G01L1/2262
involving simple electrical bridges
G01L1/2268
Arrangements for correcting or for compensating unwanted effects
G01L1/2275
for non linearity
G01L1/2281
for temperature variations
G01L1/2287
constructional details of the strain gauges
G01L1/2293
of the semi-conductor type
G01L1/24
by measuring variations of optical properties of material when it is stressed
G01L1/241
by photoelastic stress analysis
G01L1/242
the material being an optical fibre
G01L1/243
using means for applying force perpendicular to the fibre axis
G01L1/245
using micro-bending
G01L1/246
using integrated gratings
G01L1/247
using distributed sensing elements
G01L1/248
using infra-red
G01L1/25
using wave or particle radiation
G01L1/255
using acoustic waves, or acoustic emission
G01L1/26
Auxiliary measures taken, or devices used, in connection with the measurement of force
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