-
-
Thinline towed array tension sensor
-
Patent number 11,835,404
-
Issue date Dec 5, 2023
-
The United States of America as represented by the Secretary of the Navy
-
William H Slater
-
G01 - MEASURING TESTING
-
-
-
-
-
-
-
-
-
-
Load cell
-
Patent number 4,160,377
-
Issue date Jul 10, 1979
-
Kievsky Institut Avtomatiki Imeni XXV Siezda KPSS
-
Vasily I. Pechuk
-
G01 - MEASURING TESTING
-
3866157
-
Patent number 3,866,157
-
Issue date Feb 11, 1975
-
G01 - MEASURING TESTING
-
3757573
-
Patent number 3,757,573
-
Issue date Sep 11, 1973
-
G01 - MEASURING TESTING
-
3643502
-
Patent number 3,643,502
-
Issue date Feb 22, 1972
-
G01 - MEASURING TESTING
-
3635077
-
Patent number 3,635,077
-
Issue date Jan 18, 1972
-
G01 - MEASURING TESTING
-
3453582
-
Patent number 3,453,582
-
Issue date Jul 1, 1969
-
G01 - MEASURING TESTING
-
3439533
-
Patent number 3,439,533
-
Issue date Apr 22, 1969
-
G01 - MEASURING TESTING
-
3333464
-
Patent number 3,333,464
-
Issue date Aug 1, 1967
-
G01 - MEASURING TESTING
-
3326047
-
Patent number 3,326,047
-
Issue date Jun 20, 1967
-
G01 - MEASURING TESTING
-
3320802
-
Patent number 3,320,802
-
Issue date May 23, 1967
-
G01 - MEASURING TESTING
-
3261204
-
Patent number 3,261,204
-
Issue date Jul 19, 1966
-
G01 - MEASURING TESTING
-
3246385
-
Patent number 3,246,385
-
Issue date Apr 19, 1966
-
G01 - MEASURING TESTING
-
3201735
-
Patent number 3,201,735
-
Issue date Aug 17, 1965
-
G01 - MEASURING TESTING
-
3087330
-
Patent number 3,087,330
-
Issue date Apr 30, 1963
-
G01 - MEASURING TESTING
-
3086185
-
Patent number 3,086,185
-
Issue date Apr 16, 1963
-
G01 - MEASURING TESTING
-
3084542
-
Patent number 3,084,542
-
Issue date Apr 9, 1963
-
G01 - MEASURING TESTING
-
3064221
-
Patent number 3,064,221
-
Issue date Nov 13, 1962
-
G01 - MEASURING TESTING
-
3060731
-
Patent number 3,060,731
-
Issue date Oct 30, 1962
-
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
-
3058348
-
Patent number 3,058,348
-
Issue date Oct 16, 1962
-
G01 - MEASURING TESTING