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Measuring galvano-magnetic properties
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G01R33/1253
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PHYSICS
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Measuring instruments
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MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
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Arrangements or instruments for measuring magnetic variables
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G01R33/1253
Measuring galvano-magnetic properties
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Patents Grants
last 30 patents
Information
Patent Grant
Control device, multi-projection system and control method of contr...
Patent number
12,212,896
Issue date
Jan 28, 2025
Seiko Epson Corporation
Akihiko Ota
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measurement method for B-H curve of magnetic material based on magn...
Patent number
11,965,942
Issue date
Apr 23, 2024
Southeast University
Ming Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Power calculation method of magnetic circuit
Patent number
11,709,211
Issue date
Jul 25, 2023
Southeast University
Ming Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Online automatic measurement system for integral magnetic performan...
Patent number
11,366,185
Issue date
Jun 21, 2022
JIANGSU LONGCHENG PRECISION FORGING GROUP CO., LTD.
Xiaofeng Tang
G01 - MEASURING TESTING
Information
Patent Grant
Control device, multi-projection system and control method of contr...
Patent number
11,290,695
Issue date
Mar 29, 2022
Seiko Epson Corporation
Akihiko Ota
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus
Patent number
11,112,381
Issue date
Sep 7, 2021
TOSHIBA MEMORY CORPORATION
Ken Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor including a magnetic member offset from a magnetore...
Patent number
11,022,660
Issue date
Jun 1, 2021
TDK Corporation
Kei Tanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Determining energy usage of a residence based on current monitoring
Patent number
10,830,796
Issue date
Nov 10, 2020
Potential Labs, LLC
Benjamin J. Lachman
G01 - MEASURING TESTING
Information
Patent Grant
Method for multicarrier mobility spectrum analysis
Patent number
10,551,427
Issue date
Feb 4, 2020
The United States of America as represented by the Secretary of the Army
William A. Beck
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for determining a magnetic field
Patent number
10,408,894
Issue date
Sep 10, 2019
MAGCAM NV
Koen Vervaeke
G01 - MEASURING TESTING
Information
Patent Grant
Determining energy usage of a residence based on current monitoring
Patent number
10,288,646
Issue date
May 14, 2019
Potential Labs, LLC
Benjamin J. Lachman
G01 - MEASURING TESTING
Information
Patent Grant
Resonant electromagnetic sensor and inspection system
Patent number
10,215,720
Issue date
Feb 26, 2019
Kevin D McGushion
G01 - MEASURING TESTING
Information
Patent Grant
Group III-V ferromagnetic/non-magnetic semiconductor heterojunction...
Patent number
10,209,323
Issue date
Feb 19, 2019
Northwestern University
Bruce W. Wessels
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic field detecting sensor and magnetic field detecting appara...
Patent number
9,983,273
Issue date
May 29, 2018
TDK Corporation
Akihiro Ogawa
G01 - MEASURING TESTING
Information
Patent Grant
Group III-V ferromagnetic/non-magnetic semiconductor heterojunction...
Patent number
9,612,299
Issue date
Apr 4, 2017
Northwestern University
Bruce W. Wessels
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic sensor, magnetic inspection device, and sheet processing a...
Patent number
9,588,193
Issue date
Mar 7, 2017
Kabushiki Kaisha Toshiba
Junji Miura
G07 - CHECKING-DEVICES
Information
Patent Grant
Resonant electromagnetic sensor and inspection system
Patent number
9,459,237
Issue date
Oct 4, 2016
Kevin D McGushion
G01 - MEASURING TESTING
Information
Patent Grant
Method of using group III-V ferromagnetic/non-magnetic semiconducto...
Patent number
7,956,608
Issue date
Jun 7, 2011
Northwestern University
Bruce W. Wessels
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Continuous observation apparatus and method of magnetic flux distri...
Patent number
7,417,425
Issue date
Aug 26, 2008
International Superconductivity Technology Center,the Juridical foundation
Takato Machi
G01 - MEASURING TESTING
Information
Patent Grant
Detection of polarized spin transport in semiconductors
Patent number
6,403,999
Issue date
Jun 11, 2002
Spinix Corporation
Robert O'Handley
G11 - INFORMATION STORAGE
Information
Patent Grant
Quantitative mobility spectrum analysis for magnetic field dependen...
Patent number
5,789,931
Issue date
Aug 4, 1998
The United States of America as represented by the Secretary of the Navy
Jerry R. Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing the resistive properties of magnet...
Patent number
5,696,445
Issue date
Dec 9, 1997
Phase Metrics
Michael Inbar
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus for testing Hall effect device
Patent number
5,032,791
Issue date
Jul 16, 1991
A & E Manufacturing Co., Inc.
James F. Bates
G01 - MEASURING TESTING
Information
Patent Grant
Contactless hall coefficient measurement apparatus and method for p...
Patent number
4,785,232
Issue date
Nov 15, 1988
The United States of America as represented by the Secretary of the Army
Arthur Ballato
G01 - MEASURING TESTING
Information
Patent Grant
Noncontacting measurement of hall effect in a wafer
Patent number
4,190,799
Issue date
Feb 26, 1980
Bell Telephone Laboratories, Incorporated
Gabriel L. Miller
G01 - MEASURING TESTING
Information
Patent Grant
3304530
Patent number
3,304,530
Issue date
Feb 14, 1967
G01 - MEASURING TESTING
Information
Patent Grant
3160762
Patent number
3,160,762
Issue date
Dec 8, 1964
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method, computer program, and system for determining respective tra...
Publication number
20240385262
Publication date
Nov 21, 2024
HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
Artem Musiienko
G01 - MEASURING TESTING
Information
Patent Application
POWER CALCULATION METHOD OF MAGNETIC CIRCUIT
Publication number
20220373621
Publication date
Nov 24, 2022
SOUTHEAST UNIVERSITY
Ming CHENG
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD FOR B-H CURVE OF MAGNETIC MATERIAL BASED ON MAGN...
Publication number
20220342014
Publication date
Oct 27, 2022
SOUTHEAST UNIVERSITY
Ming CHENG
G01 - MEASURING TESTING
Information
Patent Application
CONTROL DEVICE, MULTI-PROJECTION SYSTEM AND CONTROL METHOD OF CONTR...
Publication number
20220141431
Publication date
May 5, 2022
SEIKO EPSON CORPORATION
Akihiko OTA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
CONTROL DEVICE, MULTI-PROJECTION SYSTEM AND CONTROL METHOD OF CONTR...
Publication number
20210132118
Publication date
May 6, 2021
SEIKO EPSON CORPORATION
Akihiko OTA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20200300936
Publication date
Sep 24, 2020
TDK Corporation
kei TANABE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MEASUREMENT APPARATUS
Publication number
20200292497
Publication date
Sep 17, 2020
Toshiba Memory Corporation
Ken HOSHINO
G01 - MEASURING TESTING
Information
Patent Application
Online automatic measurement system for integral magnetic performan...
Publication number
20200284858
Publication date
Sep 10, 2020
JIANGSU LONGCHENG PREC FORGING CO LTD
XIAOFENG TANG
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
DETERMINING ENERGY USAGE OF A RESIDENCE BASED ON CURRENT MONITORING
Publication number
20190331713
Publication date
Oct 31, 2019
Potential Labs, LLC
Benjamin J. Lachman
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MULTICARRIER MOBILITY SPECTRUM ANALYSIS
Publication number
20180231602
Publication date
Aug 16, 2018
U.S. ARMY RESEARCH LABORATORY ATTN: RDRL-LOC-I
William A. Beck
G01 - MEASURING TESTING
Information
Patent Application
Group III-V Ferromagnetic/Non-magnetic Semiconductor Heterojunction...
Publication number
20170269172
Publication date
Sep 21, 2017
Northwestern University
Bruce W. Wessels
B82 - NANO-TECHNOLOGY
Information
Patent Application
Group III-V Ferromagnetic/Non-magnetic Semiconductor Heterojunction...
Publication number
20160018486
Publication date
Jan 21, 2016
Northwestern University
Bruce W. Wessels
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD DETECTING SENSOR AND MAGNETIC FIELD DETECTING APPARA...
Publication number
20150331072
Publication date
Nov 19, 2015
TDK Corporation
Akihiro OGAWA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR, MAGNETIC INSPECTION DEVICE, AND SHEET PROCESSING A...
Publication number
20150260805
Publication date
Sep 17, 2015
Kabushiki Kaisha Toshiba
Junji Miura
G01 - MEASURING TESTING
Information
Patent Application
Resonant electromagnetic sensor
Publication number
20120206143
Publication date
Aug 16, 2012
Kevin D. McGushion
G01 - MEASURING TESTING
Information
Patent Application
Resonant Electromagnetic Sensor
Publication number
20120206133
Publication date
Aug 16, 2012
Kevin D. McGushion
G01 - MEASURING TESTING
Information
Patent Application
Continuous observation apparatus and method of magnetic flux distri...
Publication number
20070108974
Publication date
May 17, 2007
International Superconductivity Technology Center, The Juridical Foundation
Takato Machi
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for measuring Hall effect
Publication number
20020175679
Publication date
Nov 28, 2002
Hoon Kim
G01 - MEASURING TESTING