Membership
Tour
Register
Log in
Measuring gradient
Follow
Industry
CPC
G01R33/022
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R33/00
Arrangements or instruments for measuring magnetic variables
Current Industry
G01R33/022
Measuring gradient
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
MEMS magnetometer and gradiometer arrays and patterns
Patent number
12,270,868
Issue date
Apr 8, 2025
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
Brain measurement apparatus and brain measurement method
Patent number
12,262,974
Issue date
Apr 1, 2025
Hamamatsu Photonics K.K.
Takenori Oida
G01 - MEASURING TESTING
Information
Patent Grant
Gradient magnetic field sensor and magnetic matter detection device
Patent number
12,204,001
Issue date
Jan 21, 2025
TDK Corporation
Atsushi Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale scanning sensors
Patent number
12,169,209
Issue date
Dec 17, 2024
President and Fellows of Harvard College
Michael S. Grinolds
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for determining existence of magnetic disturbances
Patent number
12,105,111
Issue date
Oct 1, 2024
SWORD HEALTH, S.A.
Marta Maria Ramalho Ferreira
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Indoor access point position management
Patent number
12,099,133
Issue date
Sep 24, 2024
Hewlett Packard Enterprise Development LP
Jianpo Han
G01 - MEASURING TESTING
Information
Patent Grant
Magnetostrictive MEMS magnetic gradiometer
Patent number
11,988,727
Issue date
May 21, 2024
HRL Laboratories, LLC
Randall L. Kubena
G01 - MEASURING TESTING
Information
Patent Grant
In-vivo monitoring of an internal volume of a mammal using magnetic...
Patent number
11,944,423
Issue date
Apr 2, 2024
California Institute of Technology
Saransh Sharma
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic detector, detection method, and non-transitory computer re...
Patent number
11,946,986
Issue date
Apr 2, 2024
FUJIDENOLO CO., LTD.
Hideki Miyazaki
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring second order and higher gradients
Patent number
11,933,864
Issue date
Mar 19, 2024
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
System and method for parking detection and identification of movea...
Patent number
11,893,885
Issue date
Feb 6, 2024
National Central University
Chien-Chih Chen
G08 - SIGNALLING
Information
Patent Grant
Single point gradiometer
Patent number
11,874,343
Issue date
Jan 16, 2024
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for measuring a magnetic field gradient
Patent number
11,846,687
Issue date
Dec 19, 2023
Melexis Technologies SA
Nicolas Dupre
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor sensitivity matching calibration
Patent number
11,828,827
Issue date
Nov 28, 2023
Melexis Technologies NV
Samuel Huber Lindenberger
G01 - MEASURING TESTING
Information
Patent Grant
Current sensor system
Patent number
11,815,533
Issue date
Nov 14, 2023
Melexis Technologies SA
Simon Houis
G01 - MEASURING TESTING
Information
Patent Grant
Nanoscale scanning sensors
Patent number
11,815,528
Issue date
Nov 14, 2023
President and Fellows of Harvard College
Michael S. Grinolds
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring mechanism and measuring method of linear motion...
Patent number
11,774,521
Issue date
Oct 3, 2023
Hiwin Mikrosystem Corp.
Mikhail Tiapkin
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring second order and higher gradients
Patent number
11,693,065
Issue date
Jul 4, 2023
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor system
Patent number
11,693,067
Issue date
Jul 4, 2023
TDK Corporation
Shunji Saruki
G01 - MEASURING TESTING
Information
Patent Grant
Movement sensing device
Patent number
11,686,784
Issue date
Jun 27, 2023
iSentek Inc.
Chia-Chih Shieh
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnet control device and electromagnet system
Patent number
11,662,397
Issue date
May 30, 2023
Ebara Corporation
Haruka Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Single point gradiomeier
Patent number
11,614,501
Issue date
Mar 28, 2023
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Grant
Biomagnetic field sensor systems and methods for diagnostic evaluat...
Patent number
11,585,869
Issue date
Feb 21, 2023
Genetesis, Inc.
Emmanuel T. Setegn
G01 - MEASURING TESTING
Information
Patent Grant
Phononic comb enhanced gradiometers
Patent number
11,567,147
Issue date
Jan 31, 2023
HRL Laboratories, LLC
Randall L. Kubena
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for measuring a magnetic field gradient
Patent number
11,561,268
Issue date
Jan 24, 2023
Melexis Technologies SA
Nicolas Dupre
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor device
Patent number
11,555,870
Issue date
Jan 17, 2023
TDK Corporation
Kazuya Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Casimir-enabled sensing system and method
Patent number
11,550,003
Issue date
Jan 10, 2023
Trustees of Boston University
David J. Bishop
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive Z-axis gradient sensor chip
Patent number
11,536,779
Issue date
Dec 27, 2022
MultiDimension Technology Co., Ltd.
James Geza Deak
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic gradiometers
Patent number
11,525,870
Issue date
Dec 13, 2022
The Charles Stark Draper Laboratory, Inc.
James A. Bickford
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing magnetic detection blind zone
Patent number
11,460,518
Issue date
Oct 4, 2022
Harbin Institute of Technology
Donghua Pan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Sensor Unit and Method for Detecting Brain-Wave-Induced Magnetic Fi...
Publication number
20250152063
Publication date
May 15, 2025
ROBERT BOSCH GmbH
Felix Michael Stuerner
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
MEASURING ASSEMBLIES AND METHOD FOR DETERMINING A MAGNETIC GRADIENT...
Publication number
20250138114
Publication date
May 1, 2025
Zhe Lei
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL SENSOR WITH A HIGH DYNAMIC RANGE FOR MEASURING GRADIENT CUR...
Publication number
20250138118
Publication date
May 1, 2025
Siemens Healthineers AG
Jan Bollenbeck
G01 - MEASURING TESTING
Information
Patent Application
SENSOR LAYOUT IN A MAGNETOMETER SYSTEM
Publication number
20250076417
Publication date
Mar 6, 2025
FieldLine Inc.
Svenja Knappe
G01 - MEASURING TESTING
Information
Patent Application
A SYSTEM AND METHOD OF MEASURING ELECTRIC AND/OR MAGNETIC FIELD OF...
Publication number
20250044379
Publication date
Feb 6, 2025
Argeo Robotics AS
Johan Mattsson
G01 - MEASURING TESTING
Information
Patent Application
MEMS MAGNETOMETER AND GRADIOMETER ARRAYS AND PATTERNS
Publication number
20240385261
Publication date
Nov 21, 2024
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR DETERMINING AN ORIENTATION OF A MAGNET, AND A...
Publication number
20240230793
Publication date
Jul 11, 2024
Melexis Technologies SA
Lionel TOMBEZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MAGNETIC FIELD GRADIOMETER
Publication number
20240230794
Publication date
Jul 11, 2024
Q.ant GmbH
Robert Roelver
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD GRADIOMETER
Publication number
20240133979
Publication date
Apr 25, 2024
Q.ant GmbH
Robert Roelver
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR DETERMINING AN ORIENTATION OF A MAGNET, AND A...
Publication number
20240133978
Publication date
Apr 25, 2024
Melexis Technologies SA
Lionel TOMBEZ
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NANOSCALE SCANNING SENSORS
Publication number
20240044938
Publication date
Feb 8, 2024
President and Fellows of Harvard College
Michael S. GRINOLDS
G01 - MEASURING TESTING
Information
Patent Application
CURRENT SENSOR SYSTEM
Publication number
20240036084
Publication date
Feb 1, 2024
Melexis Technologies SA
Simon HOUIS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS
Publication number
20230305082
Publication date
Sep 28, 2023
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Application
TIME EFFICIENT MULTI-PULSED FIELD GRADIENT (MPFG) MRI WITHOUT CONCO...
Publication number
20230266418
Publication date
Aug 24, 2023
The United States of America,as represented by the Secretary,Department of He...
Magdoom Mohamed Kulam Najmudeen
G01 - MEASURING TESTING
Information
Patent Application
GRADIENT MAGNETIC FIELD SENSOR AND MAGNETIC MATTER DETECTION DEVICE
Publication number
20230258744
Publication date
Aug 17, 2023
TDK Corporation
Atsushi MATSUDA
G01 - MEASURING TESTING
Information
Patent Application
INVERSE ESTIMATION-BASED RADIUS CALCULATION METHOD AND SYSTEM FOR F...
Publication number
20230213599
Publication date
Jul 6, 2023
HUAZHONG UNIVERSITY OF SCIENCE & TECHNOLOGY
Tianxu ZHANG
G01 - MEASURING TESTING
Information
Patent Application
SINGLE POINT GRADIOMETER
Publication number
20230204690
Publication date
Jun 29, 2023
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Application
BIOMAGNETIC FIELD SENSOR SYSTEMS AND METHODS FOR DIAGNOSTIC EVALUAT...
Publication number
20230204688
Publication date
Jun 29, 2023
Genetesis, Inc.
Emmanuel T. SETEGN
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
DEVICES AND METHODS FOR MEASURING A MAGNETIC FIELD GRADIENT
Publication number
20230160979
Publication date
May 25, 2023
Melexis Technologies SA
Nicolas DUPRE
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC GRADIOMETERS
Publication number
20230097313
Publication date
Mar 30, 2023
The Charles Stark Draper Laboratory, Inc.
James A. Bickford
G01 - MEASURING TESTING
Information
Patent Application
INDOOR ACCESS POINT POSITION MANAGEMENT
Publication number
20230099699
Publication date
Mar 30, 2023
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Jianpo HAN
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR SENSITIVITY MATCHING CALIBRATION
Publication number
20230094526
Publication date
Mar 30, 2023
MELEXIS TECHNOLOGIES NV
Samuel HUBER LINDENBERGER
G01 - MEASURING TESTING
Information
Patent Application
SENSOR LOCALIZATION IN A MAGNETOENCEPHALOGRAPHY (MEG) SYSTEM
Publication number
20230074561
Publication date
Mar 9, 2023
FieldLine Inc.
Aaron Park
G01 - MEASURING TESTING
Information
Patent Application
NANOSCALE SCANNING SENSORS
Publication number
20220413007
Publication date
Dec 29, 2022
President and Fellows of Harvard College
Michael S. GRINOLDS
G01 - MEASURING TESTING
Information
Patent Application
BRAIN MEASUREMENT APPARATUS AND BRAIN MEASUREMENT METHOD
Publication number
20220386873
Publication date
Dec 8, 2022
HAMAMATSU PHOTONICS K. K.
Takenori OIDA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS
Publication number
20220291300
Publication date
Sep 15, 2022
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Application
CASIMIR-ENABLED SENSING SYSTEM AND METHOD
Publication number
20220291299
Publication date
Sep 15, 2022
Trustees of Boston University
David J. Bishop
G01 - MEASURING TESTING
Information
Patent Application
SINGLE POINT GRADIOMETER
Publication number
20220291301
Publication date
Sep 15, 2022
Trustees of Boston University
Joshua Javor
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNET CONTROL DEVICE AND ELECTROMAGNET SYSTEM
Publication number
20220236341
Publication date
Jul 28, 2022
EBARA CORPORATION
Haruka TAKEUCHI
G01 - MEASURING TESTING
Information
Patent Application
POSITION MEASURING MECHANISM AND MEASURING METHOD OF LINEAR MOTION...
Publication number
20220229123
Publication date
Jul 21, 2022
HIWIN MIKROSYSTEM CORP.
Mikhail TIAPKIN
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER