Measuring gradient

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G01R33/022

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

Current Industry

G01R33/022Measuring gradient

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining existence of magnetic disturbances
- Patent number 12,105,111
- Issue date Oct 1, 2024
- SWORD HEALTH, S.A.
- Marta Maria Ramalho Ferreira
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Indoor access point position management
- Patent number 12,099,133
- Issue date Sep 24, 2024
- Hewlett Packard Enterprise Development LP
- Jianpo Han
- G01 - MEASURING TESTING
Information Patent Grant
Magnetostrictive MEMS magnetic gradiometer
- Patent number 11,988,727
- Issue date May 21, 2024
- HRL Laboratories, LLC
- Randall L. Kubena
- G01 - MEASURING TESTING
Information Patent Grant
In-vivo monitoring of an internal volume of a mammal using magnetic...
- Patent number 11,944,423
- Issue date Apr 2, 2024
- California Institute of Technology
- Saransh Sharma
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic detector, detection method, and non-transitory computer re...
- Patent number 11,946,986
- Issue date Apr 2, 2024
- FUJIDENOLO CO., LTD.
- Hideki Miyazaki
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring second order and higher gradients
- Patent number 11,933,864
- Issue date Mar 19, 2024
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Grant
System and method for parking detection and identification of movea...
- Patent number 11,893,885
- Issue date Feb 6, 2024
- National Central University
- Chien-Chih Chen
- G08 - SIGNALLING
Information Patent Grant
Single point gradiometer
- Patent number 11,874,343
- Issue date Jan 16, 2024
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for measuring a magnetic field gradient
- Patent number 11,846,687
- Issue date Dec 19, 2023
- Melexis Technologies SA
- Nicolas Dupre
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor sensitivity matching calibration
- Patent number 11,828,827
- Issue date Nov 28, 2023
- Melexis Technologies NV
- Samuel Huber Lindenberger
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor system
- Patent number 11,815,533
- Issue date Nov 14, 2023
- Melexis Technologies SA
- Simon Houis
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring mechanism and measuring method of linear motion...
- Patent number 11,774,521
- Issue date Oct 3, 2023
- Hiwin Mikrosystem Corp.
- Mikhail Tiapkin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for measuring second order and higher gradients
- Patent number 11,693,065
- Issue date Jul 4, 2023
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor system
- Patent number 11,693,067
- Issue date Jul 4, 2023
- TDK Corporation
- Shunji Saruki
- G01 - MEASURING TESTING
Information Patent Grant
Movement sensing device
- Patent number 11,686,784
- Issue date Jun 27, 2023
- iSentek Inc.
- Chia-Chih Shieh
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnet control device and electromagnet system
- Patent number 11,662,397
- Issue date May 30, 2023
- Ebara Corporation
- Haruka Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Single point gradiomeier
- Patent number 11,614,501
- Issue date Mar 28, 2023
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Grant
Biomagnetic field sensor systems and methods for diagnostic evaluat...
- Patent number 11,585,869
- Issue date Feb 21, 2023
- Genetesis, Inc.
- Emmanuel T. Setegn
- G01 - MEASURING TESTING
Information Patent Grant
Phononic comb enhanced gradiometers
- Patent number 11,567,147
- Issue date Jan 31, 2023
- HRL Laboratories, LLC
- Randall L. Kubena
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for measuring a magnetic field gradient
- Patent number 11,561,268
- Issue date Jan 24, 2023
- Melexis Technologies SA
- Nicolas Dupre
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor device
- Patent number 11,555,870
- Issue date Jan 17, 2023
- TDK Corporation
- Kazuya Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Casimir-enabled sensing system and method
- Patent number 11,550,003
- Issue date Jan 10, 2023
- Trustees of Boston University
- David J. Bishop
- G01 - MEASURING TESTING
Information Patent Grant
Magnetoresistive Z-axis gradient sensor chip
- Patent number 11,536,779
- Issue date Dec 27, 2022
- MultiDimension Technology Co., Ltd.
- James Geza Deak
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic gradiometers
- Patent number 11,525,870
- Issue date Dec 13, 2022
- The Charles Stark Draper Laboratory, Inc.
- James A. Bickford
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing magnetic detection blind zone
- Patent number 11,460,518
- Issue date Oct 4, 2022
- Harbin Institute of Technology
- Donghua Pan
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnet gradient coil apparatus for micro-device localization
- Patent number 11,457,835
- Issue date Oct 4, 2022
- California Institute of Technology
- Saransh Sharma
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor using multiple gradiometers for angle detection
- Patent number 11,460,289
- Issue date Oct 4, 2022
- Infineon Technologies AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Grant
Method for making a magnetic gradiometer with high detection accura...
- Patent number 11,460,519
- Issue date Oct 4, 2022
- Harbin Institute of Technology
- Donghua Pan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMS MAGNETOMETER AND GRADIOMETER ARRAYS AND PATTERNS
- Publication number 20240385261
- Publication date Nov 21, 2024
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETERMINING AN ORIENTATION OF A MAGNET, AND A...
- Publication number 20240230793
- Publication date Jul 11, 2024
- Melexis Technologies SA
- Lionel TOMBEZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MAGNETIC FIELD GRADIOMETER
- Publication number 20240230794
- Publication date Jul 11, 2024
- Q.ant GmbH
- Robert Roelver
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD GRADIOMETER
- Publication number 20240133979
- Publication date Apr 25, 2024
- Q.ant GmbH
- Robert Roelver
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETERMINING AN ORIENTATION OF A MAGNET, AND A...
- Publication number 20240133978
- Publication date Apr 25, 2024
- Melexis Technologies SA
- Lionel TOMBEZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR SYSTEM
- Publication number 20240036084
- Publication date Feb 1, 2024
- Melexis Technologies SA
- Simon HOUIS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS
- Publication number 20230305082
- Publication date Sep 28, 2023
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Application
TIME EFFICIENT MULTI-PULSED FIELD GRADIENT (MPFG) MRI WITHOUT CONCO...
- Publication number 20230266418
- Publication date Aug 24, 2023
- The United States of America,as represented by the Secretary,Department of He...
- Magdoom Mohamed Kulam Najmudeen
- G01 - MEASURING TESTING
Information Patent Application
GRADIENT MAGNETIC FIELD SENSOR AND MAGNETIC MATTER DETECTION DEVICE
- Publication number 20230258744
- Publication date Aug 17, 2023
- TDK Corporation
- Atsushi MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
INVERSE ESTIMATION-BASED RADIUS CALCULATION METHOD AND SYSTEM FOR F...
- Publication number 20230213599
- Publication date Jul 6, 2023
- HUAZHONG UNIVERSITY OF SCIENCE & TECHNOLOGY
- Tianxu ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SINGLE POINT GRADIOMETER
- Publication number 20230204690
- Publication date Jun 29, 2023
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Application
BIOMAGNETIC FIELD SENSOR SYSTEMS AND METHODS FOR DIAGNOSTIC EVALUAT...
- Publication number 20230204688
- Publication date Jun 29, 2023
- Genetesis, Inc.
- Emmanuel T. SETEGN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DEVICES AND METHODS FOR MEASURING A MAGNETIC FIELD GRADIENT
- Publication number 20230160979
- Publication date May 25, 2023
- Melexis Technologies SA
- Nicolas DUPRE
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC GRADIOMETERS
- Publication number 20230097313
- Publication date Mar 30, 2023
- The Charles Stark Draper Laboratory, Inc.
- James A. Bickford
- G01 - MEASURING TESTING
Information Patent Application
INDOOR ACCESS POINT POSITION MANAGEMENT
- Publication number 20230099699
- Publication date Mar 30, 2023
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Jianpo HAN
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR SENSITIVITY MATCHING CALIBRATION
- Publication number 20230094526
- Publication date Mar 30, 2023
- MELEXIS TECHNOLOGIES NV
- Samuel HUBER LINDENBERGER
- G01 - MEASURING TESTING
Information Patent Application
SENSOR LOCALIZATION IN A MAGNETOENCEPHALOGRAPHY (MEG) SYSTEM
- Publication number 20230074561
- Publication date Mar 9, 2023
- FieldLine Inc.
- Aaron Park
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20220413007
- Publication date Dec 29, 2022
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
BRAIN MEASUREMENT APPARATUS AND BRAIN MEASUREMENT METHOD
- Publication number 20220386873
- Publication date Dec 8, 2022
- HAMAMATSU PHOTONICS K. K.
- Takenori OIDA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS
- Publication number 20220291300
- Publication date Sep 15, 2022
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Application
CASIMIR-ENABLED SENSING SYSTEM AND METHOD
- Publication number 20220291299
- Publication date Sep 15, 2022
- Trustees of Boston University
- David J. Bishop
- G01 - MEASURING TESTING
Information Patent Application
SINGLE POINT GRADIOMETER
- Publication number 20220291301
- Publication date Sep 15, 2022
- Trustees of Boston University
- Joshua Javor
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNET CONTROL DEVICE AND ELECTROMAGNET SYSTEM
- Publication number 20220236341
- Publication date Jul 28, 2022
- EBARA CORPORATION
- Haruka TAKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASURING MECHANISM AND MEASURING METHOD OF LINEAR MOTION...
- Publication number 20220229123
- Publication date Jul 21, 2022
- HIWIN MIKROSYSTEM CORP.
- Mikhail TIAPKIN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MAGNETIC DETECTOR, DETECTION METHOD, AND NON-TRANSITORY COMPUTER RE...
- Publication number 20220221529
- Publication date Jul 14, 2022
- FUJIDENOLO CO., LTD.
- Hideki MIYAZAKI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR SYSTEM
- Publication number 20220120829
- Publication date Apr 21, 2022
- TDK Corporation
- Shunji SARUKI
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR SYSTEM
- Publication number 20220091161
- Publication date Mar 24, 2022
- Melexis Technologies SA
- Simon HOUIS
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR DEVICE
- Publication number 20220043080
- Publication date Feb 10, 2022
- TDK Corporation
- Kazuya WATANABE
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL ATOMIC MAGNETIC DETECTOR
- Publication number 20220018910
- Publication date Jan 20, 2022
- COGNITIVE MEDICAL IMAGING LTD.
- Fan WANG
- G01 - MEASURING TESTING

Measuring gradient

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanoscale scanning sensors

Method and system for determining existence of magnetic disturbances

Indoor access point position management

Magnetostrictive MEMS magnetic gradiometer

In-vivo monitoring of an internal volume of a mammal using magnetic...

Magnetic detector, detection method, and non-transitory computer re...

System and method for measuring second order and higher gradients

System and method for parking detection and identification of movea...

Single point gradiometer

Devices and methods for measuring a magnetic field gradient

Magnetic sensor sensitivity matching calibration

Current sensor system

Nanoscale scanning sensors

Position measuring mechanism and measuring method of linear motion...

System and method for measuring second order and higher gradients

Magnetic sensor system

Movement sensing device

Electromagnet control device and electromagnet system

Single point gradiomeier

Biomagnetic field sensor systems and methods for diagnostic evaluat...

Phononic comb enhanced gradiometers

Devices and methods for measuring a magnetic field gradient

Magnetic sensor device

Casimir-enabled sensing system and method

Magnetoresistive Z-axis gradient sensor chip

Electromagnetic gradiometers

Method for analyzing magnetic detection blind zone

Electromagnet gradient coil apparatus for micro-device localization

Magnetic sensor using multiple gradiometers for angle detection

Method for making a magnetic gradiometer with high detection accura...

Patents Applicationslast 30 patents

MEMS MAGNETOMETER AND GRADIOMETER ARRAYS AND PATTERNS

DEVICE AND METHOD FOR DETERMINING AN ORIENTATION OF A MAGNET, AND A...

MAGNETIC FIELD GRADIOMETER

MAGNETIC FIELD GRADIOMETER

DEVICE AND METHOD FOR DETERMINING AN ORIENTATION OF A MAGNET, AND A...

NANOSCALE SCANNING SENSORS

CURRENT SENSOR SYSTEM

SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS

TIME EFFICIENT MULTI-PULSED FIELD GRADIENT (MPFG) MRI WITHOUT CONCO...

GRADIENT MAGNETIC FIELD SENSOR AND MAGNETIC MATTER DETECTION DEVICE

INVERSE ESTIMATION-BASED RADIUS CALCULATION METHOD AND SYSTEM FOR F...

SINGLE POINT GRADIOMETER

BIOMAGNETIC FIELD SENSOR SYSTEMS AND METHODS FOR DIAGNOSTIC EVALUAT...

DEVICES AND METHODS FOR MEASURING A MAGNETIC FIELD GRADIENT

ELECTROMAGNETIC GRADIOMETERS

INDOOR ACCESS POINT POSITION MANAGEMENT

MAGNETIC SENSOR SENSITIVITY MATCHING CALIBRATION

SENSOR LOCALIZATION IN A MAGNETOENCEPHALOGRAPHY (MEG) SYSTEM

NANOSCALE SCANNING SENSORS

BRAIN MEASUREMENT APPARATUS AND BRAIN MEASUREMENT METHOD

SYSTEM AND METHOD FOR MEASURING SECOND ORDER AND HIGHER GRADIENTS

CASIMIR-ENABLED SENSING SYSTEM AND METHOD

SINGLE POINT GRADIOMETER

ELECTROMAGNET CONTROL DEVICE AND ELECTROMAGNET SYSTEM

POSITION MEASURING MECHANISM AND MEASURING METHOD OF LINEAR MOTION...

MAGNETIC DETECTOR, DETECTION METHOD, AND NON-TRANSITORY COMPUTER RE...

MAGNETIC SENSOR SYSTEM

CURRENT SENSOR SYSTEM

MAGNETIC SENSOR DEVICE

MULTI-CHANNEL ATOMIC MAGNETIC DETECTOR