Measuring or testing

Industry

CPC
H03M1/1071

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Parent Industries

HELECTRICITY H03Electronic circuits H03MCODING DECODING CODE CONVERSION IN GENERAL H03M1/00Analogue/digital conversion Digital/analogue conversion

Current Industry

H03M1/1071Measuring or testing

Industries

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and control method for the same
- Patent number 12,126,352
- Issue date Oct 22, 2024
- Renesas Electronics Corporation
- Wataru Saito
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automated waveform validation
- Patent number 12,101,098
- Issue date Sep 24, 2024
- International Business Machines Corporation
- Timothy Lindquist
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Feed-forward in tracking analog-to-digital converter
- Patent number 12,081,226
- Issue date Sep 3, 2024
- Apple Inc.
- Giovanni Saccomanno
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Input stage for a sample analog to digital converter, sample analog...
- Patent number 12,068,754
- Issue date Aug 20, 2024
- Infineon Technologies AG
- Florian Renneke
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog system and associated methods thereof
- Patent number 12,057,850
- Issue date Aug 6, 2024
- Frank R. Dropps
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
CMOS image sensor with internal reference voltage and current detec...
- Patent number 12,022,223
- Issue date Jun 25, 2024
- Smart Sens Technology (HK) Co., Ltd.
- Guang Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device under test (DUT) measurement circuit having harmonic minimiz...
- Patent number 12,000,892
- Issue date Jun 4, 2024
- Texas Instruments Incorporated
- Charles Kasimer Sestok
- G01 - MEASURING TESTING
Information Patent Grant
Circuitry and method for reducing environmental noise
- Patent number 11,996,856
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chung-Ting Lu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Synchronized controller
- Patent number 11,962,280
- Issue date Apr 16, 2024
- Crestron Electronics, Inc.
- Ekin Binal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor chip providing on-chip self-testing of an ana-log-to-...
- Patent number 11,962,320
- Issue date Apr 16, 2024
- Intel Corporation
- Kameran Azadet
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit having a digital to analog converter
- Patent number 11,942,961
- Issue date Mar 26, 2024
- STMicroelectronics S.r.l.
- Daniele Oreggia
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit
- Patent number 11,888,494
- Issue date Jan 30, 2024
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Masao Iriguchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Error calibration apparatus and method
- Patent number 11,876,527
- Issue date Jan 16, 2024
- Skymizer Taiwan Inc.
- Wen Li Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test circuits and semiconductor integrated circuits i...
- Patent number 11,867,757
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Heejune Lee
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital-to-analog conversion apparatus and method having signal cal...
- Patent number 11,784,654
- Issue date Oct 10, 2023
- Realtek Semiconductor Corporation
- Hsuan-Ting Ho
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog system and associated methods thereof
- Patent number 11,716,088
- Issue date Aug 1, 2023
- Frank R. Dropps
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Root monitoring on an FPGA using satellite ADCs
- Patent number 11,709,275
- Issue date Jul 25, 2023
- Xilinx, Inc.
- Brendan Farley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter circuit, corresponding system and method
- Patent number 11,658,674
- Issue date May 23, 2023
- STMicroelectronics S.r.l.
- Nicola Errico
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Driver circuitry
- Patent number 11,658,673
- Issue date May 23, 2023
- Cirrus Logic, Inc.
- Ross C. Morgan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Non-linear inter-ADC calibration by time equidistant triggering
- Patent number 11,621,717
- Issue date Apr 4, 2023
- Infineon Technologies AG
- Mihail Jefremow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter, sensor system , and test system
- Patent number 11,611,349
- Issue date Mar 21, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Koji Obata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses involving calibration of input offset voltage and signa...
- Patent number 11,585,849
- Issue date Feb 21, 2023
- NXP USA, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuitry and method for reducing environmental noise
- Patent number 11,588,493
- Issue date Feb 21, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chung-Ting Lu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit for analog/digital conversion
- Patent number 11,581,898
- Issue date Feb 14, 2023
- WAGO Verwaltungsgesellschaft mbH
- Thorsten Lindner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converting device and control system
- Patent number 11,581,899
- Issue date Feb 14, 2023
- Denso Wave Incorporated
- Hiroshi Endo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems with ADC circuitry and associated methods
- Patent number 11,489,537
- Issue date Nov 1, 2022
- Semiconductor Components Industries, LLC
- Bharat Balar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal-to-noise based error detection
- Patent number 11,488,050
- Issue date Nov 1, 2022
- International Business Machines Corporation
- Priti Ashvin Shah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for testing successive approximation register ana...
- Patent number 11,463,098
- Issue date Oct 4, 2022
- STMICROELECTRONICS INTERNATIONAL N.V.
- Ankur Bal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for detecting signal features
- Patent number 11,443,137
- Issue date Sep 13, 2022
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Noise-shaping analog-to-digital converter
- Patent number 11,424,754
- Issue date Aug 23, 2022
- NXP B.V.
- Michael Todd Berens
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF
- Publication number 20240396561
- Publication date Nov 28, 2024
- Frank R. Dropps
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYNCHRONIZED CONTROLLER
- Publication number 20240339979
- Publication date Oct 10, 2024
- CRESTRON ELECTRONICS, INC.
- Ekin Binal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUCCESSIVE APPROXIMATION REGISTER A/D CONVERTER
- Publication number 20240322835
- Publication date Sep 26, 2024
- ROHM CO., LTD.
- Haruaki NAKAMURA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUITRY FOR MEASUREMENT OF ELECTROCHEMICAL CELLS
- Publication number 20240322834
- Publication date Sep 26, 2024
- Cirrus Logic International Semiconductor Ltd.
- John P. LESSO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20240310440
- Publication date Sep 19, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING
- Publication number 20240295601
- Publication date Sep 5, 2024
- QUALCOMM Incorporated
- Zdravko LUKIC
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUITRY AND METHOD FOR REDUCING ENVIRONMENTAL NOISE
- Publication number 20240275395
- Publication date Aug 15, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHUNG-TING LU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CLOCKING SCHEME FOR REDUCED NOISE IN CONTINUOUS-TIME SIGMA-DELTA ADCS
- Publication number 20240267055
- Publication date Aug 8, 2024
- InvenSense, Inc.
- Omid Oliaei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AVS Architecture for SAR ADC
- Publication number 20240243751
- Publication date Jul 18, 2024
- Marvell Asia Pte Ltd.
- Benjamin Tomas Reyes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Feed-Forward in Tracking Analog-to-Digital Converter
- Publication number 20240088909
- Publication date Mar 14, 2024
- Apple Inc.
- Giovanni Saccomanno
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
AUTOMATED WAVEFORM VALIDATION
- Publication number 20240063810
- Publication date Feb 22, 2024
- International Business Machines Corporation
- Timothy Lindquist
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE AND METHOD FOR TIME SKEW CALIBRATION OF MULTI CHANNEL ADC
- Publication number 20240056091
- Publication date Feb 15, 2024
- STMicroelectronics International N.V.
- Ankur BAL
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CMOS IMAGE SENSOR WITH INTERNAL REFERENCE VOLTAGE AND CURRENT DETEC...
- Publication number 20240022841
- Publication date Jan 18, 2024
- SmartSens Technology (HK) Co., Ltd.
- Guang Yang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE AND FAILURE DETECTION METHOD
- Publication number 20230353162
- Publication date Nov 2, 2023
- LAPIS Technology Co., Ltd.
- Motoki UEDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF
- Publication number 20230275591
- Publication date Aug 31, 2023
- Frank R. Dropps
- G01 - MEASURING TESTING
Information Patent Application
DRIVER CIRCUITRY
- Publication number 20230216515
- Publication date Jul 6, 2023
- Cirrus Logic International Semiconductor Ltd.
- Ross C. MORGAN
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TESTING APPARATUS AND TESTING METHOD FOR A/D CONVERTER
- Publication number 20230176107
- Publication date Jun 8, 2023
- ROHM CO., LTD.
- Keno SATO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETECTING ANALOG SIGNALS ON AN AMPLIFIER INPU...
- Publication number 20230163773
- Publication date May 25, 2023
- CRESTRON ELECTRONICS, INC.
- Ekin Binal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE AND CONTROL METHOD FOR THE SAME
- Publication number 20230138391
- Publication date May 4, 2023
- RENESAS ELECTRONICS CORPORATION
- Wataru SAITO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUITRY AND METHOD FOR REDUCING ENVIRONMENTAL NOISE
- Publication number 20230121395
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHUNG-TING LU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ERROR CALIBRATION APPARATUS AND METHOD
- Publication number 20230097158
- Publication date Mar 30, 2023
- Skymizer Taiwan Inc.
- Wen Li Tang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Input Stage for a Sample Analog to Digital Converter, Sample Analog...
- Publication number 20230045504
- Publication date Feb 9, 2023
- INFINEON TECHNOLOGIES AG
- Florian Renneke
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Digital-to-analog conversion apparatus and method having signal cal...
- Publication number 20220407531
- Publication date Dec 22, 2022
- REALTEK SEMICONDUCTOR CORPORATION
- HSUAN-TING HO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUITRY AND METHOD FOR REDUCING ENVIRONMENTAL NOISE
- Publication number 20220393695
- Publication date Dec 8, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHUNG-TING LU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR CHIP PROVIDING ON-CHIP SELF-TESTING OF AN ANA-LOG-TO-...
- Publication number 20220345144
- Publication date Oct 27, 2022
- Intel Corporation
- Kameran AZADET
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SENSOR INTERFACES FOR FUNCTIONAL SAFETY APPLICATIONS
- Publication number 20220337263
- Publication date Oct 20, 2022
- MELEXIS TECHNOLOGIES NV
- Johan VERGAUWEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRONIC CIRCUIT HAVING A DIGITAL TO ANALOG CONVERTER
- Publication number 20220329252
- Publication date Oct 13, 2022
- STMicroelectronics S.r.l.
- Daniele OREGGIA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...
- Publication number 20220268838
- Publication date Aug 25, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Charles Kasimer SESTOK
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT UNIT CONFIGURED TO PROVIDE A MEASUREMENT RESULT VALUE
- Publication number 20220263517
- Publication date Aug 18, 2022
- Advantest Corporation
- Andreas BEERMANN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BUILT-IN SELF-TEST CIRCUITS AND SEMICONDUCTOR INTEGRATED CIRCUITS I...
- Publication number 20220187366
- Publication date Jun 16, 2022
- Samsung Electronics Co., Ltd.
- Heejune Lee
- H03 - BASIC ELECTRONIC CIRCUITRY

Measuring or testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor device and control method for the same

Automated waveform validation

Feed-forward in tracking analog-to-digital converter

Input stage for a sample analog to digital converter, sample analog...

Analog system and associated methods thereof

CMOS image sensor with internal reference voltage and current detec...

Device under test (DUT) measurement circuit having harmonic minimiz...

Circuitry and method for reducing environmental noise

Synchronized controller

Semiconductor chip providing on-chip self-testing of an ana-log-to-...

Electronic circuit having a digital to analog converter

Semiconductor integrated circuit

Error calibration apparatus and method

Built-in self-test circuits and semiconductor integrated circuits i...

Digital-to-analog conversion apparatus and method having signal cal...

Analog system and associated methods thereof

Root monitoring on an FPGA using satellite ADCs

Analog-to-digital converter circuit, corresponding system and method

Driver circuitry

Non-linear inter-ADC calibration by time equidistant triggering

Analog-to-digital converter, sensor system , and test system

Apparatuses involving calibration of input offset voltage and signa...

Circuitry and method for reducing environmental noise

Circuit for analog/digital conversion

Analog-to-digital converting device and control system

Systems with ADC circuitry and associated methods

Signal-to-noise based error detection

Method and device for testing successive approximation register ana...

Method and apparatus for detecting signal features

Noise-shaping analog-to-digital converter

Patents Applicationslast 30 patents

ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF

SYNCHRONIZED CONTROLLER

SUCCESSIVE APPROXIMATION REGISTER A/D CONVERTER

CIRCUITRY FOR MEASUREMENT OF ELECTROCHEMICAL CELLS

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

DISTRIBUTED BUILT-IN SELF-TEST AND MONITORING

CIRCUITRY AND METHOD FOR REDUCING ENVIRONMENTAL NOISE

CLOCKING SCHEME FOR REDUCED NOISE IN CONTINUOUS-TIME SIGMA-DELTA ADCS

AVS Architecture for SAR ADC

Feed-Forward in Tracking Analog-to-Digital Converter

AUTOMATED WAVEFORM VALIDATION

DEVICE AND METHOD FOR TIME SKEW CALIBRATION OF MULTI CHANNEL ADC

CMOS IMAGE SENSOR WITH INTERNAL REFERENCE VOLTAGE AND CURRENT DETEC...

SEMICONDUCTOR DEVICE AND FAILURE DETECTION METHOD

ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF

DRIVER CIRCUITRY

TESTING APPARATUS AND TESTING METHOD FOR A/D CONVERTER

SYSTEM AND METHOD FOR DETECTING ANALOG SIGNALS ON AN AMPLIFIER INPU...

SEMICONDUCTOR DEVICE AND CONTROL METHOD FOR THE SAME

CIRCUITRY AND METHOD FOR REDUCING ENVIRONMENTAL NOISE

ERROR CALIBRATION APPARATUS AND METHOD

Input Stage for a Sample Analog to Digital Converter, Sample Analog...

Digital-to-analog conversion apparatus and method having signal cal...

CIRCUITRY AND METHOD FOR REDUCING ENVIRONMENTAL NOISE

SEMICONDUCTOR CHIP PROVIDING ON-CHIP SELF-TESTING OF AN ANA-LOG-TO-...

SENSOR INTERFACES FOR FUNCTIONAL SAFETY APPLICATIONS

ELECTRONIC CIRCUIT HAVING A DIGITAL TO ANALOG CONVERTER

DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZ...

MEASUREMENT UNIT CONFIGURED TO PROVIDE A MEASUREMENT RESULT VALUE

BUILT-IN SELF-TEST CIRCUITS AND SEMICONDUCTOR INTEGRATED CIRCUITS I...