Measuring ratio of two lines

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G01J2003/4435

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/4435Measuring ratio of two lines

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for control of a plasma for spectrometry
- Patent number 8,822,948
- Issue date Sep 2, 2014
- Thermo Electron Manufacturing Limited
- Stephen Hartwell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Light emission analyzing device
- Patent number 8,781,793
- Issue date Jul 15, 2014
- CREV Inc.
- Masaki Yamashita
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measuring apparatus for measuring an optical property of a fluoresc...
- Patent number 5,636,015
- Issue date Jun 3, 1997
- Minolta Co., Ltd.
- Kenji Imura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS METHOD AND DIAGNOSIS ASSISTANCE METHOD
- Publication number 20220382834
- Publication date Dec 1, 2022
- Shimadzu Corporation
- Yuichiro FUJITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROL OF A PLASMA FOR SPECTROMETRY
- Publication number 20140264000
- Publication date Sep 18, 2014
- THERMO ELECTRON MANUFACTURING LIMITED
- Stephen HARTWELL
- G01 - MEASURING TESTING
Information Patent Application
PLASMA EVALUATION METHOD, PLASMA PROCESSING METHOD AND PLASMA PROCE...
- Publication number 20140227458
- Publication date Aug 14, 2014
- TOKYO ELECTRON LIMITED
- Takayuki Karakawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
LIGHT EMISSION ANALYZING DEVICE
- Publication number 20140107980
- Publication date Apr 17, 2014
- Masaki Yamashita
- G01 - MEASURING TESTING