Measuring systems

Industry

  • CPC
  • H03M2201/192
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Patents Grantslast 30 patents

  • Information Patent Grant

    Digital Triggering using finite state machines

    • Patent number 9,618,923
    • Issue date Apr 11, 2017
    • Keysight Technologies, Inc.
    • Andrew Robert Lehane
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    Digital tiggering using finite state machines

    • Patent number 9,268,321
    • Issue date Feb 23, 2016
    • Keysight Technologies, Inc.
    • Andrew Robert Lehane
    • G05 - CONTROLLING REGULATING
  • Information Patent Grant

    3918035

    • Patent number 3,918,035
    • Issue date Nov 4, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3896431

    • Patent number 3,896,431
    • Issue date Jul 22, 1975
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3895376

    • Patent number 3,895,376
    • Issue date Jul 15, 1975
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3889254

    • Patent number 3,889,254
    • Issue date Jun 10, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3872726

    • Patent number 3,872,726
    • Issue date Mar 25, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3872288

    • Patent number 3,872,288
    • Issue date Mar 18, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3865305

    • Patent number 3,865,305
    • Issue date Feb 11, 1975
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3843872

    • Patent number 3,843,872
    • Issue date Oct 22, 1974
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3840807

    • Patent number 3,840,807
    • Issue date Oct 8, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3815126

    • Patent number 3,815,126
    • Issue date Jun 4, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3812481

    • Patent number 3,812,481
    • Issue date May 21, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3809864

    • Patent number 3,809,864
    • Issue date May 7, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3805149

    • Patent number 3,805,149
    • Issue date Apr 16, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3792352

    • Patent number 3,792,352
    • Issue date Feb 12, 1974
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3790886

    • Patent number 3,790,886
    • Issue date Feb 5, 1974
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3774018

    • Patent number 3,774,018
    • Issue date Nov 20, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3774195

    • Patent number 3,774,195
    • Issue date Nov 20, 1973
    • G02 - OPTICS
  • Information Patent Grant

    3768022

    • Patent number 3,768,022
    • Issue date Oct 23, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3750142

    • Patent number 3,750,142
    • Issue date Jul 31, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3750156

    • Patent number 3,750,156
    • Issue date Jul 31, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3745560

    • Patent number 3,745,560
    • Issue date Jul 10, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3743429

    • Patent number 3,743,429
    • Issue date Jul 3, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3742486

    • Patent number 3,742,486
    • Issue date Jun 26, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3737891

    • Patent number 3,737,891
    • Issue date Jun 5, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    3732406

    • Patent number 3,732,406
    • Issue date May 8, 1973
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3729621

    • Patent number 3,729,621
    • Issue date Apr 24, 1973
    • G01 - MEASURING TESTING
  • Information Patent Grant

    3729733

    • Patent number 3,729,733
    • Issue date Apr 24, 1973
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    3728715

    • Patent number 3,728,715
    • Issue date Apr 17, 1973
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents