Mechanical constraints

Industry

CPC
H01J2237/2062

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2062Mechanical constraints

Industries

Patents Grantslast 30 patents

Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 12,140,571
- Issue date Nov 12, 2024
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 11,237,087
- Issue date Feb 1, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Grant
Stage device and charged particle beam device
- Patent number 10,770,259
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Motohiro Takahashi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 10,663,380
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Testing assembly including a multiple degree of freedom stage
- Patent number 9,472,374
- Issue date Oct 18, 2016
- Hysitron, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Grant
Double tilt transmission electron microscope sample holder for in-s...
- Patent number 8,569,714
- Issue date Oct 29, 2013
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for quantitative measurement of electromechanical properties...
- Patent number 8,302,494
- Issue date Nov 6, 2012
- Beijing University of Technology
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Grant
Sample preparing device and sample posture shifting method
- Patent number 8,198,603
- Issue date Jun 12, 2012
- SII NanoTechnology Inc.
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mesh and method of observing rubber slice technical field
- Patent number 7,675,043
- Issue date Mar 9, 2010
- Sumitomo Rubber Industries, Ltd.
- Hiroyuki Kishimoto
- G01 - MEASURING TESTING
Information Patent Grant
Strain detection for automated nano-manipulation
- Patent number 7,395,727
- Issue date Jul 8, 2008
- Omniprobe, Inc.
- Thomas M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
In situ tensile testing machine and sample for a scanning electron...
- Patent number 5,606,168
- Issue date Feb 25, 1997
- Centre National de la Recherche Scientifique
- Remi Chiron
- G01 - MEASURING TESTING
Information Patent Grant
Stress cell for a scanning probe microscope
- Patent number 5,500,535
- Issue date Mar 19, 1996
- Molecular Imaging Corporation
- Tianwei Jing
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cryogenic temperature control and tension/compression attachment st...
- Patent number 5,355,683
- Issue date Oct 18, 1994
- The United States of America as represented by the Secretary of the Navy
- Dale E. Taylor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR OBSERVING PERMEATION AND DIFFUSION PATH OF OBSERVATION T...
- Publication number 20230127466
- Publication date Apr 27, 2023
- National Institute for Materials Science
- Akiko Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20220357251
- Publication date Nov 10, 2022
- Bruker Nano, Inc.
- Edward Cyrankowski
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20200408655
- Publication date Dec 31, 2020
- Bruker Nano, Inc.
- Edward Cyrankowski
- G01 - MEASURING TESTING
Information Patent Application
STAGE DEVICE AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20190228947
- Publication date Jul 25, 2019
- Hitachi High-Technologies Corporation
- Motohiro TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20170030812
- Publication date Feb 2, 2017
- HYSITRON, INC.
- Edward Cyrankowski
- G02 - OPTICS
Information Patent Application
TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
- Publication number 20140231670
- Publication date Aug 21, 2014
- HYSITRON, INC.
- Edward Cyrankowski
- G02 - OPTICS
Information Patent Application
Double Tilt Transmission Electron Microscope Sample Holder for In-S...
- Publication number 20130105706
- Publication date May 2, 2013
- BEIJING UNIVERSITY OF TECHNOLOGY
- Xiaodong Han
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR QUANTITATIVE MEASUREMENT OF ELECTROMECHANICAL PROPERTIES...
- Publication number 20110107472
- Publication date May 5, 2011
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- G01 - MEASURING TESTING
Information Patent Application
Sample preparing device and sample posture shifting method
- Publication number 20090114842
- Publication date May 7, 2009
- Haruo Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mesh and method of observing rubber slice technical field
- Publication number 20080083884
- Publication date Apr 10, 2008
- Sumitomo Rubber Industries, Ltd.
- Hiroyuki Kishimoto
- G01 - MEASURING TESTING
Information Patent Application
Strain detection for automated nano-manipulation
- Publication number 20070089528
- Publication date Apr 26, 2007
- Thomas M. Moore
- G01 - MEASURING TESTING

Mechanical constraints

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Testing assembly including a multiple degree of freedom stage

Testing assembly including a multiple degree of freedom stage

Stage device and charged particle beam device

Testing assembly including a multiple degree of freedom stage

Testing assembly including a multiple degree of freedom stage

Double tilt transmission electron microscope sample holder for in-s...

Sensor for quantitative measurement of electromechanical properties...

Sample preparing device and sample posture shifting method

Mesh and method of observing rubber slice technical field

Strain detection for automated nano-manipulation

In situ tensile testing machine and sample for a scanning electron...

Stress cell for a scanning probe microscope

Cryogenic temperature control and tension/compression attachment st...

Patents Applicationslast 30 patents

DEVICE FOR OBSERVING PERMEATION AND DIFFUSION PATH OF OBSERVATION T...

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

STAGE DEVICE AND CHARGED PARTICLE BEAM DEVICE

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

Double Tilt Transmission Electron Microscope Sample Holder for In-S...

SENSOR FOR QUANTITATIVE MEASUREMENT OF ELECTROMECHANICAL PROPERTIES...

Sample preparing device and sample posture shifting method

Mesh and method of observing rubber slice technical field

Strain detection for automated nano-manipulation