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G01J2003/061

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2003/061Mechanisms

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Patents Grantslast 30 patents

Information Patent Grant
Spectral feature control apparatus
- Patent number 12,124,053
- Issue date Oct 22, 2024
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopic system and method therefor
- Patent number 11,800,981
- Issue date Oct 31, 2023
- Colgate Palmolive Company
- Deborah Ann Peru
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Spectral feature control apparatus
- Patent number 11,561,407
- Issue date Jan 24, 2023
- Cymer, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectral feature control apparatus
- Patent number 10,845,610
- Issue date Nov 24, 2020
- Cymer, LLC
- Eric Anders Mason
- G02 - OPTICS
Information Patent Grant
Spectroscopic system and method therefor
- Patent number 10,842,381
- Issue date Nov 24, 2020
- Colgate Palmolive Company
- Deborah Ann Peru
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Lens scanning mode hyperspectral imaging system and rotor unmanned...
- Patent number 10,436,642
- Issue date Oct 8, 2019
- SICHUAN DUALIX SPECTRAL IMAGING TECHNOLOGY CO., LTD.
- Xinghai Chen
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Spectral feature control apparatus
- Patent number 10,416,471
- Issue date Sep 17, 2019
- Cymer, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi-scan optical system
- Patent number 9,958,325
- Issue date May 1, 2018
- Metal Power Analytical (I) Pvt. Ltd.
- Priyadarshan Divyadarshan Pant
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device, image forming apparatus, and spectrometry method
- Patent number 9,823,129
- Issue date Nov 21, 2017
- Seiko Epson Corporation
- Ryohei Kuri
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Spectrometry device, image forming device, and spectrometry method
- Patent number 9,721,195
- Issue date Aug 1, 2017
- Seiko Epson Corporation
- Takeshi Nozawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Interferometer having multiple scan carriages
- Patent number 9,200,885
- Issue date Dec 1, 2015
- Agilent Technologies, Inc.
- Gregg Ressler
- G01 - MEASURING TESTING
Information Patent Grant
Monochromator arrangement
- Patent number 4,995,725
- Issue date Feb 26, 1991
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forshung E.V.
- Wolfgang Riedel
- G02 - OPTICS
Information Patent Grant
Spectroscopic measurement system
- Patent number 4,775,234
- Issue date Oct 4, 1988
- Shimadzu Corporation
- Teiichi Shimomura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20250013066
- Publication date Jan 9, 2025
- CYMER, LLC
- Eric Anders Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COLOR MEASUREMENT APPARATUS AND CONTROL METHOD
- Publication number 20240302209
- Publication date Sep 12, 2024
- SEIKO EPSON CORPORATION
- Masahide MORIYAMA
- G01 - MEASURING TESTING
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20240302211
- Publication date Sep 12, 2024
- SEIKO EPSON CORPORATION
- Masaki ITO
- G01 - MEASURING TESTING
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20240302208
- Publication date Sep 12, 2024
- SEIKO EPSON CORPORATION
- Katsumi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
SPARK SPECTROMETRY FOR INCLUSIONS CONTENT DISTRIBUTION ON THE SURFA...
- Publication number 20240159680
- Publication date May 16, 2024
- NCS Testing Technology CO.,LTD
- Yunhai Jia
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20230124587
- Publication date Apr 20, 2023
- CYMER, LLC
- Eric Anders Mason
- G02 - OPTICS
Information Patent Application
Spectroscopic System and Method Therefor
- Publication number 20210369119
- Publication date Dec 2, 2021
- Colgate-Palmolive Company
- Deborah Ann PERU
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20210011302
- Publication date Jan 14, 2021
- CYMER, LLC
- Eric Anders Mason
- G02 - OPTICS
Information Patent Application
SPECTRAL FEATURE CONTROL APPARATUS
- Publication number 20190353920
- Publication date Nov 21, 2019
- CYMER, LLC
- Eric Anders Mason
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lens scanning mode hyperspectral imaging system and rotor unmanned...
- Publication number 20180010964
- Publication date Jan 11, 2018
- SICHUAN DUALIX SPECTRAL IMAGING TECHNOLOGY CO., LTD.
- Xinghai Chen
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SCAN OPTICAL SYSTEM
- Publication number 20170363471
- Publication date Dec 21, 2017
- Metal Power Analytical (I) Pvt. Ltd.
- Priyadarshan Divyadarshan PANT
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY DEVICE, IMAGE FORMING APPARATUS, AND SPECTROMETRY METHOD
- Publication number 20160258813
- Publication date Sep 8, 2016
- SEIKO EPSON CORPORATION
- Ryohei KURI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER HAVING MULTIPLE SCAN CARRIAGES
- Publication number 20140175288
- Publication date Jun 26, 2014
- AGILENT TECHNOLOGIES, INC.
- Gregg Ressler
- G02 - OPTICS
Information Patent Application
Fourier-transform spectrometers
- Publication number 20080068612
- Publication date Mar 20, 2008
- Christopher J. Manning
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectral feature control apparatus

Spectroscopic system and method therefor

Spectral feature control apparatus

Spectral feature control apparatus

Spectroscopic system and method therefor

Lens scanning mode hyperspectral imaging system and rotor unmanned...

Spectral feature control apparatus

Multi-scan optical system

Spectrometry device, image forming apparatus, and spectrometry method

Spectrometry device, image forming device, and spectrometry method

Interferometer having multiple scan carriages

Monochromator arrangement

Spectroscopic measurement system

Patents Applicationslast 30 patents

SPECTRAL FEATURE CONTROL APPARATUS

COLOR MEASUREMENT APPARATUS AND CONTROL METHOD

COLOR MEASUREMENT APPARATUS

COLOR MEASUREMENT APPARATUS

SPARK SPECTROMETRY FOR INCLUSIONS CONTENT DISTRIBUTION ON THE SURFA...

SPECTRAL FEATURE CONTROL APPARATUS

Spectroscopic System and Method Therefor

SPECTRAL FEATURE CONTROL APPARATUS

SPECTRAL FEATURE CONTROL APPARATUS

Lens scanning mode hyperspectral imaging system and rotor unmanned...

MULTI-SCAN OPTICAL SYSTEM

SPECTROMETRY DEVICE, IMAGE FORMING APPARATUS, AND SPECTROMETRY METHOD

INTERFEROMETER HAVING MULTIPLE SCAN CARRIAGES

Fourier-transform spectrometers