Methods for correcting for emissivity

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G01J2005/0051

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2005/0051Methods for correcting for emissivity

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Patents Grantslast 30 patents

Information Patent Grant
High-accuracy contactless measurement method for measuring temperat...
- Patent number 11,254,043
- Issue date Feb 22, 2022
- NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY
- Shiang-Feng Tang
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Temperature measurement system for furnaces
- Patent number 11,079,283
- Issue date Aug 3, 2021
- Praxair Technology, Inc.
- Tim Patrick Dubbs
- G01 - MEASURING TESTING
Information Patent Grant
Explosion-proof thermal imaging system
- Patent number 10,999,536
- Issue date May 4, 2021
- Rosemount Inc.
- Jason H. Rud
- G01 - MEASURING TESTING
Information Patent Grant
Substrate treatment method and substrate treatment apparatus
- Patent number 10,985,040
- Issue date Apr 20, 2021
- AP SYSTEMS INC.
- Sang Hyun Ji
- G01 - MEASURING TESTING
Information Patent Grant
Thermal processing chamber with low temperature control
- Patent number 10,948,353
- Issue date Mar 16, 2021
- Applied Materials, Inc.
- Lara Hawrylchak
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus for the determination of a temperature of an ob...
- Patent number 10,939,827
- Issue date Mar 9, 2021
- Drägerwerk AG & Co. KGaA
- Frank Franz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Passive millimeter wave radiometer system for calibration of infrar...
- Patent number 10,876,898
- Issue date Dec 29, 2020
- National Technology & Engineering Solutions of Sandia, LLC
- Ryan D. Murphy
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring temperature of an object to be measured, dust t...
- Patent number 10,852,195
- Issue date Dec 1, 2020
- Mitsubishi Materials Corporation
- Hirokazu Shima
- F27 - FURNACES KILNS OVENS RETORTS
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,645
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,646
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,647
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Grant
Infrared contrasting color emissivity measurement system
- Patent number 10,704,963
- Issue date Jul 7, 2020
- Exergen Corporation
- Jason N. Jarboe
- G01 - MEASURING TESTING
Information Patent Grant
Detector, correction method and calibration method of detector, det...
- Patent number 10,677,720
- Issue date Jun 9, 2020
- SHARP KABUSHIKI KAISHA
- Tazuko Kitazawa
- G01 - MEASURING TESTING
Information Patent Grant
Thermal cooling member with low temperature control
- Patent number 10,571,337
- Issue date Feb 25, 2020
- Applied Materials, Inc.
- Lara Hawrylchak
- G05 - CONTROLLING REGULATING
Information Patent Grant
Radiosonde air temperature measurement correction system and method
- Patent number 10,551,526
- Issue date Feb 4, 2020
- Korea Research Institute of Standards and Science
- Yong-Gyoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Safety cooking device and method
- Patent number 10,366,591
- Issue date Jul 30, 2019
- Tyco Safety Products Canada Ltd.
- Andrei Bucsa
- F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information Patent Grant
Temperature measurement system for furnaces
- Patent number 10,274,375
- Issue date Apr 30, 2019
- LumaSense Technologies Holdings, Inc.
- Tim Dubbs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Infrared contrasting color temperature measurement system
- Patent number 10,054,495
- Issue date Aug 21, 2018
- Exergen Corporation
- Jason N. Jarboe
- G01 - MEASURING TESTING
Information Patent Grant
Radiation thermometer and thermometry method
- Patent number 9,995,632
- Issue date Jun 12, 2018
- NUFLARE TECHNOLOGY, INC.
- Yasushi Iyechika
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for contactlessly determining the temperature of...
- Patent number 9,804,030
- Issue date Oct 31, 2017
- Sikora AG
- Harald Sikora
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring temperature of a heated part
- Patent number 9,739,664
- Issue date Aug 22, 2017
- Pratt & Whitney Canada Corp.
- Robert Chlebowski
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement device
- Patent number 9,494,466
- Issue date Nov 15, 2016
- Kabushiki Kaisha Toshiba
- Toshiyuki Uchii
- G01 - MEASURING TESTING
Information Patent Grant
Technique for temperature measurement and calibration of semiconduc...
- Patent number 9,212,949
- Issue date Dec 15, 2015
- Varian Semiconductor Equipment Associates, Inc.
- Jeffrey E. Krampert
- G01 - MEASURING TESTING
Information Patent Grant
Low temperature measurement and control using low temperature pyrom...
- Patent number 8,967,860
- Issue date Mar 3, 2015
- Applied Materials, Inc.
- Kailash Kiran Patalay
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring thermal radiation to determine temp...
- Patent number 8,483,991
- Issue date Jul 9, 2013
- Fluke Corporation
- Reno Gaertner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the emissivity, area and tempe...
- Patent number 8,050,884
- Issue date Nov 1, 2011
- The Boeing Company
- Ronald N. Murata
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlled thermal processing
- Patent number 8,021,898
- Issue date Sep 20, 2011
- Lambda Technologies, Inc.
- Iftikhar Ahmad
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Substrate temperature measurement by infrared transmission
- Patent number 7,946,759
- Issue date May 24, 2011
- Applied Materials, Inc.
- Matthew Fenton Davis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for uniform microwave treatment of semiconduct...
- Patent number 7,939,456
- Issue date May 10, 2011
- Lambda Technologies, Inc.
- Iftikhar Ahmad
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and apparatus for temperature measurement and control on a...
- Patent number 7,744,274
- Issue date Jun 29, 2010
- Ultratech, Inc.
- Boris Grek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CALIBRATION PANEL
- Publication number 20220299373
- Publication date Sep 22, 2022
- Charles Partee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
THERMAL QUALITY MAPPINGS
- Publication number 20210396585
- Publication date Dec 23, 2021
- Electric Pocket Limited
- Steven Nicholas BENNETT
- G01 - MEASURING TESTING
Information Patent Application
SPATIALLY ESTIMATING THERMAL EMISSIVITY
- Publication number 20210318172
- Publication date Oct 14, 2021
- Utah State University
- Alfonso Torres-Rua
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
Characterizing tropospheric boundary layer thermodynamic and refrac...
- Publication number 20210041299
- Publication date Feb 11, 2021
- Fredrick S. Solheim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CALIBRATION OF SUBSTRATE TEMPERATURE USING...
- Publication number 20200378832
- Publication date Dec 3, 2020
- Applied Materials, Inc.
- Eric D. Wilson
- G01 - MEASURING TESTING
Information Patent Application
THERMAL PROCESSING CHAMBER WITH LOW TEMPERATURE CONTROL
- Publication number 20200149968
- Publication date May 14, 2020
- Applied Materials, Inc.
- Lara HAWRYLCHAK
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD OF MEASURING TEMPERATURE OF AN OBJECT TO BE MEASURED, DUST T...
- Publication number 20200141809
- Publication date May 7, 2020
- MITSUBISHI MATERIALS CORPORATION
- Hirokazu SHIMA
- F27 - FURNACES KILNS OVENS RETORTS
Information Patent Application
PASSIVE MILLIMETER WAVE RADIOMETER SYSTEM FOR CALIBRATION OF INFRAR...
- Publication number 20200049562
- Publication date Feb 13, 2020
- National Technology & Engineering Solutions of Solutions of Sandia, LLC
- Ryan D. Murphy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEMPERATURE MEASUREMENT SYSTEM FOR FURNACES
- Publication number 20190219450
- Publication date Jul 18, 2019
- LUMASENSE TECHNOLOGIES HOLDINGS, INC.
- Tim Patrick Dubbs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS
- Publication number 20190103296
- Publication date Apr 4, 2019
- AP SYSTEMS INC
- Sang Hyun JI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS FOR THE DETERMINATION OF A TEMPERATURE OF AN OB...
- Publication number 20190014990
- Publication date Jan 17, 2019
- Dragerwerk AG & Co. KGaA
- Frank FRANZ
- G01 - MEASURING TESTING
Information Patent Application
Infrared Contrasting Color Emissivity Measurement System
- Publication number 20190003897
- Publication date Jan 3, 2019
- Exergen Corporation
- Jason N. Jarboe
- G01 - MEASURING TESTING
Information Patent Application
RADIATION THERMOMETER AND THERMOMETRY METHOD
- Publication number 20160109299
- Publication date Apr 21, 2016
- NUFLARE TECHNOLOGY, INC.
- Yasushi IYECHIKA
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT DEVICE
- Publication number 20140219312
- Publication date Aug 7, 2014
- KABUSHIKI KAISHA TOSHIBA
- Toshiyuki UCHII
- G01 - MEASURING TESTING
Information Patent Application
LOW TEMPERATURE MEASUREMENT AND CONTROL USING LOW TEMPERATURE PYROM...
- Publication number 20120201267
- Publication date Aug 9, 2012
- Applied Materials, Inc.
- KAILASH Kiran PATALAY
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for controlled thermal processing
- Publication number 20110076786
- Publication date Mar 31, 2011
- Iftikhar Ahmad
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for uniform microwave treatment of semiconduct...
- Publication number 20110076787
- Publication date Mar 31, 2011
- Iftikhar Ahmad
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THERMAL RADIATION TO DETERMINE TEMP...
- Publication number 20100292951
- Publication date Nov 18, 2010
- FLUKE CORPORATION
- Reno Gaertner
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Determining The Emissivity, Area And Tempe...
- Publication number 20100256945
- Publication date Oct 7, 2010
- The Boeing Company
- Ronald N. Murata
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT THERMAL IMAGING SYSTEM FOR HETEROGENEOUS COMPONENTS
- Publication number 20080224030
- Publication date Sep 18, 2008
- International Business Machines Corporation
- Julien Sylvestre
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE TEMPERATURE MEASUREMENT BY INFRARED TRANSMISSION
- Publication number 20080198895
- Publication date Aug 21, 2008
- MATTHEW FENTON DAVIS
- G01 - MEASURING TESTING
Information Patent Application
Thermal imaging system and method
- Publication number 20060232675
- Publication date Oct 19, 2006
- Land Instruments International Limited
- Gary Roy Chamberlain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Fire hazard prevention system
- Publication number 20040239511
- Publication date Dec 2, 2004
- Bezalel Urban
- G08 - SIGNALLING

Methods for correcting for emissivity

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High-accuracy contactless measurement method for measuring temperat...

Temperature measurement system for furnaces

Explosion-proof thermal imaging system

Substrate treatment method and substrate treatment apparatus

Thermal processing chamber with low temperature control

Measuring apparatus for the determination of a temperature of an ob...

Passive millimeter wave radiometer system for calibration of infrar...

Method of measuring temperature of an object to be measured, dust t...

Multispectral plasmonic thermal imaging device

Multispectral plasmonic thermal imaging device

Multispectral plasmonic thermal imaging device

Infrared contrasting color emissivity measurement system

Detector, correction method and calibration method of detector, det...

Thermal cooling member with low temperature control

Radiosonde air temperature measurement correction system and method

Safety cooking device and method

Temperature measurement system for furnaces

Infrared contrasting color temperature measurement system

Radiation thermometer and thermometry method

Method and device for contactlessly determining the temperature of...

Method of measuring temperature of a heated part

Temperature measurement device

Technique for temperature measurement and calibration of semiconduc...

Low temperature measurement and control using low temperature pyrom...

Method and system for measuring thermal radiation to determine temp...

Method and apparatus for determining the emissivity, area and tempe...

Method and apparatus for controlled thermal processing

Substrate temperature measurement by infrared transmission

Method and apparatus for uniform microwave treatment of semiconduct...

Methods and apparatus for temperature measurement and control on a...

Patents Applicationslast 30 patents

CALIBRATION PANEL

THERMAL QUALITY MAPPINGS

SPATIALLY ESTIMATING THERMAL EMISSIVITY

Characterizing tropospheric boundary layer thermodynamic and refrac...

METHOD AND APPARATUS FOR CALIBRATION OF SUBSTRATE TEMPERATURE USING...

THERMAL PROCESSING CHAMBER WITH LOW TEMPERATURE CONTROL

METHOD OF MEASURING TEMPERATURE OF AN OBJECT TO BE MEASURED, DUST T...

PASSIVE MILLIMETER WAVE RADIOMETER SYSTEM FOR CALIBRATION OF INFRAR...

TEMPERATURE MEASUREMENT SYSTEM FOR FURNACES

SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS

MEASURING APPARATUS FOR THE DETERMINATION OF A TEMPERATURE OF AN OB...

Infrared Contrasting Color Emissivity Measurement System

RADIATION THERMOMETER AND THERMOMETRY METHOD

TEMPERATURE MEASUREMENT DEVICE

LOW TEMPERATURE MEASUREMENT AND CONTROL USING LOW TEMPERATURE PYROM...

Method and apparatus for controlled thermal processing

Method and apparatus for uniform microwave treatment of semiconduct...

METHOD AND SYSTEM FOR MEASURING THERMAL RADIATION TO DETERMINE TEMP...

Method And Apparatus For Determining The Emissivity, Area And Tempe...

NON-CONTACT THERMAL IMAGING SYSTEM FOR HETEROGENEOUS COMPONENTS

SUBSTRATE TEMPERATURE MEASUREMENT BY INFRARED TRANSMISSION

Thermal imaging system and method

Fire hazard prevention system