MFM [Magnetic Force Microscopy] or apparatus therefor

Industry

CPC
G01Q60/50

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/50MFM [Magnetic Force Microscopy] or apparatus therefor

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring micrometer scale features of ele...
- Patent number 10,876,833
- Issue date Dec 29, 2020
- International Business Machines Corporation
- Robert G. Biskeborn
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting process solution, and sample pr...
- Patent number 10,746,635
- Issue date Aug 18, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tzu-Sou Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field value measuring device and method for measuring magn...
- Patent number 9,482,692
- Issue date Nov 1, 2016
- Akita University
- Hitoshi Saito
- G01 - MEASURING TESTING
Information Patent Grant
System and method for estimating the magnetization states of a nano...
- Patent number 9,286,687
- Issue date Mar 15, 2016
- University of South Florida
- Ravi Panchumarthy
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever of scanning probe microscope and method for manufacturin...
- Patent number 8,713,710
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field observation device and magnetic field observation me...
- Patent number 8,621,658
- Issue date Dec 31, 2013
- Akita University
- Hitoshi Saito
- G01 - MEASURING TESTING
Information Patent Grant
Methods for detecting and imaging magnetic metalloproteins
- Patent number 8,575,925
- Issue date Nov 5, 2013
- National Sun Yat-sen University
- Shu-Chen Hsieh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method of obtaining field by measurement
- Patent number 8,536,862
- Issue date Sep 17, 2013
- Kyoto University
- Kenjiro Kimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for analyzing distribution of coercive force in v...
- Patent number 7,560,921
- Issue date Jul 14, 2009
- Japan Science and Technology Agency
- Shunji Ishio
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,462,270
- Issue date Dec 9, 2008
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field generator device for calibration of magnetic force m...
- Patent number 7,301,336
- Issue date Nov 27, 2007
- Fujitsu Limited
- Yasuhiro Endo
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Patent number 7,214,303
- Issue date May 8, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for controlling motion of and tracking a mechan...
- Patent number 7,189,969
- Issue date Mar 13, 2007
- The University of North Carolina
- Leandra Vicci
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for controlling motion of and tracking a mechan...
- Patent number 7,191,092
- Issue date Mar 13, 2007
- The University of North Carolina
- Leandra Vicci
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for controlling motion of and tracking a mechan...
- Patent number 7,119,645
- Issue date Oct 10, 2006
- The University of North Carolina
- Leandra Vicci
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of common materials for radiation exposure by Atomic and...
- Patent number 7,041,987
- Issue date May 9, 2006
- The United States of America as represented by the Secretary of the Navy
- Jagadish Sharma
- G01 - MEASURING TESTING
Information Patent Grant
High resolution scanning magnetic microscope operable at high tempe...
- Patent number 6,930,479
- Issue date Aug 16, 2005
- Brown University Research Foundation
- Gang Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation system and method of measuring a quantitative magnetic f...
- Patent number 6,879,152
- Issue date Apr 12, 2005
- Hitachi, Ltd.
- Tomokazu Shimakura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring characteristic of specimen and i...
- Patent number 6,605,941
- Issue date Aug 12, 2003
- Kabushiki Kaisha Toshiba
- Masayuki Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Calibration of magnetic force or scanning hall probe microscopes by...
- Patent number 6,486,654
- Issue date Nov 26, 2002
- Triple-O Microscopy GmbH
- Hans Josef Hug
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for tunnel microscopy
- Patent number 6,476,386
- Issue date Nov 5, 2002
- Max-Planck- Gesselschaft zur Forderung der Wissenschaften e.V.
- Jürgen Kirschner
- G11 - INFORMATION STORAGE
Information Patent Grant
Photo-inducible magnetic exchange coupling device
- Patent number 5,723,978
- Issue date Mar 3, 1998
- Kabushiki Kaisha Toshiba
- Koichiro Inomata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tunneling susceptometry
- Patent number 4,861,990
- Issue date Aug 29, 1989
- California Institute of Technology
- Terry R. Coley
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY
- Publication number 20210405086
- Publication date Dec 30, 2021
- UChicago Argonne, LLC
- Suzanne Gabriëlle Everdine te Velthuis
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING MICROMETER SCALE FEATURES OF ELE...
- Publication number 20190293418
- Publication date Sep 26, 2019
- International Business Machines Corporation
- Robert G. Biskeborn
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PROCESS SOLUTION, AND SAMPLE PR...
- Publication number 20160061695
- Publication date Mar 3, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Sou CHUANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CORRELATING IMAGES OF A PHOTOLITHOGRAPHIC...
- Publication number 20150169997
- Publication date Jun 18, 2015
- CARL ZEISS SMS GMBH
- Dieter Weber
- G02 - OPTICS
Information Patent Application
MAGNETIC FIELD OBSERVATION DEVICE AND MAGNETIC FIELD OBSERVATION ME...
- Publication number 20130174302
- Publication date Jul 4, 2013
- AKITA UNIVERSITY
- Hitoshi Saito
- B82 - NANO-TECHNOLOGY
Information Patent Application
Cantilever of Scanning Probe Microscope and Method for Manufacturin...
- Publication number 20130097739
- Publication date Apr 18, 2013
- Kaifeng Zhang
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS FOR DETECTING AND IMAGING MAGNETIC METALLOPROTEINS
- Publication number 20110227566
- Publication date Sep 22, 2011
- NATIONAL SUN YAT-SEN UNIVERSITY
- Shu-Chen Hsieh
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF OBTAINING FIELD BY MEASUREMENT
- Publication number 20100219819
- Publication date Sep 2, 2010
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Analyzing Distribution of Coercive Force in V...
- Publication number 20080284422
- Publication date Nov 20, 2008
- Japan Science and Technology Agency
- Shunji Ishio
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Publication number 20070235340
- Publication date Oct 11, 2007
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR CONTROLLING MOTION OF AND TRACKING A MECHAN...
- Publication number 20060229842
- Publication date Oct 12, 2006
- The University of North Carolina
- Leandra Vicci
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR CONTROLLING MOTION OF AND TRACKING A MECHAN...
- Publication number 20060219904
- Publication date Oct 5, 2006
- The University of North Carolina
- Leandra Vicci
- G01 - MEASURING TESTING
Information Patent Application
Magnetic field generator device for magnetic force microscope
- Publication number 20060139026
- Publication date Jun 29, 2006
- FUJITSU LIMITED
- Yasuhiro Endo
- G01 - MEASURING TESTING
Information Patent Application
Cantilever probes for nanoscale magnetic and atomic force microscopy
- Publication number 20050241375
- Publication date Nov 3, 2005
- The Trustees of Boston College
- Michael J. Naughton
- G01 - MEASURING TESTING
Information Patent Application
Probe for an atomic force microscope and method for making such a p...
- Publication number 20050211915
- Publication date Sep 29, 2005
- Stichting voor de Technische Wetenschappen
- Arnout Gerbrand Van den Bos
- G01 - MEASURING TESTING
Information Patent Application
High resolution scanning magnetic microscope operable at high tempe...
- Publication number 20040239318
- Publication date Dec 2, 2004
- Gang Xiao
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for controlling motion of and tracking a mechan...
- Publication number 20040184214
- Publication date Sep 23, 2004
- The University of North Carolina at Chapel Hill
- Leandra Vicci
- G01 - MEASURING TESTING
Information Patent Application
Property evaluating system and method for magnetic material
- Publication number 20030214285
- Publication date Nov 20, 2003
- Tomokazu Shimakura
- G01 - MEASURING TESTING
Information Patent Application
SPM physical characteristic measuring method, measurement program,...
- Publication number 20020179833
- Publication date Dec 5, 2002
- Yoshiharu Shirakawabe
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for measuring characteristic of specimen and i...
- Publication number 20010038282
- Publication date Nov 8, 2001
- Masayuki Abe
- B82 - NANO-TECHNOLOGY

MFM [Magnetic Force Microscopy] or apparatus therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and method for measuring micrometer scale features of ele...

Method and apparatus for inspecting process solution, and sample pr...

Magnetic field value measuring device and method for measuring magn...

System and method for estimating the magnetization states of a nano...

Cantilever of scanning probe microscope and method for manufacturin...

Magnetic field observation device and magnetic field observation me...

Methods for detecting and imaging magnetic metalloproteins

Apparatus and method of obtaining field by measurement

Method and device for analyzing distribution of coercive force in v...

Cantilever probes for nanoscale magnetic and atomic force microscopy

Magnetic field generator device for calibration of magnetic force m...

Cantilever probes for nanoscale magnetic and atomic force microscopy

Methods and systems for controlling motion of and tracking a mechan...

Methods and systems for controlling motion of and tracking a mechan...

Methods and systems for controlling motion of and tracking a mechan...

Inspection of common materials for radiation exposure by Atomic and...

High resolution scanning magnetic microscope operable at high tempe...

Evaluation system and method of measuring a quantitative magnetic f...

Method and apparatus for measuring characteristic of specimen and i...

Calibration of magnetic force or scanning hall probe microscopes by...

Method and device for tunnel microscopy

Photo-inducible magnetic exchange coupling device

Tunneling susceptometry

Patents Applicationslast 30 patents

SUPER RESOLUTION FOR MAGNETO-OPTICAL MICROSCOPY

APPARATUS AND METHOD FOR MEASURING MICROMETER SCALE FEATURES OF ELE...

METHOD AND APPARATUS FOR INSPECTING PROCESS SOLUTION, AND SAMPLE PR...

APPARATUS AND METHOD FOR CORRELATING IMAGES OF A PHOTOLITHOGRAPHIC...

MAGNETIC FIELD OBSERVATION DEVICE AND MAGNETIC FIELD OBSERVATION ME...

Cantilever of Scanning Probe Microscope and Method for Manufacturin...

METHODS FOR DETECTING AND IMAGING MAGNETIC METALLOPROTEINS

APPARATUS AND METHOD OF OBTAINING FIELD BY MEASUREMENT

Method and Device for Analyzing Distribution of Coercive Force in V...

Cantilever probes for nanoscale magnetic and atomic force microscopy

METHODS AND SYSTEMS FOR CONTROLLING MOTION OF AND TRACKING A MECHAN...

METHODS AND SYSTEMS FOR CONTROLLING MOTION OF AND TRACKING A MECHAN...

Magnetic field generator device for magnetic force microscope

Cantilever probes for nanoscale magnetic and atomic force microscopy

Probe for an atomic force microscope and method for making such a p...

High resolution scanning magnetic microscope operable at high tempe...

Methods and systems for controlling motion of and tracking a mechan...

Property evaluating system and method for magnetic material

SPM physical characteristic measuring method, measurement program,...

Method and apparatus for measuring characteristic of specimen and i...