Michelson

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G01J2009/0284

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2009/0284Michelson

Industries

Patents Grantslast 30 patents

Information Patent Grant
Interferometer with at least one dispersive element
- Patent number 11,988,562
- Issue date May 21, 2024
- SYSTEMS & TECHNOLOGY RESEARCH, LLC
- Scott Bloom
- G01 - MEASURING TESTING
Information Patent Grant
Refractive scanning interferometer
- Patent number 11,668,603
- Issue date Jun 6, 2023
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Grant
Imaging apparatus including image sensor, optical system, control c...
- Patent number 10,412,319
- Issue date Sep 10, 2019
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kenji Narumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interferometric technique for measuring upper atmospheric Doppler w...
- Patent number 10,184,841
- Issue date Jan 22, 2019
- The United States of America, as represented by the Secretary of the Navy
- Christoph R. Englert
- G02 - OPTICS
Information Patent Grant
Optical switch using a michelson interferometer
- Patent number 8,917,960
- Issue date Dec 23, 2014
- Access Optical Networks, Inc.
- Paul Prucnal
- G11 - INFORMATION STORAGE
Information Patent Grant
Restoration of Fizeau FTS spectral data using low and/or zero spati...
- Patent number 7,436,518
- Issue date Oct 14, 2008
- Lockheed Martin Corporation
- Eric H. Smith
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DETECTION SYSTEM
- Publication number 20240361185
- Publication date Oct 31, 2024
- ULTRA DISPLAY TECHNOLOGY CORP.
- Hsien-Te CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THE CARRIER-ENVELOPE PHASE OFFSET O...
- Publication number 20240344892
- Publication date Oct 17, 2024
- Sphere Ultrafast Photonics, SA
- Chen Guo
- G01 - MEASURING TESTING
Information Patent Application
REFRACTIVE SCANNING INTERFEROMETER
- Publication number 20230375409
- Publication date Nov 23, 2023
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Application
REFRACTIVE SCANNING INTERFEROMETER
- Publication number 20210293624
- Publication date Sep 23, 2021
- Rapid Phenotyping Pty Limited
- Selene Rodd-Routley
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SWITCH USING A MICHELSON INTERFEROMETER
- Publication number 20100321769
- Publication date Dec 23, 2010
- PAUL PRUCNAL
- G02 - OPTICS