Micrometers

Industry

CPC
G01B3/18

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B3/00Instruments as specified in the subgroups and characterised by the use of mechanical measuring means

Current Industry

G01B3/18Micrometers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detection of deformation in battery cells
- Patent number 12,159,981
- Issue date Dec 3, 2024
- Tesla, Inc.
- Michael Kahn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring instrument and method of remote quantity value transfer/t...
- Patent number 12,055,925
- Issue date Aug 6, 2024
- Yougang Xiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital micrometer
- Patent number 11,821,724
- Issue date Nov 21, 2023
- Mitutoyo Corporation
- Koji Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Sensing winding configuration for inductive position encoder
- Patent number 11,713,983
- Issue date Aug 1, 2023
- Mitutoyo Corporation
- Ted Staton Cook
- G01 - MEASURING TESTING
Information Patent Grant
Caliper and accessories therefor
- Patent number 11,624,601
- Issue date Apr 11, 2023
- Eugene Babitchenko
- G01 - MEASURING TESTING
Information Patent Grant
Caliper measurement force detecting device
- Patent number 11,543,225
- Issue date Jan 3, 2023
- Mitutoyo Corporation
- Kohei Fuchigami
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument with coupled antenna
- Patent number 11,539,112
- Issue date Dec 27, 2022
- 2J ANTENNAS USA, CORPORATION
- Javier Ruben Flores-Cuadras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detection of deformation in battery cells
- Patent number 11,522,232
- Issue date Dec 6, 2022
- Tesla, Inc.
- Michael Kahn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro head and stage mechanism using the same
- Patent number 11,493,116
- Issue date Nov 8, 2022
- BIBLIOS Co., LTD.
- Yoshiharu Nakatomi
- G01 - MEASURING TESTING
Information Patent Grant
Spindle drive
- Patent number 11,280,389
- Issue date Mar 22, 2022
- Eppendorf AG
- Burkhardt Reichmuth
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Micrometer for measuring dimension of a conductive object
- Patent number 11,280,602
- Issue date Mar 22, 2022
- SEWON ELECTRONICS CO., LTD.
- Hong Ju Jeon
- G01 - MEASURING TESTING
Information Patent Grant
Roundness measuring device
- Patent number 11,041,707
- Issue date Jun 22, 2021
- Mitutoyo Corporation
- Yoshiyuki Omori
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling small-sized measurement device
- Patent number 10,996,043
- Issue date May 4, 2021
- Mitutoyo Corporation
- Yasuhiro Tsujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for reading value measured with analog measuring tool
- Patent number 10,825,216
- Issue date Nov 3, 2020
- Mitutoyo Corporation
- Shinsaku Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Digital measurement instrument
- Patent number 10,673,174
- Issue date Jun 2, 2020
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument that detects displacement of a contact point
- Patent number 10,598,524
- Issue date Mar 24, 2020
- Mitutoyo Corporation
- Atsuya Niwano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
External device for measuring instrument
- Patent number 10,451,450
- Issue date Oct 22, 2019
- Mitutoyo Corporation
- Atsuya Niwano
- G01 - MEASURING TESTING
Information Patent Grant
Connection unit for connecting external device to measurement devic...
- Patent number 10,283,922
- Issue date May 7, 2019
- Mitutoyo Corporation
- Atsuya Niwano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic micrometer for measuring dimensions of a body and method...
- Patent number 10,107,610
- Issue date Oct 23, 2018
- William Elof Mellander
- G01 - MEASURING TESTING
Information Patent Grant
Digital comparator having a retractable anvil supported at one end...
- Patent number 9,982,985
- Issue date May 29, 2018
- Mitutoyo Corporation
- Yuji Fujikawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Handheld measuring instrument
- Patent number 9,689,652
- Issue date Jun 27, 2017
- Hexagon Technology Center GmbH
- Pascal Jordil
- G01 - MEASURING TESTING
Information Patent Grant
Calibration control device for metrology tools
- Patent number 9,631,913
- Issue date Apr 25, 2017
- Mitutoyo Corporation
- Bruno Lefebvre
- G01 - MEASURING TESTING
Information Patent Grant
Precision hydrostatic level and flatness measuring device, system a...
- Patent number 9,587,940
- Issue date Mar 7, 2017
- Frank Olshefsky
- G01 - MEASURING TESTING
Information Patent Grant
Ergonomic micrometer including two modes of adjustment
- Patent number 9,482,509
- Issue date Nov 1, 2016
- Mitutoyo Corporation
- Kim W. Atherton
- G01 - MEASURING TESTING
Information Patent Grant
Digital displacement measuring instrument
- Patent number 9,404,724
- Issue date Aug 2, 2016
- Mitutoyo Corporation
- Yasuhiro Tsujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for validating a workpiece measurement in a dimensional metr...
- Patent number 9,377,282
- Issue date Jun 28, 2016
- Mitutoyo Corporation
- Matthew Raymond Dockrey
- G01 - MEASURING TESTING
Information Patent Grant
Micrometer
- Patent number 9,372,059
- Issue date Jun 21, 2016
- Mitutoyo Corporation
- Yoshiro Asano
- G01 - MEASURING TESTING
Information Patent Grant
Precision hydrostatic level and flatness measuring device, system a...
- Patent number 9,273,988
- Issue date Mar 1, 2016
- Frank Olshefsky
- G01 - MEASURING TESTING
Information Patent Grant
Flexible mount for coupling force actuator to caliper jaw
- Patent number 9,267,779
- Issue date Feb 23, 2016
- Mitutoyo Corporation
- Casey E. Emtman
- G01 - MEASURING TESTING
Information Patent Grant
Inductive detection type rotary encoder
- Patent number 9,163,926
- Issue date Oct 20, 2015
- Mitutoyo Corporation
- Kouji Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROMETER DRIVER SYSTEM AND METHOD
- Publication number 20240421661
- Publication date Dec 19, 2024
- Ruben Medrano
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MICROMETER HEAD DISPLACEMENT SYSTEM UTILIZING IMAGING
- Publication number 20240102784
- Publication date Mar 28, 2024
- MITUTOYO CORPORATION
- Michael NAHUM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC MEASURING DEVICE AND CONTROL METHOD OF THE SAME
- Publication number 20240035816
- Publication date Feb 1, 2024
- MITUTOYO CORPORATION
- Keita OGAWA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING A CHANGING CRACK IN A WALL OR THE LIKE
- Publication number 20230408237
- Publication date Dec 21, 2023
- FEELBAT
- Jean-Christophe Habot
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTION OF DEFORMATION IN BATTERY CELLS
- Publication number 20230102109
- Publication date Mar 30, 2023
- Tesla, Inc.
- Michael Kahn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSING WINDING CONFIGURATION FOR INDUCTIVE POSITION ENCODER
- Publication number 20230003554
- Publication date Jan 5, 2023
- MITUTOYO CORPORATION
- Ted Staton Cook
- G01 - MEASURING TESTING
Information Patent Application
MICROMETER FOR MEASURING DIMENSION OF A CONDUCTIVE OBJECT
- Publication number 20220082367
- Publication date Mar 17, 2022
- SEWON ELECTRONICS CO., LTD.
- Hong Ju JEON
- G01 - MEASURING TESTING
Information Patent Application
MEASURING INSTRUMENT AND METHOD OF REMOTE QUANTITY VALUE TRANSFER/T...
- Publication number 20220066433
- Publication date Mar 3, 2022
- YOUGANG XIANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIPER MEASUREMENT FORCE DETECTING DEVICE
- Publication number 20210372760
- Publication date Dec 2, 2021
- MITUTOYO CORPORATION
- Kohei FUCHIGAMI
- G01 - MEASURING TESTING
Information Patent Application
NETWORK APPARATUS
- Publication number 20210333079
- Publication date Oct 28, 2021
- Mitutoyo Corporation
- Takuma MIZUNAGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING INSTRUMENT WITH COUPLED ANTENNA
- Publication number 20210210835
- Publication date Jul 8, 2021
- 2J ANTENNAS USA, CORPORATION
- Javier Ruben Flores-Cuadras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIGITAL MICROMETER
- Publication number 20210140751
- Publication date May 13, 2021
- MITUTOYO CORPORATION
- Koji Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
MICRO HEAD AND STAGE MECHANISM USING THE SAME
- Publication number 20210108708
- Publication date Apr 15, 2021
- BIBLIOS Co., LTD.
- Yoshiharu NAKATOMI
- G01 - MEASURING TESTING
Information Patent Application
Spindle Drive
- Publication number 20200072329
- Publication date Mar 5, 2020
- Eppendorf AG
- Burkhardt Reichmuth
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR CONTROLLING SMALL-SIZED MEASUREMENT DEVICE
- Publication number 20190323813
- Publication date Oct 24, 2019
- Mitutoyo Corporation
- Yasuhiro TSUJIMOTO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTION OF DEFORMATION IN BATTERY CELLS
- Publication number 20190267677
- Publication date Aug 29, 2019
- Tesla, Inc.
- Michael Kahn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR READING VALUE MEASURED WITH ANALOG MEASURING TOOL
- Publication number 20190180487
- Publication date Jun 13, 2019
- Mitutoyo Corporation
- Shinsaku ABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROUNDNESS MEASURING DEVICE
- Publication number 20190145753
- Publication date May 16, 2019
- MITUTOYO CORPORATION
- Yoshiyuki OMORI
- G01 - MEASURING TESTING
Information Patent Application
Bar Length Detection Tool and Method for Detecting Bar Length
- Publication number 20190063894
- Publication date Feb 28, 2019
- Miasolé Equipment Integration (Fujian) Co., Ltd.
- Fuzhong WU
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL MEASUREMENT INSTRUMENT
- Publication number 20180316120
- Publication date Nov 1, 2018
- MITUTOYO CORPORATION
- Shuuji HAYASHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Precision Hydrostatic Level and Flatness Measuring Devices, Systems...
- Publication number 20180143019
- Publication date May 24, 2018
- Frank A. Olshefsky
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS MEASURING DEVICE
- Publication number 20180120078
- Publication date May 3, 2018
- Industrial Technology Research Institute
- Chun-Hsien Chen
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC MICROMETER FOR MEASURING DIMENSIONS OF A BODY AND METHOD...
- Publication number 20170122716
- Publication date May 4, 2017
- William Elof Mellander
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY DATA COMMUNICATION METHODOLOGY FOR METROLOGICAL DEVICE AU...
- Publication number 20170055106
- Publication date Feb 23, 2017
- GENERAL ELECTRIC COMPANY
- Yakov Polishchuk
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS OF ALIGNING AND ASSEMBLING
- Publication number 20160265892
- Publication date Sep 15, 2016
- BOE TECHNOLOGY GROUP CO., LTD.
- Peng LI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ERGONOMIC MICROMETER INCLUDING TWO MODES OF ADJUSTMENT
- Publication number 20160169653
- Publication date Jun 16, 2016
- Mitutoyo Corporation
- Kim W. Atherton
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD MEASURING DEVICE COMPRISING A USER INTERFACE RESPONSIVE TO...
- Publication number 20160123712
- Publication date May 5, 2016
- MITUTOYO CORPORATION
- Ted Staton Cook
- G01 - MEASURING TESTING
Information Patent Application
PARAMETER SETTING METHOD OF MEASURING INSTRUMENT AND COMPUTER READA...
- Publication number 20160061579
- Publication date Mar 3, 2016
- Mitutoyo Corporation
- Yasuhiro TSUJIMOTO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND POSITION DETECTOR
- Publication number 20150369580
- Publication date Dec 24, 2015
- Mitutoyo Corporation
- Osamu Kawatoko
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD MEASURING INSTRUMENT
- Publication number 20150219431
- Publication date Aug 6, 2015
- HEXAGON TECHNOLOGY CENTER GMBH
- Pascal Jordil
- G01 - MEASURING TESTING

Micrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and method for detection of deformation in battery cells

Measuring instrument and method of remote quantity value transfer/t...

Digital micrometer

Sensing winding configuration for inductive position encoder

Caliper and accessories therefor

Caliper measurement force detecting device

Measuring instrument with coupled antenna

Apparatus and method for detection of deformation in battery cells

Micro head and stage mechanism using the same

Spindle drive

Micrometer for measuring dimension of a conductive object

Roundness measuring device

Method for controlling small-sized measurement device

Apparatus for reading value measured with analog measuring tool

Digital measurement instrument

Measuring instrument that detects displacement of a contact point

External device for measuring instrument

Connection unit for connecting external device to measurement devic...

Electronic micrometer for measuring dimensions of a body and method...

Digital comparator having a retractable anvil supported at one end...

Handheld measuring instrument

Calibration control device for metrology tools

Precision hydrostatic level and flatness measuring device, system a...

Ergonomic micrometer including two modes of adjustment

Digital displacement measuring instrument

Method for validating a workpiece measurement in a dimensional metr...

Micrometer

Precision hydrostatic level and flatness measuring device, system a...

Flexible mount for coupling force actuator to caliper jaw

Inductive detection type rotary encoder

Patents Applicationslast 30 patents

MICROMETER DRIVER SYSTEM AND METHOD

MICROMETER HEAD DISPLACEMENT SYSTEM UTILIZING IMAGING

AUTOMATIC MEASURING DEVICE AND CONTROL METHOD OF THE SAME

SYSTEM FOR MEASURING A CHANGING CRACK IN A WALL OR THE LIKE

APPARATUS AND METHOD FOR DETECTION OF DEFORMATION IN BATTERY CELLS

SENSING WINDING CONFIGURATION FOR INDUCTIVE POSITION ENCODER

MICROMETER FOR MEASURING DIMENSION OF A CONDUCTIVE OBJECT

MEASURING INSTRUMENT AND METHOD OF REMOTE QUANTITY VALUE TRANSFER/T...

CALIPER MEASUREMENT FORCE DETECTING DEVICE

NETWORK APPARATUS

MEASURING INSTRUMENT WITH COUPLED ANTENNA

DIGITAL MICROMETER

MICRO HEAD AND STAGE MECHANISM USING THE SAME

Spindle Drive

METHOD FOR CONTROLLING SMALL-SIZED MEASUREMENT DEVICE

APPARATUS AND METHOD FOR DETECTION OF DEFORMATION IN BATTERY CELLS

APPARATUS FOR READING VALUE MEASURED WITH ANALOG MEASURING TOOL

ROUNDNESS MEASURING DEVICE

Bar Length Detection Tool and Method for Detecting Bar Length

DIGITAL MEASUREMENT INSTRUMENT

Precision Hydrostatic Level and Flatness Measuring Devices, Systems...

FLATNESS MEASURING DEVICE

ELECTRONIC MICROMETER FOR MEASURING DIMENSIONS OF A BODY AND METHOD...

SECONDARY DATA COMMUNICATION METHODOLOGY FOR METROLOGICAL DEVICE AU...

APPARATUS OF ALIGNING AND ASSEMBLING

ERGONOMIC MICROMETER INCLUDING TWO MODES OF ADJUSTMENT

HANDHELD MEASURING DEVICE COMPRISING A USER INTERFACE RESPONSIVE TO...

PARAMETER SETTING METHOD OF MEASURING INSTRUMENT AND COMPUTER READA...

SEMICONDUCTOR INTEGRATED CIRCUIT AND POSITION DETECTOR

HANDHELD MEASURING INSTRUMENT