Membership
Tour
Register
Log in
Microprocessor processing
Follow
Industry
CPC
G01N2201/126
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
Current Industry
G01N2201/126
Microprocessor processing
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Photoresist characteristics analysis method and characteristics ana...
Patent number
12,174,113
Issue date
Dec 24, 2024
FEMTO DEPLOYMENTS INC.
Akira Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Auto-focussing LIBS system
Patent number
12,117,401
Issue date
Oct 15, 2024
Foss Analytical A/S
Daniel Aden
G01 - MEASURING TESTING
Information
Patent Grant
Swept frequency fluorometer
Patent number
12,061,149
Issue date
Aug 13, 2024
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
Data processing method and system for detection of deterioration of...
Patent number
12,055,498
Issue date
Aug 6, 2024
Top Technology Platform Co., Ltd.
Chyuan-Ruey Lin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for pH sensing in fluids
Patent number
12,007,324
Issue date
Jun 11, 2024
University of Maryland, College Park
Yang Tao
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for quantitative phenotype analysis
Patent number
11,982,627
Issue date
May 14, 2024
Monsanto Technology LLC
Alberto B. Iandolino
G01 - MEASURING TESTING
Information
Patent Grant
Optical test platform
Patent number
11,938,483
Issue date
Mar 26, 2024
bioMerieux, Inc.
Jack R. Hoffmann
G01 - MEASURING TESTING
Information
Patent Grant
Device of complex gas mixture detection based on optical-path-adjus...
Patent number
11,933,724
Issue date
Mar 19, 2024
HUBEI UNIVERSITY OF TECHNOLOGY
Yin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Receiver, early anomaly detection system and method, and computer-r...
Patent number
11,860,089
Issue date
Jan 2, 2024
NEC Corporation
Yuma Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Extended solid angle turbidity sensor
Patent number
11,860,096
Issue date
Jan 2, 2024
YSI, Inc.
Kevin Flanagan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and device for testing electrode sheet
Patent number
11,841,328
Issue date
Dec 12, 2023
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Guoda Huang
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring characteristic of thin film
Patent number
11,835,447
Issue date
Dec 5, 2023
AUROS TECHNOLOGY, INC.
Tae Dong Kang
G01 - MEASURING TESTING
Information
Patent Grant
Data acquisition control for advanced analytic instruments having p...
Patent number
11,808,700
Issue date
Nov 7, 2023
Quantum-Si Incorporated
Jonathan M. Rothberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Auto-focussing LIBS system
Patent number
11,781,990
Issue date
Oct 10, 2023
Foss Analytical A/S
Daniel Aden
G01 - MEASURING TESTING
Information
Patent Grant
Optical density instrument and systems and methods using the same
Patent number
11,779,931
Issue date
Oct 10, 2023
bioMerieux Inc.
Perry D. Stamm
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Fire detection and feature extraction apparatus and method based on...
Patent number
11,747,270
Issue date
Sep 5, 2023
Electronics and Telecommunications Research Institute
Kyu Won Han
G01 - MEASURING TESTING
Information
Patent Grant
Measuring light scattering of a sample
Patent number
11,719,631
Issue date
Aug 8, 2023
WYATT TECHNOLOGY CORPORATION
Dwight Kahng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, apparatus, and computer program product for controlling com...
Patent number
11,673,141
Issue date
Jun 13, 2023
bioMerieux, Inc.
Joel Patrick Harrison
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Spatial gradient-based fluorometer
Patent number
11,604,143
Issue date
Mar 14, 2023
YSI, Inc.
Kevin Flanagan
G01 - MEASURING TESTING
Information
Patent Grant
Loosely-coupled inspection and metrology system for high-volume pro...
Patent number
11,562,289
Issue date
Jan 24, 2023
KLA Corporation
Song Wu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Nuisance mining for novel defect discovery
Patent number
11,514,357
Issue date
Nov 29, 2022
KLA-Tencor Corporation
Martin Plihal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Alarm threshold organic and microbial fluorimeter and methods
Patent number
11,506,606
Issue date
Nov 22, 2022
SweetSense, Inc.
Emily Bedell
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection, analysis, classification, and grading of transparent sh...
Patent number
11,480,532
Issue date
Oct 25, 2022
LiteSentry LLC
Eric Hegstrom
G01 - MEASURING TESTING
Information
Patent Grant
Scatterometry modeling in the presence of undesired diffraction orders
Patent number
11,422,095
Issue date
Aug 23, 2022
KLA Corporation
Phillip Atkins
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical imaging based on spectral shift assessment
Patent number
11,402,327
Issue date
Aug 2, 2022
Parviz Parvin
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic analysis apparatus, spectroscopic analysis method, an...
Patent number
11,385,168
Issue date
Jul 12, 2022
NEC Corporation
Minoru Asogawa
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Detection of pH
Patent number
11,346,785
Issue date
May 31, 2022
United Kingdom Research and Innovation
Pavel Matousek
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining concentrations of materials in...
Patent number
11,340,205
Issue date
May 24, 2022
Hong Kong Applied Science and Technology Research Institute Co., Ltd.
Mengting Wu
G01 - MEASURING TESTING
Information
Patent Grant
Tomography method, system, and apparatus based on time-domain spect...
Patent number
11,300,504
Issue date
Apr 12, 2022
National Tsing Hua University
Shang-Hua Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tip resistant optical testing instrument
Patent number
11,285,487
Issue date
Mar 29, 2022
bioMerieux, Inc.
Jack R. Hoffmann
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR PH SENSING IN FLUIDS
Publication number
20240402078
Publication date
Dec 5, 2024
University of Maryland, College Park
Yang TAO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND PROCEDURE FOR INSPECTION OF THE SURFACE OF A NUCLEAR FUE...
Publication number
20240404719
Publication date
Dec 5, 2024
ENUSA INDUSTRIAS AVANZADAS, S.A., S.M.E
Jesús CASTAÑO MARCOS
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
SYSTEMS AND METHODS FOR IDENTIFYING SUBSTANCES CONTAINED IN A SAMPLE
Publication number
20240393236
Publication date
Nov 28, 2024
Bruker Switzerland AG
Kevin Fäh
G01 - MEASURING TESTING
Information
Patent Application
DISTRIBUTED TIME RESOLVED FLUORESCENCE SENSOR USING TEMPORALLY CORR...
Publication number
20240377323
Publication date
Nov 14, 2024
California Institute of Technology
Scott K. Cushing
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...
Publication number
20240378716
Publication date
Nov 14, 2024
ORBOTECH LTD.
Chay Goldenberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONFIGURABLE HANDHELD BIOLOGICAL ANALYZERS FOR IDENTIFICATION OF BI...
Publication number
20240369490
Publication date
Nov 7, 2024
Amgen Inc.
Robert Joseph Soto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF...
Publication number
20240369498
Publication date
Nov 7, 2024
Republic of Korea (National Forensic Service Director Ministry of the Interio...
Kyu Young LIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ADAPTIVE SUBTRACTION FOR C-SIM MICROSCOPY
Publication number
20240338792
Publication date
Oct 10, 2024
Thermo Electron Scientific Instruments LLC
John Eichorst
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Optimizing a Measurement Pattern on a Wafer
Publication number
20240328960
Publication date
Oct 3, 2024
ROBERT BOSCH GmbH
Peter Ebersbach
G01 - MEASURING TESTING
Information
Patent Application
Fiber Verification for Composite Material Manufacturing
Publication number
20240328938
Publication date
Oct 3, 2024
The Boeing Company
David Williamson Shahan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR DETECTING LOCAL DEFECTS ON A REFLECTIVE SURFACE
Publication number
20240319105
Publication date
Sep 26, 2024
ISRA VISION GMBH
Klaus VEIT
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEM, AND METHOD FOR ANALYZING THIN FILMS WITH IMPROVE...
Publication number
20240310161
Publication date
Sep 19, 2024
AUROS TECHNOLOGY, INC.
Tae Dong KANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HYPER-SPECTRAL ASSESSMENT OF MULTIPLE VARIANTS OF CANNABIS
Publication number
20240295494
Publication date
Sep 5, 2024
Regents of the University of Minnesota
Toby J. Velte
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR DETECTING OPTICAL DEFECTS WITHIN WINDSHIELD
Publication number
20240280509
Publication date
Aug 22, 2024
SAINT-GOBAIN GLASS FRANCE
Théo RYBARCZYK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EARLY FIRE DETECTION APPARATUS AND METHOD BASED ON UNWANTED ALARM P...
Publication number
20240241050
Publication date
Jul 18, 2024
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Hoe-Sung YANG
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING DEVICE AND INSPECTION APPARATUS FOR OPTICAL INSPECTION A...
Publication number
20240230550
Publication date
Jul 11, 2024
LEICA MICROSYSTEMS (SUZHOU) TECHNOLOGY CO., LTD.
Linqi JIAO
G01 - MEASURING TESTING
Information
Patent Application
URINE TEST DEVICE DESIGNED TO BE EASILY MOUNTED AND OPERATION METHO...
Publication number
20240230541
Publication date
Jul 11, 2024
YELLOSIS, INC.
Yu Kyung TAK
G01 - MEASURING TESTING
Information
Patent Application
PORTABLE HYPERSPECTRAL SYSTEM
Publication number
20240210310
Publication date
Jun 27, 2024
KULIA LABS, INC.
Francesco CUTRALE
G01 - MEASURING TESTING
Information
Patent Application
Phase-Resolved Optical Metrology for Substrates
Publication number
20240201077
Publication date
Jun 20, 2024
Nedal SALEH
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND N...
Publication number
20240169616
Publication date
May 23, 2024
Toyota Jidosha Kabushiki Kaisha
Tetsuya SHOJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
EVALUATING APPARATUS FOR THERMAL BOUNDARY CONDUCTANCE USING ACOUSTI...
Publication number
20240159658
Publication date
May 16, 2024
GIST(Gwangju Institute of Science and Technology)
Young Dahl JHO
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING DEVICE AND INSPECTION APPARATUS FOR OPTICAL INSPECTION A...
Publication number
20240133823
Publication date
Apr 25, 2024
LEICA MICROSYSTEMS (SUZHOU) TECHNOLOGY CO., LTD.
Linqi JIAO
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE DATA FOR DEVICE METROLOGY
Publication number
20240111256
Publication date
Apr 4, 2024
ONTO INNOVATION INC.
Haodong Qiu
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS OF EMBEDDED TISSUE SAMPLES USING FLUORESCENCE-BASED DETECTION
Publication number
20240102932
Publication date
Mar 28, 2024
Agilent Technologies, Inc.
Victor LIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
Publication number
20240102937
Publication date
Mar 28, 2024
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONFIGURABLE NON-DESTRUCTIVE TESTING DEVICE
Publication number
20240094878
Publication date
Mar 21, 2024
Baker Hughes Holdings LLC
Sheldon McCrackin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
URINE ANALYSIS
Publication number
20240077414
Publication date
Mar 7, 2024
OUTSENSE DIAGNOSTICS LTD.
Yaara Kapp-Barnea
E03 - WATER SUPPLY SEWERAGE
Information
Patent Application
DATA ACQUISITION CONTROL FOR ADVANCED ANALYTIC INSTRUMENTS HAVING P...
Publication number
20240068943
Publication date
Feb 29, 2024
Quantum-Si Incorporated
Jonathan M. Rothberg
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NON-INVASIVE METHOD OF DETERMINING PROPERTIES OF A CHICKEN EGG AND/...
Publication number
20240069000
Publication date
Feb 29, 2024
AGRI Advanced Technologies GmbH
Jörg HURLIN
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CHARACTERIZING A PART THROUGH NON-DESTRUCTIVE INSPECTION
Publication number
20240013044
Publication date
Jan 11, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Clement FISHER
G06 - COMPUTING CALCULATING COUNTING