Mirror analyser

Industry

CPC
H01J2237/0535

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/0535Mirror analyser

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,978,579
- Issue date May 22, 2018
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,437,408
- Issue date Sep 6, 2016
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector
- Patent number 8,907,305
- Issue date Dec 9, 2014
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sequential radial mirror analyser
- Patent number 8,723,114
- Issue date May 13, 2014
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging energy filter for electrically charged particles and spectr...
- Patent number 8,530,835
- Issue date Sep 10, 2013
- Dietmar Funnemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe
- Patent number 8,513,597
- Issue date Aug 20, 2013
- Cameca Instruments, Inc.
- Peter Panayi
- G01 - MEASURING TESTING
Information Patent Grant
Distributed potential charged particle detector
- Patent number 8,481,962
- Issue date Jul 9, 2013
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle energy analyzer
- Patent number 8,421,030
- Issue date Apr 16, 2013
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror energy filter for electron beam apparatus
- Patent number 8,334,508
- Issue date Dec 18, 2012
- Electron Optica, Inc.
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,399,966
- Issue date Jul 15, 2008
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,294,835
- Issue date Nov 13, 2007
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,049,591
- Issue date May 23, 2006
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Precision multiple electrode ion mirror
- Patent number 6,849,846
- Issue date Feb 1, 2005
- Agilent Technologies, Inc.
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,847,038
- Issue date Jan 25, 2005
- Hitachi, Ltd.
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle device
- Patent number 6,730,907
- Issue date May 4, 2004
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterpruftechnik mbH
- Hans-Peter Feuerbaum
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20140361161
- Publication date Dec 11, 2014
- VG SCIENTA AB
- Björn Wannberg
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTOR
- Publication number 20130214156
- Publication date Aug 22, 2013
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEQUENTIAL RADIAL MIRROR ANALYSER
- Publication number 20130126730
- Publication date May 23, 2013
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Imaging energy filter for electrically charged particles and spectr...
- Publication number 20120261571
- Publication date Oct 18, 2012
- Dietmar Funnemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Distributed Potential Charged Particle Detector
- Publication number 20120037802
- Publication date Feb 16, 2012
- FEI Company
- Eric Kneedler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE ENERGY ANALYZER
- Publication number 20110168886
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Khashayar Shadman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATOM PROBE
- Publication number 20100148060
- Publication date Jun 17, 2010
- Imago Scientific Instruments Corporation
- Peter Panayi
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20070221846
- Publication date Sep 27, 2007
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20060113474
- Publication date Jun 1, 2006
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20050133719
- Publication date Jun 23, 2005
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20040051041
- Publication date Mar 18, 2004
- Hideo Todokoro
- G01 - MEASURING TESTING
Information Patent Application
Precision multiple electrode ion mirror
- Publication number 20040036029
- Publication date Feb 26, 2004
- James L. Bertsch
- H01 - BASIC ELECTRIC ELEMENTS

Mirror analyser

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Analyser arrangement for particle spectrometer

Analyser arrangement for particle spectrometer

Charged particle detector

Sequential radial mirror analyser

Imaging energy filter for electrically charged particles and spectr...

Atom probe

Distributed potential charged particle detector

Charged-particle energy analyzer

Mirror energy filter for electron beam apparatus

Scanning electron microscope

Scanning electron microscope

Scanning electron microscope

Precision multiple electrode ion mirror

Scanning electron microscope

Charged particle device

Patents Applicationslast 30 patents

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

CHARGED PARTICLE DETECTOR

SEQUENTIAL RADIAL MIRROR ANALYSER

Imaging energy filter for electrically charged particles and spectr...

Distributed Potential Charged Particle Detector

CHARGED-PARTICLE ENERGY ANALYZER

ATOM PROBE

Scanning electron microscope

Scanning electron microscope

Scanning electron microscope

Scanning electron microscope

Precision multiple electrode ion mirror