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molecular or atomic beams
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CPC
G01N2223/105
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/105
molecular or atomic beams
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Patents Grants
last 30 patents
Information
Patent Grant
Composite charged particle beam apparatus
Patent number
9,024,280
Issue date
May 5, 2015
Hitachi High-Tech Science Corporation
Atsushi Uemoto
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for surface characterization and process contr...
Patent number
4,393,311
Issue date
Jul 12, 1983
Bell Telephone Laboratories, Incorporated
Leonard C. Feldman
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
3792251
Patent number
3,792,251
Issue date
Feb 12, 1974
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ION GROUP IRRADIATION DEVICE AND SECONDARY ION MASS SPECTROMETER
Publication number
20140374587
Publication date
Dec 25, 2014
Yohei Murayama
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
Publication number
20130075606
Publication date
Mar 28, 2013
Atsushi UEMOTO
G01 - MEASURING TESTING