Monitoring and controlling the scan

Industry

CPC
G01N2201/11

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/11Monitoring and controlling the scan

Industries

Patents Grantslast 30 patents

Information Patent Grant
Process tool for analyzing bonded workpiece interface
- Patent number 12,205,855
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hau-Yi Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrophotometer, spectroscopic measurement method, and program
- Patent number 11,927,527
- Issue date Mar 12, 2024
- Hitachi High-Tech Science Corporation
- Kai Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Control device of image reading apparatus, operation method thereof...
- Patent number 11,150,188
- Issue date Oct 19, 2021
- FUJIFILM Corporation
- Takashi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning trajectories for region-of-interest tomograph
- Patent number 11,009,449
- Issue date May 18, 2021
- FEI Company
- Glenn Myers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for inspecting a semiconductor device
- Patent number 10,830,710
- Issue date Nov 10, 2020
- TOSHIBA MEMORY CORPORATION
- Motoshi Seto
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Grant
Dynamic focusing confocal optical scanning system
- Patent number 10,520,436
- Issue date Dec 31, 2019
- Caduceus Biotechnology Inc.
- Golden Tiao
- G01 - MEASURING TESTING
Information Patent Grant
Sample substance molecular bonds breakdown and SEL collection
- Patent number 10,466,177
- Issue date Nov 5, 2019
- Hewlett-Packard Development Company, L.P.
- Ning Ge
- G01 - MEASURING TESTING
Information Patent Grant
Optical element rotation type Mueller-matrix ellipsometer and metho...
- Patent number 10,145,785
- Issue date Dec 4, 2018
- Korea Research Institute of Standards and Science
- Yong Jai Cho
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inducing and detecting multi-photon processes...
- Patent number 9,851,303
- Issue date Dec 26, 2017
- Ludwig-Maximilians-Universitat München
- Robert Alexander Huber
- G01 - MEASURING TESTING
Information Patent Grant
Optical mode analysis with design-based care areas
- Patent number 9,702,827
- Issue date Jul 11, 2017
- KLA-Tencor Corp.
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Metrology optimized inspection
- Patent number 9,518,932
- Issue date Dec 13, 2016
- KLA-Tencor Corp.
- Allen Park
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fine particle optical measuring method in fluidic channels
- Patent number 8,553,229
- Issue date Oct 8, 2013
- Sony Corporation
- Motohiro Furuki
- G01 - MEASURING TESTING
Information Patent Grant
Data acquisition method using a laser scanner
- Patent number 8,222,615
- Issue date Jul 17, 2012
- Tecan Trading AG
- Alois Schausberger
- G01 - MEASURING TESTING
Information Patent Grant
Method of condensed cell slide preparation and detection of rarely...
- Patent number 7,595,874
- Issue date Sep 29, 2009
- Sciperio, Inc.
- Vladimir M. Pelekhaty
- G01 - MEASURING TESTING
Information Patent Grant
Mapping-measurement apparatus
- Patent number 7,224,460
- Issue date May 29, 2007
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Laser imaging system
- Patent number 5,037,207
- Issue date Aug 6, 1991
- Ohio State University Research Foundation
- L. David Tomei
- G02 - OPTICS
Information Patent Grant
Particle detection on patterned wafers and the like
- Patent number 4,898,471
- Issue date Feb 6, 1990
- Tencor Instruments
- John L. Vaught
- G01 - MEASURING TESTING
Information Patent Grant
Dual beam laser inspection apparatus
- Patent number 4,643,569
- Issue date Feb 17, 1987
- Lincoln Laser Company
- Sean Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Light collector for optical contaminant and flaw detector
- Patent number 4,601,576
- Issue date Jul 22, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Scanning sample, signal generation, data digitizing and retiming sy...
- Patent number 4,600,951
- Issue date Jul 15, 1986
- AT&T Technologies, Inc.
- Frank H. Blitchington
- G01 - MEASURING TESTING
Information Patent Grant
Dual collector optical flaw detector
- Patent number 4,597,665
- Issue date Jul 1, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...
- Publication number 20250052691
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Youngsun CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER
- Publication number 20250052666
- Publication date Feb 13, 2025
- KLA Corporation
- Chao Chang
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
PROCESS TOOL FOR ANALYZING BONDED WORKPIECE INTERFACE
- Publication number 20240379468
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hau-Yi Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMAL PARAMETER SELECTION FOR STRUCTURED LIGHT METROLOGY
- Publication number 20240255415
- Publication date Aug 1, 2024
- LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
- Brian Giera
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20240210319
- Publication date Jun 27, 2024
- HAMAMATSU PHOTONICS K. K.
- Satoshi YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
PROCESS TOOL FOR ANALYZING BONDED WORKPIECE INTERFACE
- Publication number 20230069432
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hau-Yi Hsiao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROPHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM
- Publication number 20220412879
- Publication date Dec 29, 2022
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Kai MARUYAMA
- G01 - MEASURING TESTING
Information Patent Application
Scanning Trajectories for Region-Of-Interest Tomograph
- Publication number 20190323946
- Publication date Oct 24, 2019
- FEI Company
- Glenn MYERS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPY APPARATUS AND METHODS
- Publication number 20190226995
- Publication date Jul 25, 2019
- RENISHAW PLC
- Thomas Anthony MASON
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SUBSTANCE MOLECULAR BONDS BREAKDOWN AND SEL COLLECTION
- Publication number 20190079008
- Publication date Mar 14, 2019
- Ning GE
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC FOCUSING CONFOCAL OPTICAL SCANNING SYSTEM
- Publication number 20180149594
- Publication date May 31, 2018
- Caduceus Biotechnology Inc.
- Golden Tiao
- G02 - OPTICS
Information Patent Application
BODY SCANNER SYSTEM AND METHOD FOR SCANNING A PERSON
- Publication number 20180067043
- Publication date Mar 8, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Josef Koeppl
- G01 - MEASURING TESTING
Information Patent Application
CONTROL DEVICE OF IMAGE READING APPARATUS, OPERATION METHOD THEREOF...
- Publication number 20170363543
- Publication date Dec 21, 2017
- FUJIFILM CORPORATION
- Takashi KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
A System and Method for Inducing and Detecting Multi-Photon Process...
- Publication number 20170146458
- Publication date May 25, 2017
- Ludwig-Maximilians-Universitat Munchen
- Robert Alexander Huber
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ELEMENT ROTATION TYPE MUELLER-MATRIX ELLIPSOMETER AND METHO...
- Publication number 20160153894
- Publication date Jun 2, 2016
- Korea Research Institute of Standards and Science
- Yong Jai Cho
- G01 - MEASURING TESTING
Information Patent Application
Metrology Optimized Inspection
- Publication number 20150124247
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Allen Park
- G01 - MEASURING TESTING
Information Patent Application
DATA ACQUISITION METHOD USING A LASER SCANNER
- Publication number 20110006219
- Publication date Jan 13, 2011
- Alois Schausberger
- G02 - OPTICS
Information Patent Application
FINE PARTICLE MEASURING METHOD, SUBSTRATE FOR MEASUREMENT, AND MEAS...
- Publication number 20090116005
- Publication date May 7, 2009
- Motohiro FURUKI
- G01 - MEASURING TESTING
Information Patent Application
Mapping-measurement apparatus
- Publication number 20050088656
- Publication date Apr 28, 2005
- JASCO CORPORATION
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Application
Machine vision inspection system and method having improved operati...
- Publication number 20040223053
- Publication date Nov 11, 2004
- Mitutoyo Corporation
- Paul G. Gladnick
- G06 - COMPUTING CALCULATING COUNTING

Monitoring and controlling the scan

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Process tool for analyzing bonded workpiece interface

Spectrophotometer, spectroscopic measurement method, and program

Control device of image reading apparatus, operation method thereof...

Scanning trajectories for region-of-interest tomograph

Method and device for inspecting a semiconductor device

Dynamic focusing confocal optical scanning system

Sample substance molecular bonds breakdown and SEL collection

Optical element rotation type Mueller-matrix ellipsometer and metho...

System and method for inducing and detecting multi-photon processes...

Optical mode analysis with design-based care areas

Metrology optimized inspection

Fine particle optical measuring method in fluidic channels

Data acquisition method using a laser scanner

Method of condensed cell slide preparation and detection of rarely...

Mapping-measurement apparatus

Laser imaging system

Particle detection on patterned wafers and the like

Dual beam laser inspection apparatus

Light collector for optical contaminant and flaw detector

Scanning sample, signal generation, data digitizing and retiming sy...

Dual collector optical flaw detector

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...

DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER

APPARATUS AND METHOD FOR MEASURING WAFERS

PROCESS TOOL FOR ANALYZING BONDED WORKPIECE INTERFACE

OPTIMAL PARAMETER SELECTION FOR STRUCTURED LIGHT METROLOGY

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

PROCESS TOOL FOR ANALYZING BONDED WORKPIECE INTERFACE

SPECTROPHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM

Scanning Trajectories for Region-Of-Interest Tomograph

SPECTROSCOPY APPARATUS AND METHODS

SAMPLE SUBSTANCE MOLECULAR BONDS BREAKDOWN AND SEL COLLECTION

DYNAMIC FOCUSING CONFOCAL OPTICAL SCANNING SYSTEM

BODY SCANNER SYSTEM AND METHOD FOR SCANNING A PERSON

CONTROL DEVICE OF IMAGE READING APPARATUS, OPERATION METHOD THEREOF...

A System and Method for Inducing and Detecting Multi-Photon Process...

OPTICAL ELEMENT ROTATION TYPE MUELLER-MATRIX ELLIPSOMETER AND METHO...

Metrology Optimized Inspection

DATA ACQUISITION METHOD USING A LASER SCANNER

FINE PARTICLE MEASURING METHOD, SUBSTRATE FOR MEASUREMENT, AND MEAS...

Mapping-measurement apparatus

Machine vision inspection system and method having improved operati...