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G01N2223/1003

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/1003monochromatic

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Patents Grantslast 30 patents

Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,867,595
- Issue date Jan 9, 2024
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive detection of surface and near surface abnormalities...
- Patent number 11,815,477
- Issue date Nov 14, 2023
- The University of Sheffield
- Matthew Brown
- G01 - MEASURING TESTING
Information Patent Grant
Multi-scan computed tomography defect detectability
- Patent number 11,480,533
- Issue date Oct 25, 2022
- Honeywell Federal Manufacturing & Technologies, LLC
- Bryan E. Schiefelbein
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter imaging systems and methods with helical motion
- Patent number 10,451,570
- Issue date Oct 22, 2019
- California Institute of Technology
- Lukas Mandrake
- G01 - MEASURING TESTING
Information Patent Grant
X-ray interferometer
- Patent number 10,074,451
- Issue date Sep 11, 2018
- CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A.—RECHERCHE ET DEVE...
- Christian Kottler
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterizing the catalyst structure in a fuel cell and...
- Patent number 9,739,725
- Issue date Aug 22, 2017
- Andrei Kulikovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Online monitoring of contaminants in crude and heavy fuels, and ref...
- Patent number 9,383,326
- Issue date Jul 5, 2016
- X-Ray Optical Systems, Inc.
- Albertus Beumer
- G01 - MEASURING TESTING
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,343,193
- Issue date May 17, 2016
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,048,001
- Issue date Jun 2, 2015
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 8,559,597
- Issue date Oct 15, 2013
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Phase-sensitive X-ray imager
- Patent number 8,351,569
- Issue date Jan 8, 2013
- Lawrence Livermore National Security, LLC
- Kevin Louis Baker
- G01 - MEASURING TESTING
Information Patent Grant
Method of bright-field imaging using X-rays
- Patent number 7,903,785
- Issue date Mar 8, 2011
- Postech Foundation
- Jung Ho Je
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for deriving tissue structure from multiple projection d...
- Patent number 6,816,564
- Issue date Nov 9, 2004
- The Johns Hopkins University
- Harry K. Charles
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
ELEMENT DISTRIBUTION MEASURING DEVICE AND ELEMENT DISTRIBUTION MEAS...
- Publication number 20240241065
- Publication date Jul 18, 2024
- Hamamatsu Photonics K.K.
- Takahiro MOCHIZUKI
- G01 - MEASURING TESTING
Information Patent Application
System and Method of Measuring Contaminants in a Substantially Tran...
- Publication number 20230213439
- Publication date Jul 6, 2023
- Hypersoniq B.V.
- Lazlo Kleczewski
- G01 - MEASURING TESTING
Information Patent Application
PH MEASUREMENT METHOD AND PH MEASUREMENT DEVICE
- Publication number 20220404286
- Publication date Dec 22, 2022
- KYOCERA CORPORATION
- Masaya WATANABE
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE DETECTION OF SURFACE AND NEAR SURFACE ABNORMALITIES...
- Publication number 20220205934
- Publication date Jun 30, 2022
- THE UNIVERSITY OF SHEFFIELD
- Matthew BROWN
- G01 - MEASURING TESTING
Information Patent Application
ONLINE MONITORING OF CONTAMINANTS IN CRUDE AND HEAVY FUELS, AND REF...
- Publication number 20140198898
- Publication date Jul 17, 2014
- X-Ray Optical Systems, Inc.
- Albertus Beumer
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20140105363
- Publication date Apr 17, 2014
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INTERFEROMETER
- Publication number 20130108015
- Publication date May 2, 2013
- CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A - RECHERCHE ET DEV...
- Christian Kottler
- G02 - OPTICS
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20110170666
- Publication date Jul 14, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
PHASE-SENSITIVE X-RAY IMAGER
- Publication number 20100316190
- Publication date Dec 16, 2010
- Kevin Louis Baker
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS
- Publication number 20090290681
- Publication date Nov 26, 2009
- Jung Ho Je
- G01 - MEASURING TESTING
Information Patent Application
Techniques for deriving tissue structure from multiple projection d...
- Publication number 20040077088
- Publication date Apr 22, 2004
- Harry K. Charles Jr
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

monochromatic

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Handheld inspection device and method of inspecting an infrastructu...

X-ray reflectometry apparatus and method thereof for measuring thre...

Non-destructive detection of surface and near surface abnormalities...

Multi-scan computed tomography defect detectability

Backscatter imaging systems and methods with helical motion

X-ray interferometer

Method for characterizing the catalyst structure in a fuel cell and...

Online monitoring of contaminants in crude and heavy fuels, and ref...

XRF system having multiple excitation energy bands in highly aligne...

XRF system having multiple excitation energy bands in highly aligne...

XRF system having multiple excitation energy bands in highly aligne...

Phase-sensitive X-ray imager

Method of bright-field imaging using X-rays

Techniques for deriving tissue structure from multiple projection d...

Patents Applicationslast 30 patents

ELEMENT DISTRIBUTION MEASURING DEVICE AND ELEMENT DISTRIBUTION MEAS...

System and Method of Measuring Contaminants in a Substantially Tran...

PH MEASUREMENT METHOD AND PH MEASUREMENT DEVICE

NON-DESTRUCTIVE DETECTION OF SURFACE AND NEAR SURFACE ABNORMALITIES...

ONLINE MONITORING OF CONTAMINANTS IN CRUDE AND HEAVY FUELS, AND REF...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

X-RAY INTERFEROMETER

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

PHASE-SENSITIVE X-RAY IMAGER

METHOD OF BRIGHT-FIELD IMAGING USING X-RAYS

Techniques for deriving tissue structure from multiple projection d...