monochromators

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CPC
G01N2223/315

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/315monochromators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,867,595
- Issue date Jan 9, 2024
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength dispersive X-ray fluorescence spectrometer
- Patent number 10,948,436
- Issue date Mar 16, 2021
- Rigaku Corporation
- Shuichi Kato
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam device, observation method, and diffraction grating
- Patent number 10,948,426
- Issue date Mar 16, 2021
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection apparatus and x-ray detection method
- Patent number 10,859,520
- Issue date Dec 8, 2020
- Horiba, Ltd.
- Tetsuya Takimoto
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-ray diffraction method and apparatus
- Patent number 10,753,890
- Issue date Aug 25, 2020
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
X-ray thin film inspection device
- Patent number 10,473,598
- Issue date Nov 12, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter imaging systems and methods with helical motion
- Patent number 10,451,570
- Issue date Oct 22, 2019
- California Institute of Technology
- Lukas Mandrake
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
- Patent number 10,436,723
- Issue date Oct 8, 2019
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optics assembly with switching system for three beam paths, a...
- Patent number 10,429,326
- Issue date Oct 1, 2019
- Frank Hans Hoffman
- G01 - MEASURING TESTING
Information Patent Grant
Active, variable sample concentration method and apparatus for sub-...
- Patent number 10,317,350
- Issue date Jun 11, 2019
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Support structure and highly aligned monochromatic X-ray optics for...
- Patent number 10,256,002
- Issue date Apr 9, 2019
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Metal grating structure for X-ray
- Patent number 10,256,001
- Issue date Apr 9, 2019
- Konica Minolta, Inc.
- Mitsuru Yokoyama
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Methods for manufacturing doubly bent X-ray focusing device, doubly...
- Patent number 10,175,185
- Issue date Jan 8, 2019
- Rigaku Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Beam generation unit and X-ray small-angle scattering apparatus
- Patent number 10,145,808
- Issue date Dec 4, 2018
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Magnetic measurement system and apparatus utilizing X-ray to measur...
- Patent number 9,835,569
- Issue date Dec 5, 2017
- TOYOTA JIDOSHA KABUSHIKI KAISHA
- Masao Yano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray topography apparatus
- Patent number 9,658,174
- Issue date May 23, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Analysis device, analysis method, film formation device, and film f...
- Patent number 9,607,909
- Issue date Mar 28, 2017
- Fujitsu Limited
- Kenji Nomura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,343,193
- Issue date May 17, 2016
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray beam conditioning
- Patent number 9,269,468
- Issue date Feb 23, 2016
- Jordan Valley Semiconductors Ltd.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 9,048,001
- Issue date Jun 2, 2015
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Grant
XRF system having multiple excitation energy bands in highly aligne...
- Patent number 8,559,597
- Issue date Oct 15, 2013
- X-Ray Optical Systems, Inc.
- Zewu Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray analysis apparatus
- Patent number 4,726,047
- Issue date Feb 16, 1988
- U.S. Philips Corporation
- Geert Brouwer
- G01 - MEASURING TESTING
Information Patent Grant
3439163
- Patent number 3,439,163
- Issue date Apr 15, 1969
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
CONTROLLING THE PROCESS PARAMETERS BY MEANS OF RADIOGRAPHIC ONLINE...
- Publication number 20220357290
- Publication date Nov 10, 2022
- SMS group GMBH
- Christian KLINKENBERG
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20190227008
- Publication date Jul 25, 2019
- Rigaku Corporation
- Shuichi KATO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTION APPARATUS AND X-RAY DETECTION METHOD
- Publication number 20190187078
- Publication date Jun 20, 2019
- HORIBA, Ltd.
- Tetsuya TAKIMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
High resolution X-ray Diffraction Method and Apparatus
- Publication number 20180259464
- Publication date Sep 13, 2018
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER IMAGING SYSTEMS AND METHODS WITH HELICAL MOTION
- Publication number 20170315067
- Publication date Nov 2, 2017
- California Institute of Technology
- Lukas Mandrake
- G01 - MEASURING TESTING
Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170234814
- Publication date Aug 17, 2017
- RIGAKU CORPORATION
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC MEASUREMENT SYSTEM AND APPARATUS FOR MEASURING COMPARATIVE...
- Publication number 20170199135
- Publication date Jul 13, 2017
- Toyota Jidosha Kabushiki Kaisha
- Masao YANO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY OPTICS ASSEMBLY WITH SWITCHING SYSTEM FOR THREE BEAM PATHS, A...
- Publication number 20170176356
- Publication date Jun 22, 2017
- Bruker AXS GmbH
- Frank Hans HOFFMAN
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE, VARIABLE SAMPLE CONCENTRATION METHOD AND APPARATUS FOR SUB-...
- Publication number 20170097311
- Publication date Apr 6, 2017
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SMALL ANGLE OPTICAL SYSTEM
- Publication number 20170074809
- Publication date Mar 16, 2017
- Rigaku Corporation
- Kazuki ITO
- G01 - MEASURING TESTING
Information Patent Application
BEAM GENERATION UNIT AND X-RAY SMALL-ANGLE SCATTERING APPARATUS
- Publication number 20170010226
- Publication date Jan 12, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATING X-RAY OPTICS FO...
- Publication number 20140294157
- Publication date Oct 2, 2014
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING
Information Patent Application
Metal Lattice Production Method, Metal Lattice, X-Ray Imaging Devic...
- Publication number 20140241493
- Publication date Aug 28, 2014
- Mitsuru Yokoyama
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20140105363
- Publication date Apr 17, 2014
- X-Ray Optical Systems, Inc.
- Zewu CHEN
- G01 - MEASURING TESTING
Information Patent Application
MONOCHROMATIC X-RAY DEVICES AND METHODS OF USE
- Publication number 20130294576
- Publication date Nov 7, 2013
- Anil K. Pradhan
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BEAM CONDITIONING
- Publication number 20130287178
- Publication date Oct 31, 2013
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Paul Anthony Ryan
- G01 - MEASURING TESTING
Information Patent Application
XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...
- Publication number 20110170666
- Publication date Jul 14, 2011
- X-Ray Optical Systems, Inc.
- Zewu Chen
- G01 - MEASURING TESTING

monochromators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray detector system with at least two stacked flat Bragg diffractors

Controlling process parameters by means of radiographic online dete...

X-ray reflectometry apparatus and method thereof for measuring thre...

Wavelength dispersive X-ray fluorescence spectrometer

Particle beam device, observation method, and diffraction grating

X-ray detection apparatus and x-ray detection method

High resolution X-ray diffraction method and apparatus

X-ray thin film inspection device

Backscatter imaging systems and methods with helical motion

X-ray diffractometer with multilayer reflection-type monochromator

X-ray optics assembly with switching system for three beam paths, a...

Active, variable sample concentration method and apparatus for sub-...

Support structure and highly aligned monochromatic X-ray optics for...

Metal grating structure for X-ray

Methods for manufacturing doubly bent X-ray focusing device, doubly...

Beam generation unit and X-ray small-angle scattering apparatus

Magnetic measurement system and apparatus utilizing X-ray to measur...

X-ray topography apparatus

Analysis device, analysis method, film formation device, and film f...

XRF system having multiple excitation energy bands in highly aligne...

X-ray beam conditioning

XRF system having multiple excitation energy bands in highly aligne...

XRF system having multiple excitation energy bands in highly aligne...

X-ray analysis apparatus

3439163

Patents Applicationslast 30 patents

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

CONTROLLING THE PROCESS PARAMETERS BY MEANS OF RADIOGRAPHIC ONLINE...

WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER

X-RAY DETECTION APPARATUS AND X-RAY DETECTION METHOD

High resolution X-ray Diffraction Method and Apparatus

BACKSCATTER IMAGING SYSTEMS AND METHODS WITH HELICAL MOTION

X-RAY THIN FILM INSPECTION DEVICE

MAGNETIC MEASUREMENT SYSTEM AND APPARATUS FOR MEASURING COMPARATIVE...

X-RAY OPTICS ASSEMBLY WITH SWITCHING SYSTEM FOR THREE BEAM PATHS, A...

ACTIVE, VARIABLE SAMPLE CONCENTRATION METHOD AND APPARATUS FOR SUB-...

X-RAY SMALL ANGLE OPTICAL SYSTEM

BEAM GENERATION UNIT AND X-RAY SMALL-ANGLE SCATTERING APPARATUS

SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATING X-RAY OPTICS FO...

Metal Lattice Production Method, Metal Lattice, X-Ray Imaging Devic...

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...

MONOCHROMATIC X-RAY DEVICES AND METHODS OF USE

X-RAY BEAM CONDITIONING

XRF SYSTEM HAVING MULTIPLE EXCITATION ENERGY BANDS IN HIGHLY ALIGNE...