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G01N2223/604
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
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G01N2223/604
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for sorting of diamonds
Patent number
12,030,086
Issue date
Jul 9, 2024
BOTSWANA INTERNATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY
Adamu Murtala Zungeru
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Method and system to determine crystal structure
Patent number
11,988,618
Issue date
May 21, 2024
FEI Company
Bart Buijsse
G01 - MEASURING TESTING
Information
Patent Grant
Method of determining the three-dimensional structure of molecules...
Patent number
11,933,748
Issue date
Mar 19, 2024
Bruker Axs GmbH
Clemens Richert
C30 - CRYSTAL GROWTH
Information
Patent Grant
Single-crystal X-ray structure analysis system
Patent number
11,879,857
Issue date
Jan 23, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Single piece droplet generation and injection device for serial cry...
Patent number
11,624,718
Issue date
Apr 11, 2023
Arizona Board of Regents on behalf of Arizona State University
Alexandra Ros
G01 - MEASURING TESTING
Information
Patent Grant
Methods and compositions for micro-electron diffraction
Patent number
11,293,883
Issue date
Apr 5, 2022
Howard Hughes Medical Institute
Tamir Gonen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of detecting an anomaly in a single crystal structure
Patent number
11,099,143
Issue date
Aug 24, 2021
Rolls-Royce PLC
Jacqueline Griffiths
G01 - MEASURING TESTING
Information
Patent Grant
Method for non-destructive testing of a turbomachine part
Patent number
10,996,180
Issue date
May 4, 2021
SAFRAN AIRCRAFT ENGINES
Clément Remacha
G01 - MEASURING TESTING
Information
Patent Grant
Crystal structure analysis system and crystal structure analysis me...
Patent number
10,955,366
Issue date
Mar 23, 2021
Jeol Ltd.
Koji Yonekura
G01 - MEASURING TESTING
Information
Patent Grant
Cryogenic cooling positioning apparatus, methods and applications
Patent number
10,241,015
Issue date
Mar 26, 2019
MITEGEN, LLC
Stephen Hollabaugh
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Grant
Intelligent machines and process for production of monocrystalline...
Patent number
9,134,260
Issue date
Sep 15, 2015
Rubicon Technology, Inc.
Srikanth Kamireddi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Intelligent machines and process for production of monocrystalline...
Patent number
8,934,606
Issue date
Jan 13, 2015
Rubicon Technology, Inc.
Srikanth Kamireddi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Intelligent machines and process for production of monocrystalline...
Patent number
8,259,901
Issue date
Sep 4, 2012
Rubicon Technology, Inc.
Srikanth Kamireddi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Apparatus and method for measuring the orientation of a single crys...
Patent number
5,768,335
Issue date
Jun 16, 1998
Lucent Technologies Inc.
Muhammed Afzal Shahid
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting a crystallographic axis of a sin...
Patent number
5,187,729
Issue date
Feb 16, 1993
Shin-Etsu Handotai Co., Ltd.
Hiroyaki Ibe
G01 - MEASURING TESTING
Information
Patent Grant
Continuous lattice constant measurments and apparatus therefor with...
Patent number
5,046,077
Issue date
Sep 3, 1991
U.S. Philips Corporation
Hiromu Murayama
G01 - MEASURING TESTING
Information
Patent Grant
3855469
Patent number
3,855,469
Issue date
Dec 17, 1974
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SOLVATED CRYSTALLINE POLYNUCLEAR METAL COMPLEX SOLVATED WITH A MIXT...
Publication number
20240300981
Publication date
Sep 12, 2024
Merck Patent GmbH
Clemens Kuehn
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR SORTING OF DIAMONDS
Publication number
20230294136
Publication date
Sep 21, 2023
BOTSWANA INTERNATIONAL UNIVERSITY OF SCIENCE AND TECHNOLOGY
Adamu Murtala ZUNGERU
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
SINGLE PIECE DROPLET GENERATION AND INJECTION DEVICE FOR SERIAL CRY...
Publication number
20230243765
Publication date
Aug 3, 2023
Alexandra Ros
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
Publication number
20230031147
Publication date
Feb 2, 2023
Merck Patent GmbH
Carolina VON ESSEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETERMINING THE THREE-DIMENSIONAL STRUCTURE OF MOLECULES...
Publication number
20220373482
Publication date
Nov 24, 2022
Bruker AXS GmbH
Clemens RICHERT
C30 - CRYSTAL GROWTH
Information
Patent Application
METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE
Publication number
20220317067
Publication date
Oct 6, 2022
FEI Company
Bart BUIJSSE
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS SYSTEM
Publication number
20220128494
Publication date
Apr 28, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR NON-DESTRUCTIVE TESTING OF A TURBOMACHINE PART
Publication number
20200386695
Publication date
Dec 10, 2020
SAFRAN
Clément Remacha
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND COMPOSITIONS FOR MICRO-ELECTRON DIFFRACTION
Publication number
20200158665
Publication date
May 21, 2020
HOWARD HUGHES MEDICAL INSTITUTE
Tamir Gonen
G01 - MEASURING TESTING
Information
Patent Application
Crystal Structure Analysis System and Crystal Structure Analysis Me...
Publication number
20200003710
Publication date
Jan 2, 2020
Riken
Koji Yonekura
G01 - MEASURING TESTING
Information
Patent Application
Intelligent Machines and Process for Production of Monocrystalline...
Publication number
20130028385
Publication date
Jan 31, 2013
RUBICON TECHNOLOGY, INC.
Srikanth KAMIREDDI
C30 - CRYSTAL GROWTH