multiple steps inspection

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CPC
G01N2223/66

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/66multiple steps inspection

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anti-vibration fixturing system for nondestructive testing
- Patent number 11,555,793
- Issue date Jan 17, 2023
- International Business Machines Corporation
- Theron Lee Lewis
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus and method for calculating a recording trajectory
- Patent number 11,016,041
- Issue date May 25, 2021
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Richard Schielein
- G01 - MEASURING TESTING
Information Patent Grant
Method for checking an electronic component
- Patent number 10,571,413
- Issue date Feb 25, 2020
- YXLON International GmbH
- Keith Bryant
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed pipe inspection system
- Patent number 10,502,697
- Issue date Dec 10, 2019
- The Boeing Company
- Gary Ernest Georgeson
- G01 - MEASURING TESTING
Information Patent Grant
Method for studying a zone of an object so as to determine a mass-t...
- Patent number 10,240,918
- Issue date Mar 26, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Eric Robin
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive modular cargo screening
- Patent number 10,228,334
- Issue date Mar 12, 2019
- Smiths Detection Group Limited
- Kristofer J. Roe
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing EDS analysis
- Patent number 9,726,625
- Issue date Aug 8, 2017
- Carl Zeiss Microscopy Ltd.
- Edward Hill
- G01 - MEASURING TESTING
Information Patent Grant
Defect sampling for electron beam review based on defect attributes...
- Patent number 9,535,010
- Issue date Jan 3, 2017
- KLA-Tencor Corp.
- Rohan Gosain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for detecting nitrogenous materials via gamma-res...
- Patent number 8,110,812
- Issue date Feb 7, 2012
- Soreq Nuclear Research Center
- Mark Goldberg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for XRD-based threat detection
- Patent number 7,924,978
- Issue date Apr 12, 2011
- Morpho Detection Inc.
- Geoffrey Harding
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for performing CT image reconstruction with motio...
- Patent number 7,532,702
- Issue date May 12, 2009
- General Electric Company
- Jiang Hsieh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Systems and methods for improving a resolution of an image
- Patent number 7,466,790
- Issue date Dec 16, 2008
- General Electric Company
- Srikanth Suryanarayanan
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ANTI-VIBRATION FIXTURING SYSTEM FOR NONDESTRUCTIVE TESTING
- Publication number 20230039471
- Publication date Feb 9, 2023
- International Business Machines Corporation
- Theron Lee Lewis
- G01 - MEASURING TESTING
Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE...
- Publication number 20220140418
- Publication date May 5, 2022
- Seoul National University R&DB Foundation
- Yung-Eun Sung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR TREATING AND EXAMINING A POWDER BY MEANS OF INSTRUMENTAL...
- Publication number 20220023943
- Publication date Jan 27, 2022
- INDUSTRIEANLAGEN-BETRIEBSGESELLSCHAFT MBH
- Tom Näke
- B22 - CASTING POWDER METALLURGY
Information Patent Application
APPARATUS AND METHOD FOR CALCULATING A RECORDING TRAJECTORY
- Publication number 20190170667
- Publication date Jun 6, 2019
- FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG e.V.
- Richard SCHIELEIN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHECKING AN ELECTRONIC COMPONENT
- Publication number 20180136145
- Publication date May 17, 2018
- YXLON INTERNATIONAL GMBH
- Keith BRYANT
- G01 - MEASURING TESTING
Information Patent Application
METHOD & SYSTEM FOR DETECTING NITROGENOUS MATERIALS VIA GAMMA-RESON...
- Publication number 20100019165
- Publication date Jan 28, 2010
- Mark Goldberg
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR XRD-BASED THREAT DETECTION
- Publication number 20090213989
- Publication date Aug 27, 2009
- Geoffrey Harding
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for improving a resolution of an image
- Publication number 20070206719
- Publication date Sep 6, 2007
- General Electric Company
- Srikanth Suryanarayanan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Method and system for performing CT image reconstruction with motio...
- Publication number 20070116172
- Publication date May 24, 2007
- General Electric Company
- Jiang Hsieh
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

multiple steps inspection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Lateral recess measurement in a semiconductor specimen

Anti-vibration fixturing system for nondestructive testing

X-ray analyzer

Apparatus and method for calculating a recording trajectory

Method for checking an electronic component

High speed pipe inspection system

Method for studying a zone of an object so as to determine a mass-t...

Adaptive modular cargo screening

Method and system for performing EDS analysis

Defect sampling for electron beam review based on defect attributes...

Method and system for detecting nitrogenous materials via gamma-res...

System and method for XRD-based threat detection

Method and system for performing CT image reconstruction with motio...

Systems and methods for improving a resolution of an image

Patents Applicationslast 30 patents

ANTI-VIBRATION FIXTURING SYSTEM FOR NONDESTRUCTIVE TESTING

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE...

METHOD FOR TREATING AND EXAMINING A POWDER BY MEANS OF INSTRUMENTAL...

APPARATUS AND METHOD FOR CALCULATING A RECORDING TRAJECTORY

METHOD FOR CHECKING AN ELECTRONIC COMPONENT

METHOD & SYSTEM FOR DETECTING NITROGENOUS MATERIALS VIA GAMMA-RESON...

SYSTEM AND METHOD FOR XRD-BASED THREAT DETECTION

Systems and methods for improving a resolution of an image

Method and system for performing CT image reconstruction with motio...