Nanoindenters

Industry

CPC
G01Q60/366

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/366Nanoindenters

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Large radius probe
- Patent number 11,953,517
- Issue date Apr 9, 2024
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Modified method to fit cell elastic modulus based on Sneddon model
- Patent number 11,860,187
- Issue date Jan 2, 2024
- Dalian University of Technology
- Wei Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thin free-standing oxide membranes
- Patent number 11,821,081
- Issue date Nov 21, 2023
- The Regents of the University of California
- Yi-Hsien Lu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Nanomechanical profiling of breast cancer molecular subtypes
- Patent number 11,686,720
- Issue date Jun 27, 2023
- Universitat Basel
- Marija Plodinec
- G01 - MEASURING TESTING
Information Patent Grant
Heterodyne scanning probe microscopy method and scanning probe micr...
- Patent number 11,635,448
- Issue date Apr 25, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Sri Ram Shankar Rajadurai
- G01 - MEASURING TESTING
Information Patent Grant
Large radius probe
- Patent number 11,448,664
- Issue date Sep 20, 2022
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
MEMS-based nanoindentation force sensor with electro-thermal tip he...
- Patent number 11,435,378
- Issue date Sep 6, 2022
- Femto Tools AG
- Felix Beyeler
- G01 - MEASURING TESTING
Information Patent Grant
MEMS nanoindenter chip with indenter probe and reference probe
- Patent number 11,307,125
- Issue date Apr 19, 2022
- FemtoTools AG
- David Beyeler
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for testing mechanical properties of ultra-soft...
- Patent number 11,275,007
- Issue date Mar 15, 2022
- The Florida International University Board of Trustees
- Arvind Agarwal
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for two dimensional nanoindentation
- Patent number 10,996,152
- Issue date May 4, 2021
- KLA-Tencor Corporation
- Warren C. Oliver
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Large radius probe
- Patent number 10,802,045
- Issue date Oct 13, 2020
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Grant
Surface measurement probe
- Patent number 10,436,562
- Issue date Oct 8, 2019
- ANTON PAAR TRITEC SA
- Bertrand Bellaton
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for the synchronous determination of the she...
- Patent number 10,151,645
- Issue date Dec 11, 2018
- Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
- Kong Boon Yeap
- G01 - MEASURING TESTING
Information Patent Grant
Measuring head for nanoindentation instrument and measuring method
- Patent number 9,970,851
- Issue date May 15, 2018
- ANTON PAAR TRITEC SA
- Bertrand Bellaton
- G01 - MEASURING TESTING
Information Patent Grant
Instrument changing assembly and methods
- Patent number 9,902,027
- Issue date Feb 27, 2018
- Hysitron, Inc.
- Rajiv Dama
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Analysis of ex vivo cells for disease state detection and therapeut...
- Patent number 9,678,105
- Issue date Jun 13, 2017
- The Regents of the University of California
- James K. Gimzewski
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter multimodal microscope objective for mechanobiology
- Patent number 9,588,327
- Issue date Mar 7, 2017
- The Board of Trustees of the University of Illinois
- Kimani Toussaint
- G02 - OPTICS
Information Patent Grant
Interface of a microfabricated scanning force sensor for combined f...
- Patent number 9,535,086
- Issue date Jan 3, 2017
- FemtoTools AG
- Felix Beyeler
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Probe tip heating assembly
- Patent number 9,476,816
- Issue date Oct 25, 2016
- Hysitron, Inc.
- Roger William Schmitz
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical transducer and test system
- Patent number 9,404,841
- Issue date Aug 2, 2016
- Hysitron, Inc.
- Yunje Oh
- G01 - MEASURING TESTING
Information Patent Grant
Method for eliminating horizontal offset of traction testing device...
- Patent number 9,377,393
- Issue date Jun 28, 2016
- Weixiong Bin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of measuring an interaction force
- Patent number 9,335,240
- Issue date May 10, 2016
- Hysitron Incorporated
- Yunje Oh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Micromachined comb drive for quantitative nanoindentation
- Patent number 9,304,072
- Issue date Apr 5, 2016
- Hysitron Incorporated
- Yunje Oh
- G01 - MEASURING TESTING
Information Patent Grant
Mechanical testing instruments including onboard data
- Patent number 9,194,727
- Issue date Nov 24, 2015
- Hysitron, Inc.
- Christopher David Young
- B82 - NANO-TECHNOLOGY
Information Patent Grant
2-D MEMS tribometer with comb drives
- Patent number 9,157,845
- Issue date Oct 13, 2015
- Hysitron Incorporated
- Yunje Oh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanoindenter
- Patent number 9,063,042
- Issue date Jun 23, 2015
- Oxford Instruments PLC
- Flavio Alejandro Bonilla
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for nanomechanical measurement using an atomic...
- Patent number 8,973,161
- Issue date Mar 3, 2015
- Rutgers, The State University of New Jersey
- Qingze Zou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanomechanical testing system
- Patent number 8,959,980
- Issue date Feb 24, 2015
- Hysitron, Inc.
- David James Vodnick
- G01 - MEASURING TESTING
Information Patent Grant
Nanomechanical testing system
- Patent number 8,770,036
- Issue date Jul 8, 2014
- Hysitron, Inc.
- David James Vodnick
- G01 - MEASURING TESTING
Information Patent Grant
Method for staging cancer progression by AFM
- Patent number 8,756,711
- Issue date Jun 17, 2014
- Universitat Basel
- Marija Plodinec
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES
- Publication number 20230358724
- Publication date Nov 9, 2023
- UNIVERSITAT BASEL
- Marija PLODINEC
- G01 - MEASURING TESTING
Information Patent Application
Large Radius Probe
- Publication number 20230021148
- Publication date Jan 19, 2023
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS OF PRODUCING SINGLE PHOTON EMITTERS ON SUBSTRATES, AND DEVI...
- Publication number 20220406962
- Publication date Dec 22, 2022
- Purdue Research Foundation
- Xiaohui Xu
- G01 - MEASURING TESTING
Information Patent Application
Large Radius Probe
- Publication number 20210132110
- Publication date May 6, 2021
- Bruker Nano, Inc.
- Jeffrey Wong
- G01 - MEASURING TESTING
Information Patent Application
MEMS-BASED NANOINDENTATION FORCE SENSOR WITH ELECTRO-THERMAL TIP HE...
- Publication number 20200249254
- Publication date Aug 6, 2020
- FEMTO TOOLS AG
- FELIX BEYELER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PREDICTING CANCER PROGRESSION BY NANOMECHANICAL PROFILING
- Publication number 20170299570
- Publication date Oct 19, 2017
- UNIVERSITAT BASEL
- Marko LOPARIC
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE FIXING MEMBER FOR NANO INDENTER
- Publication number 20150064439
- Publication date Mar 5, 2015
- NITTO DENKO CORPORATION
- Youhei Maeno
- B82 - NANO-TECHNOLOGY
Information Patent Application
PROBE TIP HEATING ASSEMBLY
- Publication number 20140326707
- Publication date Nov 6, 2014
- Roger William Schmitz
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED NANO WEAR TESTING APPARATUS
- Publication number 20140298897
- Publication date Oct 9, 2014
- Nanovea, Inc.
- Pierre Leroux
- G01 - MEASURING TESTING
Information Patent Application
NANOMECHANICAL TESTING SYSTEM
- Publication number 20140293293
- Publication date Oct 2, 2014
- HYSITRON, INC.
- David James Vodnick
- G01 - MEASURING TESTING
Information Patent Application
THREE DIMENSIONAL TRANSDUCER
- Publication number 20140150562
- Publication date Jun 5, 2014
- HYSITRON, INC.
- Oden Lee Warren
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...
- Publication number 20140123347
- Publication date May 1, 2014
- The Regents of the University of California
- James K. Gimzewski
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR ELIMINATING HORIZONTAL OFFSET OF TRACTION TESTING DEVICE...
- Publication number 20140007648
- Publication date Jan 9, 2014
- Weixiong Bin
- Weixiong Bin
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR STAGING CANCER PROGRESSION BY AFM
- Publication number 20140007309
- Publication date Jan 2, 2014
- UNIVERSITAT BASEL
- Marija Plodinec
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus for Nanomechanical Measurement Using an Atomic...
- Publication number 20130347147
- Publication date Dec 26, 2013
- Qingze Zou
- B82 - NANO-TECHNOLOGY
Information Patent Application
MECHANICAL TESTING INSTRUMENTS INCLUDING ONBOARD DATA
- Publication number 20130332100
- Publication date Dec 12, 2013
- Christopher David Young
- B82 - NANO-TECHNOLOGY
Information Patent Application
NANOMECHANICAL TESTING SYSTEM
- Publication number 20130319127
- Publication date Dec 5, 2013
- HYSITRON, INC.
- David James Vodnick
- G01 - MEASURING TESTING
Information Patent Application
NANOMECHANICAL TESTING SYSTEM
- Publication number 20130319071
- Publication date Dec 5, 2013
- HYSITRON, INC.
- David James Vodnick
- G01 - MEASURING TESTING
Information Patent Application
NANOMECHANICAL BIOMARKERS FOR DISEASE THERAPY
- Publication number 20130266665
- Publication date Oct 10, 2013
- Oliver DORIG
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL TRANSDUCER AND TEST SYSTEM
- Publication number 20130098144
- Publication date Apr 25, 2013
- HYSITRON INCORPORATED
- Yunje Oh
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING AN INTERACTION FORCE
- Publication number 20130098145
- Publication date Apr 25, 2013
- HYSITRON INCORPORATED
- Yunje Oh
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanoindenter
- Publication number 20120272411
- Publication date Oct 25, 2012
- ASYLUM RESEARCH CORPORATION
- Flavio Alejandro Bonilla
- G01 - MEASURING TESTING
Information Patent Application
MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION
- Publication number 20120266666
- Publication date Oct 25, 2012
- Hysitron Incorporated
- Yunje Oh
- G01 - MEASURING TESTING
Information Patent Application
2-D MEMS TRIBOMETER WITH COMB DRIVES
- Publication number 20110265559
- Publication date Nov 3, 2011
- Hysitron Incorporated
- Yunje Oh
- G01 - MEASURING TESTING
Information Patent Application
INDENTER ASSEMBLY
- Publication number 20110252874
- Publication date Oct 20, 2011
- HYSITRON, INC.
- Justin D. Patten
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...
- Publication number 20110070604
- Publication date Mar 24, 2011
- The Regents of the University of California
- James K. Gimzewski
- G01 - MEASURING TESTING
Information Patent Application
ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION C...
- Publication number 20110005306
- Publication date Jan 13, 2011
- Hysitron Incorporated
- Oden L. Warren
- G01 - MEASURING TESTING
Information Patent Application
NANOINDENTER TIP FOR UNIAXIAL TENSION AND COMPRESSION TESTING
- Publication number 20100281963
- Publication date Nov 11, 2010
- California Institute of Technology
- Julia R. Greer
- G01 - MEASURING TESTING
Information Patent Application
Coupled Mass-Spring Systems and Imaging Methods for Scanning Probe...
- Publication number 20100257644
- Publication date Oct 7, 2010
- Kimberly L. Turner
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope with Independent Force Control and Displa...
- Publication number 20100192267
- Publication date Jul 29, 2010
- Warren C. Oliver
- G01 - MEASURING TESTING

Nanoindenters

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Large radius probe

Modified method to fit cell elastic modulus based on Sneddon model

Thin free-standing oxide membranes

Nanomechanical profiling of breast cancer molecular subtypes

Heterodyne scanning probe microscopy method and scanning probe micr...

Large radius probe

MEMS-based nanoindentation force sensor with electro-thermal tip he...

MEMS nanoindenter chip with indenter probe and reference probe

Systems and methods for testing mechanical properties of ultra-soft...

Apparatus and method for two dimensional nanoindentation

Large radius probe

Surface measurement probe

Arrangement and method for the synchronous determination of the she...

Measuring head for nanoindentation instrument and measuring method

Instrument changing assembly and methods

Analysis of ex vivo cells for disease state detection and therapeut...

Nanoindenter multimodal microscope objective for mechanobiology

Interface of a microfabricated scanning force sensor for combined f...

Probe tip heating assembly

Microelectromechanical transducer and test system

Method for eliminating horizontal offset of traction testing device...

Method of measuring an interaction force

Micromachined comb drive for quantitative nanoindentation

Mechanical testing instruments including onboard data

2-D MEMS tribometer with comb drives

Nanoindenter

Method and apparatus for nanomechanical measurement using an atomic...

Nanomechanical testing system

Nanomechanical testing system

Method for staging cancer progression by AFM

Patents Applicationslast 30 patents

NANOMECHANICAL PROFILING OF BREAST CANCER MOLECULAR SUBTYPES

Large Radius Probe

METHODS OF PRODUCING SINGLE PHOTON EMITTERS ON SUBSTRATES, AND DEVI...

Large Radius Probe

MEMS-BASED NANOINDENTATION FORCE SENSOR WITH ELECTRO-THERMAL TIP HE...

METHOD FOR PREDICTING CANCER PROGRESSION BY NANOMECHANICAL PROFILING

SAMPLE FIXING MEMBER FOR NANO INDENTER

PROBE TIP HEATING ASSEMBLY

HIGH SPEED NANO WEAR TESTING APPARATUS

NANOMECHANICAL TESTING SYSTEM

THREE DIMENSIONAL TRANSDUCER

ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...

METHOD FOR ELIMINATING HORIZONTAL OFFSET OF TRACTION TESTING DEVICE...

METHOD FOR STAGING CANCER PROGRESSION BY AFM

Method and Apparatus for Nanomechanical Measurement Using an Atomic...

MECHANICAL TESTING INSTRUMENTS INCLUDING ONBOARD DATA

NANOMECHANICAL TESTING SYSTEM

NANOMECHANICAL TESTING SYSTEM

NANOMECHANICAL BIOMARKERS FOR DISEASE THERAPY

MICROELECTROMECHANICAL TRANSDUCER AND TEST SYSTEM

METHOD OF MEASURING AN INTERACTION FORCE

Nanoindenter

MICROMACHINED COMB DRIVE FOR QUANTITATIVE NANOINDENTATION

2-D MEMS TRIBOMETER WITH COMB DRIVES

INDENTER ASSEMBLY

ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...

ACTUATABLE CAPACITIVE TRANSDUCER FOR QUANTITATIVE NANOINDENTATION C...

NANOINDENTER TIP FOR UNIAXIAL TENSION AND COMPRESSION TESTING

Coupled Mass-Spring Systems and Imaging Methods for Scanning Probe...

Scanning Probe Microscope with Independent Force Control and Displa...