Near-field probe

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CPC
Y10S977/862

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/862Near-field probe

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Methods of manufacturing semiconductor structures and devices inclu...
- Patent number 8,993,448
- Issue date Mar 31, 2015
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tip-enhanced resonant apertures
- Patent number 8,196,217
- Issue date Jun 5, 2012
- The Board of Trustees of the Leland Stanford Junior University
- Yao-Te Cheng
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of manufacturing nanotubes having controlled characteristics
- Patent number 7,989,349
- Issue date Aug 2, 2011
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanolithography methods and products therefor and produced thereby
- Patent number 7,744,963
- Issue date Jun 29, 2010
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Nanolithography methods and products therefor and produced thereby
- Patent number 7,722,928
- Issue date May 25, 2010
- Northwestern University
- Chad A. Mirkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Probe used for surface enhanced vibrational spectroscopic analysis...
- Patent number 7,707,647
- Issue date Apr 27, 2010
- Canon Kabushiki Kaisha
- Kaoru Konakahara
- G01 - MEASURING TESTING
Information Patent Grant
Optical waveguide
- Patent number 7,702,195
- Issue date Apr 20, 2010
- Gifu Univeristy
- Kazuo Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Near-field scanning optical microscope probe having a light emittin...
- Patent number 7,621,964
- Issue date Nov 24, 2009
- The Board of Regents, University of Texas System
- Kazunori Hoshino
- G01 - MEASURING TESTING
Information Patent Grant
Mirror optic for near-field optical measurements
- Patent number 7,591,858
- Issue date Sep 22, 2009
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften E.V.
- Fritz Keilmann
- G01 - MEASURING TESTING
Information Patent Grant
Probe microscope system suitable for observing sample of long body
- Patent number 7,507,957
- Issue date Mar 24, 2009
- SII NanoTechnology Inc.
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a probe having a field effect transistor chan...
- Patent number 7,402,736
- Issue date Jul 22, 2008
- Postech Foundation
- Wonkyu Moon
- G11 - INFORMATION STORAGE
Information Patent Grant
Near field scanning microscope probe and method for fabricating same
- Patent number 7,372,013
- Issue date May 13, 2008
- California Institute of Technology
- Tom Baehr-Jones
- G01 - MEASURING TESTING
Information Patent Grant
Recording apparatus
- Patent number 7,301,888
- Issue date Nov 27, 2007
- Seiko Instruments Inc.
- Nobuyuki Kasama
- G11 - INFORMATION STORAGE
Information Patent Grant
Probe, near-field light generation apparatus including probe, expos...
- Patent number 7,297,933
- Issue date Nov 20, 2007
- Canon Kabushiki Kaisha
- Tomohiro Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Plasmon enhanced near-field optical probes
- Patent number 7,250,598
- Issue date Jul 31, 2007
- Russell E. Hollingsworth
- G01 - MEASURING TESTING
Information Patent Grant
Probe for near-field microscope, the method for manufacturing the p...
- Patent number 7,241,987
- Issue date Jul 10, 2007
- Riken
- Yuika Saito
- G01 - MEASURING TESTING
Information Patent Grant
Recording apparatus
- Patent number 7,042,829
- Issue date May 9, 2006
- Seiko Instruments Inc.
- Nobuyuki Kasama
- G11 - INFORMATION STORAGE
Information Patent Grant
Near-field optical probe
- Patent number 7,015,455
- Issue date Mar 21, 2006
- Seiko Instruments Inc.
- Yasuyuki Mitsuoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Nanotube, near-field light detecting apparatus and near-field light...
- Patent number 6,995,367
- Issue date Feb 7, 2006
- NEC Corporation
- Yoshiyuki Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scanning apertureless fluorescence microscope
- Patent number 6,953,927
- Issue date Oct 11, 2005
- California Institute of Technology
- Stephen R. Quake
- G01 - MEASURING TESTING
Information Patent Grant
Recording apparatus
- Patent number 6,914,873
- Issue date Jul 5, 2005
- Seiko Instruments Inc.
- Nobuyuki Kasama
- G11 - INFORMATION STORAGE
Information Patent Grant
Near-field optical probe
- Patent number 6,881,947
- Issue date Apr 19, 2005
- Seiko Instruments Inc.
- Yasuyuki Mitsuoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Fiber, probe and optical head of multiple optical path array type a...
- Patent number 6,813,402
- Issue date Nov 2, 2004
- Jasco Corporation
- Yoshihito Narita
- G01 - MEASURING TESTING
Information Patent Grant
Recording apparatus
- Patent number 6,754,163
- Issue date Jun 22, 2004
- Nobuyuki Kasama
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical waveguide probe and manufacturing method of the same, and s...
- Patent number 6,744,030
- Issue date Jun 1, 2004
- Seiko Instruments Inc.
- Yasuyuki Mitsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Near-field microscope
- Patent number 6,710,331
- Issue date Mar 23, 2004
- Jasco Corporation
- Yoshihito Narita
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the distance of a near-field probe from a sp...
- Patent number 6,703,614
- Issue date Mar 9, 2004
- Carl Zeiss Jena GmbH
- Thomas Stifter
- G01 - MEASURING TESTING
Information Patent Grant
Near-field optical head and head support assembly having near-field...
- Patent number 6,625,109
- Issue date Sep 23, 2003
- Seiko Instruments Inc.
- Yasuyuki Mitsuoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Near-field optical recording apparatus assistively heating recordin...
- Patent number 6,584,062
- Issue date Jun 24, 2003
- Fuji Photo Film Co., Ltd.
- Masayuki Naya
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHODS OF MANUFACTURING SEMICONDUCTOR STRUCTURES AND DEVICES INCLU...
- Publication number 20140080303
- Publication date Mar 20, 2014
- Micron Technology, Inc.
- Gurtej S. Sandhu
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS OF MANUFACTURING SEMICONDUCTOR STRUCTURES AND DEVICES INCLU...
- Publication number 20110266694
- Publication date Nov 3, 2011
- Micron Technology, Inc.
- Gurtej S. Sandhu
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Tip-enhanced resonant apertures
- Publication number 20110055984
- Publication date Mar 3, 2011
- Yao-Te Cheng
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL WAVEGUIDE
- Publication number 20090202190
- Publication date Aug 13, 2009
- GIFU UNIVERSITY
- Kazuo Tanaka
- G02 - OPTICS
Information Patent Application
PROBE USED FOR SURFACE ENHANCED VIBRATIONAL SPECTROSCOPIC ANALYSIS...
- Publication number 20080286563
- Publication date Nov 20, 2008
- Canon Kabushiki Kaisha
- Kaoru Konakahara
- G01 - MEASURING TESTING
Information Patent Application
NANOLITHOGRAPHY METHODS AND PRODUCTS THEREFOR AND PRODUCED THEREBY
- Publication number 20080113099
- Publication date May 15, 2008
- Northwestern University
- Chad Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Near-Field Scanning Optical Microscope Probe Having a Light Emittin...
- Publication number 20080054168
- Publication date Mar 6, 2008
- Kazunori Hoshino
- G01 - MEASURING TESTING
Information Patent Application
Mirror optic for near-field optical measurements
- Publication number 20070183060
- Publication date Aug 9, 2007
- Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
- Fritz Keilmann
- G01 - MEASURING TESTING
Information Patent Application
Nanotubes having controlled characteristics and methods of manufact...
- Publication number 20060233694
- Publication date Oct 19, 2006
- Gurtej S. Sandhu
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Probe of scanning probe microscope having a field effect transistor...
- Publication number 20060230475
- Publication date Oct 12, 2006
- POSTECH FOUNDATION
- Wonkyu Moon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Recording apparatus
- Publication number 20060120228
- Publication date Jun 8, 2006
- Nobuyuki Kasama
- G11 - INFORMATION STORAGE
Information Patent Application
Probe microscope system suitable for observing sample of long body
- Publication number 20060060778
- Publication date Mar 23, 2006
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Application
Probe for near-field microscope, the method for manufacturing the p...
- Publication number 20060043276
- Publication date Mar 2, 2006
- Yuika Saito
- G01 - MEASURING TESTING
Information Patent Application
Near field scanning microscope probe and method for fabricating same
- Publication number 20050263686
- Publication date Dec 1, 2005
- Tom Baehr-Jones
- G01 - MEASURING TESTING
Information Patent Application
Nanolithography methods and products therefor and produced thereby
- Publication number 20050191434
- Publication date Sep 1, 2005
- Northwestern University
- Chad A. Mirkin
- G01 - MEASURING TESTING
Information Patent Application
Near-field optical probe
- Publication number 20050167576
- Publication date Aug 4, 2005
- Yasuyuki Mitsuoka
- G01 - MEASURING TESTING
Information Patent Application
Plasmon enhanced near-field optical probes
- Publication number 20050161594
- Publication date Jul 28, 2005
- Russell E. Hollingsworth
- G01 - MEASURING TESTING
Information Patent Application
Recording apparatus
- Publication number 20050105453
- Publication date May 19, 2005
- Seiko Instruments Inc.
- Nobuyuki Kasama
- G11 - INFORMATION STORAGE
Information Patent Application
Method and system for scanning apertureless fluorescence microscope
- Publication number 20040089816
- Publication date May 13, 2004
- California Institute of Technology
- Stephen R. Quake
- G02 - OPTICS
Information Patent Application
Recording apparatus
- Publication number 20040057370
- Publication date Mar 25, 2004
- Seiko Instruments Inc.
- Nobuyuki Kasama
- G11 - INFORMATION STORAGE
Information Patent Application
Probe, near-field light generation apparatus including probe, expos...
- Publication number 20030230709
- Publication date Dec 18, 2003
- Canon Kabushiki Kaisha
- Tomohiro Yamada
- G01 - MEASURING TESTING
Information Patent Application
Nanotube, near-field light detecting apparatus and near-field light...
- Publication number 20030197120
- Publication date Oct 23, 2003
- NEC Corporation
- Yoshiyuki Miyamoto
- G01 - MEASURING TESTING
Information Patent Application
Near-field optical probe
- Publication number 20030141444
- Publication date Jul 31, 2003
- Seiko Instruments Inc.
- Yasuyuki Mitsuoka
- G01 - MEASURING TESTING
Information Patent Application
Recording apparatus
- Publication number 20020181344
- Publication date Dec 5, 2002
- Seiko Instruments Inc.
- Nobuyuki Kasama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fiber, probe and optical head of multiple optical path array type a...
- Publication number 20020126937
- Publication date Sep 12, 2002
- JASCO CORPORATION
- Yoshihito Narita
- B82 - NANO-TECHNOLOGY
Information Patent Application
Nanolithography methods and products therefor and produced thereby
- Publication number 20020122873
- Publication date Sep 5, 2002
- Chad A. Mirkin
- B82 - NANO-TECHNOLOGY
Information Patent Application
Optical fiber probe and cantilever with microscopic aperture, and m...
- Publication number 20020076184
- Publication date Jun 20, 2002
- Masoto Iyoki
- B82 - NANO-TECHNOLOGY
Information Patent Application
Near-field microscope
- Publication number 20020056807
- Publication date May 16, 2002
- JASCO CORPORATION
- Yoshihito Narita
- B82 - NANO-TECHNOLOGY
Information Patent Application
Recording medium and recording device
- Publication number 20010040864
- Publication date Nov 15, 2001
- Hitachi, Ltd.
- Sumio Hosaka
- B82 - NANO-TECHNOLOGY

Near-field probe

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Methods of manufacturing semiconductor structures and devices inclu...

Tip-enhanced resonant apertures

Methods of manufacturing nanotubes having controlled characteristics

Nanolithography methods and products therefor and produced thereby

Nanolithography methods and products therefor and produced thereby

Probe used for surface enhanced vibrational spectroscopic analysis...

Optical waveguide

Near-field scanning optical microscope probe having a light emittin...

Mirror optic for near-field optical measurements

Probe microscope system suitable for observing sample of long body

Scanning probe characterization of surfaces

Method of fabricating a probe having a field effect transistor chan...

Near field scanning microscope probe and method for fabricating same

Recording apparatus

Probe, near-field light generation apparatus including probe, expos...

Plasmon enhanced near-field optical probes

Probe for near-field microscope, the method for manufacturing the p...

Recording apparatus

Near-field optical probe

Nanotube, near-field light detecting apparatus and near-field light...

Method and system for scanning apertureless fluorescence microscope

Recording apparatus

Near-field optical probe

Fiber, probe and optical head of multiple optical path array type a...

Recording apparatus

Optical waveguide probe and manufacturing method of the same, and s...

Near-field microscope

Method for determining the distance of a near-field probe from a sp...

Near-field optical head and head support assembly having near-field...

Near-field optical recording apparatus assistively heating recordin...

Patents Applicationslast 30 patents

METHODS OF MANUFACTURING SEMICONDUCTOR STRUCTURES AND DEVICES INCLU...

METHODS OF MANUFACTURING SEMICONDUCTOR STRUCTURES AND DEVICES INCLU...

Tip-enhanced resonant apertures

OPTICAL WAVEGUIDE

PROBE USED FOR SURFACE ENHANCED VIBRATIONAL SPECTROSCOPIC ANALYSIS...

NANOLITHOGRAPHY METHODS AND PRODUCTS THEREFOR AND PRODUCED THEREBY

Near-Field Scanning Optical Microscope Probe Having a Light Emittin...

Mirror optic for near-field optical measurements

Nanotubes having controlled characteristics and methods of manufact...

Probe of scanning probe microscope having a field effect transistor...

Scanning probe characterization of surfaces

Recording apparatus

Probe microscope system suitable for observing sample of long body

Probe for near-field microscope, the method for manufacturing the p...

Near field scanning microscope probe and method for fabricating same

Nanolithography methods and products therefor and produced thereby

Near-field optical probe

Plasmon enhanced near-field optical probes

Recording apparatus

Method and system for scanning apertureless fluorescence microscope

Recording apparatus

Probe, near-field light generation apparatus including probe, expos...

Nanotube, near-field light detecting apparatus and near-field light...

Near-field optical probe

Recording apparatus

Fiber, probe and optical head of multiple optical path array type a...

Nanolithography methods and products therefor and produced thereby

Optical fiber probe and cantilever with microscopic aperture, and m...

Near-field microscope

Recording medium and recording device