Non-scanning techniques

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H01J2237/262

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

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H01J2237/262Non-scanning techniques

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Patents Grantslast 30 patents

Information Patent Grant
Grid structure
- Patent number 11,830,702
- Issue date Nov 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Wei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated tomography field ion microscope
- Patent number 11,791,129
- Issue date Oct 17, 2023
- Centre National de la Recherche Scientifique
- François Vurpillot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
- Patent number 11,688,581
- Issue date Jun 27, 2023
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing a sample for transmission electron microscopy
- Patent number 11,437,217
- Issue date Sep 6, 2022
- Imec VZW
- Eric Vancoille
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corrector transfer optics for Lorentz EM
- Patent number 10,825,644
- Issue date Nov 3, 2020
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and control method thereof
- Patent number 10,784,074
- Issue date Sep 22, 2020
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,741,358
- Issue date Aug 11, 2020
- Jeol Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen preparation and inspection in a dual-beam charged particle...
- Patent number 10,629,409
- Issue date Apr 21, 2020
- FEI Company
- Frantisek Vaske
- G01 - MEASURING TESTING
Information Patent Grant
Wide field-of-view atom probe
- Patent number 10,615,001
- Issue date Apr 7, 2020
- Cameca Instruments, Inc.
- Joseph Hale Bunton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporal compressive sensing systems
- Patent number 10,571,675
- Issue date Feb 25, 2020
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan Reed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ion source and electron source having single-atom termination struc...
- Patent number 10,529,531
- Issue date Jan 7, 2020
- Hitachi High-Tech Science Corporation
- Chuhei Oshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam generation for transmission electron microscope
- Patent number 10,529,536
- Issue date Jan 7, 2020
- Technische Universiteit Eindhoven
- Otger Jan Luiten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and phase plate
- Patent number 10,504,695
- Issue date Dec 10, 2019
- Hitachi High-Technologies Corporation
- Arthur Malcolm Blackburn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Double-tilt in-situ nanoindentation platform for transmission elect...
- Patent number 10,410,822
- Issue date Sep 10, 2019
- Beijing University of Technology
- Xiaodong Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for measuring magnetic fields produced within m...
- Patent number 10,373,801
- Issue date Aug 6, 2019
- Board of Regents, The University of Texas System
- Arturo Ponce-Pedraza
- G01 - MEASURING TESTING
Information Patent Grant
Loading station for transferring frozen samples at low temperatures
- Patent number 10,217,603
- Issue date Feb 26, 2019
- Leica Mikrosysteme GmbH
- Reinhard Lihl
- G01 - MEASURING TESTING
Information Patent Grant
Double-tilt sample holder for transmission electron microscope
- Patent number 10,103,000
- Issue date Oct 16, 2018
- Beijing University of Technology
- Xiaodong Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporal compressive sensing systems
- Patent number 10,018,824
- Issue date Jul 10, 2018
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Grant
Method and device for time-resolved pump-probe electron microscopy
- Patent number 9,978,559
- Issue date May 22, 2018
- Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
- Nahid Talebi Sarvari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential imaging with pattern recognition for process automatio...
- Patent number 9,881,766
- Issue date Jan 30, 2018
- FEI Company
- Alexander Buxbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporal compressive sensing systems
- Patent number 9,841,592
- Issue date Dec 12, 2017
- INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Grant
Method of using an environmental transmission electron microscope
- Patent number 9,570,270
- Issue date Feb 14, 2017
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for electron microscope with multiple cathodes
- Patent number 9,464,998
- Issue date Oct 11, 2016
- California Institute of Technology
- Ahmed H. Zewail
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for electron emission and device including such a...
- Patent number 9,263,229
- Issue date Feb 16, 2016
- Centre National de la Recherche Scientifique (Cnrs)
- Arnaud Arbouet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,236,225
- Issue date Jan 12, 2016
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle sources and methods for manufacturing the same
- Patent number 9,023,226
- Issue date May 5, 2015
- 38th Research Institute, China Electronics Technology Group Corporation
- Huarong Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,012,867
- Issue date Apr 21, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for axial alignment of charged particle beam and charged par...
- Patent number 8,907,298
- Issue date Dec 9, 2014
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for axial alignment of charged particle beam and charged par...
- Patent number 8,847,172
- Issue date Sep 30, 2014
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra high precision measurement tool
- Patent number 8,785,849
- Issue date Jul 22, 2014
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnick mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GRID STRUCTURE
- Publication number 20230059669
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Wei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR
- Publication number 20220254601
- Publication date Aug 11, 2022
- Centre National de la Recherche Scientifique
- Angela VELLA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE
- Publication number 20220139666
- Publication date May 5, 2022
- Centre National de la Recherche Scientifique
- François VURPILLOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Preparing a Sample for Transmission Electron Microscopy
- Publication number 20210391144
- Publication date Dec 16, 2021
- IMEC vzw
- Eric Vancoille
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE
- Publication number 20210313141
- Publication date Oct 7, 2021
- GATAN, INC.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20200013582
- Publication date Jan 9, 2020
- JEOL Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20190204579
- Publication date Jul 4, 2019
- Integrated Dynamic Electron Solutions, Inc.
- Bryan Reed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECIMEN PREPARATION AND INSPECTION IN A DUAL-BEAM CHARGED PARTICLE...
- Publication number 20190108971
- Publication date Apr 11, 2019
- FEI Company
- Frantisek Vaske
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND PHASE PLATE
- Publication number 20180330916
- Publication date Nov 15, 2018
- Hitachi High-Technologies Corporation
- Arthur Malcolm BLACKBURN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Generation for Transmission Electron Microscope
- Publication number 20180301317
- Publication date Oct 18, 2018
- Otger Jan Luiten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20180136449
- Publication date May 17, 2018
- Integrated Dynamic Electron Solutions, Inc.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Application
WIDE FIELD-OF-VIEW ATOM PROBE
- Publication number 20180130636
- Publication date May 10, 2018
- Cameca Instruments, Inc.
- Joseph Hale BUNTON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A DOUBLE-TILT IN-SITU NANOINDENTATION PLATFORM FOR TRANSMISSION ELE...
- Publication number 20180053625
- Publication date Feb 22, 2018
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- G01 - MEASURING TESTING
Information Patent Application
Systems And Methods For Measuring Magnetic Fields Produced Within A...
- Publication number 20170309447
- Publication date Oct 26, 2017
- Board of Regents, The University of Texas System
- Arturo Ponce-Pedraza
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE-TILT SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20170301510
- Publication date Oct 19, 2017
- BEIJING UNIVERSITY OF TECHNOLOGY
- XIAODONG HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR TIME-RESOLVED PUMP-PROBE ELECTRON MICROSCOPY
- Publication number 20170271123
- Publication date Sep 21, 2017
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Nahid TALEBI SARVARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOADING STATION FOR TRANSFERRING FROZEN SAMPLES AT LOW TEMPERATURES
- Publication number 20170213694
- Publication date Jul 27, 2017
- Leica Mikrosysteme GmbH
- Reinhard LIHL
- G02 - OPTICS
Information Patent Application
TEMPORAL COMPRESSIVE SENSING SYSTEMS
- Publication number 20170146787
- Publication date May 25, 2017
- Integrated Dynamic Electron Solutions, Inc.
- Bryan W. Reed
- G02 - OPTICS
Information Patent Application
Control Device, Control Method, and Analysis System
- Publication number 20160313905
- Publication date Oct 27, 2016
- JEOL Ltd.
- Kazuhiro Tachibana
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIFFERENTIAL IMAGING WITH PATTERN RECOGNITION FOR PROCESS AUTOMATIO...
- Publication number 20160211113
- Publication date Jul 21, 2016
- FEI Company
- Alexander Buxbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF USING AN ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20150041647
- Publication date Feb 12, 2015
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR AXIAL ALIGNMENT OF CHARGED PARTICLE BEAM AND CHARGED PAR...
- Publication number 20140367585
- Publication date Dec 18, 2014
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20140306121
- Publication date Oct 16, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
INCOHERENT TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20140284475
- Publication date Sep 25, 2014
- MOCHII, INC. (D/B/A VOXA)
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME
- Publication number 20140077684
- Publication date Mar 20, 2014
- 38th Research Institute, China Electronics Technology Group Corporation
- Huarong Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
INCOHERENT TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20130146764
- Publication date Jun 13, 2013
- MOCHII, INC. (D/B/A VOXA)
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY
- Publication number 20130043387
- Publication date Feb 21, 2013
- MOCHII, INC. (D/B/A VOXA)
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of protecting a radiation detector in a charged particle ins...
- Publication number 20120256085
- Publication date Oct 11, 2012
- FEI Company
- Maximus Theodorus Otten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120141693
- Publication date Jun 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
HOLDER FOR AN ELECTRON MICROSCOPY SAMPLE CARRIER
- Publication number 20120132828
- Publication date May 31, 2012
- Leica Microsystems (Schweiz) AG
- Leander GÄCHTER
- H01 - BASIC ELECTRIC ELEMENTS

Non-scanning techniques

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Grid structure

Automated tomography field ion microscope

Apparatus for transmission electron microscopy cathodoluminescence

Method for preparing a sample for transmission electron microscopy

Corrector transfer optics for Lorentz EM

Charged particle beam apparatus and control method thereof

Electron microscope

Specimen preparation and inspection in a dual-beam charged particle...

Wide field-of-view atom probe

Temporal compressive sensing systems

Ion source and electron source having single-atom termination struc...

Electron beam generation for transmission electron microscope

Charged particle beam device and phase plate

Double-tilt in-situ nanoindentation platform for transmission elect...

Systems and methods for measuring magnetic fields produced within m...

Loading station for transferring frozen samples at low temperatures

Double-tilt sample holder for transmission electron microscope

Temporal compressive sensing systems

Method and device for time-resolved pump-probe electron microscopy

Differential imaging with pattern recognition for process automatio...

Temporal compressive sensing systems

Method of using an environmental transmission electron microscope

Method and system for electron microscope with multiple cathodes

Device and method for electron emission and device including such a...

Ion sources, systems and methods

Particle sources and methods for manufacturing the same

Ion sources, systems and methods

Method for axial alignment of charged particle beam and charged par...

Method for axial alignment of charged particle beam and charged par...

Ultra high precision measurement tool

Patents Applicationslast 30 patents

GRID STRUCTURE

TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR

AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE

Method for Preparing a Sample for Transmission Electron Microscopy

APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE

Electron Microscope

TEMPORAL COMPRESSIVE SENSING SYSTEMS

SPECIMEN PREPARATION AND INSPECTION IN A DUAL-BEAM CHARGED PARTICLE...

CHARGED PARTICLE BEAM DEVICE AND PHASE PLATE

Electron Beam Generation for Transmission Electron Microscope

TEMPORAL COMPRESSIVE SENSING SYSTEMS

WIDE FIELD-OF-VIEW ATOM PROBE

A DOUBLE-TILT IN-SITU NANOINDENTATION PLATFORM FOR TRANSMISSION ELE...

Systems And Methods For Measuring Magnetic Fields Produced Within A...

DOUBLE-TILT SAMPLE HOLDER FOR TRANSMISSION ELECTRON MICROSCOPE

METHOD AND DEVICE FOR TIME-RESOLVED PUMP-PROBE ELECTRON MICROSCOPY

LOADING STATION FOR TRANSFERRING FROZEN SAMPLES AT LOW TEMPERATURES

TEMPORAL COMPRESSIVE SENSING SYSTEMS

Control Device, Control Method, and Analysis System

DIFFERENTIAL IMAGING WITH PATTERN RECOGNITION FOR PROCESS AUTOMATIO...

METHOD OF USING AN ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPE

METHOD FOR AXIAL ALIGNMENT OF CHARGED PARTICLE BEAM AND CHARGED PAR...

ION SOURCES, SYSTEMS AND METHODS

INCOHERENT TRANSMISSION ELECTRON MICROSCOPY

PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME

INCOHERENT TRANSMISSION ELECTRON MICROSCOPY

ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY

Method of protecting a radiation detector in a charged particle ins...

ION SOURCES, SYSTEMS AND METHODS

HOLDER FOR AN ELECTRON MICROSCOPY SAMPLE CARRIER