Non-SPM analysing devices

Industry

CPC
G01Q30/02

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/02Non-SPM analysing devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Nanoscale scanning sensors
- Patent number 12,169,209
- Issue date Dec 17, 2024
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Nano robotic system for high throughput single cell DNA sequencing
- Patent number 12,163,979
- Issue date Dec 10, 2024
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Detection of probabilistic process windows
- Patent number 12,142,454
- Issue date Nov 12, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Method for electrically examining electronic components of an integ...
- Patent number 12,007,408
- Issue date Jun 11, 2024
- Forschungszentrum Juelich GmbH
- Bert Voigtlaender
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,996,265
- Issue date May 28, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample, method for manufacturing sample, and method for measuring i...
- Patent number 11,828,772
- Issue date Nov 28, 2023
- Kioxia Corporation
- Machiko Ito
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale scanning sensors
- Patent number 11,815,528
- Issue date Nov 14, 2023
- President and Fellows of Harvard College
- Michael S. Grinolds
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring magnetic field strength
- Patent number 11,762,046
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Baohua Niu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for identifying sample position in atomic forc...
- Patent number 11,761,981
- Issue date Sep 19, 2023
- Park Systems Corp.
- JeongHun An
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for resolution and sensitivity enhanced atomic...
- Patent number 11,714,103
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Craig Prater
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for examining a measuring tip of a scanning pr...
- Patent number 11,680,963
- Issue date Jun 20, 2023
- Carl Zeiss SMT GmbH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with a sample holder fed with electromagn...
- Patent number 11,674,976
- Issue date Jun 13, 2023
- ALCATERA INC.
- Marco Farina
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 11,670,480
- Issue date Jun 6, 2023
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope equipped with optical measurement device an...
- Patent number 11,619,649
- Issue date Apr 4, 2023
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Thermal desorbers
- Patent number 11,609,164
- Issue date Mar 21, 2023
- Hamilton Sundstrand Corporation
- Richard K. Chun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for examining and/or processing a sample
- Patent number 11,592,461
- Issue date Feb 28, 2023
- Carl Zeiss SMT GmbH
- Christof Baur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photothermal imaging device and system
- Patent number 11,592,391
- Issue date Feb 28, 2023
- University of Notre Dame Du Lac
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Grant
Accelerated training of a machine learning based model for semicond...
- Patent number 11,580,375
- Issue date Feb 14, 2023
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for predicting stochastic-aware process window an...
- Patent number 11,521,825
- Issue date Dec 6, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for low-noise edge detection and its use for proc...
- Patent number 11,508,546
- Issue date Nov 22, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multifunctional nanoprobes for scanning probe microscopy
- Patent number 11,454,648
- Issue date Sep 27, 2022
- GETEC MICROSCOPY GMBH
- Harald Plank
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Thermal desorbers
- Patent number 11,415,495
- Issue date Aug 16, 2022
- Hamilton Sundstrand Corporation
- Richard K. Chun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Frequency tracking for subsurface atomic force microscopy
- Patent number 11,402,405
- Issue date Aug 2, 2022
- Nederlandse Oganisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Paul Louis Maria Joseph Van Neer
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,380,516
- Issue date Jul 5, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,361,937
- Issue date Jun 14, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,355,306
- Issue date Jun 7, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for examining and/or processing a sample
- Patent number 11,262,378
- Issue date Mar 1, 2022
- Carl Zeiss SMT GmbH
- Christof Baur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for measuring the absorption of a laser emission by a sample
- Patent number 11,237,105
- Issue date Feb 1, 2022
- Centre National de la Recherche Scientifique
- Alexandre Dazzi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY
- Publication number 20240361351
- Publication date Oct 31, 2024
- ICSPI CORP.
- David MORRIS
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20240312757
- Publication date Sep 19, 2024
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...
- Publication number 20240288468
- Publication date Aug 29, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD
- Publication number 20240280605
- Publication date Aug 22, 2024
- WINBOND ELECTRONICS CORP.
- Hsueh-Cheng LIAO
- G01 - MEASURING TESTING
Information Patent Application
DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...
- Publication number 20240280606
- Publication date Aug 22, 2024
- Hitachi, Ltd
- Masanari KOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Method of Dispositioning and Control of a Semiconductor Manufacturi...
- Publication number 20240258066
- Publication date Aug 1, 2024
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...
- Publication number 20240168053
- Publication date May 23, 2024
- Bruker Nano, Inc.
- Martin Wagner
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20240126061
- Publication date Apr 18, 2024
- Hitachi, Ltd
- Masanari Koguchi
- G01 - MEASURING TESTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20240044938
- Publication date Feb 8, 2024
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH
- Publication number 20230358829
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- Baohua NIU
- G01 - MEASURING TESTING
Information Patent Application
NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING
- Publication number 20230358782
- Publication date Nov 9, 2023
- Versitech Limited
- Ning Xi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20230326711
- Publication date Oct 12, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...
- Publication number 20230236221
- Publication date Jul 27, 2023
- KIOXIA Corporation
- Machiko ITO
- G01 - MEASURING TESTING
Information Patent Application
PHOTOTHERMAL IMAGING DEVICE AND SYSTEM
- Publication number 20230160817
- Publication date May 25, 2023
- UNIVERSITY OF NOTRE DAME DU LAC
- Zhongming Li
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...
- Publication number 20230134093
- Publication date May 4, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HET...
- Publication number 20230003762
- Publication date Jan 5, 2023
- Lua Optomekatronik ARGE A.S.
- Tayfun Tatar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NANOSCALE SCANNING SENSORS
- Publication number 20220413007
- Publication date Dec 29, 2022
- President and Fellows of Harvard College
- Michael S. GRINOLDS
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ELECTRICALLY EXAMINING ELECTRONIC COMPONENTS OF AN INTEG...
- Publication number 20220244290
- Publication date Aug 4, 2022
- FORSCHUNGSZENTRUM JUELICH GMBH
- Bert Voigtlaender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMAL DESORBERS
- Publication number 20220214254
- Publication date Jul 7, 2022
- HAMILTON SUNDSTRAND CORPORATION
- Richard K. Chun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORC...
- Publication number 20220206039
- Publication date Jun 30, 2022
- Park Systems Corp.
- JeongHun AN
- G05 - CONTROLLING REGULATING
Information Patent Application
APPARATUS AND METHOD FOR EXAMINING AND/OR PROCESSING A SAMPLE
- Publication number 20220178965
- Publication date Jun 9, 2022
- Carl Zeiss SMT GMBH
- Christof Baur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION
- Publication number 20220163559
- Publication date May 26, 2022
- attocube systems AG
- Alexander A. GOVYADINOV
- G01 - MEASURING TESTING
Information Patent Application
MULTIFUNCTIONAL NANOPROBES FOR SCANNING PROBE MICROSCOPY
- Publication number 20220163560
- Publication date May 26, 2022
- GETec Microscopy GmbH
- Harald Plank
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...
- Publication number 20220107340
- Publication date Apr 7, 2022
- Carl Zeiss SMT GMBH
- Kinga Kornilov
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE WITH A SAMPLE HOLDER FED WITH ELECTROMAGN...
- Publication number 20220074968
- Publication date Mar 10, 2022
- ALCATERA LLC
- Marco Farina
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF PROBABILISTIC PROCESS WINDOWS
- Publication number 20220068594
- Publication date Mar 3, 2022
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANN...
- Publication number 20220026462
- Publication date Jan 27, 2022
- GTHERANOSTICS CO., LTD.
- Hidemi SHIGEKAWA
- G01 - MEASURING TESTING

Non-SPM analysing devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanoscale scanning sensors

Nano robotic system for high throughput single cell DNA sequencing

Detection of probabilistic process windows

Automated optimization of AFM light source positioning

Method for electrically examining electronic components of an integ...

System and method for generating and analyzing roughness measuremen...

Sample, method for manufacturing sample, and method for measuring i...

Nanoscale scanning sensors

Method and apparatus for measuring magnetic field strength

Method and apparatus for identifying sample position in atomic forc...

Method and apparatus for resolution and sensitivity enhanced atomic...

Method and apparatus for examining a measuring tip of a scanning pr...

Scanning probe microscope with a sample holder fed with electromagn...

System and method for generating and analyzing roughness measurements

Automated optimization of AFM light source positioning

Atomic force microscope equipped with optical measurement device an...

Thermal desorbers

Apparatus and method for examining and/or processing a sample

Photothermal imaging device and system

Accelerated training of a machine learning based model for semicond...

System and method for predicting stochastic-aware process window an...

System and method for low-noise edge detection and its use for proc...

Multifunctional nanoprobes for scanning probe microscopy

Thermal desorbers

Frequency tracking for subsurface atomic force microscopy

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measuremen...

Apparatus and method for examining and/or processing a sample

System for measuring the absorption of a laser emission by a sample

Patents Applicationslast 30 patents

METHODS FOR FEEDBACK DETECTION OF A MEMS ARRAY

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING...

MEASUREMENT SYSTEM AND PROBE TIP LANDING METHOD

DETECTION PROBE, PROBE MICROSCOPE, AND SAMPLE TEMPERATURE MEASURING...

Method of Dispositioning and Control of a Semiconductor Manufacturi...

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

Nano-Mechanical Infrared Spectroscopy System and Method Using Gated...

SCANNING PROBE MICROSCOPE

NANOSCALE SCANNING SENSORS

METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD STRENGTH

NANO ROBOTIC SYSTEM FOR HIGH THROUGHPUT SINGLE CELL DNA SEQUENCING

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

SAMPLE, METHOD FOR MANUFACTURING SAMPLE, AND METHOD FOR MEASURING I...

PHOTOTHERMAL IMAGING DEVICE AND SYSTEM

SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...

DEVICE AND METHOD FOR COMPREHENSIVE CHARACTERIZATION, ANALYSIS, HET...

NANOSCALE SCANNING SENSORS

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

METHOD FOR ELECTRICALLY EXAMINING ELECTRONIC COMPONENTS OF AN INTEG...

THERMAL DESORBERS

METHOD AND APPARATUS FOR IDENTIFYING SAMPLE POSITION IN ATOMIC FORC...

APPARATUS AND METHOD FOR EXAMINING AND/OR PROCESSING A SAMPLE

ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION

MULTIFUNCTIONAL NANOPROBES FOR SCANNING PROBE MICROSCOPY

METHOD AND APPARATUS FOR EXAMINING A MEASURING TIP OF A SCANNING PR...

SCANNING PROBE MICROSCOPE WITH A SAMPLE HOLDER FED WITH ELECTROMAGN...

DETECTION OF PROBABILISTIC PROCESS WINDOWS

OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANN...