object and detector fixed

Industry

CPC
G01N2223/3302

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/3302object and detector fixed

Industries

Patents Grantslast 30 patents

Information Patent Grant
Backscattered electron detector, apparatus of charged-particle beam...
- Patent number 11,854,763
- Issue date Dec 26, 2023
- BORRIES PTE. LTD.
- Wei Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting a defect and apparatus for performing the same
- Patent number 10,782,254
- Issue date Sep 22, 2020
- Samsung Electronics Co., Ltd.
- Hyon-Seok Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging apparatus for monitoring objects
- Patent number 10,495,585
- Issue date Dec 3, 2019
- ASQELLA OY
- Arttu Luukanen
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional image reconstruction using transmission and scatt...
- Patent number 10,416,098
- Issue date Sep 17, 2019
- GEORGETOWN RAIL EQUIPTMENT COMPANY
- Michael John Liesenfelt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning transmission electron microscope and method of image gener...
- Patent number 10,340,118
- Issue date Jul 2, 2019
- Jeol Ltd.
- Ryusuke Sagawa
- G01 - MEASURING TESTING
Information Patent Grant
Shifting mechanism for dual x-ray tube imaging system
- Patent number 10,015,872
- Issue date Jul 3, 2018
- Avonix Imaging, LLC
- Jeffrey Diehm
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dynamic focus adjustment with optical height detection apparatus in...
- Patent number 9,400,176
- Issue date Jul 26, 2016
- Hermes-Microvision, Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic focus adjustment with optical height detection apparatus in...
- Patent number 8,791,414
- Issue date Jul 29, 2014
- Hermes Microvision, Inc.
- Joe Wang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspecting apparatus and X-ray inspecting method
- Patent number 8,391,581
- Issue date Mar 5, 2013
- Omron Corporation
- Masayuki Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Tomosynthesis radiographing apparatus
- Patent number 8,094,776
- Issue date Jan 10, 2012
- FUJIFILM Corporation
- Kenji Takahashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection apparatus and inspection method using electron beam
- Patent number 7,999,565
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method using electron beam
- Patent number 7,518,383
- Issue date Apr 14, 2009
- Hitachi High-Technologies Corporation
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Grant
X-ray photoelectron emission spectrometry system
- Patent number 5,280,176
- Issue date Jan 18, 1994
- The United States of America as represented by the Secretary of Commerce
- Terrence J. Jach
- G01 - MEASURING TESTING
Information Patent Grant
Thermal wave microscopy using areal infrared detection
- Patent number 4,578,584
- Issue date Mar 25, 1986
- International Business Machines Corporation
- Thomas Baumann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETECTING A DEFECT AND APPARATUS FOR PERFORMING THE SAME
- Publication number 20190162681
- Publication date May 30, 2019
- Samsung Electronics Co., Ltd.
- Hyon-Seok SONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL IMAGE RECONSTRUCTION USING TRANSMISSION AND SCATT...
- Publication number 20170343488
- Publication date Nov 30, 2017
- University of Florida Research Foundation, Incorporated
- MICHAEL JOHN LIESENFELT
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS FOR MONITORING OBJECTS
- Publication number 20170160210
- Publication date Jun 8, 2017
- Asqella Oy
- Arttu Luukanen
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Focus Adjustment with Optical Height Detection Apparatus in...
- Publication number 20140291517
- Publication date Oct 2, 2014
- JOE WANG
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Focus Adjustment with Optical Height Detection Apparatus in...
- Publication number 20110260055
- Publication date Oct 27, 2011
- Hermes Microvision, Inc.
- JOE WANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD
- Publication number 20100329532
- Publication date Dec 30, 2010
- OMRON CORPORATION
- Masayuki Masuda
- G01 - MEASURING TESTING
Information Patent Application
Tomosynthesis radiographing apparatus
- Publication number 20100080342
- Publication date Apr 1, 2010
- FUJIFILM CORPORATION
- Kenji Takahashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM
- Publication number 20090123059
- Publication date May 14, 2009
- Hitachi High-Technologies Corporation
- Yasuhiro GUNJI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM
- Publication number 20060251318
- Publication date Nov 9, 2006
- Hitachi High-Technologies Corporation
- Yasuhiro GUNJI
- G01 - MEASURING TESTING

object and detector fixed

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Backscattered electron detector, apparatus of charged-particle beam...

Methods and systems for acquiring three-dimensional electron diffra...

Method of detecting a defect and apparatus for performing the same

Imaging apparatus for monitoring objects

Three-dimensional image reconstruction using transmission and scatt...

Scanning transmission electron microscope and method of image gener...

Shifting mechanism for dual x-ray tube imaging system

Dynamic focus adjustment with optical height detection apparatus in...

Dynamic focus adjustment with optical height detection apparatus in...

X-ray inspecting apparatus and X-ray inspecting method

Tomosynthesis radiographing apparatus

Inspection apparatus and inspection method using electron beam

Inspection apparatus and inspection method using electron beam

X-ray photoelectron emission spectrometry system

Thermal wave microscopy using areal infrared detection

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

METHOD OF DETECTING A DEFECT AND APPARATUS FOR PERFORMING THE SAME

THREE-DIMENSIONAL IMAGE RECONSTRUCTION USING TRANSMISSION AND SCATT...

IMAGING APPARATUS FOR MONITORING OBJECTS

Dynamic Focus Adjustment with Optical Height Detection Apparatus in...

Dynamic Focus Adjustment with Optical Height Detection Apparatus in...

X-RAY INSPECTING APPARATUS AND X-RAY INSPECTING METHOD

Tomosynthesis radiographing apparatus

INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM

INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM