of detector arrays

Industry

CPC
G01S7/4863

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Parent Industries

GPHYSICS G01Measuring instruments G01SRADIO DIRECTION-FINDING RADIO NAVIGATION DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES ANALOGOUS ARRANGEMENTS USING OTHER WAVES G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00

Current Industry

G01S7/4863of detector arrays

Industries

Patents Grantslast 30 patents

Information Patent Grant
Limitation of noise on light detectors using an aperture
- Patent number 12,292,502
- Issue date May 6, 2025
- Waymo LLC
- Pierre-Yves Droz
- G01 - MEASURING TESTING
Information Patent Grant
Beam steering LADAR sensor
- Patent number 12,292,533
- Issue date May 6, 2025
- Continental Autonomous Mobility US, LLC
- Patrick B Gilliland
- G01 - MEASURING TESTING
Information Patent Grant
Phased array LiDAR transmitting chip of mixed materials, manufactur...
- Patent number 12,287,432
- Issue date Apr 29, 2025
- VANJEE TECHNOLOGY CO., LTD.
- Pengfei Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Camera device and depth information extraction method of same
- Patent number 12,282,098
- Issue date Apr 22, 2025
- LG Innotek Co., Ltd
- Ju Un Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
LIDAR sensor system including a dual-polarization transmit and rece...
- Patent number 12,276,762
- Issue date Apr 15, 2025
- AURORA OPERATIONS, INC.
- Sen Lin
- G01 - MEASURING TESTING
Information Patent Grant
LIDAR with switchable local oscillator signals
- Patent number 12,259,477
- Issue date Mar 25, 2025
- AURORA OPERATIONS, INC.
- Sen Lin
- G01 - MEASURING TESTING
Information Patent Grant
Light detector and distance measurement device
- Patent number 12,259,499
- Issue date Mar 25, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi Kubota
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device, sensor module, imaging system and method to operate...
- Patent number 12,253,631
- Issue date Mar 18, 2025
- ams AG
- Robert Kappel
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for photodiode-based detection
- Patent number 12,253,634
- Issue date Mar 18, 2025
- Innoviz Technologies Ltd.
- Yuval Stern
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-speed light sensing apparatus III
- Patent number 12,243,901
- Issue date Mar 4, 2025
- Artilux, Inc.
- Yun-Chung Na
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Avalanche photodiode sensor and distance measuring device including...
- Patent number 12,243,947
- Issue date Mar 4, 2025
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Shinichiro Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated lidar image-sensor devices and systems and related metho...
- Patent number 12,222,454
- Issue date Feb 11, 2025
- Sense Photonics, Inc.
- Hod Finkelstein
- G01 - MEASURING TESTING
Information Patent Grant
Airborne topo-bathy lidar system and methods thereof
- Patent number 12,222,459
- Issue date Feb 11, 2025
- WOOLPERT, INC.
- Nathan Lee Hopper
- G01 - MEASURING TESTING
Information Patent Grant
LIDAR system design to mitigate LIDAR cross-talk
- Patent number 12,222,457
- Issue date Feb 11, 2025
- AURORA OPERATIONS, INC.
- Soren Juelsgaard
- G01 - MEASURING TESTING
Information Patent Grant
LiDAR device
- Patent number 12,210,125
- Issue date Jan 28, 2025
- Samsung Electronics Co., Ltd.
- Jungwoo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Lidar receiver circuit having redundancy to bypass failure
- Patent number 12,204,055
- Issue date Jan 21, 2025
- Elmos Semiconductor SE
- André Srowig
- G01 - MEASURING TESTING
Information Patent Grant
Integrated device for temporal binning of received photons
- Patent number 12,203,854
- Issue date Jan 21, 2025
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Light receiving device and distance measuring device
- Patent number 12,204,024
- Issue date Jan 21, 2025
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Yasuhiro Shinozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LIDAR signal acquisition
- Patent number 12,196,889
- Issue date Jan 14, 2025
- VELODYNE LIDAR USA, INC.
- David S. Hall
- G01 - MEASURING TESTING
Information Patent Grant
Optical distance measuring device
- Patent number 12,189,057
- Issue date Jan 7, 2025
- Denso Corporation
- Noriyuki Ozaki
- G01 - MEASURING TESTING
Information Patent Grant
CMOS image sensor for direct time of flight measurement
- Patent number 12,181,610
- Issue date Dec 31, 2024
- TELEDYNE INNOVACIONES MICROELECTRONICAS SLU
- Rafael Dominguez Castro
- G01 - MEASURING TESTING
Information Patent Grant
Distance measurement device, camera, inspection adjustment device,...
- Patent number 12,181,578
- Issue date Dec 31, 2024
- TOPPAN Holdings Inc.
- Masanori Nagase
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device, camera, and method for adjusting drive o...
- Patent number 12,181,609
- Issue date Dec 31, 2024
- TOPPAN Holdings Inc.
- Masanori Nagase
- G01 - MEASURING TESTING
Information Patent Grant
Lidar sensor for optically detecting a field of vision, working dev...
- Patent number 12,174,298
- Issue date Dec 24, 2024
- Robert Bosch GmbH
- Reiner Schnitzer
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric conversion apparatus and system having photodiodes to...
- Patent number 12,177,593
- Issue date Dec 24, 2024
- Canon Kabushiki Kaisha
- Kenzo Tojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-pathway distance measurements for optical sensors
- Patent number 12,164,027
- Issue date Dec 10, 2024
- Apple Inc.
- Xiyu Duan
- G01 - MEASURING TESTING
Information Patent Grant
Time of flight sensors with light directing elements
- Patent number 12,164,062
- Issue date Dec 10, 2024
- ams International AG
- Miguel Bruno Vaello Paños
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid crystal polymer optics for lidar systems
- Patent number 12,158,523
- Issue date Dec 3, 2024
- Analog Devices, Inc.
- Tyler Adam Dunn
- G01 - MEASURING TESTING
Information Patent Grant
Light detector
- Patent number 12,159,954
- Issue date Dec 3, 2024
- Kabushiki Kaisha Toshiba
- Koichi Kokubun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light-receiving element and distance-measuring module
- Patent number 12,158,542
- Issue date Dec 3, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Ryota Watanabe
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LIDAR DEVICE
- Publication number 20250147158
- Publication date May 8, 2025
- ROBERT BOSCH GmbH
- Annette Frederiksen
- G01 - MEASURING TESTING
Information Patent Application
Light Ranging Device Having An Electronically Scanned Emitter Array
- Publication number 20250147181
- Publication date May 8, 2025
- Ouster, Inc.
- Angus PACALA
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD AND DEVICE FOR CONTROLLING SENSITIVITY OF A SPAD MACRO-CELL
- Publication number 20250147159
- Publication date May 8, 2025
- ams-OSRAM AG
- Scott LINDNER
- G01 - MEASURING TESTING
Information Patent Application
SOLID-STATE IMAGING DEVICE
- Publication number 20250150723
- Publication date May 8, 2025
- NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
- Shoji Kawahito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGE SENSING DEVICE
- Publication number 20250123372
- Publication date Apr 17, 2025
- SK HYNIX INC.
- Eun Chang LEE
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSING DEVICE AND LIDAR DEVICE
- Publication number 20250116780
- Publication date Apr 10, 2025
- Samsung Electronics Co., Ltd.
- Young KIM
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT, DISTANCE MEASUREMENT DEVICE, AND EQUIPMENT
- Publication number 20250110450
- Publication date Apr 3, 2025
- Canon Kabushiki Kaisha
- SATORU MIKAJIRI
- G04 - HOROLOGY
Information Patent Application
DISTANCE MEASUREMENT DEVICE AND EQUIPMENT
- Publication number 20250110220
- Publication date Apr 3, 2025
- Canon Kabushiki Kaisha
- KAZUMA CHIDA
- G01 - MEASURING TESTING
Information Patent Application
RANGING DEVICE
- Publication number 20250110219
- Publication date Apr 3, 2025
- Sony Semiconductor Solutions Corporation
- Akito Sekiya
- G01 - MEASURING TESTING
Information Patent Application
RANGING APPARATUS, RANGING SYSTEM, MOVING BODY, AND DEVICE
- Publication number 20250110222
- Publication date Apr 3, 2025
- Canon Kabushiki Kaisha
- DAIKI SHIRAHIGE
- G01 - MEASURING TESTING
Information Patent Application
DTOF RANGING METHOD AND SYSTEM
- Publication number 20250102642
- Publication date Mar 27, 2025
- SHENZHEN ADAPS PHOTONICS TECHNOLOGY CO., LTD.
- Letian WANG
- G01 - MEASURING TESTING
Information Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING METHOD
- Publication number 20250102643
- Publication date Mar 27, 2025
- TOPPAN Holdings Inc.
- Kazuto YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING DEGREE OF TOWING POINT OF POINT CLOUD OF LASE...
- Publication number 20250102649
- Publication date Mar 27, 2025
- Hesai Technology Co., Ltd.
- Jinsong CHEN
- G01 - MEASURING TESTING
Information Patent Application
LIDAR WITH MICROLENS ARRAY AND INTEGRATED PHOTONIC SWITCH ARRAY
- Publication number 20250102676
- Publication date Mar 27, 2025
- nEye Systems, Inc.
- Tae Joon SEOK
- G01 - MEASURING TESTING
Information Patent Application
RANGE IMAGING DEVICE AND RANGE IMAGING METHOD
- Publication number 20250093506
- Publication date Mar 20, 2025
- TOPPAN Holdings Inc.
- Yu OOKUBO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL DEVICE, SENSING SYSTEM, CONTROL METHOD AND NON-TRANSITORY C...
- Publication number 20250085403
- Publication date Mar 13, 2025
- DENSO CORPORATION
- TOMONARI YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
RANGE IMAGING APPARATUS AND RANGE IMAGING METHOD
- Publication number 20250085404
- Publication date Mar 13, 2025
- TOPPAN Holdings Inc.
- Kazuto YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PATHWAY DISTANCE MEASUREMENTS FOR OPTICAL SENSORS
- Publication number 20250076502
- Publication date Mar 6, 2025
- Apple Inc.
- Xiyu Duan
- G01 - MEASURING TESTING
Information Patent Application
TIME OF FLIGHT PATH DELAY COMPENSATION
- Publication number 20250076473
- Publication date Mar 6, 2025
- STMicroelectronics International N.V.
- John Kevin MOORE
- G01 - MEASURING TESTING
Information Patent Application
MICROSECOND TIME OF FLIGHT (MTOF) SENSOR
- Publication number 20250076474
- Publication date Mar 6, 2025
- Artis, LLC
- Jared BENCH
- G01 - MEASURING TESTING
Information Patent Application
Hybrid LADAR with Co-Planar Scanning and Imaging Field-of-View
- Publication number 20250067873
- Publication date Feb 27, 2025
- Red Creamery LLC
- Dmitriy Yavid
- G01 - MEASURING TESTING
Information Patent Application
LIDAR DEVICE USING CHANNEL GROUPING TO INCREASE ANGULAR RESOLUTION...
- Publication number 20250060456
- Publication date Feb 20, 2025
- Liturex (Guangzhou) Co. Ltd
- XIMING REN
- G01 - MEASURING TESTING
Information Patent Application
LASER DISTANCE-MEASURING RECEIVING CHIP AND ITS CONFIGURATION METHO...
- Publication number 20250060461
- Publication date Feb 20, 2025
- SHENZHEN ADAPS PHOTONICS TECHNOLOGY CO., LTD.
- Honggang LI
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE IMAGE MEASURING DEVICE, AND DISTANCE IMAGE MEASURING METHOD
- Publication number 20250060460
- Publication date Feb 20, 2025
- NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
- Shoji KAWAHITO
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTION DEVICE AND RANGING DEVICE
- Publication number 20250052865
- Publication date Feb 13, 2025
- Sony Semiconductor Solutions Corporation
- SOZO YOKOGAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FLUORESCENCE LIFETIME BASED SEQUENCING
- Publication number 20250052681
- Publication date Feb 13, 2025
- Illumina, Inc.
- Hod Finkelstein
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
RANGING DEVICE
- Publication number 20250052871
- Publication date Feb 13, 2025
- Canon Kabushiki Kaisha
- YUUTA OOSHIMA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250052902
- Publication date Feb 13, 2025
- Koito Manufacturing Co., Ltd.
- Masayuki TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
WIDE-DYNAMIC-RANGE SPLIT-DETECTOR LIDAR PHOTORECEIVER
- Publication number 20250044422
- Publication date Feb 6, 2025
- ALLEGRO MICROSYSTEMS, LLC
- Andrew S. Huntington
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM
- Publication number 20250044423
- Publication date Feb 6, 2025
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Victor BELOKONSKIY
- G01 - MEASURING TESTING

of detector arrays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Limitation of noise on light detectors using an aperture

Beam steering LADAR sensor

Phased array LiDAR transmitting chip of mixed materials, manufactur...

Camera device and depth information extraction method of same

LIDAR sensor system including a dual-polarization transmit and rece...

LIDAR with switchable local oscillator signals

Light detector and distance measurement device

Sensor device, sensor module, imaging system and method to operate...

Systems and methods for photodiode-based detection

High-speed light sensing apparatus III

Avalanche photodiode sensor and distance measuring device including...

Integrated lidar image-sensor devices and systems and related metho...

Airborne topo-bathy lidar system and methods thereof

LIDAR system design to mitigate LIDAR cross-talk

LiDAR device

Lidar receiver circuit having redundancy to bypass failure

Integrated device for temporal binning of received photons

Light receiving device and distance measuring device

LIDAR signal acquisition

Optical distance measuring device

CMOS image sensor for direct time of flight measurement

Distance measurement device, camera, inspection adjustment device,...

Distance measuring device, camera, and method for adjusting drive o...

Lidar sensor for optically detecting a field of vision, working dev...

Photoelectric conversion apparatus and system having photodiodes to...

Multi-pathway distance measurements for optical sensors

Time of flight sensors with light directing elements

Liquid crystal polymer optics for lidar systems

Light detector

Light-receiving element and distance-measuring module

Patents Applicationslast 30 patents

LIDAR DEVICE

Light Ranging Device Having An Electronically Scanned Emitter Array

METHOD AND DEVICE FOR CONTROLLING SENSITIVITY OF A SPAD MACRO-CELL

SOLID-STATE IMAGING DEVICE

IMAGE SENSING DEVICE

IMAGE SENSING DEVICE AND LIDAR DEVICE

ELECTRONIC CIRCUIT, DISTANCE MEASUREMENT DEVICE, AND EQUIPMENT

DISTANCE MEASUREMENT DEVICE AND EQUIPMENT

RANGING DEVICE

RANGING APPARATUS, RANGING SYSTEM, MOVING BODY, AND DEVICE

DTOF RANGING METHOD AND SYSTEM

RANGE IMAGING DEVICE AND RANGE IMAGING METHOD

METHOD FOR EVALUATING DEGREE OF TOWING POINT OF POINT CLOUD OF LASE...

LIDAR WITH MICROLENS ARRAY AND INTEGRATED PHOTONIC SWITCH ARRAY

RANGE IMAGING DEVICE AND RANGE IMAGING METHOD

CONTROL DEVICE, SENSING SYSTEM, CONTROL METHOD AND NON-TRANSITORY C...

RANGE IMAGING APPARATUS AND RANGE IMAGING METHOD

MULTI-PATHWAY DISTANCE MEASUREMENTS FOR OPTICAL SENSORS

TIME OF FLIGHT PATH DELAY COMPENSATION

MICROSECOND TIME OF FLIGHT (MTOF) SENSOR

Hybrid LADAR with Co-Planar Scanning and Imaging Field-of-View

LIDAR DEVICE USING CHANNEL GROUPING TO INCREASE ANGULAR RESOLUTION...

LASER DISTANCE-MEASURING RECEIVING CHIP AND ITS CONFIGURATION METHO...

DISTANCE IMAGE MEASURING DEVICE, AND DISTANCE IMAGE MEASURING METHOD

PHOTODETECTION DEVICE AND RANGING DEVICE

METHOD AND SYSTEM FOR FLUORESCENCE LIFETIME BASED SEQUENCING

RANGING DEVICE

MEASUREMENT DEVICE

WIDE-DYNAMIC-RANGE SPLIT-DETECTOR LIDAR PHOTORECEIVER

ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM