of electrons (ESCA, XPS)

Industry

CPC
H01J2237/2522

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2522of electrons (ESCA, XPS)

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Nano vacuum tube
- Patent number 11,152,188
- Issue date Oct 19, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsien-Yu Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hard X-ray photoelectron spectroscopy arrangement and system
- Patent number 11,002,694
- Issue date May 11, 2021
- Scienta Omicron AB
- Tomas Wiell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nano vacuum tube
- Patent number 10,566,173
- Issue date Feb 18, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hsien-Yu Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror energy filter for electron beam apparatus
- Patent number 8,334,508
- Issue date Dec 18, 2012
- Electron Optica, Inc.
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 7,977,630
- Issue date Jul 12, 2011
- Jeol Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoelectron microscope
- Patent number 7,718,961
- Issue date May 18, 2010
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spherical aberration corrected electrostatic lens, input lens, elec...
- Patent number 7,655,923
- Issue date Feb 2, 2010
- National University Corporation Nara Institute of Science and Technology
- Hiroshi Daimon
- G01 - MEASURING TESTING
Information Patent Grant
Device for obtaining the image and/or spectra of electron energy loss
- Patent number 7,642,513
- Issue date Jan 5, 2010
- Centre National de la Recherche Scientifique
- Henri Pinna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining layer thickness using photoelectron spectroscopy
- Patent number 7,420,163
- Issue date Sep 2, 2008
- ReVera Incorporated
- Bruno Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Carrier and analyzing apparatus including the carrier
- Patent number 7,230,253
- Issue date Jun 12, 2007
- Samsung SDI Co., Ltd.
- Yong-nam Ham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope with curved axes
- Patent number 7,205,542
- Issue date Apr 17, 2007
- KLA-Tencor Technologies Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-mode charged particle beam device
- Patent number 7,157,720
- Issue date Jan 2, 2007
- Ropintassco Holdings, L.P.
- Henry Shih-Ming Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,933,501
- Issue date Aug 23, 2005
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,794,648
- Issue date Sep 21, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy employing controlled surface charging
- Patent number 6,720,556
- Issue date Apr 13, 2004
- Yeda Research and Development Co. Ltd.
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Particle optical apparatus
- Patent number 6,462,332
- Issue date Oct 8, 2002
- Koninklijke Philips Electronics N.V.
- Petrus Hubertus Franciscus Trompenaars
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for adjusting electron beam apparatus
- Patent number 5,895,916
- Issue date Apr 20, 1999
- Research Development Corporation of Japan
- Junichi Tsukajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing nucleic acids
- Patent number 5,796,101
- Issue date Aug 18, 1998
- IBM Corporation
- Richard Allan Haight
- G01 - MEASURING TESTING
Information Patent Grant
X-ray microscope
- Patent number 5,590,168
- Issue date Dec 31, 1996
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged-particle analyzer
- Patent number 5,506,414
- Issue date Apr 9, 1996
- Fisons plc
- Peter Coxon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray microscope
- Patent number 5,450,463
- Issue date Sep 12, 1995
- Olympus Optical Co., Ltd.
- Yoshinori Iketaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scanning and high resolution electron spectroscopy and imaging
- Patent number 5,444,242
- Issue date Aug 22, 1995
- Physical Electronics Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy analyzer and a method of correcting a shift o...
- Patent number 5,352,894
- Issue date Oct 4, 1994
- Sharp Kabushiki Kaisha
- Fumitoshi Yasuo
- G01 - MEASURING TESTING
Information Patent Grant
Scanning and high resolution x-ray photoelectron spectroscopy and i...
- Patent number 5,315,113
- Issue date May 24, 1994
- The Perkin-Elmer Corporation
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for locating target area for electron microana...
- Patent number 5,118,941
- Issue date Jun 2, 1992
- The Perkin-Elmer Corporation
- Paul E. Larson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
NANO VACUUM TUBE
- Publication number 20200161085
- Publication date May 21, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsien-Yu CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HARD X-RAY PHOTOELECTRON SPECTROSCOPY ARRANGEMENT AND SYSTEM
- Publication number 20200103358
- Publication date Apr 2, 2020
- SCIENTA OMICRON AB
- Tomas WIELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANO VACUUM TUBE
- Publication number 20190035598
- Publication date Jan 31, 2019
- Taiwan Semiconductor Manufacturing Co., LTD
- Hsien-Yu CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Device For Obtaining the Image and/or Spectra of Electron Energy Loss
- Publication number 20080210863
- Publication date Sep 4, 2008
- Henri Pinna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spherical Aberration Corrected Electrostatic Lens, Input Lens, Elec...
- Publication number 20080135748
- Publication date Jun 12, 2008
- Hiroshi Daimon
- G01 - MEASURING TESTING
Information Patent Application
Determining layer thickness using photoelectron spectroscopy
- Publication number 20060243904
- Publication date Nov 2, 2006
- Bruno Schueler
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20050242284
- Publication date Nov 3, 2005
- JEOL Ltd.
- Toshikatsu Kaneyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Carrier and analyzing apparatus including the carrier
- Publication number 20050035303
- Publication date Feb 17, 2005
- Samsung SDI Co., Ltd.
- Yong-nam Ham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-mode charged particle beam device
- Publication number 20050030373
- Publication date Feb 10, 2005
- Henry Shih-Ming Chao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20040169143
- Publication date Sep 2, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20030085356
- Publication date May 8, 2003
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Electron spectroscopy employing controlled surface charging
- Publication number 20020020814
- Publication date Feb 21, 2002
- Hagai Cohen
- B82 - NANO-TECHNOLOGY

of electrons (ESCA, XPS)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nano vacuum tube

Hard X-ray photoelectron spectroscopy arrangement and system

Nano vacuum tube

Mirror energy filter for electron beam apparatus

Electron microscope

Photoelectron microscope

Spherical aberration corrected electrostatic lens, input lens, elec...

Device for obtaining the image and/or spectra of electron energy loss

Determining layer thickness using photoelectron spectroscopy

Carrier and analyzing apparatus including the carrier

Scanning electron microscope with curved axes

Multi-mode charged particle beam device

Ultimate analyzer, scanning transmission electron microscope and ul...

Ultimate analyzer, scanning transmission electron microscope and ul...

Electron spectroscopy employing controlled surface charging

Particle optical apparatus

Method and apparatus for adjusting electron beam apparatus

Method of processing nucleic acids

X-ray microscope

Charged-particle analyzer

X-ray microscope

Scanning and high resolution electron spectroscopy and imaging

Electron spectroscopy analyzer and a method of correcting a shift o...

Scanning and high resolution x-ray photoelectron spectroscopy and i...

Apparatus and method for locating target area for electron microana...

Patents Applicationslast 30 patents

NANO VACUUM TUBE

HARD X-RAY PHOTOELECTRON SPECTROSCOPY ARRANGEMENT AND SYSTEM

NANO VACUUM TUBE

Device For Obtaining the Image and/or Spectra of Electron Energy Loss

Spherical Aberration Corrected Electrostatic Lens, Input Lens, Elec...

Determining layer thickness using photoelectron spectroscopy

Electron microscope

Carrier and analyzing apparatus including the carrier

Multi-mode charged particle beam device

Ultimate analyzer, scanning transmission electron microscope and ul...

Ultimate analyzer, scanning transmission electron microscope and ul...

Electron spectroscopy employing controlled surface charging