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of etalon type comprising a resonant cavity other than a thin solid film
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G02B5/284
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PHYSICS
G02
Optics
G02B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
G02B5/00
Optical elements other than lenses
Current Industry
G02B5/284
of etalon type comprising a resonant cavity other than a thin solid film
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Patents Grants
last 30 patents
Information
Patent Grant
Combined frequency and mode filter
Patent number
12,164,129
Issue date
Dec 10, 2024
Lumentum Technology UK Limited
Adrian Perrin Janssen
G02 - OPTICS
Information
Patent Grant
Optical filter and spectrometer
Patent number
12,135,239
Issue date
Nov 5, 2024
Viavi Solutions Inc.
Paula Smith
G02 - OPTICS
Information
Patent Grant
Filter assembly, detector, and method of manufacture of a filter as...
Patent number
12,072,235
Issue date
Aug 27, 2024
ams AG
Gerhard Eilmsteiner
G01 - MEASURING TESTING
Information
Patent Grant
High power light absorbers having anti-reflection coating
Patent number
12,066,679
Issue date
Aug 20, 2024
Massachusetts Institute of Technology
Steven J. Augst
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wavelength-tunable liquid crystal etalon filter, light source and o...
Patent number
12,044,937
Issue date
Jul 23, 2024
Sang Hyun Park
G02 - OPTICS
Information
Patent Grant
Spectroscopic unit and spectroscopic module
Patent number
11,971,301
Issue date
Apr 30, 2024
Hamamatsu Photonics K.K.
Kei Tabata
G01 - MEASURING TESTING
Information
Patent Grant
Solid-state imaging element, electronic device, and method of manuf...
Patent number
11,961,858
Issue date
Apr 16, 2024
SONY SEMICONDUCTOR SOLUTIONS CORPORATION
Atsushi Toda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Suctioning method
Patent number
11,947,140
Issue date
Apr 2, 2024
Hamamatsu Photonics K.K.
Masaki Hirose
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Color measurement apparatus
Patent number
11,927,484
Issue date
Mar 12, 2024
Seiko Epson Corporation
Haruki Miyasaka
G01 - MEASURING TESTING
Information
Patent Grant
Suction method
Patent number
11,865,701
Issue date
Jan 9, 2024
Hamamatsu Photonics K.K.
Masaki Hirose
G02 - OPTICS
Information
Patent Grant
Device with a heterostructure adapted to be applied as a resonator...
Patent number
11,803,002
Issue date
Oct 31, 2023
Terra Quantum AG
Igor Lukyanchuk
G01 - MEASURING TESTING
Information
Patent Grant
Optical filter
Patent number
11,789,188
Issue date
Oct 17, 2023
Viavi Solutions Inc.
William D. Houck
G02 - OPTICS
Information
Patent Grant
Tunable notch filter
Patent number
11,788,887
Issue date
Oct 17, 2023
Nanohmics, Inc.
Chris W. Mann
G02 - OPTICS
Information
Patent Grant
Optical filter, spectrometer including the optical filter, and elec...
Patent number
11,692,875
Issue date
Jul 4, 2023
Samsung Electronics Co., Ltd.
Chanwook Baik
G01 - MEASURING TESTING
Information
Patent Grant
High precision optical locker
Patent number
11,662,508
Issue date
May 30, 2023
Lumentum Operations LLC
Adrian Perrin Janssen
G01 - MEASURING TESTING
Information
Patent Grant
Intrinsic and tunable self-modulating optical limiter via strong ca...
Patent number
11,604,316
Issue date
Mar 14, 2023
The Government of the United States of America, as represented by the Secreta...
Blake Simpkins
G02 - OPTICS
Information
Patent Grant
Thin-film filter based hyperspectral imager spanning an octave of l...
Patent number
11,604,095
Issue date
Mar 14, 2023
HRL Laboratories, LLC
Shuoqin Wang
G02 - OPTICS
Information
Patent Grant
Optical detection device having adhesive member
Patent number
11,555,741
Issue date
Jan 17, 2023
Hamamatsu Photonics K.K.
Masaki Hirose
G01 - MEASURING TESTING
Information
Patent Grant
Angle- and polarization-insensitive narrow-band optical filters usi...
Patent number
11,543,571
Issue date
Jan 3, 2023
United States of America as represented by the Secretary of the Air Force
Justin W. Cleary
G02 - OPTICS
Information
Patent Grant
Optical filter device, optical module, and electronic apparatus
Patent number
11,493,748
Issue date
Nov 8, 2022
Seiko Epson Corporation
Daisuke Saito
G01 - MEASURING TESTING
Information
Patent Grant
Tunable MEMS etalon device
Patent number
11,474,343
Issue date
Oct 18, 2022
UNISPECTRAL LTD.
Ariel Raz
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical filter, spectrometer including the optical filter, and elec...
Patent number
11,346,716
Issue date
May 31, 2022
Samsung Electronics Co., Ltd.
Chanwook Baik
G01 - MEASURING TESTING
Information
Patent Grant
Capacitance detection device and optical wavelength-selective filte...
Patent number
11,320,473
Issue date
May 3, 2022
Pioneer Corporation
Yoshiyuki Okuda
G02 - OPTICS
Information
Patent Grant
Method for removing foreign matter and method for manufacturing opt...
Patent number
11,294,170
Issue date
Apr 5, 2022
Hamamatsu Photonics K.K.
Masaki Hirose
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Projector and method for controlling projector
Patent number
11,269,248
Issue date
Mar 8, 2022
Seiko Epson Corporation
Hirotaka Mochizuki
G02 - OPTICS
Information
Patent Grant
Spectral imager and spectral imaging method
Patent number
11,249,289
Issue date
Feb 15, 2022
Bodkin Design and Engineering LLC
Andrew Bodkin
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multi-pass etalon filter
Patent number
11,239,626
Issue date
Feb 1, 2022
LightMachinery Inc.
John H. Hunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical filter and spectrometer
Patent number
11,237,049
Issue date
Feb 1, 2022
VIAVI Solutions Inc.
Paula Smith
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement control program, optical measurement system, an...
Patent number
11,156,500
Issue date
Oct 26, 2021
Hamamatsu Photonics K.K.
Takashi Kasahara
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for cavity angle tuning for operating conditi...
Patent number
11,159,245
Issue date
Oct 26, 2021
Raytheon Company
Andrew Kowalevicz
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR MANUFACTURING A MULTISPECTRAL FILTER FOR ELECTROMAGNETIC...
Publication number
20240419067
Publication date
Dec 19, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Ujwol PALANCHOKE
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
WAVELENGTH-TUNABLE LIQUID CRYSTAL ETALON FILTER, LIGHT SOURCE AND O...
Publication number
20240310680
Publication date
Sep 19, 2024
ALBATRACE, INC.
Sang Hyun PARK
G02 - OPTICS
Information
Patent Application
SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE
Publication number
20240230405
Publication date
Jul 11, 2024
HAMAMATSU PHOTONICS K. K.
Kei Tabata
G01 - MEASURING TESTING
Information
Patent Application
SUPPRESSION OF EXCITATION FIELD FOR QUANTUM LIGHT EMITTERS USING OP...
Publication number
20240069261
Publication date
Feb 29, 2024
PHOTONIC INC.
Youn Seok Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTERFERENCE FILTER AND USE OF A STACKED ARRANGEMENT OF LAYER STRUC...
Publication number
20230393316
Publication date
Dec 7, 2023
UNIVERSITÄT ZU KOLN
Malte C. GATHER
G02 - OPTICS
Information
Patent Application
WAVELENGTH-TUNABLE LIQUID CRYSTAL ETALON FILTER, LIGHT SOURCE AND O...
Publication number
20230324743
Publication date
Oct 12, 2023
ALBATRACE, INC.
Sang Hyun PARK
G02 - OPTICS
Information
Patent Application
OPTICAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING OP...
Publication number
20230185005
Publication date
Jun 15, 2023
Samsung Electronics Co., Ltd.
Hyochul Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CALIBRATION DEVICE AND METHOD FOR HYPERSPECTRAL MEMS TUNABLE FILTER
Publication number
20230123709
Publication date
Apr 20, 2023
Unispectral Ltd.
Peleg Levin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FILTER ARRAY AND LIGHT DETECTION SYSTEM
Publication number
20230092032
Publication date
Mar 23, 2023
Panasonic Intellectual Property Management Co., Ltd.
MOTOKI YAKO
G01 - MEASURING TESTING
Information
Patent Application
FILTER ARRAY AND LIGHT DETECTION SYSTEM
Publication number
20230069927
Publication date
Mar 9, 2023
Panasonic Intellectual Property Management Co., Ltd.
MOTOKI YAKO
G01 - MEASURING TESTING
Information
Patent Application
HIGH PRECISION OPTICAL LOCKER
Publication number
20230025759
Publication date
Jan 26, 2023
Lumentum Operations LLC
Adrian Perrin JANSSEN
G02 - OPTICS
Information
Patent Application
COMPACT ETALON STRUCTURE
Publication number
20230017729
Publication date
Jan 19, 2023
Lumentum Operations LLC
Adrian Perrin JANSSEN
G02 - OPTICS
Information
Patent Application
COMBINED FREQUENCY AND MODE FILTER
Publication number
20220404534
Publication date
Dec 22, 2022
Lumentum Technology UK Limited
Adrian Perrin JANSSEN
G02 - OPTICS
Information
Patent Application
COLOR MEASUREMENT APPARATUS
Publication number
20220299366
Publication date
Sep 22, 2022
SEIKO EPSON CORPORATION
Haruki MIYASAKA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FILTER, SPECTROMETER INCLUDING THE OPTICAL FILTER, AND ELEC...
Publication number
20220291041
Publication date
Sep 15, 2022
Samsung Electronics Co., Ltd.
Chanwook BAIK
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ FERROELECTRIC RESONATOR
Publication number
20220283348
Publication date
Sep 8, 2022
Terra Quantum AG
Igor Lukyanchuk
G01 - MEASURING TESTING
Information
Patent Application
Mirror Device for an Interferometer Device, Interferometer Device a...
Publication number
20220221709
Publication date
Jul 14, 2022
ROBERT BOSCH GmbH
Christoph Schelling
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL ANTI-COUNTERFEITING ELEMENT AND MANUFACTURING METHOD THEREOF
Publication number
20220184992
Publication date
Jun 16, 2022
ZHONGCHAO SPECIAL SECURITY TECHNOLOGY CO., LTD.
Weiwei Zhang
G02 - OPTICS
Information
Patent Application
COLOR MEASUREMENT APPARATUS
Publication number
20220146314
Publication date
May 12, 2022
SEIKO EPSON CORPORATION
Haruki MIYASAKA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL FILTER AND SPECTROMETER
Publication number
20220146308
Publication date
May 12, 2022
VIAVI Solutions Inc.
Paula SMITH
G01 - MEASURING TESTING
Information
Patent Application
COLOR MEASUREMENT APPARATUS
Publication number
20220146316
Publication date
May 12, 2022
SEIKO EPSON CORPORATION
Haruki MIYASAKA
G01 - MEASURING TESTING
Information
Patent Application
FABRY-PEROT INTERFERENCE FILTER
Publication number
20220050238
Publication date
Feb 17, 2022
Hamamatsu Photonics K.K.
Takashi KASAHARA
G02 - OPTICS
Information
Patent Application
IMAGE SENSING DEVICE
Publication number
20220020801
Publication date
Jan 20, 2022
SK HYNIX INC.
Sie Uoo KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONTROL DEVICE, OPTICAL FILTER SYSTEM, AND CONTROL METHOD
Publication number
20220003603
Publication date
Jan 6, 2022
Hamamatsu Photonics K.K.
Peter SEITZ
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE
Publication number
20210389178
Publication date
Dec 16, 2021
Hamamatsu Photonics K.K.
Kei TABATA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER
Publication number
20210372854
Publication date
Dec 2, 2021
HAMAMATSU PHOTONICS K. K.
Masaki HIROSE
G02 - OPTICS
Information
Patent Application
SUCTION METHOD
Publication number
20210362351
Publication date
Nov 25, 2021
Hamamatsu Photonics K.K.
Masaki HIROSE
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
SUCTIONING METHOD
Publication number
20210364681
Publication date
Nov 25, 2021
Hamamatsu Photonics K.K.
Masaki HIROSE
G02 - OPTICS
Information
Patent Application
High Power Light Absorbers
Publication number
20210349281
Publication date
Nov 11, 2021
Steven J. AUGST
G02 - OPTICS
Information
Patent Application
OPTICAL DEVICE AND A METHOD FOR BONDING
Publication number
20210255376
Publication date
Aug 19, 2021
Unispectral Ltd.
Eliahu Chaim ASHKENAZI
B81 - MICRO-STRUCTURAL TECHNOLOGY