of etalon type comprising a resonant cavity other than a thin solid film

Industry

CPC
G02B5/284

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Parent Industries

GPHYSICS G02Optics G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS G02B5/00Optical elements other than lenses

Current Industry

G02B5/284of etalon type comprising a resonant cavity other than a thin solid film

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device with a heterostructure adapted to be applied as a resonator...
- Patent number 11,803,002
- Issue date Oct 31, 2023
- Terra Quantum AG
- Igor Lukyanchuk
- G01 - MEASURING TESTING
Information Patent Grant
Optical filter
- Patent number 11,789,188
- Issue date Oct 17, 2023
- Viavi Solutions Inc.
- William D. Houck
- G02 - OPTICS
Information Patent Grant
Tunable notch filter
- Patent number 11,788,887
- Issue date Oct 17, 2023
- Nanohmics, Inc.
- Chris W. Mann
- G02 - OPTICS
Information Patent Grant
Optical filter, spectrometer including the optical filter, and elec...
- Patent number 11,692,875
- Issue date Jul 4, 2023
- Samsung Electronics Co., Ltd.
- Chanwook Baik
- G01 - MEASURING TESTING
Information Patent Grant
High precision optical locker
- Patent number 11,662,508
- Issue date May 30, 2023
- Lumentum Operations LLC
- Adrian Perrin Janssen
- G01 - MEASURING TESTING
Information Patent Grant
Thin-film filter based hyperspectral imager spanning an octave of l...
- Patent number 11,604,095
- Issue date Mar 14, 2023
- HRL Laboratories, LLC
- Shuoqin Wang
- G02 - OPTICS
Information Patent Grant
Intrinsic and tunable self-modulating optical limiter via strong ca...
- Patent number 11,604,316
- Issue date Mar 14, 2023
- The Government of the United States of America, as represented by the Secreta...
- Blake Simpkins
- G02 - OPTICS
Information Patent Grant
Optical detection device having adhesive member
- Patent number 11,555,741
- Issue date Jan 17, 2023
- Hamamatsu Photonics K.K.
- Masaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Angle- and polarization-insensitive narrow-band optical filters usi...
- Patent number 11,543,571
- Issue date Jan 3, 2023
- United States of America as represented by the Secretary of the Air Force
- Justin W. Cleary
- G02 - OPTICS
Information Patent Grant
Optical filter device, optical module, and electronic apparatus
- Patent number 11,493,748
- Issue date Nov 8, 2022
- Seiko Epson Corporation
- Daisuke Saito
- G01 - MEASURING TESTING
Information Patent Grant
Tunable MEMS etalon device
- Patent number 11,474,343
- Issue date Oct 18, 2022
- UNISPECTRAL LTD.
- Ariel Raz
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical filter, spectrometer including the optical filter, and elec...
- Patent number 11,346,716
- Issue date May 31, 2022
- Samsung Electronics Co., Ltd.
- Chanwook Baik
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance detection device and optical wavelength-selective filte...
- Patent number 11,320,473
- Issue date May 3, 2022
- Pioneer Corporation
- Yoshiyuki Okuda
- G02 - OPTICS
Information Patent Grant
Method for removing foreign matter and method for manufacturing opt...
- Patent number 11,294,170
- Issue date Apr 5, 2022
- Hamamatsu Photonics K.K.
- Masaki Hirose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Projector and method for controlling projector
- Patent number 11,269,248
- Issue date Mar 8, 2022
- Seiko Epson Corporation
- Hirotaka Mochizuki
- G02 - OPTICS
Information Patent Grant
Spectral imager and spectral imaging method
- Patent number 11,249,289
- Issue date Feb 15, 2022
- Bodkin Design and Engineering LLC
- Andrew Bodkin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-pass etalon filter
- Patent number 11,239,626
- Issue date Feb 1, 2022
- LightMachinery Inc.
- John H. Hunter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical filter and spectrometer
- Patent number 11,237,049
- Issue date Feb 1, 2022
- VIAVI Solutions Inc.
- Paula Smith
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement control program, optical measurement system, an...
- Patent number 11,156,500
- Issue date Oct 26, 2021
- Hamamatsu Photonics K.K.
- Takashi Kasahara
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for cavity angle tuning for operating conditi...
- Patent number 11,159,245
- Issue date Oct 26, 2021
- Raytheon Company
- Andrew Kowalevicz
- G02 - OPTICS
Information Patent Grant
Multispectral imaging device with array of microlenses
- Patent number 11,143,554
- Issue date Oct 12, 2021
- Silios Technologies
- Stephane Tisserand
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection device having adhesive member
- Patent number 11,118,972
- Issue date Sep 14, 2021
- Hamamatsu Photonics K.K.
- Masaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Use of spectral leaks to obtain high spatial resolution information...
- Patent number 11,095,835
- Issue date Aug 17, 2021
- Imec VZW
- Nicolaas Tack
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Matched interference pigments or foils having viewing angle depende...
- Patent number 11,079,525
- Issue date Aug 3, 2021
- VIAVI Solutions Inc.
- Cornelis Jan Delst
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Tuneable filter
- Patent number 11,060,913
- Issue date Jul 13, 2021
- Lumentum Technology UK Limited
- Adrian Perrin Janssen
- G01 - MEASURING TESTING
Information Patent Grant
Laser communication network implemented with multi-chroic filters
- Patent number 11,002,894
- Issue date May 11, 2021
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Scott Merritt
- G02 - OPTICS
Information Patent Grant
Optical filter and spectrometer including sub-wavelength reflector,...
- Patent number 10,976,477
- Issue date Apr 13, 2021
- Samsung Electronics Co., Ltd.
- Chanwook Baik
- G02 - OPTICS
Information Patent Grant
Wavelength variable interference filter and optical module
- Patent number 10,921,503
- Issue date Feb 16, 2021
- Seiko Epson Corporation
- Akira Sano
- G01 - MEASURING TESTING
Information Patent Grant
Production method for fabry-perot interference filter
- Patent number 10,908,022
- Issue date Feb 2, 2021
- Hamamatsu Photonics K.K.
- Takashi Kasahara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fabry-Perot interference filter having layer with thinned edge port...
- Patent number 10,900,834
- Issue date Jan 26, 2021
- Hamamatsu Photonics K.K.
- Takashi Kasahara
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
INTERFERENCE FILTER AND USE OF A STACKED ARRANGEMENT OF LAYER STRUC...
- Publication number 20230393316
- Publication date Dec 7, 2023
- UNIVERSITÄT ZU KOLN
- Malte C. GATHER
- G02 - OPTICS
Information Patent Application
WAVELENGTH-TUNABLE LIQUID CRYSTAL ETALON FILTER, LIGHT SOURCE AND O...
- Publication number 20230324743
- Publication date Oct 12, 2023
- ALBATRACE, INC.
- Sang Hyun PARK
- G02 - OPTICS
Information Patent Application
OPTICAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING OP...
- Publication number 20230185005
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Hyochul Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CALIBRATION DEVICE AND METHOD FOR HYPERSPECTRAL MEMS TUNABLE FILTER
- Publication number 20230123709
- Publication date Apr 20, 2023
- Unispectral Ltd.
- Peleg Levin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FILTER ARRAY AND LIGHT DETECTION SYSTEM
- Publication number 20230092032
- Publication date Mar 23, 2023
- Panasonic Intellectual Property Management Co., Ltd.
- MOTOKI YAKO
- G01 - MEASURING TESTING
Information Patent Application
FILTER ARRAY AND LIGHT DETECTION SYSTEM
- Publication number 20230069927
- Publication date Mar 9, 2023
- Panasonic Intellectual Property Management Co., Ltd.
- MOTOKI YAKO
- G01 - MEASURING TESTING
Information Patent Application
HIGH PRECISION OPTICAL LOCKER
- Publication number 20230025759
- Publication date Jan 26, 2023
- Lumentum Operations LLC
- Adrian Perrin JANSSEN
- G02 - OPTICS
Information Patent Application
COMPACT ETALON STRUCTURE
- Publication number 20230017729
- Publication date Jan 19, 2023
- Lumentum Operations LLC
- Adrian Perrin JANSSEN
- G02 - OPTICS
Information Patent Application
COMBINED FREQUENCY AND MODE FILTER
- Publication number 20220404534
- Publication date Dec 22, 2022
- Lumentum Technology UK Limited
- Adrian Perrin JANSSEN
- G02 - OPTICS
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20220299366
- Publication date Sep 22, 2022
- SEIKO EPSON CORPORATION
- Haruki MIYASAKA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER, SPECTROMETER INCLUDING THE OPTICAL FILTER, AND ELEC...
- Publication number 20220291041
- Publication date Sep 15, 2022
- Samsung Electronics Co., Ltd.
- Chanwook BAIK
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ FERROELECTRIC RESONATOR
- Publication number 20220283348
- Publication date Sep 8, 2022
- Terra Quantum AG
- Igor Lukyanchuk
- G01 - MEASURING TESTING
Information Patent Application
Mirror Device for an Interferometer Device, Interferometer Device a...
- Publication number 20220221709
- Publication date Jul 14, 2022
- ROBERT BOSCH GmbH
- Christoph Schelling
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ANTI-COUNTERFEITING ELEMENT AND MANUFACTURING METHOD THEREOF
- Publication number 20220184992
- Publication date Jun 16, 2022
- ZHONGCHAO SPECIAL SECURITY TECHNOLOGY CO., LTD.
- Weiwei Zhang
- G02 - OPTICS
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20220146314
- Publication date May 12, 2022
- SEIKO EPSON CORPORATION
- Haruki MIYASAKA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FILTER AND SPECTROMETER
- Publication number 20220146308
- Publication date May 12, 2022
- VIAVI Solutions Inc.
- Paula SMITH
- G01 - MEASURING TESTING
Information Patent Application
COLOR MEASUREMENT APPARATUS
- Publication number 20220146316
- Publication date May 12, 2022
- SEIKO EPSON CORPORATION
- Haruki MIYASAKA
- G01 - MEASURING TESTING
Information Patent Application
FABRY-PEROT INTERFERENCE FILTER
- Publication number 20220050238
- Publication date Feb 17, 2022
- Hamamatsu Photonics K.K.
- Takashi KASAHARA
- G02 - OPTICS
Information Patent Application
IMAGE SENSING DEVICE
- Publication number 20220020801
- Publication date Jan 20, 2022
- SK HYNIX INC.
- Sie Uoo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL DEVICE, OPTICAL FILTER SYSTEM, AND CONTROL METHOD
- Publication number 20220003603
- Publication date Jan 6, 2022
- Hamamatsu Photonics K.K.
- Peter SEITZ
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE
- Publication number 20210389178
- Publication date Dec 16, 2021
- Hamamatsu Photonics K.K.
- Kei TABATA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER
- Publication number 20210372854
- Publication date Dec 2, 2021
- HAMAMATSU PHOTONICS K. K.
- Masaki HIROSE
- G02 - OPTICS
Information Patent Application
SUCTION METHOD
- Publication number 20210362351
- Publication date Nov 25, 2021
- Hamamatsu Photonics K.K.
- Masaki HIROSE
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
SUCTIONING METHOD
- Publication number 20210364681
- Publication date Nov 25, 2021
- Hamamatsu Photonics K.K.
- Masaki HIROSE
- G02 - OPTICS
Information Patent Application
High Power Light Absorbers
- Publication number 20210349281
- Publication date Nov 11, 2021
- Steven J. AUGST
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE AND A METHOD FOR BONDING
- Publication number 20210255376
- Publication date Aug 19, 2021
- Unispectral Ltd.
- Eliahu Chaim ASHKENAZI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
OPTICAL FILTER, SPECTROMETER INCLUDING THE OPTICAL FILTER, AND ELEC...
- Publication number 20210140818
- Publication date May 13, 2021
- Samsung Electronics Co., Ltd., Suwon-si, KOREA, REPUBLIC OF;
- Chanwook BAIK
- G01 - MEASURING TESTING
Information Patent Application
PRODUCTION METHOD FOR FABRY-PEROT INTERFERENCE FILTER
- Publication number 20210131870
- Publication date May 6, 2021
- HAMAMATSU PHOTONICS K. K.
- Takashi KASAHARA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Intrinsic and Tunable Self-Modulating Optical Limiter via Strong Ca...
- Publication number 20210124122
- Publication date Apr 29, 2021
- The Government of the United States of America, as represented by the Secreta...
- Blake Simpkins
- G02 - OPTICS
Information Patent Application
PROJECTOR AND METHOD FOR CONTROLLING PROJECTOR
- Publication number 20210088890
- Publication date Mar 25, 2021
- SEIKO EPSON CORPORATION
- Hirotaka MOCHIZUKI
- G02 - OPTICS

of etalon type comprising a resonant cavity other than a thin solid film

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device with a heterostructure adapted to be applied as a resonator...

Optical filter

Tunable notch filter

Optical filter, spectrometer including the optical filter, and elec...

High precision optical locker

Thin-film filter based hyperspectral imager spanning an octave of l...

Intrinsic and tunable self-modulating optical limiter via strong ca...

Optical detection device having adhesive member

Angle- and polarization-insensitive narrow-band optical filters usi...

Optical filter device, optical module, and electronic apparatus

Tunable MEMS etalon device

Optical filter, spectrometer including the optical filter, and elec...

Capacitance detection device and optical wavelength-selective filte...

Method for removing foreign matter and method for manufacturing opt...

Projector and method for controlling projector

Spectral imager and spectral imaging method

Multi-pass etalon filter

Optical filter and spectrometer

Optical measurement control program, optical measurement system, an...

Methods and apparatus for cavity angle tuning for operating conditi...

Multispectral imaging device with array of microlenses

Optical detection device having adhesive member

Use of spectral leaks to obtain high spatial resolution information...

Matched interference pigments or foils having viewing angle depende...

Tuneable filter

Laser communication network implemented with multi-chroic filters

Optical filter and spectrometer including sub-wavelength reflector,...

Wavelength variable interference filter and optical module

Production method for fabry-perot interference filter

Fabry-Perot interference filter having layer with thinned edge port...

Patents Applicationslast 30 patents

INTERFERENCE FILTER AND USE OF A STACKED ARRANGEMENT OF LAYER STRUC...

WAVELENGTH-TUNABLE LIQUID CRYSTAL ETALON FILTER, LIGHT SOURCE AND O...

OPTICAL FILTER, AND IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING OP...

CALIBRATION DEVICE AND METHOD FOR HYPERSPECTRAL MEMS TUNABLE FILTER

FILTER ARRAY AND LIGHT DETECTION SYSTEM

FILTER ARRAY AND LIGHT DETECTION SYSTEM

HIGH PRECISION OPTICAL LOCKER

COMPACT ETALON STRUCTURE

COMBINED FREQUENCY AND MODE FILTER

COLOR MEASUREMENT APPARATUS

OPTICAL FILTER, SPECTROMETER INCLUDING THE OPTICAL FILTER, AND ELEC...

TERAHERTZ FERROELECTRIC RESONATOR

Mirror Device for an Interferometer Device, Interferometer Device a...

OPTICAL ANTI-COUNTERFEITING ELEMENT AND MANUFACTURING METHOD THEREOF

COLOR MEASUREMENT APPARATUS

OPTICAL FILTER AND SPECTROMETER

COLOR MEASUREMENT APPARATUS

FABRY-PEROT INTERFERENCE FILTER

IMAGE SENSING DEVICE

CONTROL DEVICE, OPTICAL FILTER SYSTEM, AND CONTROL METHOD

SPECTROSCOPIC UNIT AND SPECTROSCOPIC MODULE

OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER

SUCTION METHOD

SUCTIONING METHOD

High Power Light Absorbers

OPTICAL DEVICE AND A METHOD FOR BONDING

OPTICAL FILTER, SPECTROMETER INCLUDING THE OPTICAL FILTER, AND ELEC...

PRODUCTION METHOD FOR FABRY-PEROT INTERFERENCE FILTER

Intrinsic and Tunable Self-Modulating Optical Limiter via Strong Ca...

PROJECTOR AND METHOD FOR CONTROLLING PROJECTOR