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G01N35/00623
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N35/00
Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00 Handling materials therefor
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G01N35/00623
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Patents Grants
last 30 patents
Information
Patent Grant
Quality control support method, quality control support system, qua...
Patent number
12,203,950
Issue date
Jan 21, 2025
Sysmex Corporation
Shrey Singh
G01 - MEASURING TESTING
Information
Patent Grant
Z-axis measurement fixture and method of determining the planarity...
Patent number
12,181,420
Issue date
Dec 31, 2024
IDEXX Laboratories, Inc.
David C. Giroux
G01 - MEASURING TESTING
Information
Patent Grant
Method of handling laboratory sample containers and apparatus for h...
Patent number
12,169,206
Issue date
Dec 17, 2024
Roche Diagnostics Operations, Inc.
Raul Baltasar Badaya
G01 - MEASURING TESTING
Information
Patent Grant
Automated analyzer and automated analysis method
Patent number
12,146,890
Issue date
Nov 19, 2024
HITACHI HIGH-TECH CORPORATION
Yuto Kazama
G01 - MEASURING TESTING
Information
Patent Grant
Calibration management of an in-vitro diagnostic system
Patent number
12,140,601
Issue date
Nov 12, 2024
Roche Diagnostics Operations, Inc.
Juliane Drobnik
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring the cleaning status of an automatic analyzer
Patent number
12,123,884
Issue date
Oct 22, 2024
HITACHI HIGH-TECH CORPORATION
Kenichi Yagi
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer with a control unit for displaying background ma...
Patent number
12,111,327
Issue date
Oct 8, 2024
HITACHI HIGH-TECH CORPORATION
Satoru Chida
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for analyzing samples including a temperature controlling...
Patent number
12,097,490
Issue date
Sep 24, 2024
DNABOY CO., LTD.
Muntak Son
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Systems and methods for multi-analysis
Patent number
12,085,583
Issue date
Sep 10, 2024
Labrador Diagnostics LLC
Elizabeth A. Holmes
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Analysis system, server apparatus, control method, and computer rea...
Patent number
12,086,050
Issue date
Sep 10, 2024
Shimadzu Corporation
Koki Yamamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Failure state prediction for automated analyzers for analyzing a bi...
Patent number
12,072,341
Issue date
Aug 27, 2024
Roche Diagnostics Operations, Inc.
Fabian Heinemann
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for analyzing liquid compositions, particularly s...
Patent number
12,050,229
Issue date
Jul 30, 2024
NEOVITEA
Gilles Mougin
G01 - MEASURING TESTING
Information
Patent Grant
Chromatography column qualification in manufacturing methods for pr...
Patent number
12,018,075
Issue date
Jun 25, 2024
Janssen Biotech, Inc.
Paul Randolph
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Methods for assuring quality compliance of point-of-care instrument...
Patent number
11,994,526
Issue date
May 28, 2024
Abbott Point of Care Inc.
Paul Glavina
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
11,971,424
Issue date
Apr 30, 2024
HITACHI HIGH-TECH CORPORATION
Yuichi Hirabayashi
G01 - MEASURING TESTING
Information
Patent Grant
Indicating a status of an analytical instrument on a screen of the...
Patent number
11,965,900
Issue date
Apr 23, 2024
Wyatt Technology, LLC
Vivianna Day
G01 - MEASURING TESTING
Information
Patent Grant
Analysis device for detection chip, method for operating analysis d...
Patent number
11,946,944
Issue date
Apr 2, 2024
BEIJING BOE HEALTH TECHNOLOGY CO., LTD.
Hongquan Li
G01 - MEASURING TESTING
Information
Patent Grant
Quality control method, quality control system, management apparatu...
Patent number
11,933,796
Issue date
Mar 19, 2024
Sysmex Corporation
Keiji Fujimoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic sample injection device
Patent number
11,933,799
Issue date
Mar 19, 2024
Shimadzu Corporation
Daiki Fukushima
G01 - MEASURING TESTING
Information
Patent Grant
Device with blockable/un-blockable fluid channels and built-in self...
Patent number
11,921,126
Issue date
Mar 5, 2024
Technische Universitat Munchen
Mengchu Li
G01 - MEASURING TESTING
Information
Patent Grant
Quality control for point-of-care diagnostic systems
Patent number
11,887,727
Issue date
Jan 30, 2024
IDEXX Laboratories, Inc.
Jeremy Hammond
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods of efficiently performing biological assays
Patent number
11,887,703
Issue date
Jan 30, 2024
Becton, Dickinson and Company
Clarke Bowers
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test method and dispensing device
Patent number
11,879,902
Issue date
Jan 23, 2024
HITACHI HIGH-TECH CORPORATION
Akihiro Nojima
G01 - MEASURING TESTING
Information
Patent Grant
Automatic quality check for laboratory instruments
Patent number
11,867,708
Issue date
Jan 9, 2024
Beckman Coulter, Inc.
Madhuri La Barrie
G01 - MEASURING TESTING
Information
Patent Grant
Distributed control system, automatic analysis device, and automati...
Patent number
11,863,374
Issue date
Jan 2, 2024
HITACHI HIGH-TECH CORPORATION
Takafumi Hasegawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hematology analyzers and methods of operation
Patent number
11,852,640
Issue date
Dec 26, 2023
Beckman Coulter, Inc.
Carlos Ramirez
G01 - MEASURING TESTING
Information
Patent Grant
Z-axis measurement fixture and method of determining the planarity...
Patent number
11,835,471
Issue date
Dec 5, 2023
IDEXX Laboratories, Inc.
David C. Giroux
G01 - MEASURING TESTING
Information
Patent Grant
Stray light compensating methods and apparatus for characterizing a...
Patent number
11,815,519
Issue date
Nov 14, 2023
Siemens Healthcare Diagnostics Inc.
Patrick Wissmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for optimizing an instrument system workflow
Patent number
11,802,883
Issue date
Oct 31, 2023
Berkeley Lights, Inc.
Darshan Thaker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reliability indicating method for an electrochemiluminescence metho...
Patent number
11,796,477
Issue date
Oct 24, 2023
Roche Diagnostics Operations, Inc.
Stefan Quint
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method For Predicting Performance Of Detection Device
Publication number
20250060380
Publication date
Feb 20, 2025
SEEGENE, Inc
Kwang Min KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
POSITION TRACKING SYSTEM AND METHOD FOR TRACKING A RELATIVE POSITIO...
Publication number
20250060381
Publication date
Feb 20, 2025
Roche Diagnostics Operations, Inc.
Vladimirs Leontjevs
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF HANDLING LABORATORY SAMPLE CONTAINERS AND APPARATUS FOR H...
Publication number
20250052773
Publication date
Feb 13, 2025
Roche Diagnostics Opereations, Inc.
Raul Baltasar Badaya
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED ANALYZING DEVICE, AND METHOD FOR DETERMINING SERVICE LIFE...
Publication number
20250035654
Publication date
Jan 30, 2025
Hitachi High-Tech Corporation
Kumiko KAWATO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE CONTROL METHOD, AND AUTOMATIC ANALYSIS DE...
Publication number
20250020680
Publication date
Jan 16, 2025
HITACHI HIGH-TECH CORPORATION
Wenxi Fei
G01 - MEASURING TESTING
Information
Patent Application
A METHOD OF AUTOMATICALLY TESTING THE SENSITIVITY OF A TYPE OF DUAL...
Publication number
20250003998
Publication date
Jan 2, 2025
NANJING TYCHO INFORMATION TECHNOLOGY CO., LTD
Qichang GUO
G01 - MEASURING TESTING
Information
Patent Application
SOLENOID VALVE MONITOR USING HALL EFFECT SENSORS
Publication number
20250003524
Publication date
Jan 2, 2025
Beckman Coulter, Inc.
Masayuki Osako
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
DEVICES AND METHODS TO DETERMINE WHETHER TO CALIBRATE A LABORATORY...
Publication number
20240426850
Publication date
Dec 26, 2024
CCQCC Corp.
George S. Cembrowski
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analyzer and Sample Dispensing Method
Publication number
20240426851
Publication date
Dec 26, 2024
Hitachi High-Tech Corporation
Hideto TAMEZANE
G01 - MEASURING TESTING
Information
Patent Application
DEVICES AND METHODS TO DETERMINE WHETHER TO CALIBRATE A LABORATORY...
Publication number
20240426852
Publication date
Dec 26, 2024
George S. Cembrowski
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, METHOD AND SYSTEM FOR ASSIGNING PROCESSING STEPS TO A LA...
Publication number
20240418737
Publication date
Dec 19, 2024
Beckman Coulter, Inc.
Eric VARLET
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analyzer and Abnormality Determination Method for the Same
Publication number
20240402200
Publication date
Dec 5, 2024
Hitachi High-Tech Corporation
Hiroki HAMADA
G01 - MEASURING TESTING
Information
Patent Application
DATA ANALYSIS METHOD AND SERVER DEVICE
Publication number
20240402199
Publication date
Dec 5, 2024
Hitachi High-Tech Corporation
Takuya IMI
G01 - MEASURING TESTING
Information
Patent Application
Automated Analysis Support Robot, and Automated Analysis System
Publication number
20240377422
Publication date
Nov 14, 2024
Hitachi High-Tech Corporation
Hikaru TAKIZAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Pressure monitored piston pump
Publication number
20240376889
Publication date
Nov 14, 2024
Stratec SE
Tibor Horvath
F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20240361346
Publication date
Oct 31, 2024
HITACHI HIGH-TECH CORPORATION
Makoto NOGAMI
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analyzer
Publication number
20240345110
Publication date
Oct 17, 2024
Hitachi High-Tech Corporation
Hiromi Hirama
G01 - MEASURING TESTING
Information
Patent Application
PIPETTE CALIBRATION MANAGING SYSTEM AND METHOD
Publication number
20240345111
Publication date
Oct 17, 2024
Eppendorf SE
Dieter Jäger
G01 - MEASURING TESTING
Information
Patent Application
REAL-TIME SHORT-SAMPLE ASPIRATION FAULT DETECTION
Publication number
20240337672
Publication date
Oct 10, 2024
Siemens Healthcare Diagnostics Inc.
Narayanan Ramakrishnan
G01 - MEASURING TESTING
Information
Patent Application
FLUID HANDLING SYSTEMS WITH FUNCTION CHECKS
Publication number
20240329067
Publication date
Oct 3, 2024
Beckman Coulter, Inc.
Juan J. FERNANDEZ DE CASTRO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
Publication number
20240319215
Publication date
Sep 26, 2024
Kabushiki Kaisha Toshiba
Ryota SEKIYA
G01 - MEASURING TESTING
Information
Patent Application
Method of quantifying and presenting an experimental error
Publication number
20240310394
Publication date
Sep 19, 2024
SARTORIUS BIOHIT LIQUID HANDLING OY
Hannes Jantunen
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SYSTEMS AND METHODS FOR OPTIMIZING AN INSTRUMENT SYSTEM WORKFLOW
Publication number
20240272183
Publication date
Aug 15, 2024
Berkeley Lights, Inc.
Darshan Thaker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND APPARATUS FOR PREDICTING AND PREVENTING FAILURE OF IN V...
Publication number
20240255533
Publication date
Aug 1, 2024
Siemens Healthcare Diagnostics Inc.
Arnold Rudorfer
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR TRACKING PERFORMANCE CHARACTERISTICS OF PRO...
Publication number
20240248104
Publication date
Jul 25, 2024
Culture Biosciences, Inc.
Sean Dolan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR A REGULATORY-COMPLIANT AUTOMATED ASSAY
Publication number
20240230691
Publication date
Jul 11, 2024
Regeneron Pharmaceuticals, Inc.
Yi Liu Chen
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC CHEMICAL ANALYZER, AUTOMATIC CHEMICAL ANALYZER MAINTENANC...
Publication number
20240230693
Publication date
Jul 11, 2024
HITACHI HIGH-TECH CORPORATION
Hajime KATO
G01 - MEASURING TESTING
Information
Patent Application
SLIDE INFORMATION CAPTURING AND EVALUATION DEVICE AND METHOD OF OPE...
Publication number
20240230697
Publication date
Jul 11, 2024
SONG YI SYSTEM CO., LTD.
Chun-Chieh CHIANG
G01 - MEASURING TESTING
Information
Patent Application
ROBOT TASK SCHEDULER WITH VERIFIED AUDIT TRAIL
Publication number
20240230692
Publication date
Jul 11, 2024
Merck Sharp & Dohme LLC
Edward M. Hudak
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CALIBRATING A SENSOR DURING OPERATION, SENSOR WITH IMPLE...
Publication number
20240210351
Publication date
Jun 27, 2024
Endress + Hauser Conducta GmbH + Co. KG
Holm Petzold
G01 - MEASURING TESTING